EP1010048B1 - Voltage regulating circuit for eliminating "latch-up - Google Patents

Voltage regulating circuit for eliminating "latch-up Download PDF

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Publication number
EP1010048B1
EP1010048B1 EP98929294A EP98929294A EP1010048B1 EP 1010048 B1 EP1010048 B1 EP 1010048B1 EP 98929294 A EP98929294 A EP 98929294A EP 98929294 A EP98929294 A EP 98929294A EP 1010048 B1 EP1010048 B1 EP 1010048B1
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Prior art keywords
voltage
terminal
transistor
regulated
circuit
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German (de)
French (fr)
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EP1010048A1 (en
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Antonio Martino Ponzetta
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EM Microelectronic Marin SA
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EM Microelectronic Marin SA
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    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05FSYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F1/00Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05FSYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F1/00Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
    • G05F1/10Regulating voltage or current
    • G05F1/46Regulating voltage or current wherein the variable actually regulated by the final control device is dc
    • G05F1/56Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices
    • G05F1/575Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices characterised by the feedback circuit

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  • the present invention relates to a circuit for voltage regulation for regulating a voltage disturbed by a phenomenon called "latch-up".
  • a circuit of this type is described in the document GB 2,298,939, and is shown in Figure 1A of the present description.
  • This circuit includes a transistor command Q1 connected in series between an input terminal I and an output terminal O, and a voltage detector output D consisting of two resistors Ra and Rb connected in series between the output terminal O and the earth of the circuit.
  • a voltage corresponding to the output voltage detected by detector D is compared to a voltage of reference E3 by an operational amplifier AO, and the output voltage of the latter is applied to the terminal base of a transistor Q2. So a base current of control transistor Q1 can be controlled by the output voltage of the operational amplifier AO, by through transistor Q2, so the impedance of the control transistor Q1 is controlled to provide a predetermined voltage at the output terminal O.
  • a problem encountered during the operation of such circuit lies in the involuntary appearance of so-called "latch-up" phenomena that occur in a electronic component of the circuit, following external disturbances such as the provision of a electric voltage, electric current or radiation.
  • a device of this type is described in the application Japanese patent application published under No. 5,326,825 in the name of FUNAI ELECTRIC CO LTD, and is shown in Figure 1B of this description.
  • This device includes a integrated circuit IC1 at a first terminal of which is supplied a supply voltage Vdd, by through a bipolar transistor T1, and at the second terminal of which a resonant circuit is connected consisting of a resistor R3 and a capacitor C3.
  • a integrated circuit IC2 detection includes a terminal ground, a first terminal on which the supply voltage Vdd, and a second terminal connected said resonant circuit as well as at the base terminal of a bipolar transistor T2 by a resistor R2.
  • the terminal of base of transistor T1 is connected to the terminal of collector of transistor T2 by a resistor R1, and the emitter terminal of transistor T2 is grounded.
  • An object of the present invention is to provide a voltage regulation circuit intended to suppress a Inopportune latch-up phenomenon.
  • Another object of the present invention is to provide such a circuit meeting the cost criteria and of simplicity.
  • An advantage of the circuit according to the present invention is to provide a voltage regulation circuit having an uncomplicated structure, which makes it inexpensive.
  • Another advantage of the circuit according to this invention is to provide a circuit comprising means voltage comparison at the input of which is supplied the regulated voltage, these means being arranged so as to define two voltage thresholds likely to be predetermined to meet the requirements of the user.
  • Figure 2 shows a preferred embodiment of a circuit 1 according to the present invention.
  • Circuit 1 includes an input terminal I and a output terminal O of which a regulated voltage Vreg must be supplied, the voltage Vreg being supplied from so as to be substantially equal to a level of tension Vo.
  • Circuit 1 further includes a bipolar transistor 2, two capacitors 3 and 9, a resistor 5, a diode Zener 6, and voltage detection means 11.
  • the bipolar transistor 2 typically comprises a collector terminal C, emitter terminal E and terminal base B, terminals C and E being connected respectively at terminals I and O.
  • Resistor 5 is connected between terminal B and terminal C of transistor 2.
  • the Zener diode 6 is arranged so that it provides a voltage having a value chosen so as to form the voltage level Vo on the output terminal O.
  • Capacitors 3 and 9 are connected between the input terminal I and ground, and between the output terminal O and mass, respectively. Those skilled in the art will note that capacitor 3 is conventionally used as deworming capacitor, and that capacitor 9 is conventionally used as a smoothing capacitor and / or deworming. Capacitor 3 is not used as an improvement in the present invention, and therefore is not limiting in nature for the present invention.
  • the means 11 comprise an input terminal connected to terminal O, so as to receive the input Vreg voltage, a ground terminal, and an output terminal connected to terminal B, so as to provide an output control voltage Vres to control transistor 2.
  • the means 11 are arranged so that they detect whether the Vreg voltage is disturbed by a "latch-up" phenomenon and, if necessary, order an initialization of this voltage at its initial voltage level Vo, as is explained in more detail below.
  • the voltage regulation circuit comprises means for voltage detection which, following a type disturbance "latch-up", bring to the ground potential the tension regulated, which has the effect of removing this disturbance.
  • FIG. 3 shows in detail the mode of preferred embodiment of the means 11, according to the present invention.
