EP0122129B1 - Process for sealing anodised aluminium - Google Patents

Process for sealing anodised aluminium Download PDF

Info

Publication number
EP0122129B1
EP0122129B1 EP84302358A EP84302358A EP0122129B1 EP 0122129 B1 EP0122129 B1 EP 0122129B1 EP 84302358 A EP84302358 A EP 84302358A EP 84302358 A EP84302358 A EP 84302358A EP 0122129 B1 EP0122129 B1 EP 0122129B1
Authority
EP
European Patent Office
Prior art keywords
acid
process according
sealing
bath
smut
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
EP84302358A
Other languages
German (de)
French (fr)
Other versions
EP0122129A3 (en
EP0122129A2 (en
Inventor
Stanley Renton
Kenneth Urmston Holker
John Richard Collier
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Solvay Solutions UK Ltd
Original Assignee
Albright and Wilson Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Albright and Wilson Ltd filed Critical Albright and Wilson Ltd
Priority to AT84302358T priority Critical patent/ATE45396T1/en
Publication of EP0122129A2 publication Critical patent/EP0122129A2/en
Publication of EP0122129A3 publication Critical patent/EP0122129A3/en
Application granted granted Critical
Publication of EP0122129B1 publication Critical patent/EP0122129B1/en
Expired legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D11/00Electrolytic coating by surface reaction, i.e. forming conversion layers
    • C25D11/02Anodisation
    • C25D11/04Anodisation of aluminium or alloys based thereon
    • C25D11/18After-treatment, e.g. pore-sealing
    • C25D11/24Chemical after-treatment
    • C25D11/246Chemical after-treatment for sealing layers

