EP1627431A1 - Bidirektionaler schalter und verwendung des schalters - Google Patents
Bidirektionaler schalter und verwendung des schaltersInfo
- Publication number
- EP1627431A1 EP1627431A1 EP04721516A EP04721516A EP1627431A1 EP 1627431 A1 EP1627431 A1 EP 1627431A1 EP 04721516 A EP04721516 A EP 04721516A EP 04721516 A EP04721516 A EP 04721516A EP 1627431 A1 EP1627431 A1 EP 1627431A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- contact
- semiconductor component
- switch
- input
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02J—ELECTRIC POWER NETWORKS; CIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTING ELECTRIC POWER; SYSTEMS FOR STORING ELECTRIC ENERGY
- H02J7/00—Circuit arrangements for charging or discharging batteries or for supplying loads from batteries
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
- H10W72/07551—Connecting or disconnecting of bond wires characterised by changes in properties of the bond wires during the connecting
- H10W72/07552—Connecting or disconnecting of bond wires characterised by changes in properties of the bond wires during the connecting changes in structures or sizes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
- H10W72/07551—Connecting or disconnecting of bond wires characterised by changes in properties of the bond wires during the connecting
- H10W72/07553—Connecting or disconnecting of bond wires characterised by changes in properties of the bond wires during the connecting changes in shapes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/521—Structures or relative sizes of bond wires
- H10W72/527—Multiple bond wires having different sizes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/531—Shapes of wire connectors
- H10W72/5363—Shapes of wire connectors the connected ends being wedge-shaped
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/531—Shapes of wire connectors
- H10W72/537—Multiple bond wires having different shapes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/541—Dispositions of bond wires
- H10W72/5445—Dispositions of bond wires being orthogonal to a side surface of the chip, e.g. parallel arrangements
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/541—Dispositions of bond wires
- H10W72/547—Dispositions of multiple bond wires
- H10W72/5475—Dispositions of multiple bond wires multiple bond wires connected to common bond pads at both ends of the wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/921—Structures or relative sizes of bond pads
- H10W72/926—Multiple bond pads having different sizes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/751—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
- H10W90/753—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between laterally-adjacent chips
Definitions
- the invention relates to a bidirectional switch and a use of the bidirectional switch.
- switches between an energy store (battery) and a power store (capacitor) and between a generator and a consumer are required for optimized vehicle electrical system management , If required, the switches should ensure a directed and controlled exchange of power between the various components of the vehicle electrical system.
- these switches are designed as bidirectional switches. This means that current can flow in both directions almost regardless of the potentials present. With such a bidirectional switch, so-called regenerative braking can be carried out, for example.
- Electrical power is fed from the starter generator into a capacitor (for example a so-called "supercap”) in order to be available as power when the motor of the motor vehicle is started or to charge the motor vehicle's battery.
- a mechanical switch or semiconductor switch is usually composed of several discrete individual components in order to implement the bidirectional switch.
- MOSFETs MOSFETs
- Standard connection technology does not dominate the share of semiconductor resistance in the total resistance. Rather, bond wires, which are used for the electrical contacting of the semiconductor component and which are in some cases implemented multiple times in parallel using thick wire bonding technology, make a significant contribution to the overall resistance of the switch.
- the object of the present invention is to provide a bidirectional switch with a low overall resistance compared to conventional bidirectional switches.
- a bidirectional switch comprising at least one first controllable semiconductor component with a first input contact, a first output contact and a first control contact, and at least one second controllable semiconductor component with a second input contact, a second output contact and a second control contact , specified.
- the first input contact of the first semiconductor component and the second input contact of the second semiconductor component are electrically conductively connected to one another and the first output contact of the first semiconductor component and the second output contact of the second semiconductor component are electrically insulated from one another.
- the semiconductor components of the bidirectional switch are arranged on a common substrate having an electrically conductive coating.
- At least one of the semiconductor components of the switch is arranged on the electrically conductive coating in such a way that there is a common contact surface of the coating and a surface of the contact facing the coating, which corresponds to at least 60% of the surface of the contact facing the coating.