  • the means 11 comprise means for supplying reference voltage 20 to provide a voltage of reference Vref from the voltage Vreg, a divider of voltage 21 intended to supply two regulated voltages corrected Vreg 'and Vreg "from the regulated voltage Vreg, two voltage comparators 23 and 22 to compare the voltage Vref at the voltages Vreg 'and Vreg ", respectively, and control means 24 for supplying, if necessary, the voltage Vres likely to command the transistor 2, and regulate the voltage Vreg.
  • the means 20 comprise an input terminal connected to the input terminal of the means 11 (i.e. at terminal O), so that the means 20 receive at input voltage Vreg, a ground terminal connected to the ground, and an output terminal connected to the comparators 22 and 23, so that the means 20 provide an output the voltage Vref.
  • the means 20 are known in the technical, see for example the articles "CMOS Analog Integrated Circuits Based on Weak Inversion Operation ", from E. Vittoz et al, IEEE Journal of Solid States Circuits, flight. SC-12, No. 3, June 1977, and “CMOS Voltage References Using Lateral Bipolar Transistors ", by M. Degrauwe et al, IEEE Journal of Solid States Circuits, vol. SC-20, No 6, December 1985.
  • Figure 4 shows a curve 31 corresponding to the relationship between the voltage Vref and the voltage Vreg.
  • the means 20 are arranged so that for a voltage value input voltage greater than 1.5 V, the output voltage Vref is substantially equal to a voltage threshold Vr 'of the order of 1.2 V, and that there is a voltage plateau on which the voltage Vref is substantially equal to a threshold of voltage Vr ", for low values of the voltage Vreg.
  • A'Vr ' as the voltage level below which a phenomenon "latch-up" is assumed to occur. In other words, when Vreg voltage drops significantly, a "latch-up" phenomenon is assumed to be responsible for this fall, as soon as the tension Vreg becomes less than A'Vr '.
  • a "Vr” a second voltage level as the voltage level below which a latch-up phenomenon is suppressed. In other words, during a drop in the voltage Vreg, as this is the case when a latch-up phenomenon occurs, this disturbance is removed, as soon as the voltage Vreg becomes less than A "Vr”.
  • Voltage levels A'Vr 'and A "Vr" are predetermined values according to specific to the user's requirements.
  • the voltage divider 21 is formed by a bridge resistive consisting of three resistors 25, 26 and 27 connected in series between the output terminal O and earth.
  • the connection point between the two resistors 26 and 27 is connected to a first input of comparator 23, so as to provide the input voltage Vreg '.
  • This tension is, by definition, proportional to tension Vreg, the proportionality ratio, referenced by A ', being predetermined and dependent on the values of resistances 27, 26 and 25.
  • FIG. 4 represents a curve 32 corresponding to the relationship between the voltage Vreg 'and the voltage Vreg. Point of connection between the two resistors 25 and 26 is connected to a first input of comparator 22, so to supply as input the voltage Vreg ".
  • This voltage is, by definition, proportional to the Vreg voltage, the proportionality ratio, referenced by A ", being predetermined and dependent on the values of the resistors 25, 26 and 27.
  • FIG. 4 represents a curve 33 corresponding to the relationship between the voltage Vreg "and the voltage Vreg.
  • Each comparator 23, 22 comprises a first terminal input on which a regulated voltage is supplied corrected Vreg ', Vreg ", respectively, as is described above, and a second input terminal on which is supplied the voltage Vref, as it is also described above.
  • the comparator 23 compares the voltage Vreg 'with the voltage Vref, while the comparator 22 compares the voltage Vreg "with the voltage Vref.
  • Each comparator 22, 23 further comprises a terminal output connected to a respective input terminal of control means 24.
  • the control means 24 further comprise a output terminal serving as output terminal of the means 11, so as to switch the voltage Vres, when one of the comparators 22, 23 switches, which controls the regulation of the Vreg voltage, as will be described so more detailed.
  • the means 24 can be formed by a scale known per se to those skilled in the art, and arranged so it switches to output a level voltage logic low enough to bring the transistor 2 in a blocked state, or a logic level of voltage high enough to bring transistor 2 in a conductive state, these two logical levels being designated “0L” and "1L", respectively.
  • circuit 1 The operation of circuit 1 according to this invention will be explained with reference to Figures 5A and 5B.
  • FIGS. 5A and 5B represent so diagram of the timing diagrams of the Vreg and Vres voltages present in circuit 1, respectively.
  • circuit 1 When circuit 1 is operating normally, i.e. when it is not disturbed by a latch-up phenomenon, the voltage Vreg is substantially equal to the level of voltage Vo, and the voltage detection means 11 output a logic level "1L" as voltage Lips. As a result, transistor 2 is held in a conductive state, so the voltage across its terminals base and transmitter subtracted from the terminal voltage of the Zener diode 6 is equal to the voltage level Vo.
  • a latch-up phenomenon is therefore declared responsible for the loss of control over the Vreg voltage.
  • the voltage Vreg '(curve 32) becomes below the threshold of voltage Vr '(curve 31), which causes the switching of comparator 23.
  • the means 24 advantageously bring the voltage Vres to "0L", this logical level being sufficient to block the transistor 2.
  • the integrated circuit under the influence of Latch-up phenomenon is therefore no longer fed under the voltage level Vo. This has the effect of bringing down notably the voltage Vreg and, consequently, the voltage Vref.

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  • Automation & Control Theory (AREA)
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Abstract

The voltage regulator has a series bipolar transistor (2) to adjust the voltage output. The base voltage of the transistor is controlled by a resistor (5) and Zener diode (6) connected across the unregulated potential source, with the base connected to the junction between the resistor and the Zener diode. In addition, a voltage detector circuit (11) is connected across the regulated output and is also connected to the base of the transistor. The voltage detector causes the transistor to switch to the blocking state when latch up occurs. Filter capacitors (3,9) are fitted across the unregulated and the regulated supplies.

Description

La présente invention concerne un circuit de régulation de tension destinée à réguler une tension perturbée par un phénomène dit "latch-up".The present invention relates to a circuit for voltage regulation for regulating a voltage disturbed by a phenomenon called "latch-up".

Il existe dans l'art antérieur de nombreux circuits de régulation de tension.There are many circuits in the prior art voltage regulation.