Definitions

  • This invention relates to a novel process for the treatment of anodised aluminium surfaces by immersing them in aqueous liquors.
  • the resistance of the surface of aluminium and aluminium alloys to corrosion and abrasion is conventionally improved by subjecting them to anodic oxidation so as to form a substantially anhydrous layer of adherent aluminium oxide.
  • Surfaces which have been subjected to this treatment are referred to as having been "anodised".
  • the anodising treatment can be carried out in a variety of ways, for example, by the application of direct current in dilute aqueous solutions of sulphuric acid, or organic acids such as oxalic acid or mixtures thereof with sulphuric acid. These coatings can be coloured by immersion in a solution of a suitable dye or by treatment with alternating current in an electrolyte containing metal salts.
  • the anodising can be carried out in solutions of organic acids such as sulphophthalic acid or sulphosalicyclic acid or mixtures thereof with sulphuric acid.
  • the oxidised layer formed by these anodising treatments has a porous structure and is insufficiently durable to fully protect the metal surface.
  • the anodised metal is usually subjected to a further treatment known as sealing.
  • Sealing is usually carried out by immersing the metal in hot or boiling water, which process is believed to cause the hydration of the substantially anhydrous aluminium oxide in the anodised layer thus causing a swelling of that layer which serves to seal the pores in its structure. Whatever the mechanism, the durability of the anodised surfaces is considerably increased by sealing.
  • the pH of a sealing bath is normally maintained within the range 5.5 to 6.5 and sealing times of from 2 to 4 minutes per micrometer of thickness of the anodised layer are required to obtain adequate sealing (see for example The Technology of Anodising Aluminium by A. W. Brace and P. G. Sheasby publishers Technicopy Ltd., 2nd edition, 1979, p 224-5.
  • anti-smutting additives a variety of additives to the sealing bath which are claimed to inhibit the formation of smut have been described, which additives will hereinafter be referred to as "anti-smutting additives".
  • anti-smutting additives examples include the compounds disclosed in British Patents 1265465, 1302288, 1368336, 1398589, 1419957, 1574161 and British Patent Application 2104921.
  • British Patent 1574161 mentions that the sealing bath, in which the additives described therein are used, may have a pH of 4-8.
  • our invention provides a process for the hydrothermal sealing of anodised aluminium which comprises immersing the anodised surface in an aqueous medium at a temperature of at least 80°C wherein satisfactory sealing is effected without the formation of any substantial quantity of smut whilst immersing the surface in the aqueous medium for a period of not more than 2 minutes per micrometer of the thickness of the anodised layer and maintaining the pH of the aqueous medium at a value of at least 7.0 and ensuring that the medium contains an effective quantity of a smut inhibiting additive.
  • the additives which are useful in the process of this invention are "anti-smutting additives" in that they are selected so as to avoid the formation of smut during the novel alkaline sealing process. They are distinguished from the known "anti-smutting additives" in that not all of the known additives are effective in the novel alkaline sealing process and in that the smut-inhibiting additives need not be effective as anti-smutting additives in the acidic sealing processes of the prior art. For reasons of clarity the term "smut-inhibiting additives" will be used hereafter in relation to those additives which are effective in the novel sealing process of this invention.
  • the sealing process of the present invention is advantageous in that it is carried out under such conditions that a sealed coating of acceptable quality which is free from smut is obtained in a shorter time than is attainable using comparable known sealing processes. Since the sealing bath must be maintained at an elevated temperature the energy required of the process is considerably reduced without the need to chemically or mechanically remove the smut.
  • the present invention provides a sealing process wherein satisfactory sealing is achieved in not more than 2 minutes per micrometer of thickness of the anodised layer advantageously less than 1.5 minutes, preferably less than 1.25 and more preferably less than 1.00 minutes per micrometer at bath temperatures of 95°C or above. The rate of sealing may be less than this if the process is carried out at temperatures of less than 95°C.
  • the temperature of the sealing bath will be at least 80°C since the rate of sealing at lower temperatures than this is unacceptably slow.
  • the seating temperature is preferably between 95°C and the boiling point of the bath. Pressurised systems in which the temperature may be above 100°C, e.g. 110°C or even 115°C may be employed.
  • a smut-free product is one upon which no smut is visually detectable. Products which are deemed “smut-free” may carry small particles of smut which are detectable by careful scrutiny, but which do not detract from the appearance of.the sealed article as a whole.
  • the process of the present invention is carried out under such conditions so as to seal the product to the desired degree.
  • Anodised aluminium which is to be used in architecture and exposed to weathering will normally be sealed as efficiently as is practicable in order to maximise its corrosion resistance.
  • the quality of sealing may be evaluated using one or more of three classes of standard tests; the weight loss in acid test, the dyespot test and the conductivity test. These tests can be carried out using the following techniques.
  • the criterion used to evaluate the quality of the seal is an at least adequate performance in the weight loss in acid test.
  • the pH of the sealing bath is at least 7.0 and more preferably at least 7.5 or 8.0. Higher pH's promote the rapid sealing of the anodised coating but may have detrimental effects upon the quality of that coating and also may encourage the formation of smut.
  • the maximum pH of the bath will vary with its composition and the temperature of operation, but will generally be below 10.0, preferably below 9.5 and most preferably below 9.0. Thus, preferably, the pH of the sealing bath will be maintained at a value in the range 7.0 to 9.0, e.g. 7.5 to 8.5.
  • the compounds which are effective smut-inhibiting agents in the sealing process of the present invention must be water soluble and must not adversely effect the quality of the seal.
  • Compounds which inhibit crystal growth in alkaline aqueous media when present in threshold quantities e.g. from 1 to 1000 ppm are potentially valuable as smut-inhibiting additives although not all known threshold treatment agents are useful as smut-inhibiting additives in the process of the present invention either because they do not inhibit smut formation or because they retard the sealing process.
  • Smut inhibiting additives which may be useful in the process of the present invention can be selected from the group comprising dextrins (including commercial dextrins, especially those having a viscosity of 50 to 400 cP in 50% by weight solution at 20°C as measured with a Brookfield rotary viscometer, e.g.
  • acrylic acid, methacrylic acid and water soluble polymers derived therefrom especially those polymers having a specific viscosity of up to 0.75 cP measured at 20°C in 2N caustic soda and at a concentration of 0.7%, e.g.
  • acids such as cycloaliphatic or aromatic polycarboxylic acid having from 4 to 6 carboxylic acid groups per molecule such as benzene penta carboxylic acid, benzene tetracarboxylic acid, benzene hexacarboxylic acid, cyclohexane tetracarboxylic acid and cyclohexane hexacarboxylic acid (in any of their various isomeric forms) or a water soluble salt thereof, e.g.
  • alkali metal, alkaline earth metal ammonium and alkanolamine salts especially those described in British Patent 1574161, certain hydroxy carboxylic acids for example gallic acid and saccharic acid; the reaction products of one or more sulphonated aromatic compounds with an aldehyde and/or dimethylol urea or a mixture of formaldehyde and urea (including all those which are described or disclosed in British Patent Application 2104921
  • Other compounds which may be useful as smut-inhibiting additives include water-soluble phosphonic acids or one or more water-soluble salts of such acid each of which acid or salt forms one or more complexes with a divalent metal.
  • water-soluble phosphonic acids or one or more water-soluble salts of such acid each of which acid or salt forms one or more complexes with a divalent metal.
  • a relatively large number of phosphonic acids are known which form complexes with divalent metals.
  • R represents a phenyl residue or alkyl residue with 1 to 5 carbon atoms
  • R, and R 2 each represent a hydrogen atom or alkyl residue with 1 to 4 carbon atoms
  • R 3 represent a hydrogen atom or alkyl residue with 1 to 4 carbon atoms or a phenyl residue or those of the formula in which X and Y each represents a hydrogen atom or an alkyl residue with 1 to 4 carbon atoms
  • R 4 represents a P0 3 H 2 group or an alkyl group having from 1 to 18 carbon atoms or a group of the formula where n is zero or an integer having a value of from 1 to 5 and X and Y are as hereinbefore defined. or wherein X and Y are as hereinbefore defined wherein R 5 represents a hydrogen atom, a methyl group or a -CH2-CHz-COOH group.
  • hydroxyalkanediphosphonic acids of Formula 1 which may be used are 1-hydroxypropane-, 1-hydroxybutane-, 1-hydroxypentane- and 1-hydroxyhexane-1,1-diphosphonic acid as well as 1-hydroxy-1-phenylmethane-1,1-diphosphonic acid and preferably 1-hydroxyethane-1,1-diphosphonic acid.
  • phosphonic acids of the general formula 11 are 1-aminoethane-, 1-amino-1-phenylmethane-, dimethylaminoethane-, propyl- and butyl-aminoethane-1,1-diphosphonic acid.
  • Examples of phosphonic acids of formula 111 are aminotrimethylene phosphonic acid, hexamethylenediaminetetra(methylene phosphonic) acid, ethylenediaminotetramethylenephosphonic acid, diethylenetriaminopentamethylene- phosphonic acid, n-propylimino bis (methylene phosphonic) acid and aminotri(2-propylene-2-phosphonic acid).
  • Examples of phosphonic acids of the general formula IV are phosphonosuccinic acid, 1-phosphono-1-methylsuccinic acid and 2-phosphonobutane-1,2,4 tricarboxylic acid.
