EP0678218A1 - Ultra fast camera for visualizing the intensity profile of a laser pulse - Google Patents

Ultra fast camera for visualizing the intensity profile of a laser pulse

Info

Publication number
EP0678218A1
EP0678218A1 EP92902925A EP92902925A EP0678218A1 EP 0678218 A1 EP0678218 A1 EP 0678218A1 EP 92902925 A EP92902925 A EP 92902925A EP 92902925 A EP92902925 A EP 92902925A EP 0678218 A1 EP0678218 A1 EP 0678218A1
Authority
EP
European Patent Office
Prior art keywords
laser pulse
pulse
intensity profile
camera
visualizing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP92902925A
Other languages
German (de)
French (fr)
Other versions
EP0678218B1 (en
Inventor
Jean-Claude Grossetie
Joseph-Albert Miehe
Mustapha Boussoukaya
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
COMMUNAUTE ECONOMIQUE EUROPEENNE (CEE)
Original Assignee
COMMUNAUTE ECONOMIQUE EUROPEENNE (CEE)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by COMMUNAUTE ECONOMIQUE EUROPEENNE (CEE) filed Critical COMMUNAUTE ECONOMIQUE EUROPEENNE (CEE)
Publication of EP0678218A1 publication Critical patent/EP0678218A1/en
Application granted granted Critical
Publication of EP0678218B1 publication Critical patent/EP0678218B1/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J31/00—Cathode ray tubes; Electron beam tubes
    • H01J31/08—Cathode ray tubes; Electron beam tubes having a screen on or from which an image or pattern is formed, picked up, converted, or stored
    • H01J31/50—Image-conversion or image-amplification tubes, i.e. having optical, X-ray, or analogous input, and optical output
    • H01J31/501—Image-conversion or image-amplification tubes, i.e. having optical, X-ray, or analogous input, and optical output with an electrostatic electron optic system
    • H01J31/502—Image-conversion or image-amplification tubes, i.e. having optical, X-ray, or analogous input, and optical output with an electrostatic electron optic system with means to interrupt the beam, e.g. shutter for high speed photography

Definitions

  • the invention refers to a super-fast slit scan camera (strea camera) for viewing the intensity profile of a laser pulse.
  • strea camera super-fast slit scan camera
  • a slit-scanning camera which comprises in a vacuum enclosure a photocathode, an extraction grid, focusing electrodes, deflection plates and a display screen.
  • the laser pulse to be analyzed is applied through a transparent substrate of the photocathode, which, in response, emits electrons. These are then subjected to the electric field applied between the cathode and the extraction grid. They are accelerated, pass through a hole in a focusing anode and are finally deflected by deflection plates, which receive a sawtooth tension. On the screen, one can then visualize the temporal distribution of the photons of the laser pulse which strike the photocathode.
  • the invention aims to provide a camera for analyzing pulses of duration less than 10 " sec, that is to say having a temporal response of one picosecond and even less.
  • This object is achieved according to the invention by replacing the photocathode of the semiconductor type with at least one metallic tip. that and by sending the laser pulse in an area located opposite this point.
  • Figure 1 shows schematically and in axial section a camera according to the invention.
  • FIG. 2 represents a variant of the electron emitter according to FIG. 1.
  • an enclosure 1 which is capable of being evacuated by about 10 -8 Torr and which comprises, centered on an axis 2, a metal needle 3, an extraction grid 4, a focusing anode 5 having a central hole, deflection plates 6 and finally a display screen 7, made of phosphor, for example.
  • the various organs are connected to sources of electrical voltage suitable for performing their respective conventional functions.
  • the needle 3 is connected to a generator 8 of an electrical pulse which is synchronized with the optical pulse to be analyzed. The latter comes from a laser 9 placed outside the enclosure 1 and directing its beam 13 through a window 10 towards an area located opposite the needle 3.
  • the amplitude of the electric pulse supplied by the generator 8 is chosen slightly below a threshold at which spontaneous emission of electrons from the needle occurs.
  • the invention therefore makes it possible to reduce the power of the laser beam to be analyzed and therefore to improve the temporal resolution of the analysis.
  • FIG. 2 represents a variant with respect to needle 3 of FIG. 1.
  • a substrate 11 made of a good conductive metal which is connected as before to the generator 8 through the wall of the enclosure 1.
  • This substrate comprises an emission surface 12 having a certain microscopic roughness as the substrate, so that there is a plurality of spikes capable of emitting electrons. It has been observed that the emission threshold is much lower when the surface is rough, because the local electric field at the top of an acute point is a factor B greater than the microscopic field than around this point. , the factor B can reach 10.4 '
  • the invention is not limited to the embodiment described above.
  • the laser beam it is not compulsory for the laser beam to intersect the axis 2 to 90 e .

