EP0825430A2 - Gasüberwachungsgeräte - Google Patents

Gasüberwachungsgeräte Download PDF

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Publication number
EP0825430A2
EP0825430A2 EP97305952A EP97305952A EP0825430A2 EP 0825430 A2 EP0825430 A2 EP 0825430A2 EP 97305952 A EP97305952 A EP 97305952A EP 97305952 A EP97305952 A EP 97305952A EP 0825430 A2 EP0825430 A2 EP 0825430A2
Authority
EP
European Patent Office
Prior art keywords
source
monitor
sensor
gas
reflective
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP97305952A
Other languages
English (en)
French (fr)
Other versions
EP0825430A3 (de
EP0825430B1 (de
Inventor
Michael Parry
Alan Mason Doncaster
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teledyne UK Ltd
Original Assignee
EEV Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by EEV Ltd filed Critical EEV Ltd
Publication of EP0825430A2 publication Critical patent/EP0825430A2/de
Publication of EP0825430A3 publication Critical patent/EP0825430A3/de
Application granted granted Critical
Publication of EP0825430B1 publication Critical patent/EP0825430B1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03—Cuvette constructions
    • G01N21/031—Multipass arrangements

Definitions

  • This invention relates to gas monitors and more particularly to those in which optical radiation is transmitted through a gas and subsequently detected to provide information concerning the gas.
  • an infra-red source is arranged to emit radiation which passes through a gas to be monitored. Infra-red radiation is absorbed by the gas and that remaining is subsequently detected by a pyroelectric detector. A comparison is made between the source intensity and the intensity of radiation detected following passage through the gas to give the concentration of the gas.
  • an infra-red source is located remote from a pyroelectric detector on a bench with a tube between them through which gas is passed.
  • Infra-red radiation travels along a direct path between the source and sensor but there also tend to be multiple reflections from the interior surfaces of the tube. This results in numerous different path lengths taken by the infra-red radiation between the source and the sensor, which leads to errors in measuring the gas concentration. Moreover, the errors vary over time because the interior surfaces of the tube gradually degrade and present a non-uniform surface.
  • the present invention seeks to provide a gas monitor having improved characteristics over those previously known.
  • a gas monitor comprising an optical source, a sensor sensitive to light from the source, a chamber containing gas to be monitored and reflector means having reflective surfaces in the chamber, the source and sensor being substantially at foci of the reflector means and light being reflected at least three times before reaching the sensor from the source.
  • a plurality of folded optical paths are defined between the source and sensor through gas to be monitored, and the paths may be made substantially the same length.
  • the optical source is preferably an infra-red source but sources and sensors operating in other parts of the optical spectrum may be used in other embodiments.
  • a monitor in accordance with the invention may be used to detect vapour or gas concentration or may be used to provide other information depending on the regime under which it operates.
  • the gas monitor is used to determine concentration of a known gas by providing a comparison between the source intensity and intensity of optical radiation detected by the sensor after having been partially absorbed by the gas.
  • the reflective surfaces of the reflector means may be discontinuous in two or more discrete sections or present a continuous surface.
  • the reflector means includes curved regions and planar regions to provide a compact arrangement.
  • the reflective surfaces are defined by interior surfaces of the chamber.
  • the chamber may have polished walls or have a reflective coating laid down on it for example.
  • the chamber may be fabricated by machining from a solid block of material, for example.
  • the invention By employing the invention, radiation travelling from the source to the sensor over different routes can be arranged to travel along the same path length and hence the same amount of absorption occurs, giving an accurate measure of the concentration.
  • this provides a particularly compact arrangement whilst giving relatively long optical paths through the gas.
  • This makes a monitor in accordance with the invention convenient to use and include in other equipment. It also allows the monitor to be readily incorporated in a housing which can be made safe for use in hazardous environments where, for example, flammable or explosive gases are to be detected.
  • the housing is flameproof.
  • the source is arranged to heat substantially all the reflective surfaces, the folded configuration allowing this to be readily achieved. This reduces the risk of condensation on optical surfaces which in previously known devices has required a separate heater to be provided.
  • the reflective means includes a reflective surface or surfaces having part elliptical section to provide focusing of the optical radiation from the source and onto the sensor.
  • the properties of an ellipse or ellipsoid are such that the optical path lengths along different routes between the source and sensor can be made substantially equal.
  • the source is located at a focus of a first ellipsoid and the sensor at a focus of a second ellipsoid, and the first and second ellipsoid having a common virtual focus.
  • the first and second ellipsoids have substantially the same dimensions.
  • focusing of the optical radiation may also be achieved at a point intermediate the source and sensor along the optical path, enabling an accurate measurement of the concentration of the gas to be obtained.
  • the reflective means may be thought of as comprising an ellipsoidal surface which is folded back on itself.
  • a planar reflective surface may form part of the optical path between the curved surfaces such as those which are part elliptical in section.
  • the planar surface need not be located at the mid-point between the foci of either or both ellipses. If it is arranged nearer the source and reflector than the common virtual focus it results in a more compact arrangement than if it were arranged at the mid-point.
  • the reflector means includes offset parabolic surfaces to provide focusing at the source and sensor.
  • the source and sensor may be located exactly at foci of the reflector means or close to them. Similarly, although complete focusing of the optical radiation at the source and sensor will give more accurate measurements, it may be acceptable to provide a reduced amount of focusing in some circumstances.