  • Especially valuable smut-inhibiting additives for use in the present invention are the phosphonic acids, especially ethylenediaminotetramethylenephosphonic acid, hexamethylenediaminetetra(methylene phosphonic) acid, n-propyliminobis(methylene phosphonic) acid and benzene hexacarboxylic acid and salts thereof and the reaction products of sulphonated aromatic compounds with an aldehyde and/or dimethylolurea or a mixture of formaldehyde and urea especially those products formed by the reaction of the sulphonation products of diphenyl, phenyltoluene, dimethyldiphenyl, diphenylether, diphenylsulphide, diphenylsulphoxide, dihydroxydiphenylsulphone, diphenylene oxide, diphenylene sulphide and bis phenol with an aldehyde and/or dimethylolurea or a mixture or formaldehyde and ure
  • the preferred sulphonated aromatic compounds are sulphonated diphenyl, dimethyldiphenyl, diphenyl ether and additionally, when reacted with dimethylolurea (or a mixutre of formaldehyde and urea), unsubstituted phenol and cresol.
  • Preferred aldehydes used in the preparation of the reaction product are acetaldehyde and formaldehyde, more preferably formaldehyde.
  • the reaction product is formed with a mixture of formaldehyde and urea
  • the molar ratio of formaldehyde to urea is at least 2:1.
  • Preferred reaction products are those formed by the reaction of formaldehyde with a compound containing no halogen or hydroxyl groups, or the reaction of sulphonated phenols with dimethylolurea. More preferred is the reaction product of formaldehyde with a compound of formula V in which R represents a hydrogen atom an alkyl group having 1 to 4 carbon atoms, a hydroxyl group or a halogen atom X represents a direct bond or a group of the formula and n has an average value in the range 1 to 4.
  • the mixture to form the reaction product is sulphonated phenol, cresol or naphthol with dimethylolurea (or a mixture of formaldehyde and urea) further compounds such as phenols and naphthols may be included into the product by polymerisation with formaldehyde.
  • the sulphonated aromatic compounds are known and may be made according to known methods.
  • reaction of a compound of formula V with formaldehyde or. dimethylolurea is known and may be carried out in accordance with known methods.
  • the phosphonic acid smut-inhibiting additives must be used in combination with a divalent metal ion M2+ in a molar ratio of at least 2M 2+ :1 phosphonate group in order to be effective, i.e. the molar proportion of divalent metal ions must be at least sufficient as is theoretically required to form a complex with all of the phosphonate groups present. If the necessary quantity of divalent metal ions is not present in the sealing bath, e.g. in the form of calcium and magnesium salts dissolved in tap water, it is necessary to add a sufficient quantity of a soluble salt of a divalent metal to raise the molar ratio of metal ions to phosphonate groups to at least 2: 1. Preferably the molar ratio of divalent metal ions to phosphonate group is at least 4: 1.
  • divalent metal ions appear to deactivate the phosphonate. Where this effect is observed a sufficient quantity of phosphonate can be added which will form a complex with the deactivating metal ion. Thereafter the addition of a further quantity of phosphonate together with the appropriate quantity of a salt of an acceptable divalent metal will be effective in inhibiting smut formation.
  • salts of calcium magnesium, nickel or cobalt are examples of ions which may be deactivate the phosphonate and whose presence is thereby less preferred.
  • ferric ions and cupric ions are ferric ions and cupric ions.
  • ions which complex strongly with the phosphonate appear to deactivate it as a smut-inhibiting agent and their presence is correspondingly less preferred.
  • the use of ethylenediamino tetramethylene phosphonic acid or its water soluble salts as a smut-inhibiting agent especially its magnesium salt is particularly preferred.
  • the quantity of anti-smutting agent which is present in the bath varies with the nature of that agent.
  • the quantity which is sufficient to suppress smut formation in a particular sealing process and the minimum effective quantity will normally be determined empirically.
  • the formation of a sealed anodised surface of a satisfactory quality is accompanied by the formation of smut it is necessary to adjust one or more of the parameters which effect the efficiency of the bath, e.g. by increasing quantity of smut-inhibiting additive in the bath or to select a more effective smut-inhibiting additive.
  • the quantity of some of the preferred anti-smutting agents e.g. benzene hexacarboxylic acid, 1-hydroxyethane-1-1 diphosphonic acid, and ethylenediaminotetramethylenephosphonic acid will be in the range 1 to 500 ppm of the bath, e.g. 2 to 300 and more preferably 5 to 200 ppm of the bath.
  • the reaction product of sulphonated aromatic compounds with an aldehyde and/or dimethylolurea (or a mixture of formaldehyde and urea) will preferably be present in a quantity of from 0.01 to 5.0 gms/litre of the bath.
  • the effective quantity will vary according to the anti-smutting agent which is selected and will normally be determined empirically under the conditions which are to be employed in the sealing process.
  • the quantity will be from 5 to 500 ppm in the case of benzene hexacarboxylic acid, from 5 to 100 ppm in the case of ethylenediaminotetramethylenephosphonic acid.
  • the use of excessive quantities of anti-smutting additives may have a detrimental effect upon the quality of the anodised coating and is thereby preferably avoided. Where the pH of the bath is relatively high the maximum amount of a particular anti-smutting agent which may be tolerated without damage to the anodised coating will be increased.
  • the preferred bases for present use are Lewis bases. Examples of suitable bases are triethanolamine, sodium borate, sodium carbonate, sodium bicarbonate, mono-ethanolamine, diethanolamine and hexamine or mixtures thereof. The most preferred base for present use is triethanolamine. Commercial grades of triethanolamine which contain minor quantities of diethanolamine and monoethanolamine may be used if desired. The addition of a base which might inhibit the sealing process should preferably be avoided. Thus, bases which liberate phosphate silicate and fluoride ions on dissolution in water are preferably not employed.
  • the sealing process of the present invention may be carried out in demineralised water or in tap water.
  • demineralised water is advantageous in that the sealing process is more likely to proceed without complication.
  • the bath will inevitably become contaminated by the carry-over of material from previous processing steps, e.g. the anodising bath and subsequent rinsing steps. Although a certain amount of this contamination may be tolerated the efficiency of the sealing process is decreased and eventually the bath must be discarded.
  • the use of tap water to make up the bath may be disadvantageous in that the minerals which are dissolved in it may affect the efficiency of the sealing process.
  • the presence of dissolved minerals may also lead to the precipitation of solid material in the sealing bath which can form an unsightly crusted coating upon the anodised surface.
  • This tendency is most common when the anti-smutting agent comprises a phosphonic acid or a phosphonate as hereinbefore described.
  • the deposited solids can usually be removed by rinsing with water, it is preferred to operate the sealing bath under such conditions as will avoid the need for such a rinsing step. We have discovered that this tendency to the formation of solid material can be reduced by the addition of a surface active agent to the bath.
  • the quantity of such a compound may vary through a wide range say 1 ppm to 10 gms/litre.
  • the preferred additive is carboxymethylcellulose, hereinafter referred to as CMC.
  • CMC carboxymethylcellulose
  • the addition of from 5 ppm to 100 ppm of CMC will often be sufficient to prevent the formation of solid material in the bath.
  • the sealing bath may also contain conventional additives e.g. additives which are known to inhibit the leaching of dye such as nickel acetate.
  • the bath may also advantageously contain a wetting agent, the presence of which enhances the efficiency of the sealing process. Relatively small quantities of wetting agent, say wetting agent, say from 2.0 to 2000 ppm of the bath may be employed.
  • wetting agent say wetting agent
  • the efficient operation of the bath may be prolonged by the addition of an agent which is capable of complexing with the metal.
  • An example of a suitable agent is citric acid.
  • Such agents may be effective when present in quantities which are significantly less than would be required to complex the metal ions which are present in the bath.
  • the baths may also advantageously contain a buffering agent to assist the control of the pH.
  • Suitable buffering agents include salts of acetic acid and formic acid.
  • the various ingredients of the sealing bath may be added separately if so desired. It is preferred by way of convenience to formulate the various additives as a separate concentrate and then add that concentrate to the bath. Concentrates, when added to water, form a sealing bath useful in the process of the present invention.
  • Such concentrates comprise at least one anti-smutting agent, as hereinbefore defined, and at least one base, as hereinbefore defined.
  • Optional ingredients include salts of organic acids such as acetic acid to regulate the pH thereof, other additives such as nickel acetate and any other compatible ingredients of the bath.
  • Additives such as nickel acetate are preferably solubilised in the concentrate e.g. by the addition of triethanolamine to form a water soluble complex.
  • the pH of the sealing bath is established by the addition of such a concentrate to water and maintained within the desired limits by the addition of further quantities of reagents as the sealing operation progresses.
  • sealing baths were assessed using the methods hereinbefore described and in addition by visually inspecting the sealed product the visible presence of any velvety bloom being regarded as unsatisfactory.
  • the pieces used were formed of Type 6063 aluminium alloy which had been alkaline etched (5% NaOH + additives) and anodised in sulphuric acid (175 gms/litre at 18-20 0 C and 1.5A/dm 2 ) to provide an anodic film of 20 microns thickness.
  • Demineralised water with mellitic acid (benzene hexacarboxylic acid) added in the quantities shown.
  • the pH of the bath was raised by the addition of triethanolamine.
  • the first two results illustrate comparative procedures.
  • the seal obtained in the time used is not of adequate quality.
  • the third result is an Example according to the invention showing satisfactory sealing is obtained in a significantly shorter time.
  • the sealing time was 1 min/micrometer.
  • ANADOL SH1 is an aqueous solution comprising a reaction product of a sulphonated aromatic compound with an aldehyde or dimethylolurea (or a mixture of formaldehyde and urea).