Landscapes

  • Electron Sources, Ion Sources (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Image-Pickup Tubes, Image-Amplification Tubes, And Storage Tubes (AREA)
  • Common Detailed Techniques For Electron Tubes Or Discharge Tubes (AREA)
  • Lasers (AREA)

Abstract

The invention relates to an ultrafast camera for displaying the intensity profile of a laser pulse. This camera includes, inside an evacuated enclosure, a photocathode, an extraction grid, focusing electrodes, deflection plates and a display screen. According to the invention, the electron emitter consists of at least one metal point (3, 12) and of means (9, 10) for conveying the said laser pulse (13) into a zone situated opposite this point. <IMAGE>

Description

Caméra ultrarapide pour visualiser le profile d'intensité d'une impulsion laser Ultra-fast camera to view the intensity profile of a laser pulse
'invention se réfère à une caméra à balayage de fente ultra¬ rapide (strea caméra) pour visualiser le profile d'intensité d'une impulsion laser.The invention refers to a super-fast slit scan camera (strea camera) for viewing the intensity profile of a laser pulse.
Pour l'étude des phénomènes transitoires, on sait générer des impulsions laser d'une durée très brève de l'ordre de 10~ sec. La connaissance exacte du profile d'intensité de cette impulsion y est très importante. On l'obtient jusqu'ici par une caméra à balayage de fente qui comporte dans une enceinte sous vide une photocathode, une grille d'extraction, des élec¬ trodes de focalisation, des plaques de deflection et un écran de visualisation. L'impulsion laser à analyser est appliquée à travers un substrat transparent de la photocathode, qui, en réponse, émet des électrons. Ceux-ci sont alors soumis au champ électrique appliqué entre la cathode et la grille d'ex¬ traction. Ils sont accélérés, passent à travers un trou dans une anode de focalisation et sont enfin défléchis par des plaques de deflection, qui reçoivent une tension en dent de scie. Sur l'écran, on peut alors visualiser la distribution temporelle des photons de 1'impulsion laser qui frappent la photocathode.For the study of transient phenomena, it is known to generate laser pulses of a very short duration of the order of 10 ~ sec. The exact knowledge of the intensity profile of this pulse is very important. Up to now, it has been obtained by a slit-scanning camera which comprises in a vacuum enclosure a photocathode, an extraction grid, focusing electrodes, deflection plates and a display screen. The laser pulse to be analyzed is applied through a transparent substrate of the photocathode, which, in response, emits electrons. These are then subjected to the electric field applied between the cathode and the extraction grid. They are accelerated, pass through a hole in a focusing anode and are finally deflected by deflection plates, which receive a sawtooth tension. On the screen, one can then visualize the temporal distribution of the photons of the laser pulse which strike the photocathode.
L'invention a pour but de proposer une caméra permettant d'analyser des impulsions d'une durée inférieure à 10" sec, c'est-à-dire ayant une réponse temporelle d'une picoseconde et même moins.The invention aims to provide a camera for analyzing pulses of duration less than 10 " sec, that is to say having a temporal response of one picosecond and even less.
Ce but est atteint selon l'invention en remplaçant la photoca- thode de type semiconducteur par au moins une pointe métalli- que et en envoyant 1'impulsion laser dans une zone située en face de cette pointe.This object is achieved according to the invention by replacing the photocathode of the semiconductor type with at least one metallic tip. that and by sending the laser pulse in an area located opposite this point.
En ce qui concerne des exemples de mise en oeuvre de 1'inven- tion, référence est faite aux revendications secondaires.With reference to exemplary embodiments of the invention, reference is made to the secondary claims.
L'invention sera décrite ci-après plus en détail à 1'aide d' exemple de réalisation et des dessins annexés.The invention will be described below in more detail with the aid of an exemplary embodiment and the accompanying drawings.
La figure 1 montre schématiquement et en coupe axiale une caméra selon l'invention.Figure 1 shows schematically and in axial section a camera according to the invention.
La figure 2 représente une variante de l'émetteur d'électrons selon la figure 1.FIG. 2 represents a variant of the electron emitter according to FIG. 1.