  • the reflective means, source and sensor may be arranged such that there are only three reflections of light as it travels through the gas between the source and the sensor. In one particular advantageous embodiment however there are five reflections involved, giving long optical paths through the gas.
  • a gas monitor 1 comprises a flameproof housing 2 having a cylindrical outer surface with end walls 3 and 4.
  • the interior of the housing 2 contains an infra-red source 5 mounted on one of the end walls 4 and a pyroelectric detector 6 also mounted on the end wall 4.
  • the interior surface of the housing 2 is of polished aluminium or some other material which reflects infra-red radiation.
  • the housing 2 defines a chamber within which gas to be monitored is contained.
  • the chamber may be sealed following introduction of the gas but more usually includes an aperture or apertures (not shown) to allow gas to enter and leave the chamber from its surroundings.
  • the reflective curved wall 7 in the region of the source 5 is a part ellipse in section with the source 5 being placed at one of its foci.
  • the wall 7 is curved in three dimensions to define a part-ellipsoid.
  • the sensor 6 is located at a focus defined by the adjacent curved surface 8 which is also part elliptical in section, the reflective surfaces 7 and 8 being continuous and adjacent one another.
  • the end wall 3 opposite that on which the source 5 and sensor 6 are mounted has a reflective inner surface which is planar.
  • the wall 4 between the source 5 and sensor 6 has a reflective section 9 which is also planar and parallel to the end wall 3.
  • the configuration of the reflective surfaces and locations of the source 5 and sensor 6 are such that infra-red radiation emitted from the source 5 in most directions is directed onto the elliptical surface 7. Radiation reflected from the surface 7 is then incident on the planar surface 3 from which it is reflected and focussed on the region 9 between the source 5 and sensor 6. The radiation is then directed onto the elliptical surface 8 via the surface 3 to the detector 6, where it is focussed. Thus the radiation undergoes five reflections before being received at the sensor 6. A wall 10 surrounding the central region 9 reduces the amount of radiation which reaches the sensor 6 directly, without reflection, from the source or via a route other than that described above.
  • the housing also includes a reference sensor 11 which is located adjacent to the sensor 6 and used to compensate for changes in operating conditions and with time. Electrical connections to the source 5 and sensors 6 and 11 have been omitted from the Figure. There is an opening (not shown) in the planar surface 3 through which gas to be detected enters the chamber. Although not shown in the embodiment of Figure 1, shielding additional to the wall 10 may be used to further reduce the amount of radiation travelling along paths other than that taken when reflected off the ellipsoidal surfaces.
  • Figure 3 is an explanatory diagram in section illustrating the equality of optical path length for light emitted in different directions achievable by employing the invention.
  • the parts of the housing are indicated schematically, with the end walls 3 and 4 being shown.
  • the part ellipsoidal reflective surfaces 7 and 8 are shown as an unbroken line, the broken line illustrating the form of these surfaces if they were to be continued to form complete ellipsoids.
  • the source 5 is located at a focus of an ellipse a which has a second focus 12, which in this case is a virtual focus as the elliptical surface does not continue beyond end wall 3. It is a property of an ellipse that light emitted from one focus is focussed at the second focus.
  • the path of optical radiation from the source 5 is shown and, in the absence of the reflective surface 3 and assuming that the ellipse a were continuous, would be focussed at the second focus 12. Because of the intervening planar reflective surface 3, the light is instead focussed at the region 9 which is the same distance along the optical path from the source 5 as the virtual focus 12, region 9 being the same distance from the reflective surface 3 as the second focus 12.
  • the sensor 6 is located at a focus of an ellipse b which in this case, and preferably, has the same configuration as ellipse a and is orientated such that it has a virtual focus which coincides with virtual focus 12.
  • Light reflected from the focussed region 9 is reflected from planar surface 3 and focussed by the ellipsoidal surface 8 onto the sensor 6. In the absence of the reflective surface 3 and if the ellipse b were complete, then this light would be reflected and focussed at the virtual focus 12.
  • the properties of the ellipses ensure that light reflected from the source 5 in a plurality of different directions travels along the same path length before being refocussed at the sensor 6.
  • the planar surface 3 may be located such that it is closer to the foci at which the source 5 and sensor 6 are positioned than it is to the virtual focus 12 to provide a more compact arrangement. This will require the reflective surface 9 to be re-positioned relative to the foci at 5 and 6 if it is still wished to obtain focusing of the light at this surface.
  • Figure 4 illustrates schematically another gas monitor in which a chamber containing the gas has curved interior surfaces 13 and 14 which define foci at which an infra-red source 15 and sensor 16 are located.
  • the curved surfaces 13 and 14 are offset parabolas.
  • Planar reflective surfaces 17 and 18 define part of the optical path between the source 15 and sensor 16.
  • the curved surfaces 13 and 14 are offset parabolas, there is no focussing of the infra red radiation at the reflective planar surface 18 located on a common substrate with the source 15 and sensor 16, but optical path lengths between the source 15 and sensor 16 are substantially equal for a wide angular spread of emitted radiation.
  • three reflections from planar surfaces between two curved surfaces only one reflection occurs at a planar surface. This may be achieved in an off axis parabola arrangement by one parabolic reflective surface being approximately normal to another such surface.
  • the monitor illustrated in Figure 1 might be modified by replacing planar region 9 with a part ellipsoidal surface having the sensor at it foucs. Light is then reflected three times as it passes through the gas. Other arrangements may involve more than five reflections.

