EP0378648B1 - Piege a ions icr - Google Patents
Piege a ions icr Download PDFInfo
- Publication number
- EP0378648B1 EP0378648B1 EP89907696A EP89907696A EP0378648B1 EP 0378648 B1 EP0378648 B1 EP 0378648B1 EP 89907696 A EP89907696 A EP 89907696A EP 89907696 A EP89907696 A EP 89907696A EP 0378648 B1 EP0378648 B1 EP 0378648B1
- Authority
- EP
- European Patent Office
- Prior art keywords
- plates
- end plates
- ion trap
- additional electrode
- ions
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/36—Radio frequency spectrometers, e.g. Bennett-type spectrometers, Redhead-type spectrometers
- H01J49/38—Omegatrons ; using ion cyclotron resonance
Definitions
- the invention relates to an ICR ion trap with electrically conductive side plates that extend parallel to an axis and have the same length in the axial direction, and with electrically conductive end plates that extend perpendicular to the axis and that lie symmetrically to a central plane perpendicular to the axis, that of the side plates Enclose enclosed space and are electrically isolated from the side plates, and with a voltage source for applying trapping potential to the side and end plates, with two further electrode plates being arranged at a distance from the end plates, which extend parallel to the end plates and one from the center plane have a greater axial distance than the end plates and the end plates and possibly also the further electrode plates are provided with holes lying on a common axis for the passage of the ions trapped between the further electrode plates and possibly an ionization beam.
- ICR ion trap is known from EP-A-162 649.
- Such ion traps are used in ICR mass spectrometers and have the purpose of capturing the ions of substances which are to be examined by mass spectroscopy using cyclotron resonance.
- the end plates are held at a negative potential compared to the side plates to trap negative ions, while the potential of the end plates is positive towards the side plates to trap positive ions.
- the ions are generated within the ion trap by irradiating the substance to be examined, for example by means of a laser beam or an electron beam, negative and positive ions can arise simultaneously, in particular when excited by an electron beam. of which one type of ion is always lost, although the investigation of both types of ion could be of interest.
- the invention has for its object to provide an ion trap that allows the simultaneous capture of positive and negative ions in spatially overlapping areas.
- This object is achieved according to the invention in that, in the case of an ICR ion trap of the type mentioned at the outset, the distance between each end plate and the other electrode plate lying next to it is three to five times as large as the diameter of the central holes, and in that capture electrodes can be applied to further electrode plates by means of the voltage source, the polarity of which is opposite to the polarity of the potentials applied to the end plates.
- the ICR ion trap according to the invention accordingly forms an arrangement in which, as it were, two regions forming ICR ion traps are nested one inside the other. While the ions of one polarity are trapped between the end plates which delimit an inner region in a conventional manner, the other ions can pass through holes arranged in the end plates and reach the further electrode plates which delimit an outer region. These other ions are reflected on the other electrodes because of their polarity reversed to the end plates, so that they fly through the openings in the end plates to the other further electrode plate, where they are then reflected again.
- the ions with the other polarity each cross the inner region delimited by the end plates, in which they can interact with the ions which are trapped within this region of the ion trap.
- recombination reactions can then take place, the results of which can be examined by a later mass analysis of the trapped ions.
- either only positive or only negative ions can be detected because only the ions trapped between the side plates, ie also between the end plates, can be excited to cyclotron movements and can thereby be selectively eliminated.
- the ion trap shown in FIG. 1 has four side walls 1, of which three side walls are visible in FIG. 1. These side walls 1 extend parallel to an axis Z and delimit a prism with a square cross section. The ends of this prism are closed by two end plates 5, 6, which are kept at a defined positive potential of -1 V with respect to the side plates 1 by means of a voltage source 7. As a result, within the space delimited by the side plates 1 and the end plates 5, 6 along the Z axis, the potential curve between the maxima 15, 16 shown by the curve 4 in FIG. 2 results. In this respect, the ion trap has a known, typical structure and is suitable for capturing positive ions, since positive ions are reflected by the end plates 5, 6 which are at a positive potential and are thus limited to the space between these end plates.
- further electrode plates 8, 9 are arranged parallel to the end plates 5, 6, which are located in relation to the side plates 1 on the outside of the associated end plate 5, 6 and are at a certain, equal distance from these end plates. As shown in FIG. 2, these further electrode plates 8, 9 are at a potential with the opposite sign to the potential of the end plates 5, 6 held, that is, in the exemplary embodiment shown, at a potential of in each case -1 V. This results in the potential profile shown in FIG. 2 by curve 4 between its end points 18 and 19 and the respectively adjacent maximum 15 or respectively between the end plates and the further electrode plates 16.
- the further electrode plates 8, 9 located at a negative potential form a potential barrier for negative ions.
- the substances located within the ion trap can be ionized by means of a laser or electron beam which traverses the ICR ion trap in the direction of the Z axis.
- the end plates 5, 6 have central holes 25, 26, but also the further electrode plates 8, 9 have corresponding central holes 28, 29.