- the first control contact of the first semiconductor component and the second control contact of the second semiconductor component can be electrically insulated from one another and thus separately can be controlled. These contacts are preferably connected to one another in an electrically conductive manner.
- the semiconductor component is preferably a power semiconductor component which is suitable for the transmission of high currents in the kA range.
- the semiconductor component is preferably a MOSFET.
- An IGBT or a bipolar transistor is also conceivable.
- the input contact is usually referred to as the emitter, the output contact as the collector and the control contact as the base, and in the case of a MOSFET as the source, drain and gate.
- the substrate acts as a circuit carrier and consists of a layer of a dielectric material on which the electrically conductive coating is applied.
- the dielectric material can be a ceramic or a plastic.
- the electrically conductive coating is, for example, a copper layer.
- the layer made of the dielectric material can have an electrically conductive coating on both sides.
- Such a substrate is, for example, a so-called DCB (Direct Copper Bonding) substrate.
- a coating of the substrate is used for the electrical contacting of the contacts of a semiconductor component, large-area contacting of the input and / or the output contact is possible.
- the resulting contact area preferably corresponds to at least 80% of the surface of the contact of the semiconductor component facing the coating.
- the contacts electrically contacted in this way are, in particular, the input and the output contact of the semiconductor component.
- the result is a bidirectional switch with a significantly lower overall resistance compared to the known prior art.
- suitable measures for example galvanic reinforcement of the coating a relatively high current carrying capacity can be realized, so that high currents in the range of up to several kA can be switched.
- the bidirectional switch in an implementation with MOSFETs is designed as a so-called transfer gate. Two transfer gates are preferably connected to form a module (changeover switch).
- the bidirectional switch has at least one third controllable semiconductor component with a third input contact, a third output contact and a third control contact and at least one fourth controllable semiconductor component with a fourth input contact, a fourth output contact and a fourth control contact.
- the third input contact of the third semiconductor component and the fourth input contact of the fourth semiconductor component are electrically conductively connected to one another, the third control contact of the third semiconductor component and the fourth control contact of the fourth semiconductor component are electrically conductively connected to one another, the third
- Output contact of the third semiconductor component and the fourth output contact of the fourth semiconductor component are electrically insulated from one another and the second output contact of the second semiconductor component and the third output contact of the third semiconductor component are electrically connected to one another.
- At least one further semiconductor component is connected in parallel with at least one of the semiconductor components of the switch.
- the function of one of the semiconductor components described above is carried out by several, connected in parallel to each other
- the substrate has a cooling device for cooling at least one of the Semiconductor components of the switch. It is ensured that the semiconductor components and in particular the contacts are cooled efficiently. The large-area contacting of the contacts alone ensures good thermal
- connection of the semiconductor components to an environment is further improved by the cooling device, which is reflected in a reduced temperature rise during operation and thus in a reduced overall resistance of the bidirectional switch.
- the cooling device is, for example, a heat sink.
- the heat sink cools the semiconductor components and / or the electrical contacts by heat conduction.
- the heat sink can be connected directly or indirectly via the substrate to the semiconductor components.
- the semiconductor components are thermally bonded via the electrically conductive coating which is connected to the heat sink.
- the electrically conductive coating serves not only for electrical contacting, but also for cooling the semiconductor components.
- a cooling device with a cooling fluid is also conceivable.
- the cooling fluid can be brought into direct contact with the semiconductor components. It is also conceivable that the cooling fluid with the
- Heat sink is in contact, which is connected directly or indirectly to the semiconductor devices.
- the bi-directional switch presented is generally suitable for power and energy transmission between different electrical components.
- the switch is used in particular for charging and discharging a battery and / or a capacitor.
- the battery and the capacitor are in particular components of an electrical system of a motor vehicle.
- the bidirectional switch is used to control the vehicle electrical system.
- the capacitor used is, for example, a "supercap”.
- the present invention has the following advantages:
- the large-area contacting of the contacts of the semiconductor components results in a good thermal connection of the contacts to the environment.