Landscapes

  • Chemical & Material Sciences (AREA)
  • General Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Rigid Containers With Two Or More Constituent Elements (AREA)
  • Preventing Corrosion Or Incrustation Of Metals (AREA)
  • Sealing Material Composition (AREA)
  • Catalysts (AREA)
  • Shaping Metal By Deep-Drawing, Or The Like (AREA)
  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
  • Road Signs Or Road Markings (AREA)
  • Resistance Heating (AREA)
  • Electrochemical Coating By Surface Reaction (AREA)
  • Casings For Electric Apparatus (AREA)
  • Gasket Seals (AREA)

Abstract

Processes for sealing anodised aluminium carried out in a bath having a pH of at least 7 and in the presence of a smut,inhibiting additive have been discovered to give rapid, efficient sealing without the formation of bloom. Examples of smut-inhibiting additives are phosphonates, benzene hexacarboxylic acid, and the reaction products of an aldehyde or dimethylol urea with sulphonated aromatic compounds. The reduction in time required for sealing reduces energy consumption in the anodising operation.

Description

  • This invention relates to a novel process for the treatment of anodised aluminium surfaces by immersing them in aqueous liquors.
  • The resistance of the surface of aluminium and aluminium alloys to corrosion and abrasion is conventionally improved by subjecting them to anodic oxidation so as to form a substantially anhydrous layer of adherent aluminium oxide. Surfaces which have been subjected to this treatment are referred to as having been "anodised". The anodising treatment can be carried out in a variety of ways, for example, by the application of direct current in dilute aqueous solutions of sulphuric acid, or organic acids such as oxalic acid or mixtures thereof with sulphuric acid. These coatings can be coloured by immersion in a solution of a suitable dye or by treatment with alternating current in an electrolyte containing metal salts. Alternatively, the anodising can be carried out in solutions of organic acids such as sulphophthalic acid or sulphosalicyclic acid or mixtures thereof with sulphuric acid.
  • The oxidised layer formed by these anodising treatments has a porous structure and is insufficiently durable to fully protect the metal surface. For this reason the anodised metal is usually subjected to a further treatment known as sealing. Sealing is usually carried out by immersing the metal in hot or boiling water, which process is believed to cause the hydration of the substantially anhydrous aluminium oxide in the anodised layer thus causing a swelling of that layer which serves to seal the pores in its structure. Whatever the mechanism, the durability of the anodised surfaces is considerably increased by sealing.
  • One attendant disadvantage of sealing processes is that the treatment affects not only the pores in the oxide layer but also the surface of that layer. Sealed surfaces tend to have a layer of loosely adherent material formed at their surface, which layer is visually unattractive and also detracts from the useful properties of the metal. This surface layer which is commonly termed "smut" is usually removed prior to sale by mechanical or chemical treatment. The use of an alkaline sealing bath is known to significantly accelerate the sealing process, but the problem of smut formation worsens as the alkalinity increases and sealing is normally carried out in baths which are slightly acidic, e.g. the pH of a sealing bath is normally maintained within the range 5.5 to 6.5 and sealing times of from 2 to 4 minutes per micrometer of thickness of the anodised layer are required to obtain adequate sealing (see for example The Technology of Anodising Aluminium by A. W. Brace and P. G. Sheasby publishers Technicopy Ltd., 2nd edition, 1979, p 224-5. Recently in an attempt to overcome the problem of smut formation a variety of additives to the sealing bath which are claimed to inhibit the formation of smut have been described, which additives will hereinafter be referred to as "anti-smutting additives". Examples of anti-smutting additives are the compounds disclosed in British Patents 1265465, 1302288, 1368336, 1398589, 1419957, 1574161 and British Patent Application 2104921. British Patent 1574161 mentions that the sealing bath, in which the additives described therein are used, may have a pH of 4-8.
  • We have now discovered that the sealing of anodised coatings can be carried out rapidly and efficiently and without any significant smut formation by immersing the anodised surface in an aqueous medium containing an effective quantity of at least one selected smut inhibiting additive and having a pH of at least 7.0. Accordingly, from one aspect our invention provides a process for the hydrothermal sealing of anodised aluminium which comprises immersing the anodised surface in an aqueous medium at a temperature of at least 80°C wherein satisfactory sealing is effected without the formation of any substantial quantity of smut whilst immersing the surface in the aqueous medium for a period of not more than 2 minutes per micrometer of the thickness of the anodised layer and maintaining the pH of the aqueous medium at a value of at least 7.0 and ensuring that the medium contains an effective quantity of a smut inhibiting additive.
  • The additives which are useful in the process of this invention are "anti-smutting additives" in that they are selected so as to avoid the formation of smut during the novel alkaline sealing process. They are distinguished from the known "anti-smutting additives" in that not all of the known additives are effective in the novel alkaline sealing process and in that the smut-inhibiting additives need not be effective as anti-smutting additives in the acidic sealing processes of the prior art. For reasons of clarity the term "smut-inhibiting additives" will be used hereafter in relation to those additives which are effective in the novel sealing process of this invention.
  • The sealing process of the present invention is advantageous in that it is carried out under such conditions that a sealed coating of acceptable quality which is free from smut is obtained in a shorter time than is attainable using comparable known sealing processes. Since the sealing bath must be maintained at an elevated temperature the energy required of the process is considerably reduced without the need to chemically or mechanically remove the smut. The present invention provides a sealing process wherein satisfactory sealing is achieved in not more than 2 minutes per micrometer of thickness of the anodised layer advantageously less than 1.5 minutes, preferably less than 1.25 and more preferably less than 1.00 minutes per micrometer at bath temperatures of 95°C or above. The rate of sealing may be less than this if the process is carried out at temperatures of less than 95°C. Generally the temperature of the sealing bath will be at least 80°C since the rate of sealing at lower temperatures than this is unacceptably slow. The seating temperature is preferably between 95°C and the boiling point of the bath. Pressurised systems in which the temperature may be above 100°C, e.g. 110°C or even 115°C may be employed.
  • The process of the present invention is carried out under such conditions that no smut is formed during the sealing step. A smut-free product is one upon which no smut is visually detectable. Products which are deemed "smut-free" may carry small particles of smut which are detectable by careful scrutiny, but which do not detract from the appearance of.the sealed article as a whole.
  • The process of the present invention is carried out under such conditions so as to seal the product to the desired degree.
  • Anodised aluminium which is to be used in architecture and exposed to weathering will normally be sealed as efficiently as is practicable in order to maximise its corrosion resistance. The quality of sealing may be evaluated using one or more of three classes of standard tests; the weight loss in acid test, the dyespot test and the conductivity test. These tests can be carried out using the following techniques.
  • Methods for measuring these criteria are laid down in the relevant British Standards. The methods used in this disclosure are
    • (i) Weight loss in phosphoric/chromic acid - BS6161: Part 3:1981 (IS03210-1974). The maximum permissible loss in mass for the coating under test is commonly accepted at 30 mg/dm2.
    • (ii) Dye adsorption - BS6161: Part 5:1982 (ISO 2413-1981) - using Acid A and Dye B an intensity of stain of 2 or less (rated according to BS6161: Parts 5:1982) is satisfactory.
    • (iii) Electrical conductivity BS1615: 1972 Appendix G - to take account of the variations in the thickness of the anodic film the result is expressed as the product of the conductivity in microsiemens and the thickness of the coating in micrometers which to satisfy BS 1615 should be less than 500.
  • Satisfactory and preferred levels of performance in these tests are set out in the following table.
    Figure imgb0001
  • For the purpose of this disclosure the criterion used to evaluate the quality of the seal is an at least adequate performance in the weight loss in acid test.
  • The pH of the sealing bath is at least 7.0 and more preferably at least 7.5 or 8.0. Higher pH's promote the rapid sealing of the anodised coating but may have detrimental effects upon the quality of that coating and also may encourage the formation of smut. The maximum pH of the bath will vary with its composition and the temperature of operation, but will generally be below 10.0, preferably below 9.5 and most preferably below 9.0. Thus, preferably, the pH of the sealing bath will be maintained at a value in the range 7.0 to 9.0, e.g. 7.5 to 8.5.