- the ions formed by irradiation collect the positive ions between the end plates 5, 6, while the negative ions oscillate between the further electrode plates 8, 9.
- the negative ions continuously cross through the inner area filled with the positive ions, so that interactions between the positive and negative ions can easily occur.
- the ICR ion trap according to the invention is therefore particularly suitable for observing interactions between positive and negative ions.
- the side plates could be formed as parts of cylindrical outer surfaces, so the ICR ion trap could have a circular cross section.
- plate sections aligned with the side plates could be arranged between the end plates and the further electrode plates, as is indicated by dash-dotted lines in FIG. 1 of the drawing.
- the beam could also be directed perpendicular to the Z axis of the arrangement and thus to the axis of the magnetic field, so that the holes in the further electrode plates 8, 9 could be omitted.
- typical values for the distance between two opposite side plates 1 are between 1 cm and 10 cm, for the distance between the end plates 5 and 6 between 1 cm and 15 cm, for the distance of each end plate 5 or 6 from the further electrode plate 8 or 9 lying respectively first between 1 cm and 10 cm and for the diameter of the central holes 25, 26, 28, 29 between 1 mm and 10 mm.
- the distance of each end plate 5 or 6 from the further electrode plate 8 or 9 lying next to it is three to five times as large as the diameter of the central holes 25, 26, 28, 29.
- the capture potentials are typically between -5 V and +5 V, the potentials applied to the end plates 5, 6 having the opposite sign to the potentials applied to the further electrode plates 8, 9, but being of the same amount. However, it can also be advantageous to apply a larger or smaller capture potential to the further electrode plates 8, 9 than to the End plates 5, 6, for example to achieve a special spatial distribution of the electric field.
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- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Abstract
Claims (7)
- Piège à ions ICR, avec des plaques latérales électriquement conductrices de même longueur en direction axiale et s'étendant parallèlement à un axe, avec des plaques terminales électriquement conductrices s'étendant perpendiculairement à l'axe, qui sont disposées en symétrie par rapport à un plan médian perpendiculaire à l'axe, ferment l'espace inclus entre les plaques latérales et sont électriquement isolées par rapport aux plaques latérales, et avec une source de tension pour appliquer des potentiels collecteurs aux plaques latérales et aux plaques terminales, deux plaques supplémentaires d'électrodes étant disposées à distance des plaques terminales, ces plaques supplémentaires s'étendant parallèlement aux plaques terminales et étant axialement plus éloignées du plan médian que les plaques terminales, et les plaques terminales ainsi éventuellement que les plaques supplémentaires d'électrodes étant pourvues de trous situés sur un axe commun pour le passage des ions piégés entre les plaques supplémentaires d'électrodes et étant éventuellement dotées d'un faisceau ionisant,
caractérisé en ce que la distance entre chaque plaque terminale (5 ou 6) et la plaque supplémentaire d'électrode (8 ou 9) qui en est respectivement la plus proche est trois à cinq fois supérieure au diamètre des trous centraux (25, 26, 28, 29), et en ce qu'au moyen de la source de tension (7), on peut appliquer aux plaques supplémentaires d'électrodes (8, 9) des potentiels collecteurs dont la polarité est opposée à la polarité des potentiels appliqués aux plaques terminales (5, 6). - Piège à ions ICR selon la revendication 1, caractérisé en ce que la source de tension (7) est conçue de telle sorte que la polarité des potentiels appliqués aux plaques terminales (5, 6) et aux plaques supplémentaires d'électrodes (8, 9) est réversible.
- Piège à ions ICR selon la revendication 1 ou 2, caractérisé en ce que le diamètre des trous centraux (25, 26, 28, 29) est compris entre 1 mm et 10 mm.
- Piège à ions ICR selon l'une des revendications précédentes, caractérisé en ce que les plaques latérales (1), les plaques terminales (5, 6) et les plaques supplémentaires d'électrodes (8, 9) sont disposées en symétrie par rapport à l'axe.
- Piège à ions ICR selon l'une des revendications précédentes, caractérisé en ce que les plaques latérales (1), les plaques terminales (5, 6) et les plaques supplémentaires d'électrodes (8, 9) sont disposées en symétrie par rapport à un plan médian coupant perpendiculairement les plaques latérales (1)
- Piège à ions ICR selon l'une des revendications précédentes, caractérisé en ce que la distance entre deux plaques latérales opposées (1) respectives est comprise entre 1 cm et 10 cm, la distance entre les plaques terminales (5, 6) entre 1 cm et 15 cm, et la distance entre chaque plaque terminale (5 ou 6) et la plaque supplémentaire d'électrode (8 ou 9) qui en est respectivement la plus proche entre 1 cm et 10 cm.