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  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Glass Compositions (AREA)
  • Investigating Or Analyzing Materials By The Use Of Fluid Adsorption Or Reactions (AREA)
EP97305952A 1996-08-10 1997-08-05 Gasüberwachungsgeräte Expired - Lifetime EP0825430B1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB9616809 1996-08-10
GBGB9616809.1A GB9616809D0 (en) 1996-08-10 1996-08-10 Gas monitors

Publications (3)

Publication Number Publication Date
EP0825430A2 true EP0825430A2 (de) 1998-02-25
EP0825430A3 EP0825430A3 (de) 1998-08-19
EP0825430B1 EP0825430B1 (de) 2006-03-29

Family

ID=10798302

Family Applications (1)

Application Number Title Priority Date Filing Date
EP97305952A Expired - Lifetime EP0825430B1 (de) 1996-08-10 1997-08-05 Gasüberwachungsgeräte

Country Status (7)

Country Link
US (1) US5973326A (de)
EP (1) EP0825430B1 (de)
AT (1) ATE322006T1 (de)
CA (1) CA2212432C (de)
DE (1) DE69735574T2 (de)
GB (2) GB9616809D0 (de)
ZA (1) ZA976936B (de)

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1112716A3 (de) * 1999-12-31 2001-11-07 GE Marquette Medical Systems, Inc. Kostengünstiges System mit einem Hauptstromgasanalysator
WO2002063283A1 (en) * 2001-02-08 2002-08-15 Dynament Limited Gas sensor
WO2003102553A1 (en) * 2002-05-31 2003-12-11 E2V Technologies (Uk) Limited Gas sensors
WO2004010116A1 (en) * 2002-07-22 2004-01-29 Senseair Ab Gas analysis arrangement
WO2004063725A1 (en) * 2003-01-15 2004-07-29 Senseair Ab A gas cell
WO2005062024A1 (de) * 2003-12-20 2005-07-07 Robert Bosch Gmbh Gassensor
EP1736754A1 (de) * 2005-06-23 2006-12-27 GFG Gesellschaft für Gerätebau mbH Optisches Analysegerät
JP2008517295A (ja) * 2004-10-18 2008-05-22 イーエルティー インコーポレイテッド 二つの放物線状の凹面鏡を利用した気体セル及びその気体セルを利用した気体センサーの製造方法
US7488942B2 (en) 2002-11-07 2009-02-10 E2V Technologies (Uk) Limited Gas sensors
CN103954577A (zh) * 2014-05-11 2014-07-30 西安安通测控技术有限公司 一种微型红外气体检测传感器
US9035256B2 (en) 2010-01-18 2015-05-19 Gas Sensing Solutions Ltd. Gas sensor with radiation guide
WO2018038491A1 (ko) * 2016-08-22 2018-03-01 (주)트루아이즈 포물 반사체를 이용한 광 도파관 및 이를 구비하는 적외선 가스 센서