  • The compounds which are effective smut-inhibiting agents in the sealing process of the present invention must be water soluble and must not adversely effect the quality of the seal. Compounds which inhibit crystal growth in alkaline aqueous media when present in threshold quantities, e.g. from 1 to 1000 ppm are potentially valuable as smut-inhibiting additives although not all known threshold treatment agents are useful as smut-inhibiting additives in the process of the present invention either because they do not inhibit smut formation or because they retard the sealing process.
  • Not all compounds are equally effective as smut-inhibitors. Under conditions which are known to favour the formation of smut, e.g. high alkalinity and high temperatures, some compounds will not adequately suppress the formation of smut even when present in large quantities. However, such compounds may function adequately under less onerous conditions or may be useful in combination with other smut-inhibiting additives which are more effective under particular conditions. Smut inhibiting additives which may be useful in the process of the present invention can be selected from the group comprising dextrins (including commercial dextrins, especially those having a viscosity of 50 to 400 cP in 50% by weight solution at 20°C as measured with a Brookfield rotary viscometer, e.g. as described in British Patent 1302288); acrylic acid, methacrylic acid and water soluble polymers derived therefrom, especially those polymers having a specific viscosity of up to 0.75 cP measured at 20°C in 2N caustic soda and at a concentration of 0.7%, e.g. those described in British Patent 1368336, and lignin sulphonates (including all those described in British Patent 1368336); acids such as cycloaliphatic or aromatic polycarboxylic acid having from 4 to 6 carboxylic acid groups per molecule such as benzene penta carboxylic acid, benzene tetracarboxylic acid, benzene hexacarboxylic acid, cyclohexane tetracarboxylic acid and cyclohexane hexacarboxylic acid (in any of their various isomeric forms) or a water soluble salt thereof, e.g. the alkali metal, alkaline earth metal ammonium and alkanolamine salts especially those described in British Patent 1574161, certain hydroxy carboxylic acids for example gallic acid and saccharic acid; the reaction products of one or more sulphonated aromatic compounds with an aldehyde and/or dimethylol urea or a mixture of formaldehyde and urea (including all those which are described or disclosed in British Patent Application 2104921
  • Other compounds which may be useful as smut-inhibiting additives include water-soluble phosphonic acids or one or more water-soluble salts of such acid each of which acid or salt forms one or more complexes with a divalent metal. A relatively large number of phosphonic acids are known which form complexes with divalent metals. It is preferred to use compounds which correspond to the following general formula:
    Figure imgb0002
    in which R represents a phenyl residue or alkyl residue with 1 to 5 carbon atoms, or those of the formula:
    Figure imgb0003
    in which R, and R2 each represent a hydrogen atom or alkyl residue with 1 to 4 carbon atoms, and R3 represent a hydrogen atom or alkyl residue with 1 to 4 carbon atoms or a phenyl residue or those of the formula
    Figure imgb0004
    in which X and Y each represents a hydrogen atom or an alkyl residue with 1 to 4 carbon atoms, R4 represents a P03H2 group or an alkyl group having from 1 to 18 carbon atoms or a group of the formula
    Figure imgb0005
    where n is zero or an integer having a value of from 1 to 5 and X and Y are as hereinbefore defined. or
    Figure imgb0006
    wherein X and Y are as hereinbefore defined
    Figure imgb0007
    wherein R5 represents a hydrogen atom, a methyl group or a -CH2-CHz-COOH group.
  • Examples of hydroxyalkanediphosphonic acids of Formula 1 which may be used are 1-hydroxypropane-, 1-hydroxybutane-, 1-hydroxypentane- and 1-hydroxyhexane-1,1-diphosphonic acid as well as 1-hydroxy-1-phenylmethane-1,1-diphosphonic acid and preferably 1-hydroxyethane-1,1-diphosphonic acid. Examples of phosphonic acids of the general formula 11 are 1-aminoethane-, 1-amino-1-phenylmethane-, dimethylaminoethane-, propyl- and butyl-aminoethane-1,1-diphosphonic acid. Examples of phosphonic acids of formula 111 are aminotrimethylene phosphonic acid, hexamethylenediaminetetra(methylene phosphonic) acid, ethylenediaminotetramethylenephosphonic acid, diethylenetriaminopentamethylene- phosphonic acid, n-propylimino bis (methylene phosphonic) acid and aminotri(2-propylene-2-phosphonic acid). Examples of phosphonic acids of the general formula IV are phosphonosuccinic acid, 1-phosphono-1-methylsuccinic acid and 2-phosphonobutane-1,2,4 tricarboxylic acid.
  • Especially valuable smut-inhibiting additives for use in the present invention are the phosphonic acids, especially ethylenediaminotetramethylenephosphonic acid, hexamethylenediaminetetra(methylene phosphonic) acid, n-propyliminobis(methylene phosphonic) acid and benzene hexacarboxylic acid and salts thereof and the reaction products of sulphonated aromatic compounds with an aldehyde and/or dimethylolurea or a mixture of formaldehyde and urea especially those products formed by the reaction of the sulphonation products of diphenyl, phenyltoluene, dimethyldiphenyl, diphenylether, diphenylsulphide, diphenylsulphoxide, dihydroxydiphenylsulphone, diphenylene oxide, diphenylene sulphide and bis phenol with an aldehyde and/or dimethylolurea or a mixture or formaldehyde and urea or where the sulphonated aromatic compound is a sulphonated derivative of phenol, cresol or naphthol the reaction products thereof with dimethylolurea or a mixture of formaldehyde and urea.
  • The preferred sulphonated aromatic compounds are sulphonated diphenyl, dimethyldiphenyl, diphenyl ether and additionally, when reacted with dimethylolurea (or a mixutre of formaldehyde and urea), unsubstituted phenol and cresol.
  • Preferred aldehydes used in the preparation of the reaction product are acetaldehyde and formaldehyde, more preferably formaldehyde.
  • Preferably where the reaction product is formed with a mixture of formaldehyde and urea, the molar ratio of formaldehyde to urea is at least 2:1.
  • Preferred reaction products are those formed by the reaction of formaldehyde with a compound containing no halogen or hydroxyl groups, or the reaction of sulphonated phenols with dimethylolurea. More preferred is the reaction product of formaldehyde with a compound of formula V
    Figure imgb0008
    in which R represents a hydrogen atom an alkyl group having 1 to 4 carbon atoms, a hydroxyl group or a halogen atom X represents a direct bond or a group of the formula
    Figure imgb0009
    and n has an average value in the range 1 to 4.
  • When the mixture to form the reaction product is sulphonated phenol, cresol or naphthol with dimethylolurea (or a mixture of formaldehyde and urea) further compounds such as phenols and naphthols may be included into the product by polymerisation with formaldehyde.
  • The sulphonated aromatic compounds are known and may be made according to known methods. For the sulphonation reaction of compounds of formula V one uses preferably 1-2 moles (more preferably 1.5 moles) of sulphuric acid per mole of the aromatic compound to be sulphonated at a temperature of from 80 to 180°C in the presence of a sulphonating medium.
  • The reaction of a compound of formula V with formaldehyde or. dimethylolurea is known and may be carried out in accordance with known methods.
  • The phosphonic acid smut-inhibiting additives must be used in combination with a divalent metal ion M2+ in a molar ratio of at least 2M2+:1 phosphonate group in order to be effective, i.e. the molar proportion of divalent metal ions must be at least sufficient as is theoretically required to form a complex with all of the phosphonate groups present. If the necessary quantity of divalent metal ions is not present in the sealing bath, e.g. in the form of calcium and magnesium salts dissolved in tap water, it is necessary to add a sufficient quantity of a soluble salt of a divalent metal to raise the molar ratio of metal ions to phosphonate groups to at least 2: 1. Preferably the molar ratio of divalent metal ions to phosphonate group is at least 4: 1.
  • In some instances certain divalent metal ions appear to deactivate the phosphonate. Where this effect is observed a sufficient quantity of phosphonate can be added which will form a complex with the deactivating metal ion. Thereafter the addition of a further quantity of phosphonate together with the appropriate quantity of a salt of an acceptable divalent metal will be effective in inhibiting smut formation. In general we prefer to use salts of calcium magnesium, nickel or cobalt as the divalent metal salt. Examples of ions which may be deactivate the phosphonate and whose presence is thereby less preferred are ferric ions and cupric ions. In general ions which complex strongly with the phosphonate appear to deactivate it as a smut-inhibiting agent and their presence is correspondingly less preferred. The use of ethylenediamino tetramethylene phosphonic acid or its water soluble salts as a smut-inhibiting agent especially its magnesium salt is particularly preferred.
  • The quantity of anti-smutting agent which is present in the bath varies with the nature of that agent. The quantity which is sufficient to suppress smut formation in a particular sealing process and the minimum effective quantity will normally be determined empirically. When the formation of a sealed anodised surface of a satisfactory quality is accompanied by the formation of smut it is necessary to adjust one or more of the parameters which effect the efficiency of the bath, e.g. by increasing quantity of smut-inhibiting additive in the bath or to select a more effective smut-inhibiting additive.