Un circuit de ce type est décrit dans le document GB 2 298 939, et est représenté à la figure 1A de la présente description. Ce circuit comprend un transistor de commande Q1 connecté en série entre une borne d'entrée I et une borne de sortie O, et un détecteur de tension de sortie D constitué de deux résistances Ra et Rb connectées en série entre la borne de sortie O et la masse du circuit.A circuit of this type is described in the document GB 2,298,939, and is shown in Figure 1A of the present description. This circuit includes a transistor command Q1 connected in series between an input terminal I and an output terminal O, and a voltage detector output D consisting of two resistors Ra and Rb connected in series between the output terminal O and the earth of the circuit.

Une tension correspondant à la tension de sortie détectée par le détecteur D est comparée à une tension de référence E3 par un amplificateur opérationnel AO, et la tension de sortie de ce dernier est appliquée à la borne de base d'un transistor Q2. Ainsi, un courant de base du transistor de commande Q1 peut être commandé par la tension de sortie de l'amplificateur opérationnel AO, par l'intermédiaire du transistor Q2, de sorte que l'impédance du transistor de commande Q1 est commandée pour fournir une tension prédéterminée à la borne de sortie O.A voltage corresponding to the output voltage detected by detector D is compared to a voltage of reference E3 by an operational amplifier AO, and the output voltage of the latter is applied to the terminal base of a transistor Q2. So a base current of control transistor Q1 can be controlled by the output voltage of the operational amplifier AO, by through transistor Q2, so the impedance of the control transistor Q1 is controlled to provide a predetermined voltage at the output terminal O.

Un problème rencontré lors du fonctionnement d'un tel circuit réside dans l'apparition involontaire de phénomènes dits "latch-up" qui se produisent dans un composant électronique du circuit, suite à des perturbations externes telle que la fourniture d'une tension électrique, d'un courant électrique ou d'un rayonnement.A problem encountered during the operation of such circuit lies in the involuntary appearance of so-called "latch-up" phenomena that occur in a electronic component of the circuit, following external disturbances such as the provision of a electric voltage, electric current or radiation.

On désigne communément par phénomène "latch-up" tout phénomène se produisant dans un circuit intégré suite à des perturbations externes telles que la fourniture d'une tension, d'un courant ou d'un rayonnement. We commonly refer to the phenomenon as "latch-up" while phenomenon occurring in an integrated circuit following external disturbances such as the provision of voltage, current or radiation.

Il existe dans l'art antérieur de nombreux dispositifs pour détecter le phénomène "latch-up" dans un substrat et, en particulier, des dispositifs analysant un courant susceptible d'être perturbé par ledit phénomène.There are many prior art devices to detect the latch-up phenomenon in a substrate and, in particular, devices analyzing a current likely to be disturbed by said phenomenon.

Un dispositif de ce type est décrit dans la demande de brevet japonais publiée sous le No 5 326 825 au nom de FUNAI ELECTRIC CO LTD, et est représenté dans la figure 1B de la présente description. Ce dispositif comprend un circuit intégré IC1 à une première borne duquel est fournie une tension d'alimentation Vdd, par l'intermédiaire d'un transistor T1 bipolaire, et à la seconde borne duquel est connecté un circuit résonant constitué d'une résistance R3 et d'un condensateur C3. Un circuit intégré IC2 de détection comprend une borne de masse, une première borne sur laquelle est fournie la tension d'alimentation Vdd, et une seconde borne connectée audit circuit résonnant ainsi qu'à la borne de base d'un transistor T2 bipolaire par une résistance R2. La borne de base du transistor T1 est connectée à la borne de collecteur du transistor T2 par une résistance R1, et la borne d'émetteur du transistor T2 est mise à la masse.A device of this type is described in the application Japanese patent application published under No. 5,326,825 in the name of FUNAI ELECTRIC CO LTD, and is shown in Figure 1B of this description. This device includes a integrated circuit IC1 at a first terminal of which is supplied a supply voltage Vdd, by through a bipolar transistor T1, and at the second terminal of which a resonant circuit is connected consisting of a resistor R3 and a capacitor C3. A integrated circuit IC2 detection includes a terminal ground, a first terminal on which the supply voltage Vdd, and a second terminal connected said resonant circuit as well as at the base terminal of a bipolar transistor T2 by a resistor R2. The terminal of base of transistor T1 is connected to the terminal of collector of transistor T2 by a resistor R1, and the emitter terminal of transistor T2 is grounded.

Dans le dispositif décrit ci-dessus en relation avec la figure 1B, s'il se produit un phénomène "latch-up", une chute notable de la tension d'alimentation Vdd est détectée par le circuit intégré IC2. Dans ce cas, les transistors T1 et T2 sont bloqués, et la tension alimentant le circuit intégré IC1 est interrompue, ce qui initialise ce circuit. Par suite, le circuit intégré IC1 fonctionne à nouveau normalement.In the device described above in relation to FIG. 1B, if a "latch-up" phenomenon occurs, a notable drop in the supply voltage Vdd is detected by IC2 integrated circuit. In this case, the transistors T1 and T2 are blocked, and the voltage supplying the integrated circuit IC1 is interrupted, which initializes this circuit. As a result, the integrated circuit IC1 works normally again.

Toutefois, ces dispositifs ont des structures complexes, et nécessitent un grand nombre de composants électroniques pour réaliser les fonctions de détection et de régulation.However, these devices have structures complex, and require a large number of components electronics to perform the detection functions and of regulation.

Un objet de la présente invention est de prévoir un circuit de régulation de tension destiné à supprimer un phénomène "latch-up" inopportun. An object of the present invention is to provide a voltage regulation circuit intended to suppress a Inopportune latch-up phenomenon.

Un autre objet de la présente invention est de prévoir un tel circuit répondant aux critères de coût et de simplicité.Another object of the present invention is to provide such a circuit meeting the cost criteria and of simplicity.