Sur la figure 1, on voit une enceinte 1, qui est susceptible d'être mise sous vide d'environ 10 —8 Torr et qui comporte, centrés sur un axe 2, une aiguille métallique 3, une grille d'extraction 4, une anode de focalisation 5 ayant un trou central, des plaques de deflection 6 et enfin un écran de visualisation 7, en phosphore, par exemple. Les différents organes sont reliés à des sources de tension électrique adé¬ quats pour assurer leurs fonctions conventionelles respec¬ tives. En particulier, l'aiguille 3 est connectée à un généra- teur 8 d'une impulsion électrique qui est synchronisée avec l'impulsion optique à analyser. Cette dernière provient d'un laser 9 placé hors de l'enceinte 1 et dirigeant son faisceau 13 à travers une fenêtre 10 vers une zone située en face de l'aiguille 3. L'amplitude de l'impulsion électrique fournie par le générateur 8 est choisie légèrement inférieure à un seuil auquel se produit une émission spontanée d'électrons de l'aiguille.In FIG. 1, we see an enclosure 1, which is capable of being evacuated by about 10 -8 Torr and which comprises, centered on an axis 2, a metal needle 3, an extraction grid 4, a focusing anode 5 having a central hole, deflection plates 6 and finally a display screen 7, made of phosphor, for example. The various organs are connected to sources of electrical voltage suitable for performing their respective conventional functions. In particular, the needle 3 is connected to a generator 8 of an electrical pulse which is synchronized with the optical pulse to be analyzed. The latter comes from a laser 9 placed outside the enclosure 1 and directing its beam 13 through a window 10 towards an area located opposite the needle 3. The amplitude of the electric pulse supplied by the generator 8 is chosen slightly below a threshold at which spontaneous emission of electrons from the needle occurs.
Cette émission n'est enfin obtenue que par l'application si- multanée de cette impulsion électrique et du faisceau optique provenant du laser 9, 1'émission d'électrons correspondant alors assez fidèlement au profil temporel de 1'impulsion opti¬ que. La réalisation directe, à partir d'un laser seul, d'un champ électrique, d'une intensité telle qu'il se produit un effet tunnel et une émission d'électrons, nécessiterait des puissances importantes de l'ordre de 1,3.10 /cm2 alors que l'action conjointe de l'impulsion électrique et de l'impulsion optique fait qu'une puissance optique du faisceau de l'ordreThis emission is finally obtained only by the simultaneous application of this electrical pulse and the optical beam coming from the laser 9, the emission of electrons then corresponds fairly faithfully to the time profile of the optical pulse. The direct realization, from a laser alone, of an electric field, of an intensity such that it produces a tunnel effect and an emission of electrons, would require significant powers of the order of 1.3.10 / cm 2 while the joint action of the electrical pulse and the optical pulse causes an optical power of the beam of the order
5 de 10 W/cm2 suffit pour déclencher l'effet tunnel. L'invention permet donc de réduire la puissance du faisceau laser à analy¬ ser et donc d'améliorer la résolution temporelle de l'analyse. 5 of 10 W / cm 2 is enough to trigger the tunnel effect. The invention therefore makes it possible to reduce the power of the laser beam to be analyzed and therefore to improve the temporal resolution of the analysis.
La figure 2 représente une variante par rapport à 1'aiguille 3 de la figure.1. On y voit en effet un substrat 11 en métal bon conducteur qui est relié comme précédemment au générateur 8 à travers la paroi de 1'enceinte 1. Ce substrat comporte une surface d'émission 12 ayant une certaine rugosité microscopi¬ que du substrat, de sorte qu'il y a une pluralité de pointes susceptibles d'émettre des électrons. On a observé que le seuil d'émission est bien plus bas lorsque la surface est rugueuse, car le champ électrique local au sommet d'une pointe aiguë est d'un facteur B plus grande que le champ microscopi¬ que moyen autour de cette pointe, le facteur B pouvant at- teindre 10,4' FIG. 2 represents a variant with respect to needle 3 of FIG. 1. We can see there in fact a substrate 11 made of a good conductive metal which is connected as before to the generator 8 through the wall of the enclosure 1. This substrate comprises an emission surface 12 having a certain microscopic roughness as the substrate, so that there is a plurality of spikes capable of emitting electrons. It has been observed that the emission threshold is much lower when the surface is rough, because the local electric field at the top of an acute point is a factor B greater than the microscopic field than around this point. , the factor B can reach 10.4 '
L'invention n'est pas limitée à l'exemple de réalisation dé¬ crit ci-dessus. Ainsi, il n'est pas obligatoire que le fais¬ ceau laser intersecte l'axe 2 à 90e. En choisissant par ex¬ emple un angle de 45° avec la surface d'émission rugueuse, on obtient une émission de champ impulsionnel accompagnée d'une photoémission. On peut en outre remplacer le générateur d'im¬ pulsions 8 par une source de tension continue, mais dans ce cas il faut réduire cette tension pour éviter' des décharges involontaires avant que l'impulsion laser soit déclenchée. The invention is not limited to the embodiment described above. Thus, it is not compulsory for the laser beam to intersect the axis 2 to 90 e . By choosing for example an angle of 45 ° with the rough emission surface, one obtains an impulse field emission accompanied by a photoemission. It is also possible to replace the pulse generator 8 with a source of direct voltage, but in this case it is necessary to reduce this voltage to avoid 'involuntary discharges before the laser pulse is triggered.