  • By way of example, the quantity of some of the preferred anti-smutting agents e.g. benzene hexacarboxylic acid, 1-hydroxyethane-1-1 diphosphonic acid, and ethylenediaminotetramethylenephosphonic acid will be in the range 1 to 500 ppm of the bath, e.g. 2 to 300 and more preferably 5 to 200 ppm of the bath. The reaction product of sulphonated aromatic compounds with an aldehyde and/or dimethylolurea (or a mixture of formaldehyde and urea) will preferably be present in a quantity of from 0.01 to 5.0 gms/litre of the bath. The effective quantity will vary according to the anti-smutting agent which is selected and will normally be determined empirically under the conditions which are to be employed in the sealing process. For the preferred anti-smutting agents the quantity will be from 5 to 500 ppm in the case of benzene hexacarboxylic acid, from 5 to 100 ppm in the case of ethylenediaminotetramethylenephosphonic acid. The use of excessive quantities of anti-smutting additives may have a detrimental effect upon the quality of the anodised coating and is thereby preferably avoided. Where the pH of the bath is relatively high the maximum amount of a particular anti-smutting agent which may be tolerated without damage to the anodised coating will be increased.
  • In order to maintain the pH of the sealing bath above 7.0 and preferably within the preferred ranges set out above, it will usually be necessary to add a quantity of a water-soluble base to the sealing bath. The preferred bases for present use are Lewis bases. Examples of suitable bases are triethanolamine, sodium borate, sodium carbonate, sodium bicarbonate, mono-ethanolamine, diethanolamine and hexamine or mixtures thereof. The most preferred base for present use is triethanolamine. Commercial grades of triethanolamine which contain minor quantities of diethanolamine and monoethanolamine may be used if desired. The addition of a base which might inhibit the sealing process should preferably be avoided. Thus, bases which liberate phosphate silicate and fluoride ions on dissolution in water are preferably not employed.
  • The sealing process of the present invention may be carried out in demineralised water or in tap water. The use of demineralised water is advantageous in that the sealing process is more likely to proceed without complication. However, in a commercial operating process the bath will inevitably become contaminated by the carry-over of material from previous processing steps, e.g. the anodising bath and subsequent rinsing steps. Although a certain amount of this contamination may be tolerated the efficiency of the sealing process is decreased and eventually the bath must be discarded.
  • The use of tap water to make up the bath may be disadvantageous in that the minerals which are dissolved in it may affect the efficiency of the sealing process. The presence of dissolved minerals may also lead to the precipitation of solid material in the sealing bath which can form an unsightly crusted coating upon the anodised surface. This tendency is most common when the anti-smutting agent comprises a phosphonic acid or a phosphonate as hereinbefore described. Although the deposited solids can usually be removed by rinsing with water, it is preferred to operate the sealing bath under such conditions as will avoid the need for such a rinsing step. We have discovered that this tendency to the formation of solid material can be reduced by the addition of a surface active agent to the bath. The quantity of such a compound may vary through a wide range say 1 ppm to 10 gms/litre. The preferred additive is carboxymethylcellulose, hereinafter referred to as CMC. The addition of from 5 ppm to 100 ppm of CMC will often be sufficient to prevent the formation of solid material in the bath.
  • The sealing bath may also contain conventional additives e.g. additives which are known to inhibit the leaching of dye such as nickel acetate. The bath may also advantageously contain a wetting agent, the presence of which enhances the efficiency of the sealing process. Relatively small quantities of wetting agent, say wetting agent, say from 2.0 to 2000 ppm of the bath may be employed. Where heavy metal ions are present in the bath whether by addition, e.g. of tap water or by contamination from other parts of the anodising plant, which ions interfere with the efficiency of the sealing process, the efficient operation of the bath may be prolonged by the addition of an agent which is capable of complexing with the metal. An example of a suitable agent is citric acid. Such agents may be effective when present in quantities which are significantly less than would be required to complex the metal ions which are present in the bath. The baths may also advantageously contain a buffering agent to assist the control of the pH. Suitable buffering agents include salts of acetic acid and formic acid.
  • The various ingredients of the sealing bath may be added separately if so desired. It is preferred by way of convenience to formulate the various additives as a separate concentrate and then add that concentrate to the bath. Concentrates, when added to water, form a sealing bath useful in the process of the present invention.
  • Such concentrates comprise at least one anti-smutting agent, as hereinbefore defined, and at least one base, as hereinbefore defined. Optional ingredients include salts of organic acids such as acetic acid to regulate the pH thereof, other additives such as nickel acetate and any other compatible ingredients of the bath. Additives such as nickel acetate are preferably solubilised in the concentrate e.g. by the addition of triethanolamine to form a water soluble complex.
  • In a preferred embodiment of the process of the present invention the pH of the sealing bath is established by the addition of such a concentrate to water and maintained within the desired limits by the addition of further quantities of reagents as the sealing operation progresses.
  • The invention is illustrated by the following examples:-
  • In the Examples the sealing baths were assessed using the methods hereinbefore described and in addition by visually inspecting the sealed product the visible presence of any velvety bloom being regarded as unsatisfactory.
  • In these examples the pieces used were formed of Type 6063 aluminium alloy which had been alkaline etched (5% NaOH + additives) and anodised in sulphuric acid (175 gms/litre at 18-200C and 1.5A/dm2) to provide an anodic film of 20 microns thickness.
  • Each test was carried out on uncoloured specimens for measurement of sealing quality and on replicate specimens which were black dyed prior to sealing (using standard anodising dye) to aid detection of surface films of bloom.
  • Example 1 Comparative
  • (A) Standard Demineralised Water Sealing pH of bath = 6.0. Bath Temperature = 98°C
    Figure imgb0010
  • Comparative
  • (B) Demineralised Water + 2 mls/litre triethanolamine adjust to pH 8.0 with acetic acid pH of bath = 8.0. Bath Temperature = 98°C
    Figure imgb0011
  • Smut formed after less than 0.5 min/micrometer.
  • Example of Invention
  • (C) To the bath of (B) was added 20 ppm of the ammonium salt of ethylenediamine-tetra (methylenephosphonic) acid and 10 ppm of nickel in the form of nickel sulphate.
    Figure imgb0012
  • x comparison.
  • No smut observed.
  • Example 2 . Comparative
  • (A) South Staffordshire Tap Water of total hardness expressed as CaC03 of 150 ppm. pH of bath = 6.0. Bath Temperature = 98°C
    Figure imgb0013
  • Smut present throughout
  • Examples of Invention
  • (B) To the bath used in (A) was added 2 mls/litre of triethanolamine and 40 ppm of ethylenediamine tetra (methylenephosphonic) acid. ph of bath = 8.2. Bath Temperature = 98°C
    Figure imgb0014
  • x comparison
  • No smut observed
  • Example 3
  • Demineralised water with mellitic acid (benzene hexacarboxylic acid) added in the quantities shown. The pH of the bath was raised by the addition of triethanolamine.
    Figure imgb0015
  • The first two results illustrate comparative procedures. The seal obtained in the time used is not of adequate quality. The third result is an Example according to the invention showing satisfactory sealing is obtained in a significantly shorter time.
  • Example 4 Comparative
  • Demineralised water with ethylene diamine tetrakis (methylene phosphonic) acid. EDTMPA added as a smut-inhibitor. pH = 8.3. Sealing Time = 1 min/micrometer.
    Figure imgb0016
  • These results show that the phosphonate is ineffective as a smut-inhibitor in the absence of divalent metal ions.
  • Example of Invention
  • Sufficient magnesium salt added to provide a molar ratio of EDTMPA: Mg2+ of 1:4.
    Figure imgb0017
    x comparative
  • These results show that the phosphonate is effective as a smut-inhibitor in the presence of divalent metal ions.
  • The results at a concentration of 60 mg/litre illustrate the reduction of the quality of the seal produced by excessive quantities of smut-inhibitor and how this effect can be overcome by raising the pH of the bath.
  • Example 5 (of Invention)
  • A set quantity of one of three phosphonates A, B and C was added to a sealing bath comprising demineralised water together with sufficient magnesium ion to give a molar ratio of phosphonate:Mg = 1:4. The sealing time was 1 min/micrometer.
    • A = Hexamethylenediaminetetrakis (methylene phosphonic) acid.
    • B = Diethylenetriaminepentakis (methylene phosphonic) acid.
    • C = n-propyliminobis(methylenephonic) acid.
      Figure imgb0018
    Example 6
  • A commercial product sold under the Trade Name ANODAL SH1 * by the Sandoz Company was added to demineralised water in varying quantities to form sealing baths. The baths were tested at various pH's and various sealing times, as shown in the following tabular summary of results.
  • *ANADOL SH1 is an aqueous solution comprising a reaction product of a sulphonated aromatic compound with an aldehyde or dimethylolurea (or a mixture of formaldehyde and urea).
    Figure imgb0019