- the contact is low-resistance (low loss resistance).
- the large-area contacting also leads to low-inductive electrical contacting. This has a positive effect on the EMC (electromagnetic compatibility) behavior of the switch.
- the bidirectional switch is characterized by a high current carrying capacity.
- thermomechanical loads Due to the good thermal connection, there are low temperature gradients within the arrangement and thus low thermomechanical loads.
- FIG. 4 shows a circuit diagram of the bidirectional switches of FIGS. 1 to 3.
- Figures 5 and 7 to 9 each show an arrangement of a bidirectional switch in the form of a switch with two transfer gates on a substrate from above.
- FIG. 6 shows a circuit diagram of the bidirectional switches of FIGS. 5 and 7 to 9.
- FIG. 10 shows a section of an arrangement of a bidirectional switch on a substrate in a lateral cross section.
- the switch 2 has at least one first controllable semiconductor component 100 with a first input contact 101, a first output contact 102 and a first control contact 103 and at least one second controllable semiconductor component 200 with a second input contact 201, a second output contact 202 and a second control contact 203 (see FIG. 4).
- the first input contact 101 of the first semiconductor component 100 and the second input contact 201 of the second semiconductor component 200 are electrically conductively connected to one another
- the first control contact 103 of the first semiconductor component 100 and the second control contact 203 of the second semiconductor component 200 are electrically conductively connected to one another
- the first output contact 102 of the first semiconductor component 100 and the second output contact 202 of the second semiconductor component 200 are electrically insulated from one another. At least one of the
- Semiconductor components 100, 200 of the switch 2 are arranged on the electrically conductive coating such that a there is a common contact surface 5 of the coating 4 and a surface 6 of the contact facing the coating 4, which corresponds to at least 80% of the surface 6 of the contact facing the coating.
- the semiconductor devices are MOSFETs with a. Surface of the input (source) or output (drain) contact of approximately 60 mm 2 . These MOSFETs are designed so that up to 300 A can be switched permanently.
- the bidirectional switch can switch up to 1 kA switching current for 100 ms to 200 ms. Up to 600 A can be switched for about 8 s.
- the substrate is a DCB substrate with a ceramic layer, which is provided on both sides with an electrically conductive coating made of copper.
- the ceramic layer forms the actual substrate 3, which has the electrically conductive coatings 4 and 48 (cf. FIG. 10).
- the coating 4 and the contact of the semiconductor component 100, 200, 300 or 400 have a common contact area 5.
- the common contact surface 5 is formed by the surface 6 of the contact of the semiconductor component facing the coating 4.
- Insulator component is contacted over large areas via bond wires, or according to FIG.
- an electrically conductive film 43, 45, 46 or 47 reinforced with galvanically deposited copper is used.
- An insulation film 10 ensures the electrical insulation of the contacts of the semiconductor component from one another.
- the substrate 3 has two heat sinks 7. With a connecting means 9 in the form of a screw connection, the heat sinks 7 are connected to the substrate in such a way that the
- This is Lanyard a clamp.
- An (electrically insulating) heat-conducting paste 11 in the form of a molding compound is arranged between the heat sinks 7 and the substrate 3, so that heat generated during operation of the bidirectional switch can be dissipated efficiently.
- the heat sink 7 and the substrate 3 or the coatings 4 and 48 of the substrate 3 are soldered to one another.
- the solder forms the heat-conducting contact between the heat sinks and the coating of the substrate.
- a heat-conducting paste and, alternatively, a heat-conducting film are provided in place of the solder in further embodiments.
- the bidirectional switch 2 forms a single transfer gate ( Figure 1, Figure 4).
- Semiconductor component 100 is arranged on a first coating 41 of the substrate 3 in such a way that the output contact 102 of the first semiconductor component 100, which cannot be seen, is electrically conductively connected to the first coating 41 and, above that, to the first output connection 105.
- the first output connection 105 serves as a load connection of the first semiconductor component 100.