Claims

REVENDICATIONS
1. Caméra ultrarapide pour visualiser le profile d'intensité d'une impulsion laser, comportant dans une enceinte sous vide une photocathode, une grille d'extraction, des électrodes de focalisation, des plaques de deflection et un écran de visua¬ lisation, caractérisée en ce que l'émetteur d'électrons est constitué d'au moins une pointe métallique (3, 12) et de moy¬ ens (9,10) pour envoyer ladite impulsion laser (13) dans une zone située en face de cette pointe.1. Ultrafast camera for viewing the intensity profile of a laser pulse, comprising in a vacuum chamber a photocathode, an extraction grid, focusing electrodes, deflection plates and a visualization screen, characterized in that the electron emitter consists of at least one metal tip (3, 12) and of means (9, 10) for sending said laser pulse (13) to an area located opposite this tip .
2. Caméra selon la revendication 1, caractérisée en ce que l'émetteur comporte une pluralité de pointes définissant une surface rugueuse (12) d'un support métallique (11) (figure 2).2. Camera according to claim 1, characterized in that the transmitter comprises a plurality of points defining a rough surface (12) of a metal support (11) (Figure 2).
3. Méthode de mise en oeuvre de la caméra selon l'une des revendications précédentes, caractérisée en ce que la tension électrique d'extraction appliquée entre la grille d'extraction et les pointes est une impulsion électrique qui définit une fenêtre autour de l'impulsion laser à visualiser, l'amplitude de cette impulsion électrique étant choisie légèrement infé¬ rieure à celle nécessaire pour causer toute seule une émission d'électrons. 3. Method of implementing the camera according to one of the preceding claims, characterized in that the electric extraction voltage applied between the extraction grid and the tips is an electric pulse which defines a window around the laser pulse to be viewed, the amplitude of this electrical pulse being chosen to be slightly lower than that necessary to cause an emission of electrons on its own.
EP92902925A 1991-01-30 1992-01-27 Method for visualising the intensity profile of a laser pulse Expired - Lifetime EP0678218B1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
LU87882 1991-01-30
LU87882A LU87882A1 (en) 1991-01-30 1991-01-30 ULTRA-FAST CAMERA FOR VIEWING THE INTENSITY PROFILE OF A LASER PULSE
PCT/EP1992/000165 WO1992014257A1 (en) 1991-01-30 1992-01-27 Ultra fast camera for visualizing the intensity profile of a laser pulse

Publications (2)

Publication Number Publication Date
EP0678218A1 true EP0678218A1 (en) 1995-10-25
EP0678218B1 EP0678218B1 (en) 1999-09-29

Family

ID=19731274

Family Applications (2)

Application Number Title Priority Date Filing Date
EP92101273A Pending EP0497244A1 (en) 1991-01-30 1992-01-27 Ultrafast camera to display the intensity profile of a laser pulse
EP92902925A Expired - Lifetime EP0678218B1 (en) 1991-01-30 1992-01-27 Method for visualising the intensity profile of a laser pulse

Family Applications Before (1)

Application Number Title Priority Date Filing Date
EP92101273A Pending EP0497244A1 (en) 1991-01-30 1992-01-27 Ultrafast camera to display the intensity profile of a laser pulse

Country Status (9)