Ces objets, ainsi que d'autres, sont atteints par le circuit de régulation de tension selon la revendication 1.These and other objects are achieved by the voltage regulation circuit according to claim 1.

Un avantage du circuit selon la présente invention est de fournir un circuit de régulation de tension ayant une structure peu complexe, ce qui le rend bon marché.An advantage of the circuit according to the present invention is to provide a voltage regulation circuit having an uncomplicated structure, which makes it inexpensive.

Un autre avantage du circuit selon la présente invention est de fournir un circuit comprenant des moyens de comparaison de tension à l'entrée desquels est fournie la tension régulée, ces moyens étant agencés de manière à définir deux seuils de tension susceptibles d'être prédéterminés pour répondre aux exigences de l'utilisateur.Another advantage of the circuit according to this invention is to provide a circuit comprising means voltage comparison at the input of which is supplied the regulated voltage, these means being arranged so as to define two voltage thresholds likely to be predetermined to meet the requirements of the user.

Ces objets, caractéristiques et avantages, ainsi que d'autres, de la présente invention apparaítront plus clairement à la lecture de la description détaillée d'un mode de réalisation préféré de l'invention, donné à titre d'exemple uniquement, en relation avec les figures jointes, parmi lesquelles :

  • les figures 1A et 1B déjà citées représentent deux circuits de régulation de tension selon l'art antérieur;
  • la figure 2 représente un mode de réalisation préféré d'un circuit de régulation de tension selon la présente invention;
  • la figure 3 représente de façon détaillée le mode de réalisation préféré des moyens de détection du circuit de la figure 2;
  • la figure 4 représente la relation entre trois tensions présentes dans le circuit de régulation de tension selon le mode de réalisation préféré de la présente invention; et
  • les figures 5A et 5B représentent les chronogrammes de la tension régulée et du signal fourni par le circuit de régulation de tension selon le mode de réalisation préféré de la présente invention.
These objects, characteristics and advantages, as well as others, of the present invention will appear more clearly on reading the detailed description of a preferred embodiment of the invention, given by way of example only, in relation to the attached figures, among which:
  • FIGS. 1A and 1B already cited represent two voltage regulation circuits according to the prior art;
  • FIG. 2 represents a preferred embodiment of a voltage regulation circuit according to the present invention;
  • Figure 3 shows in detail the preferred embodiment of the detection means of the circuit of Figure 2;
  • FIG. 4 represents the relationship between three voltages present in the voltage regulation circuit according to the preferred embodiment of the present invention; and
  • FIGS. 5A and 5B represent the timing diagrams of the regulated voltage and of the signal supplied by the voltage regulation circuit according to the preferred embodiment of the present invention.

La figure 2 représente un mode de réalisation préféré d'un circuit 1 selon la présente invention.Figure 2 shows a preferred embodiment of a circuit 1 according to the present invention.

Le circuit 1 comprend une borne d'entrée I et une borne de sortie O de laquelle une tension régulée Vreg doit être fournie, la tension Vreg étant fournie de manière à être sensiblement égale à un niveau de tension Vo. Le circuit 1 comprend en outre un transistor bipolaire 2, deux condensateurs 3 et 9, une résistance 5, une diode Zener 6, et des moyens de détection de tension 11.Circuit 1 includes an input terminal I and a output terminal O of which a regulated voltage Vreg must be supplied, the voltage Vreg being supplied from so as to be substantially equal to a level of tension Vo. Circuit 1 further includes a bipolar transistor 2, two capacitors 3 and 9, a resistor 5, a diode Zener 6, and voltage detection means 11.

Le transistor bipolaire 2 comprend typiquement une borne de collecteur C, une borne d'émetteur E et une borne de base B, les bornes C et E étant connectées respectivement aux bornes I et O. La résistance 5 est connectée entre la borne B et la borne C du transistor 2.The bipolar transistor 2 typically comprises a collector terminal C, emitter terminal E and terminal base B, terminals C and E being connected respectively at terminals I and O. Resistor 5 is connected between terminal B and terminal C of transistor 2.

La diode Zener 6 est agencée de sorte qu'elle fournit une tension ayant une valeur choisie de manière à former le niveau de tension Vo sur la borne de sortie O.The Zener diode 6 is arranged so that it provides a voltage having a value chosen so as to form the voltage level Vo on the output terminal O.

Les condensateurs 3 et 9 sont connectés entre la borne d'entrée I et la masse, et entre la borne de sortie O et la masse, respectivement. L'homme de l'art notera que le condensateur 3 est classiquement utilisé en tant que condensateur de déparasitage, et que le condensateur 9 est classiquement utilisé en tant que condensateur de lissage et/ou de déparasitage. Le condensateur 3 n'est utilisé qu'à titre de perfectionnement dans la présente invention, et ne présente donc pas de caractère limitatif pour la présente invention.Capacitors 3 and 9 are connected between the input terminal I and ground, and between the output terminal O and mass, respectively. Those skilled in the art will note that capacitor 3 is conventionally used as deworming capacitor, and that capacitor 9 is conventionally used as a smoothing capacitor and / or deworming. Capacitor 3 is not used as an improvement in the present invention, and therefore is not limiting in nature for the present invention.

Les moyens 11 comprennent une borne d'entrée connectée à la borne O, de façon à recevoir en entrée la tension Vreg, une borne de masse, et une borne de sortie connectée à la borne B, de façon à fournir en sortie une tension de commande Vres pour commander le transistor 2. Les moyens 11 sont agencés de sorte qu'ils détectent si la tension Vreg est perturbée par un phénomène "latch-up" et, le cas échéant, commandent une initialisation de cette tension à son niveau de tension initial Vo, comme cela est expliqué de façon plus détaillée ci-après. The means 11 comprise an input terminal connected to terminal O, so as to receive the input Vreg voltage, a ground terminal, and an output terminal connected to terminal B, so as to provide an output control voltage Vres to control transistor 2. The means 11 are arranged so that they detect whether the Vreg voltage is disturbed by a "latch-up" phenomenon and, if necessary, order an initialization of this voltage at its initial voltage level Vo, as is explained in more detail below.