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SE506942C2 (sv) * 1996-08-28 1998-03-02 Hans Goeran Evald Martin Gassensor
SE521415C2 (sv) * 1998-02-17 2003-10-28 Hans Goeran Evald Martin Metod för att framställa en gassensortillhörig detektor, samt en detektor framställd enligt metoden
US6190327B1 (en) * 1999-05-05 2001-02-20 Nonin Medical, Inc. Disposable airway adapter for use with a carbon dioxide detector
US6876305B2 (en) * 1999-12-08 2005-04-05 Gentex Corporation Compact particle sensor
SE522941C2 (sv) * 2000-04-26 2004-03-16 Senseair Ab Gascell
DE10058469C1 (de) * 2000-11-24 2002-05-02 Draeger Safety Ag & Co Kgaa Optischer Gassensor
DE10131724B4 (de) * 2001-06-29 2007-10-18 Dräger Safety AG & Co. KGaA Optisches Absorptions-Messgerät
DE20301081U1 (de) * 2002-05-24 2003-04-10 Dräger Safety AG & Co. KGaA, 23560 Lübeck Optischer Gassensor
GB2392976A (en) * 2002-09-13 2004-03-17 Delphi Tech Inc An optical measuring cell with total internal reflection
AU2003251361A1 (en) * 2003-07-28 2005-02-25 Status Scientific Controls Limited Gas detector
GB0327931D0 (en) 2003-12-02 2004-01-07 City Tech Gas sensor
KR100494103B1 (ko) * 2003-12-12 2005-06-10 (주)이엘티 광학적 가스 센서
JP4547385B2 (ja) * 2003-12-12 2010-09-22 イーエルティー インコーポレイテッド ガスセンサ
DE102004007946A1 (de) * 2004-02-18 2005-09-15 Tyco Electronics Raychem Gmbh Gassensoranordnung in integrierter Bauweise
JP2006275980A (ja) * 2005-03-30 2006-10-12 Denso Corp 赤外線式ガス検出器
KR100576541B1 (ko) * 2005-06-16 2006-05-03 (주) 인바이런먼트 리딩 테크놀러지 비분산 적외선 가스 센서를 위한 광 공동
US7717294B2 (en) 2005-06-20 2010-05-18 South-Tek Systems Beverage dispensing gas consumption detection with alarm and backup operation
DE102005055860B3 (de) * 2005-11-23 2007-05-10 Tyco Electronics Raychem Gmbh Gassensoranordnung mit Lichtkanal in Gestalt eines Kegelschnittrotationskörpers
DE102006002870B3 (de) * 2006-01-19 2007-06-28 Tyco Electronics Raychem Gmbh Gassensor und Verfahren zu dessen Herstellung
US8117897B2 (en) * 2006-11-27 2012-02-21 Applied Nanotech Holdings, Inc. Elliptical photo-acoustic sensor
GB0705356D0 (en) 2007-03-21 2007-04-25 Alphasense Ltd Optical absorption gas sensor
GB2449433B (en) 2007-05-21 2009-12-09 Clairair Ltd Optical gas sensor
FR2932567B1 (fr) * 2008-06-11 2010-08-13 Oldham Cellule de mesure pour appareil de detection de la presence d'un gaz dans une atmosphere
DE102009031694B3 (de) * 2009-07-04 2010-10-14 Qundis Gmbh Durchflusszähler
TW201200858A (en) * 2010-06-28 2012-01-01 Unimems Mfg Co Ltd A photoelectric gas sensor device and manufacturing method therefor
ITMI20130478A1 (it) 2013-03-29 2014-09-30 N E T Srl Rilevatore ottico di gas a geometria variabile
JP6134207B2 (ja) * 2013-06-07 2017-05-24 アズビル株式会社 ガス検出装置
KR101581341B1 (ko) * 2014-02-03 2015-12-31 한국교통대학교산학협력단 복수의 독립된 광 경로를 갖는 광 도파관 및 그를 이용한 광학적 가스센서
FR3048084A1 (fr) * 2016-02-18 2017-08-25 Commissariat Energie Atomique Capteur infrarouge non-dispersif pour detecter un gaz.
FR3057363B1 (fr) 2016-10-11 2019-05-24 Commissariat A L'energie Atomique Et Aux Energies Alternatives Cavite optique pendulaire a fort repliement.
US10161859B2 (en) 2016-10-27 2018-12-25 Honeywell International Inc. Planar reflective ring
WO2018222764A1 (en) * 2017-05-30 2018-12-06 Analog Devices, Inc. Compact optical gas detection system and apparatus
US11788942B2 (en) 2017-12-15 2023-10-17 Analog Devices, Inc. Compact optical smoke detector system and apparatus
DE102018215587A1 (de) * 2018-09-13 2020-03-19 Osram Opto Semiconductors Gmbh Strahlleitende kavitätsstrukur, gassensor und verfahren zum herstellen der derselben
US11073467B2 (en) * 2018-09-28 2021-07-27 Stmicroelectronics S.R.L. Miniaturized optical particle detector
US11079321B2 (en) 2018-09-28 2021-08-03 Stmicroelectronics S.R.L. NDIR detector device for detecting gases having an infrared absorption spectrum
US11150130B2 (en) 2019-03-04 2021-10-19 Si-Ware Systems Compact multi-pass gas cell for multi-gas spectral sensors
US11796445B2 (en) 2019-05-15 2023-10-24 Analog Devices, Inc. Optical improvements to compact smoke detectors, systems and apparatus
US11747272B2 (en) 2019-06-10 2023-09-05 Analog Devices, Inc. Gas detection using differential path length measurement
US11821836B2 (en) 2020-07-13 2023-11-21 Analog Devices, Inc. Fully compensated optical gas sensing system and apparatus
CN112649389B (zh) * 2020-12-07 2022-03-08 珠海格力电器股份有限公司 传感器光路组件、气体传感器及测量方法和空调系统
CN112649387A (zh) * 2020-12-07 2021-04-13 珠海格力电器股份有限公司 气室组件、气体浓度传感器和空调系统
CN113484267B (zh) * 2021-06-11 2022-07-29 汉威科技集团股份有限公司 一种基于硅基多次反射腔的红外气体传感器