Country Link
US (1) US5362959A (en)
EP (2) EP0497244A1 (en)
JP (1) JPH06504649A (en)
AT (1) ATE185220T1 (en)
CA (1) CA2100266C (en)
DE (1) DE69230075T2 (en)
IE (1) IE920295A1 (en)
LU (1) LU87882A1 (en)
WO (1) WO1992014257A1 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0944621A (en) * 1995-07-25 1997-02-14 Yokohama Rubber Co Ltd:The Information memory cell, scanner and information storage and reproducing device
US7721948B1 (en) * 1999-05-25 2010-05-25 Silverbrook Research Pty Ltd Method and system for online payments
RU2704330C1 (en) * 2018-11-30 2019-10-28 Федеральное государственное бюджетное учреждение науки Институт спектроскопии Российской академии наук (ИСАН) Photoemission profilometer of laser beam

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3316027A1 (en) * 1983-05-03 1984-11-08 Dornier System Gmbh, 7990 Friedrichshafen PHOTODETECTOR
US4868380A (en) * 1988-03-02 1989-09-19 Tektronix, Inc. Optical waveguide photocathode
US5013902A (en) * 1989-08-18 1991-05-07 Allard Edward F Microdischarge image converter
FR2662036B1 (en) * 1990-05-14 1993-06-25 Centre Nat Rech Scient SLIT SCANNING CAMERA.
JP3071809B2 (en) * 1990-09-07 2000-07-31 浜松ホトニクス株式会社 Streak tube

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See references of WO9214257A1 *

Also Published As

Publication number Publication date
CA2100266A1 (en) 1992-07-31
DE69230075D1 (en) 1999-11-04
US5362959A (en) 1994-11-08
DE69230075T2 (en) 2000-01-05
LU87882A1 (en) 1992-10-15
WO1992014257A1 (en) 1992-08-20
EP0497244A1 (en) 1992-08-05
CA2100266C (en) 2002-05-14
EP0678218B1 (en) 1999-09-29
ATE185220T1 (en) 1999-10-15
JPH06504649A (en) 1994-05-26
IE920295A1 (en) 1992-07-29

Similar Documents

Publication Publication Date Title
FR2609840A1 (en) ION PLASMA ELECTRON CANON
EP0480518B1 (en) Electron source providing a particle retention device
FR2491257A1 (en) LASER-DRIVEN HIGH DENSITY ELECTRON SOURCE
FR2488044A1 (en) DEVICE FOR DETECTING SECONDARY ELECTRONS IN A SCANNING ELECTRON MICROSCOPE
EP0678218A1 (en) Ultra fast camera for visualizing the intensity profile of a laser pulse
EP0298817B1 (en) Process and device for the production of electrons using a field coupling and the photoelectric effect
FR2578356A1 (en) DEVICE PROVIDED WITH A SEMICONDUCTOR CATHODE
US4506191A (en) Light source cathode ray tube
EP0044239B1 (en) Microchannels image intensifier tube and image pick-up assembly comprising such a tube
EP0295743B1 (en) Ion source with four electrodes
EP0379243A1 (en) Photomultiplier tube provided with a big first dynode and a stacked dynodes multiplier
FR2480500A1 (en) GENERATOR FOR PULSE ELECTRON BEAM
US3422307A (en) Electric arc device with a photoelectric starting electrode
EP1210721B1 (en) Field emission flat screen with modulating electrode
EP0956581B1 (en) Photoelectric multiplier tube of reduced length
JP2000243356A (en) Hollow cathode lamp
EP0423886A1 (en) Multi-path photomultiplier with high inter-signal resolution
US6005351A (en) Flat panel display device using thin diamond electron beam amplifier
TWI840615B (en) Light modulated electron source, method for modulating an electron beam, and device including an electron source
EP0300932B1 (en) Electron source
FR2618605A1 (en) Device for detecting and amplifying small positive or negative ion currents
EP1052668A1 (en) Operating at high pressure of a field-emission type cold cathode
FR2687504A1 (en) IMPROVEMENTS ON X-RAY TUBES.
Pickard et al. Plasma production via laser‐induced photoemissiona
FR3098010B1 (en) DEVICE FOR GENERATING ELECTROMAGNETIC RADIATION AND METHOD FOR PRODUCING SUCH A DEVICE

Legal Events

Date Code Title Description
PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

Free format text: ORIGINAL CODE: 0009012

17P Request for examination filed

Effective date: 19930726

AK Designated contracting states

Kind code of ref document: A1

Designated state(s): AT BE CH DE DK ES FR GB GR IT LI LU NL PT SE

RBV Designated contracting states (corrected)

Designated state(s): AT BE CH DE DK ES FR GB GR IT LI LU NL PT SE

XX Miscellaneous (additional remarks)

Free format text: VERBUNDEN MIT 92101273.8/0497244 (EUROPAEISCHE ANMELDENUMMER/VEROEFFENTLICHUNGSNUMMER) DURCH ENTSCHEIDUNG VOM 11.09.96.