Claims (22)

1. A process for the hydrothermal sealing of the surface of anodised aluminium which comprises immersing the anodised surface in an aqueous medium at a temperature of at least 80°C wherein satisfactory sealing is effected without the formation of any substantial quantity of smut whilst immersing the surface in the aqueous medium for a period of not more than 2 minutes per micrometer of the thickness of the anodised layer and maintaining the pH of the aqueous medium at a value of at least 7.0 and ensuring that the medium contains an effective quantity of a smut inhibiting additive.
2. A process according to claim 1, characterised in that satisfactory sealing is effected in a time which is not more than 1.5 minutes per micrometer of the thickness of the anodised layer.
3. A process according to either of claims 1 and 2, characterised in that the sealing bath comprises one or more compounds selected from the group comprising dextrins, acrylic acid, methacrylic acid, water-soluble polymers derived from acrylic acid or methacrylic acid lignin sulphonates; cycloaliphatic or aromatic polycarboxylic acids and cyclohexane hexacarboxylic acids, water-soluble phosphonic acids which are capable of forming complexes with a divalent metal and the reaction product of one or more sulphonated aromatic compounds with an aldehyde and/or dimethylolurea or a mixture of formaldehyde and urea.
4. A process according to claim 3, characterised in that the sealing bath comprises a water soluble phosphonic acid together with a divalent metal ion.
5. A process according to claim 4, characterised in that the phosphonic acid is selected from the group comprising 1 hydroxypropane 1, diphosphonic acid, 1-hydroxybutane 1, 1 diphosphonic acid, 1-hydroxy 1-phenylmethane-1, 1 diphosphonic acid, 1 hydroxyethane 1, 1 diphosphonic acid, 1 aminoethane 1, 1 diphosphonic acid, 1 amino-1-phenyl methane 1, 1 diphosphonic acid, dimethylaminoethane-1,1- diphosphonic acid, propylaminoethane 1,1 diphosphonic acid, butylamino ethane-1,1-diphosphonic acid, amino trimethylenephosphonic acid ethylenediaminotetramethylenephosphonic acid, diethylenetriamino- pentamethylene phosphonic acid, hexamethylene diamine tetra(methylenephosphonic) acid, n-propyl- iminobis(methylenephosphonic) acid, aminotri-(2-propylene-2-phosphonic acid, phosphonosuccinic acid, 1-phosphono-1-methylsuccinic acid and 1-phosphono-butane-1,2,4-tricarboxylic acid.
6. A process according to claim 5, characterised in that the phosphonate is selected from the group comprising ethylenediamino tetramethylene phosphonic acid hexamethylene diamine tetra (methylenephosphonic) acid and n-propylimino bis-(methylenephosphonic) acid.
7. A process according to claim 3, characterised in that the bath comprises benzene hexacarboxylic acid.
8. A process according to 7, characterised in that the bath contains from 5 to 500 ppm of benzene hexacarboxylic acid.
9. A process according to either of claims 7 or 8, characterised in that the bath is maintained at a pH of from 7.0 to 10.0.
10. A process according to any of claims 1 to 6, characterised in that the bath comprises at least one divalent metal ion and a phosphonate in a molar ratio of at least 2:1.
11. A process according to claim 10, characterised in that the molar ratio of divalent metal ions to phosphonate ions is at least 4:1.
12. A process according to either of claims 10 or 11, characterised in that the divalent metal ion is selected from the group comprising calcium, magnesium, nickel or cobalt.
13. A process according to claim 12, characterised in that the divalent metal ion is magnesium.
14. A process according to any of claims 1 to 6 and 9 to 13, characterised in that the pH of the bath is from 7.0 to 10.0.
15. A process according to claim 14, characterised in that the pH of the bath is from 7.0 to 9.0.
16. A process according to any of claims 1 to 6 and 9 to 15, characterised in that the smut-inhibiting agent is present in a quantity of from 1 to 500 ppm.
17. A process according to claim 16, characterised in that the smut inhibiting agent is present in a quantity of from 5 to 100 ppm.
18. A process according to claim 3, characterised in that sealing bath comprises one or more of the products formed by the reaction of the sulphonation products of diphenyl, phenyltoluene, dimethyldiphenyl, diphenylether, diphenylsulphide, diphenylsulphoxide, dihydroxydiphenylsulphone, diphenylene oxide, diphenylenesulphide and bisphenol with an aldehyde and/or dimethylolurea or a mixture of formaldehyde and urea or where the sulphonated aromatic compound is a sulphonated derivative of phenol, cresol or naphthol the reaction products thereof with dimethylolurea.
19. A process according to claim 18, characterised in that the sealing bath contains from 0.01 to 5.0 gms/litre of the reaction product.
20. A process according to any of the preceding claims characterised in that the sealing bath comprises a surface active agent.
21. A process according to claim 20, characterised in that the surface active agent is carboxymethylcellulose. -
22. A process according to claim 18, characterised in that the bath contains from 5 to 100 ppm of carboxymethyl cellulose.
EP84302358A 1983-04-08 1984-04-06 Process for sealing anodised aluminium Expired EP0122129B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
AT84302358T ATE45396T1 (en) 1983-04-08 1984-04-06 PROCESS FOR DENSING ANODIZED ALUMINUM.

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB838309571A GB8309571D0 (en) 1983-04-08 1983-04-08 Accelerated sealing of anodised aluminium
GB8309571 1983-04-08

Publications (3)

Publication Number Publication Date
EP0122129A2 EP0122129A2 (en) 1984-10-17
EP0122129A3 EP0122129A3 (en) 1985-09-18
EP0122129B1 true EP0122129B1 (en) 1989-08-09

Family

ID=10540815

Family Applications (1)

Application Number Title Priority Date Filing Date
EP84302358A Expired EP0122129B1 (en) 1983-04-08 1984-04-06 Process for sealing anodised aluminium

Country Status (10)

Country Link
EP (1) EP0122129B1 (en)
JP (1) JPS59197594A (en)
AT (1) ATE45396T1 (en)
AU (1) AU579098B2 (en)
BR (1) BR8401643A (en)
CA (1) CA1251416A (en)
DE (1) DE3479324D1 (en)
ES (1) ES8608589A1 (en)
GB (2) GB8309571D0 (en)
ZA (1) ZA842624B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19831780B4 (en) * 1997-07-15 2012-11-08 Fuji Electric Co., Ltd Substrate for an electrophotographic photoconductor and electrophotographic photoconductor in which it is used
EP4299792A3 (en) * 2019-03-01 2024-03-20 Howmet Aerospace Inc. Metallic substrate treatment methods and articles comprising a phosphonate functionalized layer

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3820650A1 (en) * 1988-06-18 1989-12-21 Henkel Kgaa METHOD FOR COMPRESSING ANODIZED OXIDE LAYERS ON ALUMINUM AND ALUMINUM ALLOYS
DE3900169A1 (en) * 1989-01-05 1990-07-12 Henkel Kgaa METHOD OF IMPREGNIZING ANODICALLY PRODUCED SURFACES OF ALUMINUM
DE4210884C2 (en) * 1991-04-09 2000-10-05 Clariant Finance Bvi Ltd Cobalt- and nickel-free compaction preparations
WO1997014828A1 (en) * 1995-10-18 1997-04-24 Henkel Kommanditgesellschaft Auf Aktien Short duration hot seal for anodised metal surfaces
DE19621818A1 (en) * 1996-05-31 1997-12-04 Henkel Kgaa Short-term hot compression of anodized metal surfaces with solutions containing surfactants
WO2001036717A1 (en) * 1999-11-18 2001-05-25 Houghton Metal Finishing A sealant composition
WO2003016596A1 (en) * 2001-08-14 2003-02-27 Magnesium Technology Limited Magnesium anodisation system and methods
CN101736386B (en) * 2008-11-27 2011-11-16 比亚迪股份有限公司 Aluminium alloy sealing agent