En effet, suite à de nombreuses expérimentations, la demanderesse de la présente invention a constaté qu'une des solutions les plus efficaces pour supprimer un phénomène "latch-up" dans un circuit intégré consiste à amener au potentiel de masse le niveau de la tension d'alimentation du circuit intégré perturbé par ledit phénomène, pendant une durée suffisante pour que ce circuit chute en-dessous d'un certain seuil de tension.Indeed, following numerous experiments, the Applicant of the present invention has found that most effective solutions to remove a "latch-up" phenomenon in an integrated circuit consists of bring the voltage level to ground potential of the integrated circuit disturbed by said phenomenon, for a sufficient time for this circuit drops below a certain voltage threshold.

A cet effet, le circuit de régulation de tension selon la présente invention comprend des moyens de détection de tension qui, suite à une perturbation de type "latch-up", amènent au potentiel de masse la tension régulée, ce qui a pour effet de supprimer cette perturbation.For this purpose, the voltage regulation circuit according to the present invention comprises means for voltage detection which, following a type disturbance "latch-up", bring to the ground potential the tension regulated, which has the effect of removing this disturbance.

La figure 3 représente de façon détaillée le mode de réalisation préféré des moyens 11, selon la présente invention.Figure 3 shows in detail the mode of preferred embodiment of the means 11, according to the present invention.

Les moyens 11 comprennent des moyens de fourniture de tension de référence 20 pour fournir une tension de référence Vref à partir de la tension Vreg, un diviseur de tension 21 destiné à fournir deux tensions régulées corrigées Vreg' et Vreg" à partir de la tension régulée Vreg, deux comparateurs de tension 23 et 22 pour comparer la tension Vref aux tensions Vreg' et Vreg", respectivement, et des moyens de commande 24 pour fournir, le cas échéant, la tension Vres susceptible de commander le transistor 2, et de réguler la tension Vreg.The means 11 comprise means for supplying reference voltage 20 to provide a voltage of reference Vref from the voltage Vreg, a divider of voltage 21 intended to supply two regulated voltages corrected Vreg 'and Vreg "from the regulated voltage Vreg, two voltage comparators 23 and 22 to compare the voltage Vref at the voltages Vreg 'and Vreg ", respectively, and control means 24 for supplying, if necessary, the voltage Vres likely to command the transistor 2, and regulate the voltage Vreg.

Les moyens 20 comprennent une borne d'entrée connectée à la borne d'entrée des moyens 11 (c'est-à-dire à la borne O), de sorte que les moyens 20 reçoivent en entrée la tension Vreg, une borne de masse connectée à la masse, et une borne de sortie connectée aux comparateurs 22 et 23, de sorte que les moyens 20 fournissent en sortie la tension Vref. Les moyens 20 sont connus dans la technique, voir par exemple les articles "CMOS Analog Integrated Circuits Based on Weak Inversion Operation", de E. Vittoz et al, IEEE Journal of Solid States Circuits, vol. SC-12, No. 3, Juin 1977, et "CMOS Voltage References Using Lateral Bipolar Transistors", de M. Degrauwe et al, IEEE Journal of Solid States Circuits, vol. SC-20, No 6, décembre 1985.The means 20 comprise an input terminal connected to the input terminal of the means 11 (i.e. at terminal O), so that the means 20 receive at input voltage Vreg, a ground terminal connected to the ground, and an output terminal connected to the comparators 22 and 23, so that the means 20 provide an output the voltage Vref. The means 20 are known in the technical, see for example the articles "CMOS Analog Integrated Circuits Based on Weak Inversion Operation ", from E. Vittoz et al, IEEE Journal of Solid States Circuits, flight. SC-12, No. 3, June 1977, and "CMOS Voltage References Using Lateral Bipolar Transistors ", by M. Degrauwe et al, IEEE Journal of Solid States Circuits, vol. SC-20, No 6, December 1985.

On rappelle brièvement le fonctionnement de moyens en se référant à la figure 4. La figure 4 représente une courbe 31 correspondant à la relation entre la tension Vref et la tension Vreg. Dans cet exemple, les moyens 20 sont agencés de sorte que, pour une valeur de la tension d'entrée Vreg supérieure à 1,5 V, la tension de sortie Vref est sensiblement égale à un seuil de tension Vr' de l'ordre de 1,2 V, et qu'il existe un palier de tension sur lequel la tension Vref est sensiblement égale à un seuil de tension Vr", pour de faibles valeurs de la tension Vreg.We briefly recall the operation of means in referring to Figure 4. Figure 4 shows a curve 31 corresponding to the relationship between the voltage Vref and the voltage Vreg. In this example, the means 20 are arranged so that for a voltage value input voltage greater than 1.5 V, the output voltage Vref is substantially equal to a voltage threshold Vr 'of the order of 1.2 V, and that there is a voltage plateau on which the voltage Vref is substantially equal to a threshold of voltage Vr ", for low values of the voltage Vreg.

