EP1071174A3 - Anordnung und Verfahren zur Prüfung der Crimpqualität von Kontakten - Google Patents

Anordnung und Verfahren zur Prüfung der Crimpqualität von Kontakten Download PDF

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Publication number
EP1071174A3
EP1071174A3 EP00115750A EP00115750A EP1071174A3 EP 1071174 A3 EP1071174 A3 EP 1071174A3 EP 00115750 A EP00115750 A EP 00115750A EP 00115750 A EP00115750 A EP 00115750A EP 1071174 A3 EP1071174 A3 EP 1071174A3
Authority
EP
European Patent Office
Prior art keywords
terminal
terminal crimping
decision method
crimping
quality decision
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP00115750A
Other languages
English (en)
French (fr)
Other versions
EP1071174A2 (de
EP1071174B1 (de
Inventor
Teruyuki c/o Yazaki Parts Co. Ltd. Ishibashi
Kazuyoshi c/o Yazaki Parts Co. Ltd. Tomikawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yazaki Corp
Original Assignee
Yazaki Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yazaki Corp filed Critical Yazaki Corp
Publication of EP1071174A2 publication Critical patent/EP1071174A2/de
Publication of EP1071174A3 publication Critical patent/EP1071174A3/de
Application granted granted Critical
Publication of EP1071174B1 publication Critical patent/EP1071174B1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R43/00—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors
    • H01R43/04—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors for forming connections by deformation, e.g. crimping tool
    • H01R43/048—Crimping apparatus or processes
    • H01R43/0486—Crimping apparatus or processes with force measuring means

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Manufacturing Of Electrical Connectors (AREA)
  • Cable Accessories (AREA)
EP20000115750 1999-07-23 2000-07-21 Anordnung und Verfahren zur Prüfung der Crimpqualität von Kontakten Expired - Lifetime EP1071174B1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP20873899 1999-07-23
JP11208738A JP2001035628A (ja) 1999-07-23 1999-07-23 端子圧着状態判別方法および装置

Publications (3)

Publication Number Publication Date
EP1071174A2 EP1071174A2 (de) 2001-01-24
EP1071174A3 true EP1071174A3 (de) 2001-08-29
EP1071174B1 EP1071174B1 (de) 2005-02-23

Family

ID=16561274

Family Applications (1)

Application Number Title Priority Date Filing Date
EP20000115750 Expired - Lifetime EP1071174B1 (de) 1999-07-23 2000-07-21 Anordnung und Verfahren zur Prüfung der Crimpqualität von Kontakten

Country Status (5)

Country Link
EP (1) EP1071174B1 (de)
JP (1) JP2001035628A (de)
DE (1) DE60018233T2 (de)
PT (1) PT1071174E (de)
TR (1) TR200002154A3 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4657880B2 (ja) * 2005-10-13 2011-03-23 新明和工業株式会社 端子圧着不良検出装置の圧着不良判定データ作成方法および圧着不良判定データ検査方法
US8746026B2 (en) * 2008-10-02 2014-06-10 Komax Holding Ag Method for determining the quality of a crimped connection between a conductor and a contact
JP5437685B2 (ja) 2009-04-07 2014-03-12 矢崎総業株式会社 圧着端子、圧着端子の圧着構造、および圧着端子の圧着方法
US9331447B2 (en) 2010-12-07 2016-05-03 Tyco Electronics Corporation Crimping apparatus having a crimp quality monitoring system
CN102801077B (zh) * 2012-06-29 2014-10-08 上海和旭电子科技有限公司 自适应端子压接模具
CN103673965B (zh) * 2013-12-25 2016-03-30 青岛科技大学 基于dsp的端子质量检测系统的检测方法
DE102018218371A1 (de) * 2018-10-26 2020-04-30 Schäfer Werkzeug- und Sondermaschinenbau GmbH Verfahren zur Überwachung einer Crimpvorrichtung, Überwachungseinheit sowie Crimpvorrichtung
JP7343424B2 (ja) * 2020-03-11 2023-09-12 新明和工業株式会社 端子圧着検査装置および端子圧着検査の基準波形の更新方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0500217A2 (de) * 1991-02-22 1992-08-26 The Whitaker Corporation Vorrichtung zur Bestimmung der Kraft beim Verpressen einer elektrischen Anschlussklemme
DE4408499A1 (de) * 1994-03-14 1995-09-21 Uwe Engberts Verfahren und Vorrichtung zur Überwachung der Arbeitsqualität eines Preßwerkzeuges, insbesondere eines Crimpwerkzeuges

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0500217A2 (de) * 1991-02-22 1992-08-26 The Whitaker Corporation Vorrichtung zur Bestimmung der Kraft beim Verpressen einer elektrischen Anschlussklemme
DE4408499A1 (de) * 1994-03-14 1995-09-21 Uwe Engberts Verfahren und Vorrichtung zur Überwachung der Arbeitsqualität eines Preßwerkzeuges, insbesondere eines Crimpwerkzeuges

Also Published As

Publication number Publication date
TR200002154A2 (tr) 2001-08-21
EP1071174A2 (de) 2001-01-24
DE60018233T2 (de) 2006-01-12
JP2001035628A (ja) 2001-02-09
DE60018233D1 (de) 2005-03-31
TR200002154A3 (tr) 2001-08-21
PT1071174E (pt) 2005-05-31
EP1071174B1 (de) 2005-02-23

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