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB991114A (en) * 1960-09-30 1965-05-05 Reynolds Metals Co Improvements in sealing of anodic oxide films on aluminium
BE755573A (en) * 1969-09-02 1971-03-01 Henkel & Cie Gmbh PROCESS FOR TREATING ALUMINUM SURFACES AND ALUMINIU ALLOYS
DE2062661A1 (en) * 1970-12-19 1972-06-22 Henkel & Cie Gmbh Process to prevent deposits in the redensification of anodically oxidized aluminum surfaces
DE2211553C3 (en) * 1972-03-10 1978-04-20 Henkel Kgaa, 4000 Duesseldorf Process for compacting anodic oxide layers on aluminum and aluminum alloys
US3961111A (en) * 1975-03-18 1976-06-01 Pennwalt Corporation Method of increasing corrosion resistance of anodized aluminum
JPS5235017A (en) * 1975-09-11 1977-03-17 Nippon Signal Co Ltd:The Train control system
DE2650989C2 (en) * 1976-11-08 1985-01-24 Henkel KGaA, 4000 Düsseldorf Process for the treatment of aluminum surfaces by oxidation with subsequent compaction
CH645929A5 (en) * 1978-09-07 1984-10-31 Alusuisse RE-COMPRESSION BATH FOR ANODICALLY OXIDIZED SURFACES MADE OF ALUMINUM OR ALUMINUM ALLOYS AND USE OF THE BATH.
DE2855508A1 (en) * 1978-12-22 1980-07-10 Basf Ag METHOD FOR PRODUCING BENZALDEHYDES
CH655519B (en) * 1981-08-28 1986-04-30
DE3219922A1 (en) * 1982-05-27 1983-12-01 Hoechst Ag, 6230 Frankfurt METHOD FOR TREATING ALUMINUM OXIDE LAYERS WITH AQUEOUS SOLUTIONS CONTAINING ALKALISILICATE AND THE USE THEREOF IN THE PRODUCTION OF OFFSET PRINT PLATE CARRIERS
CH654853A5 (en) * 1982-08-07 1986-03-14 Sandoz Ag METHOD FOR COMPRESSING ANODICALLY OXYDED ALUMINUM SURFACES.

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19831780B4 (en) * 1997-07-15 2012-11-08 Fuji Electric Co., Ltd Substrate for an electrophotographic photoconductor and electrophotographic photoconductor in which it is used
EP4299792A3 (en) * 2019-03-01 2024-03-20 Howmet Aerospace Inc. Metallic substrate treatment methods and articles comprising a phosphonate functionalized layer
US12018380B2 (en) 2019-03-01 2024-06-25 Howmet Aerospace Inc. Metallic substrate treatment methods and articles comprising a phosphonate functionalized layer

Also Published As

Publication number Publication date
AU579098B2 (en) 1988-11-17
AU2671884A (en) 1984-10-11
DE3479324D1 (en) 1989-09-14
ATE45396T1 (en) 1989-08-15
GB2139646A (en) 1984-11-14
ES8608589A1 (en) 1986-06-16
ZA842624B (en) 1984-11-28
EP0122129A3 (en) 1985-09-18
EP0122129A2 (en) 1984-10-17
GB8309571D0 (en) 1983-05-11
GB8408870D0 (en) 1984-05-16
CA1251416A (en) 1989-03-21
ES531380A0 (en) 1986-06-16
JPS59197594A (en) 1984-11-09
BR8401643A (en) 1984-11-20
GB2139646B (en) 1987-07-29

Similar Documents

Publication Publication Date Title
USRE35513E (en) Cyanide-free plating solutions for monovalent metals
JPH0459392B2 (en)
EP0122129B1 (en) Process for sealing anodised aluminium
JPS5930797B2 (en) Trivalent chromium electrolyte using vanadium reducing agent and its method
GB2062010A (en) Electroplating Bath and Process
US20160068984A1 (en) Zinc-nickel alloy plating solution and plating method
US3216835A (en) Synergistic chelate combinations in dilute immersion zincate solutions for treatment of aluminum and aluminum alloys
US4939001A (en) Process for sealing anodized aluminum
USRE27999E (en) Certificate of correction
US4069113A (en) Electroplating gold alloys and electrolytes therefor
JPS5818996B2 (en) Neutral tin electroplating bath to obtain a dense plating film
JPH0312159B2 (en)
US3839165A (en) Nickel electroplating method
GB2101634A (en) Process and composition for the electrodeposition of tin
US3338725A (en) Novel plating process and composition
US4615774A (en) Gold alloy plating bath and process
US3594197A (en) Process and composition for immersion plating of aluminum or aluminum alloys with tin
CN111349953B (en) Environment-friendly carrier-free water-based sulfate zinc plating additive
US6506263B1 (en) Sealant composition
TWI645078B (en) Functional chromium layer with improved corrosion resistance
US2585616A (en) Process of pickling metals
CN112760647A (en) Scale-inhibiting brightening aluminum alloy alkaline etching solution and preparation method thereof
US3528895A (en) Plating low stress bright rhodium
JP3466229B2 (en) Tin plating method
US3838022A (en) Chelating/complexing dip in bright plating of brass

Legal Events

Date Code Title Description
PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

Free format text: ORIGINAL CODE: 0009012

17P Request for examination filed

Effective date: 19840409

AK Designated contracting states

Designated state(s): AT BE CH DE FR GB IT LI LU NL SE

PUAL Search report despatched

Free format text: ORIGINAL CODE: 0009013

AK Designated contracting states

Designated state(s): AT BE CH DE FR GB IT LI LU NL SE

17Q First examination report despatched

Effective date: 19860918

GRAA (expected) grant

Free format text: ORIGINAL CODE: 0009210

AK Designated contracting states

Kind code of ref document: B1

Designated state(s): AT BE CH DE FR IT LI LU NL SE

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: NL

Effective date: 19890809

REF Corresponds to:

Ref document number: 45396

Country of ref document: AT

Date of ref document: 19890815

Kind code of ref document: T

ITF It: translation for a ep patent filed
REF Corresponds to:

Ref document number: 3479324

Country of ref document: DE

Date of ref document: 19890914

ET Fr: translation filed
NLV1 Nl: lapsed or annulled due to failure to fulfill the requirements of art. 29p and 29m of the patents act
PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: LU

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 19900430

PLBE No opposition filed within time limit

Free format text: ORIGINAL CODE: 0009261

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: NO OPPOSITION FILED WITHIN TIME LIMIT

26N No opposition filed
ITTA It: last paid annual fee
EAL Se: european patent in force in sweden

Ref document number: 84302358.1

REG Reference to a national code

Ref country code: CH

Ref legal event code: PFA

Free format text: ALBRIGHT & WILSON UK LIMITED

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: FR

Payment date: 20020327

Year of fee payment: 19

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: AT

Payment date: 20020403

Year of fee payment: 19

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: CH

Payment date: 20020409

Year of fee payment: 19

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: SE

Payment date: 20020416

Year of fee payment: 19

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: BE

Payment date: 20020429

Year of fee payment: 19

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: DE

Payment date: 20020628

Year of fee payment: 19

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: AT

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20030406

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: SE

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20030407

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: LI

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20030430

Ref country code: CH

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20030430

Ref country code: BE

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20030430

BERE Be: lapsed

Owner name: *ALBRIGHT & WILSON UK LTD

Effective date: 20030430

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: DE

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20031101

EUG Se: european patent has lapsed
REG Reference to a national code

Ref country code: CH

Ref legal event code: PL

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: FR

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20031231

REG Reference to a national code

Ref country code: FR

Ref legal event code: ST