17Q First examination report despatched

Effective date: 19960919

GRAG Despatch of communication of intention to grant

Free format text: ORIGINAL CODE: EPIDOS AGRA

GRAG Despatch of communication of intention to grant

Free format text: ORIGINAL CODE: EPIDOS AGRA

GRAH Despatch of communication of intention to grant a patent

Free format text: ORIGINAL CODE: EPIDOS IGRA

GRAG Despatch of communication of intention to grant

Free format text: ORIGINAL CODE: EPIDOS AGRA

GRAH Despatch of communication of intention to grant a patent

Free format text: ORIGINAL CODE: EPIDOS IGRA

GRAH Despatch of communication of intention to grant a patent

Free format text: ORIGINAL CODE: EPIDOS IGRA

GRAA (expected) grant

Free format text: ORIGINAL CODE: 0009210

AK Designated contracting states

Kind code of ref document: B1

Designated state(s): AT BE CH DE DK ES FR GB GR IT LI LU NL PT SE

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: GR

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 19990929

Ref country code: ES

Free format text: THE PATENT HAS BEEN ANNULLED BY A DECISION OF A NATIONAL AUTHORITY

Effective date: 19990929

Ref country code: AT

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 19990929

REF Corresponds to:

Ref document number: 185220

Country of ref document: AT

Date of ref document: 19991015

Kind code of ref document: T

XX Miscellaneous (additional remarks)

Free format text: VERBUNDEN MIT 92101273.8/0497244 (EUROPAEISCHE ANMELDENUMMER/VEROEFFENTLICHUNGSNUMMER) DURCH ENTSCHEIDUNG VOM 11.09.96.

REG Reference to a national code

Ref country code: CH

Ref legal event code: EP

REF Corresponds to:

Ref document number: 69230075

Country of ref document: DE

Date of ref document: 19991104

GBT Gb: translation of ep patent filed (gb section 77(6)(a)/1977)

Effective date: 19991102

ITF It: translation for a ep patent filed

Owner name: STUDIO TORTA S.R.L.

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: DK

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 19991229

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: PT

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20000113

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: LI

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20000131

Ref country code: CH

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20000131

PLBE No opposition filed within time limit

Free format text: ORIGINAL CODE: 0009261

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: NO OPPOSITION FILED WITHIN TIME LIMIT

26N No opposition filed
REG Reference to a national code

Ref country code: CH

Ref legal event code: PL

REG Reference to a national code

Ref country code: GB

Ref legal event code: IF02

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: NL

Payment date: 20031224

Year of fee payment: 13

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: SE

Payment date: 20031229

Year of fee payment: 13

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: LU

Payment date: 20031230

Year of fee payment: 13

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: BE

Payment date: 20031231

Year of fee payment: 13

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: LU

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20050127

Ref country code: IT

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES;WARNING: LAPSES OF ITALIAN PATENTS WITH EFFECTIVE DATE BEFORE 2007 MAY HAVE OCCURRED AT ANY TIME BEFORE 2007. THE CORRECT EFFECTIVE DATE MAY BE DIFFERENT FROM THE ONE RECORDED.

Effective date: 20050127

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: SE

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20050128

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: BE

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20050131

BERE Be: lapsed

Owner name: COMMUNAUTE ECONOMIQUE EUROPEENNE *CEE

Effective date: 20050131

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: NL

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20050801

EUG Se: european patent has lapsed
NLV4 Nl: lapsed or anulled due to non-payment of the annual fee

Effective date: 20050801

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: DE

Payment date: 20051227

Year of fee payment: 15

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: DE

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20070801

BERE Be: lapsed

Owner name: COMMUNAUTE ECONOMIQUE EUROPEENNE *CEE

Effective date: 20050131

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: GB

Payment date: 20101230

Year of fee payment: 20

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: FR

Payment date: 20110216

Year of fee payment: 20

REG Reference to a national code

Ref country code: GB

Ref legal event code: PE20

Expiry date: 20120126

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: GB

Free format text: LAPSE BECAUSE OF EXPIRATION OF PROTECTION

Effective date: 20120126