On définit un premier niveau de tension A'Vr' comme le niveau de tension au-dessous duquel un phénomène "latch-up" est supposé se produire. Autrement dit, quand la tension Vreg chute notablement, un phénomène "latch-up" est supposé responsable de cette chute, dès que la tension Vreg devient inférieure à A'Vr'. On définit également un second niveau de tension A"Vr" comme le niveau de tension au-dessous duquel un phénomène "latch-up" est supprimé. Autrement dit, lors d'une chute de la tension Vreg, comme cela est le cas quand il se produit un phénomène "latch-up", cette perturbation est supprimée, dès que la tension Vreg devient inférieure à A"Vr". Les niveaux de tension A'Vr' et A"Vr" sont des valeurs prédéterminées selon des spécificités propres aux exigences de l'utilisateur.We define a first voltage level A'Vr 'as the voltage level below which a phenomenon "latch-up" is assumed to occur. In other words, when Vreg voltage drops significantly, a "latch-up" phenomenon is assumed to be responsible for this fall, as soon as the tension Vreg becomes less than A'Vr '. We also define a second voltage level A "Vr" as the voltage level below which a latch-up phenomenon is suppressed. In other words, during a drop in the voltage Vreg, as this is the case when a latch-up phenomenon occurs, this disturbance is removed, as soon as the voltage Vreg becomes less than A "Vr". Voltage levels A'Vr 'and A "Vr" are predetermined values according to specific to the user's requirements.

Dans le mode de réalisation préféré représenté en figure 3, le diviseur de tension 21 est formé par un pont résistif constitué de trois résistances 25, 26 et 27 montées en série entre la borne de sortie O et la masse. Le point de raccordement entre les deux résistances 26 et 27 est connecté à une première entrée du comparateur 23, de façon à fournir en entrée la tension Vreg'. Cette tension est, par définition, proportionnelle à la tension Vreg, le rapport de proportionnalité, référencé par A', étant prédéterminé et dépendant des valeurs des résistances 27, 26 et 25. A titre illustratif, la figure 4 représente une courbe 32 correspondant à la relation entre la tension Vreg' et la tension Vreg. Le point de raccordement entre les deux résistances 25 et 26 est connecté à une première entrée du comparateur 22, de façon à fournir en entrée la tension Vreg". Cette tension est, par définition, proportionnelle à la tension Vreg, le rapport de proportionnalité, référencé par A", étant prédéterminé et dépendant des valeurs des résistances 25, 26 et 27. A titre illustratif, la figure 4 représente une courbe 33 correspondant à la relation entre la tension Vreg" et la tension Vreg.In the preferred embodiment shown in Figure 3, the voltage divider 21 is formed by a bridge resistive consisting of three resistors 25, 26 and 27 connected in series between the output terminal O and earth. The connection point between the two resistors 26 and 27 is connected to a first input of comparator 23, so as to provide the input voltage Vreg '. This tension is, by definition, proportional to tension Vreg, the proportionality ratio, referenced by A ', being predetermined and dependent on the values of resistances 27, 26 and 25. By way of illustration, FIG. 4 represents a curve 32 corresponding to the relationship between the voltage Vreg 'and the voltage Vreg. Point of connection between the two resistors 25 and 26 is connected to a first input of comparator 22, so to supply as input the voltage Vreg ". This voltage is, by definition, proportional to the Vreg voltage, the proportionality ratio, referenced by A ", being predetermined and dependent on the values of the resistors 25, 26 and 27. By way of illustration, FIG. 4 represents a curve 33 corresponding to the relationship between the voltage Vreg "and the voltage Vreg.

Chaque comparateur 23, 22 comprend une première borne d'entrée sur laquelle est fournie une tension régulée corrigée Vreg', Vreg", respectivement, comme cela est décrit ci-dessus, et une seconde borne d'entrée sur laquelle est fournie la tension Vref, comme cela est également décrit ci-dessus. Ainsi, le comparateur 23 compare la tension Vreg' à la tension Vref, tandis que le comparateur 22 compare la tension Vreg" à la tension Vref. Chaque comparateur 22, 23 comprend en outre une borne de sortie connectée à une borne d'entrée respective des moyens de commande 24.Each comparator 23, 22 comprises a first terminal input on which a regulated voltage is supplied corrected Vreg ', Vreg ", respectively, as is described above, and a second input terminal on which is supplied the voltage Vref, as it is also described above. Thus, the comparator 23 compares the voltage Vreg 'with the voltage Vref, while the comparator 22 compares the voltage Vreg "with the voltage Vref. Each comparator 22, 23 further comprises a terminal output connected to a respective input terminal of control means 24.

Les moyens de commande 24 comprennent en outre une borne de sortie servant de borne de sortie des moyens 11, de façon à commuter la tension Vres, quand l'un des comparateurs 22, 23 commute, ce qui commande la régulation de la tension Vreg, comme cela va être décrit de façon plus détaillée. Les moyens 24 peuvent être formés par une bascule connue en soi de l'homme de l'art, et agencée de sorte qu'elle commute pour fournir en sortie un niveau logique de tension suffisamment bas pour amener le transistor 2 dans un état bloqué, ou un niveau logique de tension suffisamment élevé pour amener le transistor 2 dans un état conducteur, ces deux niveaux logiques étant désignés "0L" et "1L", respectivement. The control means 24 further comprise a output terminal serving as output terminal of the means 11, so as to switch the voltage Vres, when one of the comparators 22, 23 switches, which controls the regulation of the Vreg voltage, as will be described so more detailed. The means 24 can be formed by a scale known per se to those skilled in the art, and arranged so it switches to output a level voltage logic low enough to bring the transistor 2 in a blocked state, or a logic level of voltage high enough to bring transistor 2 in a conductive state, these two logical levels being designated "0L" and "1L", respectively.

Le fonctionnement du circuit 1 selon la présente invention va être expliqué en se référant aux figures 5A et 5B.The operation of circuit 1 according to this invention will be explained with reference to Figures 5A and 5B.

Les figures 5A et 5B représentent de façon schématique des chronogrammes des tensions Vreg et Vres présentes dans le circuit 1, respectivement.FIGS. 5A and 5B represent so diagram of the timing diagrams of the Vreg and Vres voltages present in circuit 1, respectively.