- the exposed, first control contact 103 of the first is also indicated
- the semiconductor component 100 that is electrically connected to the first control connection 106.
- Three further first semiconductor components 110 are connected in parallel with the first semiconductor component 100. This is realized in such a way that the first output contacts of the first semiconductor components are connected to one another in an electrically conductive manner via the first electrically conductive coating 41, the first input contacts of the first semiconductor components via bond wires 107 and the first control contacts of the first semiconductor components via a bond wire 108.
- the second semiconductor component 200 is arranged on a second coating 42 of the substrate 3 such that the invisible output contact 203 of the second semiconductor component 200 is electrically conductively connected to the second coating 42 and, moreover, to the second output terminal 205.
- the second output connection 205 serves as a load connection of the second semiconductor component 200.
- the second control contact 203 of the second semiconductor component 200 is electrically connected to the first control connection 106.
- Three further second semiconductor components 210 are connected in parallel with the second semiconductor component 200. This is realized in such a way that the second output contacts of the second semiconductor components are connected to one another in an electrically conductive manner via the second electrically conductive coating 42, the second input contacts of the second semiconductor components via bond wires 207 and the control contacts of the second semiconductor components via a bond wire 208.
- Semiconductor component 100 or the first input contacts of the first semiconductor components 100 and 110 are connected to the second input contact 201 of the second semiconductor component 200 or the second input contacts of the second via the electrically conductive coating 4 of the substrate
- the first input port 104 and the second input port 204 are identical.
- first and second control contacts 103 and 203 of the first and second semiconductor components 100, 110 and 200, 210 are electrically connected to one another.
- first control connection 106 and the second control connection 206 are connected to one another in an electrically conductive manner. This is not shown in Figure 1.
- Example 2
- first input contacts of the first semiconductor components 100, 110 and the second input contacts are the second
- Semiconductor components 200, 210 are not connected to one another in an electrically conductive manner via a coating 4 of the substrate 3, but rather via further bond wires 112 (FIG. 2).
- no bond wires 112 are used for electrically contacting the first input contacts of the first semiconductor components 100, 110 with the second input contacts of the second semiconductor components 200, 210 (FIG. 3).
- the input contacts are contacted over a large area via an electrically conductive film 43 and are connected to one another in an electrically conductive manner. At least 60% of the surface of an input contact is electrically conductively connected to the film 43 and forms a common contact area.
- copper is electrodeposited on the foil. Films made of a dielectric material are used for electrical insulation from the substrate, for example the electrically conductive coatings 41 and 42.
- bond wires 108 and 208 can be used for electrical contacting of the control contacts.
- the control contacts are also electrically connected to one another by an electrically conductive film.
- the bidirectional switch 2 forms two transfer gates, which are interconnected to form a changeover switch 8.
- Figure 6 shows the corresponding equivalent circuit diagram. For the sake of clarity, the internal diodes of the MOSFETs are not shown in this figure.
- a third controllable semiconductor component 300 with a third input contact 301, a third output contact 302 and a third control contact 303 and a fourth controllable semiconductor component 400 with a fourth input contact 401, a fourth output contact 402 and a fourth control contact 403 are present (FIG. 5 ).
- the third input contact 301 of the third semiconductor component 300 and the fourth input contact 401 of the fourth semiconductor component 400 are electrically conductively connected to one another via bond wires 134.
- the third control contact 303 of the third semiconductor component 300 and the fourth control contact 403 of the fourth semiconductor component 400 are electrically conductively connected to one another via a bonding wire 334.
- the third output contact 303 of the third semiconductor component 300 and the fourth output contact 403 of the fourth semiconductor component 400 are electrically insulated from one another.
- the second output contact 202 of the second semiconductor component 200 and the third output contact 302 of the third semiconductor component 300 are electrically conductively connected to one another via a coating 44 of the substrate 3.
- the second output connection 205 and the third output connection 305 are identical.
- the first and second input ports 104 and 204 are identical.
- the third and fourth Electrically conductive foils 43 and 45 are used at the input contact (FIG. 7, cf. exemplary embodiment 3). These foils are reinforced by galvanic deposition of copper.