- Piège à ions ICR selon l'une des revendications précédentes, caractérisé en ce qu'on applique des potentiels collecteurs compris entre -5 V et +5 V.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE3821998 | 1988-06-30 | ||
DE3821998A DE3821998A1 (de) | 1988-06-30 | 1988-06-30 | Icr-ionenfalle |
PCT/EP1989/000751 WO1990000309A1 (fr) | 1988-06-30 | 1989-06-28 | Piege a ions icr |
Publications (2)
Publication Number | Publication Date |
---|---|
EP0378648A1 EP0378648A1 (fr) | 1990-07-25 |
EP0378648B1 true EP0378648B1 (fr) | 1995-05-24 |
Family
ID=6357562
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP89907696A Expired - Lifetime EP0378648B1 (fr) | 1988-06-30 | 1989-06-28 | Piege a ions icr |
Country Status (5)
Country | Link |
---|---|
US (2) | US4982087A (fr) |
EP (1) | EP0378648B1 (fr) |
JP (1) | JPH0668969B2 (fr) |
DE (2) | DE3821998A1 (fr) |
WO (1) | WO1990000309A1 (fr) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3821998A1 (de) * | 1988-06-30 | 1990-01-04 | Spectrospin Ag | Icr-ionenfalle |
US5206506A (en) * | 1991-02-12 | 1993-04-27 | Kirchner Nicholas J | Ion processing: control and analysis |
US5389784A (en) * | 1993-05-24 | 1995-02-14 | The United States Of America As Represented By The United States Department Of Energy | Ion cyclotron resonance cell |
US5536642A (en) * | 1993-09-09 | 1996-07-16 | Barbera-Guillem; Emilio | Diagnostic and prognostic methods for solid non-lymphoid tumors and their metastases |
US7026613B2 (en) * | 2004-01-23 | 2006-04-11 | Thermo Finnigan Llc | Confining positive and negative ions with fast oscillating electric potentials |
US7206700B2 (en) * | 2004-07-23 | 2007-04-17 | Baylor University | Method and machine for identifying a chemical compound |
US8334506B2 (en) * | 2007-12-10 | 2012-12-18 | 1St Detect Corporation | End cap voltage control of ion traps |
US7973277B2 (en) * | 2008-05-27 | 2011-07-05 | 1St Detect Corporation | Driving a mass spectrometer ion trap or mass filter |
US8304715B2 (en) * | 2010-04-07 | 2012-11-06 | Science & Engineering Services, Inc. | Ion cyclotron resonance mass spectrometer system and a method of operating the same |
US8927943B2 (en) * | 2011-09-20 | 2015-01-06 | Korea Basic Science Institute | Device for obtaining the ion source of a mass spectrometer using an ultraviolet diode and a CEM |
DE102015208188A1 (de) * | 2015-05-04 | 2016-11-24 | Carl Zeiss Smt Gmbh | Verfahren zur massenspektrometrischen Untersuchung eines Gases und Massenspektrometer |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0215011A1 (fr) * | 1985-02-11 | 1987-03-25 | Nicolet Instrument Corp | Spectrometre de masse a piegeage magnetique. |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4581533A (en) * | 1984-05-15 | 1986-04-08 | Nicolet Instrument Corporation | Mass spectrometer and method |
US4686365A (en) * | 1984-12-24 | 1987-08-11 | American Cyanamid Company | Fourier transform ion cyclothon resonance mass spectrometer with spatially separated sources and detector |
DE3538407A1 (de) * | 1985-10-29 | 1987-04-30 | Spectrospin Ag | Ionen-zyklotron-resonanz-spektrometer |
DE3821998A1 (de) * | 1988-06-30 | 1990-01-04 | Spectrospin Ag | Icr-ionenfalle |
-
1988
- 1988-06-30 DE DE3821998A patent/DE3821998A1/de active Granted
-
1989
- 1989-06-28 EP EP89907696A patent/EP0378648B1/fr not_active Expired - Lifetime
- 1989-06-28 JP JP1507224A patent/JPH0668969B2/ja not_active Expired - Fee Related
- 1989-06-28 US US07/460,938 patent/US4982087A/en not_active Expired - Fee Related
- 1989-06-28 WO PCT/EP1989/000751 patent/WO1990000309A1/fr active IP Right Grant
- 1989-06-28 DE DE58909253T patent/DE58909253D1/de not_active Expired - Fee Related
-
1990
- 1990-12-12 US US07/612,481 patent/US5089702A/en not_active Expired - Lifetime
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0215011A1 (fr) * | 1985-02-11 | 1987-03-25 | Nicolet Instrument Corp | Spectrometre de masse a piegeage magnetique. |
Also Published As
Publication number | Publication date |
---|---|
US5089702A (en) | 1992-02-18 |
EP0378648A1 (fr) | 1990-07-25 |
DE58909253D1 (de) | 1995-06-29 |
DE3821998A1 (de) | 1990-01-04 |
JPH0668969B2 (ja) | 1994-08-31 |
DE3821998C2 (fr) | 1991-12-12 |
US4982087A (en) | 1991-01-01 |
WO1990000309A1 (fr) | 1990-01-11 |
JPH03501187A (ja) | 1991-03-14 |
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