Quand le circuit 1 fonctionne normalement, c'est-à-dire quand il n'est pas perturbé par un phénomène "latch-up", la tension Vreg est sensiblement égale au niveau de tension Vo, et les moyens de détection de tension 11 fournissent en sortie un niveau logique "1L" comme tension Vres. En conséquence, le transistor 2 est maintenu dans un état conducteur, de sorte que la tension entre ses bornes de base et d'émetteur soustraite à la tension aux bornes de la diode Zener 6 est égale au niveau de tension Vo.When circuit 1 is operating normally, i.e. when it is not disturbed by a latch-up phenomenon, the voltage Vreg is substantially equal to the level of voltage Vo, and the voltage detection means 11 output a logic level "1L" as voltage Lips. As a result, transistor 2 is held in a conductive state, so the voltage across its terminals base and transmitter subtracted from the terminal voltage of the Zener diode 6 is equal to the voltage level Vo.

Considérons, à un instant t1, qu'une perturbation apparaít de telle sorte que la tension Vreg commence à chuter notablement au-dessous du niveau de tension Vo. Cette chute se poursuit jusqu'à un instant t2 où la tension Vreg atteint le niveau de tension A'Vr', puis devient inférieure à ce niveau.Let us consider, at an instant t1, that a perturbation appears so that the Vreg voltage begins to drop significantly below the voltage level Vo. This fall continues until an instant t2 when the voltage Vreg reaches the voltage level A'Vr ', then becomes below this level.

Un phénomène "latch-up" est dès lors déclaré responsable de la perte de contrôle sur la tension Vreg. Comme cela est représenté en figure 4, quand la tension Vreg devient inférieure au niveau de tension A'Vr', la tension Vreg' (courbe 32) devient inférieure au seuil de tension Vr' (courbe 31), ce qui entraíne la commutation du comparateur 23. Comme le comparateur 23 commute, les moyens 24 amènent avantageusement la tension Vres à "0L", ce niveau logique étant suffisant pour bloquer le transistor 2. Le circuit intégré sous l'emprise du phénomène "latch-up" n'est donc plus alimenté sous le niveau de tension Vo. Ceci a pour effet de faire chuter notablement la tension Vreg et, par conséquent, la tension Vref.A latch-up phenomenon is therefore declared responsible for the loss of control over the Vreg voltage. As shown in Figure 4, when the voltage Vreg becomes lower than the voltage level A'Vr ', the voltage Vreg '(curve 32) becomes below the threshold of voltage Vr '(curve 31), which causes the switching of comparator 23. As comparator 23 switches, the means 24 advantageously bring the voltage Vres to "0L", this logical level being sufficient to block the transistor 2. The integrated circuit under the influence of Latch-up phenomenon is therefore no longer fed under the voltage level Vo. This has the effect of bringing down notably the voltage Vreg and, consequently, the voltage Vref.

Cette'chute se poursuit jusqu'à un instant t3 où la tension Vreg atteint le niveau de tension A"Vr", puis devient inférieure à ce niveau. Le phénomène "latch-up" responsable de la perturbation de la tension Vreg en dessous du niveau de tension Vo à l'instant t2 est dès lors supprimé. Comme cela est représenté en figure 4, quand la tension Vreg devient inférieure au niveau de tension A"Vr", la tension Vreg" (courbe 33) devient inférieure au seuil de tension Vr" (courbe 31), ce qui entraíne la commutation du comparateur 22. Comme le comparateur 22 commute, les moyens 24 amènent avantageusement la tension Vres au niveau logique "1L". Comme ce niveau logique est suffisant pour rendre conducteur le transistor 2, la tension entre ses bornes de base et d'émetteur augmentée de la tension aux bornes de la diode Zener 6 est à nouveau égale, à un instant t4, au niveau de tension Vo. Le fonctionnement du circuit 1 redevient donc normal, jusqu'à ce qu'un phénomène "latch-up" perturbe à nouveau le circuit 1, et que la situation semblable à celle de l'instant t1 se répète.This fall continues until an instant t3 when the voltage Vreg reaches voltage level A "Vr", then becomes below this level. The latch-up phenomenon responsible for the disturbance of the Vreg voltage in below the voltage level Vo at time t2 is from when deleted. As shown in Figure 4, when the voltage Vreg becomes lower than the level of voltage A "Vr", the voltage Vreg "(curve 33) becomes below the voltage threshold Vr "(curve 31), which causes the comparator 22 to switch. As the comparator 22 switches, the means 24 bring advantageously the voltage Vres at logic level "1L". As this logical level is sufficient to make conductor transistor 2, the voltage between its terminals base and transmitter increased by the voltage across Zener diode 6 is again equal, at time t4, to voltage level Vo. The operation of circuit 1 therefore becomes normal again, until a "latch-up" phenomenon again disrupts circuit 1, and that the situation similar to that of time t1 repeats.

Il va de soi pour l'homme de l'art que la description détaillée ci-dessus peut subir diverses modifications sans sortir du cadre de la présente invention. Comme variante de réalisation, on peut utiliser d'autres moyens de fourniture de tension constante que la diode Zener.It goes without saying for those skilled in the art that the description detailed above may undergo various modifications without depart from the scope of the present invention. As a variant other means of constant voltage supply as the Zener diode.