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US4266219A (en) * 1978-09-18 1981-05-05 Baker Industries, Inc. Supervisory control system for a smoke detector
DE3830906A1 (de) * 1988-09-10 1990-03-15 Draegerwerk Ag Spiegelanordnung fuer einen strahlengang in einer vielfach-reflexionsmesszelle
WO1990014581A1 (en) * 1989-05-19 1990-11-29 Opsis Ab Apparatus for emitting and receiving light
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Cited By (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1112716A3 (de) * 1999-12-31 2001-11-07 GE Marquette Medical Systems, Inc. Kostengünstiges System mit einem Hauptstromgasanalysator
US6534769B1 (en) 1999-12-31 2003-03-18 Ge Medical Systems Information Technologies, Inc. Low cost main stream gas analyzer system
WO2002063283A1 (en) * 2001-02-08 2002-08-15 Dynament Limited Gas sensor
WO2003102553A1 (en) * 2002-05-31 2003-12-11 E2V Technologies (Uk) Limited Gas sensors
WO2004010116A1 (en) * 2002-07-22 2004-01-29 Senseair Ab Gas analysis arrangement
US7488942B2 (en) 2002-11-07 2009-02-10 E2V Technologies (Uk) Limited Gas sensors
WO2004063725A1 (en) * 2003-01-15 2004-07-29 Senseair Ab A gas cell
AU2004204334B2 (en) * 2003-01-15 2009-05-14 Senseair Ab A gas cell
WO2005062024A1 (de) * 2003-12-20 2005-07-07 Robert Bosch Gmbh Gassensor
US7880886B2 (en) 2003-12-20 2011-02-01 Robert Bosch Gmbh Gas sensor
JP2008517295A (ja) * 2004-10-18 2008-05-22 イーエルティー インコーポレイテッド 二つの放物線状の凹面鏡を利用した気体セル及びその気体セルを利用した気体センサーの製造方法
EP1736754A1 (de) * 2005-06-23 2006-12-27 GFG Gesellschaft für Gerätebau mbH Optisches Analysegerät
US9035256B2 (en) 2010-01-18 2015-05-19 Gas Sensing Solutions Ltd. Gas sensor with radiation guide
CN103954577A (zh) * 2014-05-11 2014-07-30 西安安通测控技术有限公司 一种微型红外气体检测传感器
WO2018038491A1 (ko) * 2016-08-22 2018-03-01 (주)트루아이즈 포물 반사체를 이용한 광 도파관 및 이를 구비하는 적외선 가스 센서

Also Published As

Publication number Publication date
DE69735574T2 (de) 2007-04-05
EP0825430A3 (de) 1998-08-19
GB2316172B (en) 2000-03-22
GB9716355D0 (en) 1997-10-08
GB9616809D0 (en) 1996-09-25
EP0825430B1 (de) 2006-03-29
GB2316172A (en) 1998-02-18
DE69735574D1 (de) 2006-05-18
ZA976936B (en) 1998-02-18
CA2212432C (en) 2007-07-17
US5973326A (en) 1999-10-26
ATE322006T1 (de) 2006-04-15
CA2212432A1 (en) 1998-02-10

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