- the first and second control contacts 103 and 203 are electrically contacted over a large area via an electrically conductive film 46 and the third and fourth control contacts 303 and 304 via an electrically conductive film 47.
- three further semiconductor components 110, 210, 310 and 410 are connected in parallel to each of the semiconductor components 100, 200, 300 and 400 (FIGS. 8 and 9).
- the square arrangement of the semiconductor components according to FIG. 9 results in a more favorable heat distribution in the operation of the switch 8 compared to the arrangement in FIG. 8.
- a thermal stress in the substrate caused by the operation of the switch is smaller.
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Electronic Switches (AREA)
Abstract
Description
Claims
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE10324048 | 2003-05-27 | ||
| PCT/EP2004/002853 WO2004107442A1 (de) | 2003-05-27 | 2004-03-18 | Bidirektionaler schalter und verwendung des schalters |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| EP1627431A1 true EP1627431A1 (de) | 2006-02-22 |
Family
ID=33482209
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP04721516A Withdrawn EP1627431A1 (de) | 2003-05-27 | 2004-03-18 | Bidirektionaler schalter und verwendung des schalters |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US20070040189A1 (de) |
| EP (1) | EP1627431A1 (de) |
| WO (1) | WO2004107442A1 (de) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006147700A (ja) * | 2004-11-17 | 2006-06-08 | Sanyo Electric Co Ltd | 半導体装置 |
| JP2008153748A (ja) * | 2006-12-14 | 2008-07-03 | Matsushita Electric Ind Co Ltd | 双方向スイッチ及び双方向スイッチの駆動方法 |
| DE102016122963B4 (de) * | 2016-11-29 | 2021-06-24 | Infineon Technologies Austria Ag | Halbleitervorrichtung mit einem bidirektionalen Schalter |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0064856B1 (de) * | 1981-05-12 | 1986-12-30 | LUCAS INDUSTRIES public limited company | Multiphasen-Brückenanordnung |
| US5141616A (en) * | 1991-07-23 | 1992-08-25 | Heraeus Elektroden Gmbh | Electrode for extracting metals from a metal ion solution |
| DE4222973A1 (de) * | 1992-07-13 | 1994-01-20 | Asea Brown Boveri | Bidirektionaler Halbleiterschalter |
| JP3521757B2 (ja) * | 1998-09-08 | 2004-04-19 | 株式会社豊田自動織機 | 半導体モジュール電極構造 |
| US6072240A (en) * | 1998-10-16 | 2000-06-06 | Denso Corporation | Semiconductor chip package |
| JP3538042B2 (ja) * | 1998-11-24 | 2004-06-14 | 松下電器産業株式会社 | スラリー供給装置及びスラリー供給方法 |
| WO2000034964A1 (en) * | 1998-12-05 | 2000-06-15 | Energy Storage Systems Pty. Ltd. | A charge storage device |
| JP2001308264A (ja) * | 2000-04-21 | 2001-11-02 | Toyota Industries Corp | 半導体装置 |
| EP1316999A1 (de) * | 2001-11-28 | 2003-06-04 | Continental ISAD Electronic Systems GmbH & Co. oHG | Verfahren und Vorichtung zum Kontaktieren von Leistungselektronik-Bauelementen |
-
2004
- 2004-03-18 WO PCT/EP2004/002853 patent/WO2004107442A1/de not_active Ceased
- 2004-03-18 US US10/558,285 patent/US20070040189A1/en not_active Abandoned
- 2004-03-18 EP EP04721516A patent/EP1627431A1/de not_active Withdrawn
Non-Patent Citations (1)
| Title |
|---|
| See references of WO2004107442A1 * |
Also Published As
| Publication number | Publication date |
|---|---|
| US20070040189A1 (en) | 2007-02-22 |
| WO2004107442A1 (de) | 2004-12-09 |
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| PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
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| 17P | Request for examination filed |
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| AK | Designated contracting states |
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| DAX | Request for extension of the european patent (deleted) | ||
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