Claims (5)

  1. Voltage regulator circuit (1) for supplying a regulated voltage (Vreg) having a predetermined level, this circuit being able to detect a latch-up phenomenon disturbing said voltage, to suppress this phenomenon and re-establish the voltage at said predetermined level, this circuit including an input terminal (I) and an output terminal (O) from which the regulated voltage (Vreg) is supplied, this circuit including a bipolar transistor (2) whose collector terminal (C) is connected to said input terminal (I), and whose emitter terminal (E) is connected to said output terminal (O), a resistor (5) connected across the collector terminal (C) and the base terminal (B) of said transistor (2), means (6) for supplying a substantially constant voltage at the base terminal of said transistor (2) and voltage detection means (11) connected across the output terminal (O) of the regulated voltage and the base terminal of said transistor (2), characterised in that detection means include :
    reference voltage supply means (20) from the regulated voltage, said means being connected to an earth terminal of said detection means, the input of said supply means being connected to the output terminal (O) of the regulated voltage and the output of said supply means supplying the reference voltage capable of being substantially equal to first and second voltage thresholds, as a function of the value of the regulated voltage, these first and second thresholds corresponding to said first and second predetermined voltage levels, respectively;
    a voltage divider (21) for supplying via two output terminals, respectively first and second regulated voltages corrected as a function of said regulated voltage, this divider being connected to the output terminal (O) of the regulated voltage and to the earth terminal of said voltage detection means (11),
    a first voltage comparator (23) intended to compare the first corrected regulated voltage to the first reference voltage threshold, this comparator (23) being arranged to switch when the first corrected regulated voltage becomes lower than said first reference voltage threshold;
    a second voltage comparator (22) intended to compare the second corrected regulated voltage to the second reference voltage threshold, this comparator (22) being arranged to switch when the second corrected regulated voltage becomes lower than said second reference voltage threshold;
    control means (24) for controlling the switching of said transistor (2) into the blocked state or the conducting state, two inputs of said control means (24) being connected to the outputs of the first and second voltage comparators (23, 22), respectively, the output of said control means being connected to the base terminal of the transistor (2), these control means (24) being arranged so that the transistor (2) is in the blocked state when a disturbance causes said regulated voltage to drop below a first predetermined voltage level, a level below which a latch-up phenomenon is defined as being responsible for said disturbance, the switching of said transistor (2) into the blocked state bringing said regulated voltage to the earth potential, and so that the transistor (2) is in the conducting state when said regulated voltage is substantially equal to the predetermined level, i.e. higher than the first voltage level, or when it is lower than a second predetermined voltage level, the latch-up phenomenon being suppressed below such level.
  2. Voltage detection and regulator circuit (1) according to claim 1, characterised in that said voltage divider (21) further includes three resistors (25, 26, 27) connected in series, so that they form a resistive bridge supplying at its output the first and second corrected regulated voltages.
  3. Voltage detection and regulator circuit (1) according to claim 1, characterised in that the voltage supply means (6) are formed of a Zener diode.
  4. Voltage regulator circuit (1) according to claim 1, characterised in that it further includes a first capacitor (3) connected across said input terminal (I) of said circuit (1) and earth, this capacitor being arranged as an interference suppression capacitor.
  5. Voltage regulator circuit (1) according to claim 1, characterised in that it further includes a second capacitor (9) connected across said output terminal (O) of said circuit (1) and earth, this capacitor being arranged as an interference suppression and smoother capacitor.
EP98929294A 1997-05-12 1998-05-11 Voltage regulating circuit for eliminating "latch-up Expired - Lifetime EP1010048B1 (en)

Priority Applications (1)

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EP98929294A EP1010048B1 (en) 1997-05-12 1998-05-11 Voltage regulating circuit for eliminating "latch-up

Applications Claiming Priority (4)

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EP97107722 1997-05-12
EP97107722A EP0878752A1 (en) 1997-05-12 1997-05-12 Voltage regulation circuit for suppressing the "latch-up" effect
PCT/EP1998/002749 WO1998052111A1 (en) 1997-05-12 1998-05-11 Voltage regulating circuit for eliminating 'latch-up
EP98929294A EP1010048B1 (en) 1997-05-12 1998-05-11 Voltage regulating circuit for eliminating "latch-up

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EP1010048A1 EP1010048A1 (en) 2000-06-21
EP1010048B1 true EP1010048B1 (en) 2002-05-02

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US6465914B1 (en) * 2000-03-09 2002-10-15 Capable Controls, Inc. Microcontroller power removal reset circuit
US6473284B1 (en) * 2000-09-06 2002-10-29 General Electric Company Low-power dc-to-dc converter having high overvoltage protection
EP1280033B1 (en) 2001-07-26 2006-05-31 AMI Semiconductor Belgium BVBA EMC immune low drop regulator
EP1751800B1 (en) * 2004-06-01 2008-03-26 Deutsches Zentrum für Luft- und Raumfahrt e.V. Method for suppressing latch-ups occurring in a circuit, and systems for carrying out said method
DE102005025160B4 (en) * 2004-06-01 2008-08-07 Deutsches Zentrum für Luft- und Raumfahrt e.V. A method for erasing circuit-occurring latch-ups and arrangements for carrying out the method
US7564230B2 (en) * 2006-01-11 2009-07-21 Anadigics, Inc. Voltage regulated power supply system
US9071073B2 (en) * 2007-10-04 2015-06-30 The Gillette Company Household device continuous battery charger utilizing a constant voltage regulator
KR100915830B1 (en) * 2008-03-12 2009-09-07 주식회사 하이닉스반도체 Semiconductor integrated circuit

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CA718127A (en) * 1961-06-20 1965-09-14 J. Giger Adolf Electronic direct current voltage regulator
JPH0727421B2 (en) * 1990-05-18 1995-03-29 東光株式会社 DC power supply circuit
US5212616A (en) * 1991-10-23 1993-05-18 International Business Machines Corporation Voltage regulation and latch-up protection circuits
JP2925470B2 (en) * 1995-03-17 1999-07-28 東光株式会社 Series control type regulator

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US6184664B1 (en) 2001-02-06
CA2289935A1 (en) 1998-11-19
EP1010048A1 (en) 2000-06-21
JP2001525091A (en) 2001-12-04
EP0878752A1 (en) 1998-11-18
KR20010012426A (en) 2001-02-15
DE69805188T2 (en) 2002-11-28
DE69805188D1 (en) 2002-06-06
ATE217102T1 (en) 2002-05-15

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