EP0095172A3 - Chemical etching method - Google Patents
Chemical etching method Download PDFInfo
- Publication number
- EP0095172A3 EP0095172A3 EP83105052A EP83105052A EP0095172A3 EP 0095172 A3 EP0095172 A3 EP 0095172A3 EP 83105052 A EP83105052 A EP 83105052A EP 83105052 A EP83105052 A EP 83105052A EP 0095172 A3 EP0095172 A3 EP 0095172A3
- Authority
- EP
- European Patent Office
- Prior art keywords
- etching method
- chemical etching
- chemical
- etching
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/02—Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding
- H05K3/06—Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding the conductive material being removed chemically or electrolytically, e.g. by photo-etch process
- H05K3/061—Etching masks
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
- C23F1/00—Etching metallic material by chemical means
- C23F1/02—Local etching
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/40—Treatment after imagewise removal, e.g. baking
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/01—Dielectrics
- H05K2201/0137—Materials
- H05K2201/0166—Polymeric layer used for special processing, e.g. resist for etching insulating material or photoresist used as a mask during plasma etching
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/03—Metal processing
- H05K2203/0369—Etching selective parts of a metal substrate through part of its thickness, e.g. using etch resist
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/05—Patterning and lithography; Masks; Details of resist
- H05K2203/0562—Details of resist
- H05K2203/0597—Resist applied over the edges or sides of conductors, e.g. for protection during etching or plating
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- ing And Chemical Polishing (AREA)
- Weting (AREA)
- Manufacturing Of Printed Circuit Boards (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP87705/82 | 1982-05-24 | ||
JP57087705A JPS58204176A (en) | 1982-05-24 | 1982-05-24 | Chemical etching method |
Publications (3)
Publication Number | Publication Date |
---|---|
EP0095172A2 EP0095172A2 (en) | 1983-11-30 |
EP0095172A3 true EP0095172A3 (en) | 1985-06-19 |
EP0095172B1 EP0095172B1 (en) | 1988-02-10 |
Family
ID=13922326
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP83105052A Expired EP0095172B1 (en) | 1982-05-24 | 1983-05-21 | Chemical etching method |
Country Status (4)
Country | Link |
---|---|
US (1) | US4470872A (en) |
EP (1) | EP0095172B1 (en) |
JP (1) | JPS58204176A (en) |
DE (1) | DE3375672D1 (en) |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS616817A (en) * | 1984-06-20 | 1986-01-13 | Canon Inc | Manufacture of sheet coil |
DE3430075A1 (en) * | 1984-08-16 | 1986-02-27 | Robert Bosch Gmbh, 7000 Stuttgart | METHOD FOR PRODUCING A MEASURING PROBE FOR USE IN MEASURING THE TEMPERATURE OR MASS OF A FLOWING MEDIUM |
US4733079A (en) * | 1985-12-13 | 1988-03-22 | Lockheed Corporation | Method of and apparatus for thermographic identification of parts |
US4690833A (en) * | 1986-03-28 | 1987-09-01 | International Business Machines Corporation | Providing circuit lines on a substrate |
DE69111002T2 (en) * | 1990-09-20 | 1995-11-02 | Dainippon Screen Mfg | Process for making small through holes in thin metal plates. |
US5312456A (en) * | 1991-01-31 | 1994-05-17 | Carnegie Mellon University | Micromechanical barb and method for making the same |
US5294520A (en) * | 1992-08-25 | 1994-03-15 | International Business Machines Corporation | Zero undercut etch process |
ES2140310B1 (en) * | 1997-07-30 | 2000-10-16 | Mecanismos Aux Es Ind S A | IMPROVEMENTS IN THE DESIGNS OF INTERLAYS IN THE PRINTED CIRCUITS OF POWER. |
US6280555B1 (en) * | 1999-03-30 | 2001-08-28 | Robert L. Wilbur | Method of forming a printed circuit board |
US7018418B2 (en) * | 2001-01-25 | 2006-03-28 | Tecomet, Inc. | Textured surface having undercut micro recesses in a surface |
US6599322B1 (en) * | 2001-01-25 | 2003-07-29 | Tecomet, Inc. | Method for producing undercut micro recesses in a surface, a surgical implant made thereby, and method for fixing an implant to bone |
US6620332B2 (en) | 2001-01-25 | 2003-09-16 | Tecomet, Inc. | Method for making a mesh-and-plate surgical implant |
CN111526666B (en) * | 2020-04-30 | 2021-07-02 | 生益电子股份有限公司 | PCB manufacturing method |
CN114686884B (en) * | 2020-12-29 | 2023-07-07 | 苏州运宏电子有限公司 | Etching area control method for precisely preventing side etching |
CN114203544A (en) * | 2021-10-31 | 2022-03-18 | 苏州焜原光电有限公司 | Etching method capable of reducing lateral corrosion degree of wafer |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3695955A (en) * | 1969-03-14 | 1972-10-03 | Pieter Johannes Wilhelmus Joch | Method of manufacturing an electric device e.g. a semiconductor device |
US3736197A (en) * | 1972-03-29 | 1973-05-29 | Mona Industries Inc | Powderless etching bath compositions and additives |
JPS5377848A (en) * | 1976-12-21 | 1978-07-10 | Showa Denko Kk | Etching method that prevent side etch |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3006796A (en) * | 1958-04-18 | 1961-10-31 | Jones Graphic Products Of Ohio | Etching method |
US3544401A (en) * | 1967-05-16 | 1970-12-01 | Texas Instruments Inc | High depth-to-width ratio etching process |
JPS556833A (en) * | 1978-06-29 | 1980-01-18 | Nippon Mektron Kk | Cirucit board and method of manufacturing same |
JPS5570835A (en) * | 1978-11-22 | 1980-05-28 | Hitachi Ltd | Photoresist material and etching method |
JPS56114319A (en) * | 1980-02-14 | 1981-09-08 | Fujitsu Ltd | Method for forming contact hole |
JPS56131929A (en) * | 1980-03-19 | 1981-10-15 | Fujitsu Ltd | Selective etching method of laminar structure |
JPS5815537B2 (en) * | 1980-07-02 | 1983-03-26 | 勧業電気機器株式会社 | chemical etching method |
-
1982
- 1982-05-24 JP JP57087705A patent/JPS58204176A/en active Granted
-
1983
- 1983-05-18 US US06/495,911 patent/US4470872A/en not_active Expired - Fee Related
- 1983-05-21 DE DE8383105052T patent/DE3375672D1/en not_active Expired
- 1983-05-21 EP EP83105052A patent/EP0095172B1/en not_active Expired
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3695955A (en) * | 1969-03-14 | 1972-10-03 | Pieter Johannes Wilhelmus Joch | Method of manufacturing an electric device e.g. a semiconductor device |
US3736197A (en) * | 1972-03-29 | 1973-05-29 | Mona Industries Inc | Powderless etching bath compositions and additives |
JPS5377848A (en) * | 1976-12-21 | 1978-07-10 | Showa Denko Kk | Etching method that prevent side etch |
Non-Patent Citations (2)
Title |
---|
IBM TECHNICAL DISCLOSURE BULLETIN, Vol.14, No.9, February 1972, page 2607, NEW YORK. (US). L.M. ELIJAH et al.: "Etching technique for minimum undercutting". * |
PATENTS ABSTRACTS OF JAPAN, Vol.6, No.9, (E-90)(887) January 20, 1982; & JP-A-56 131 929 (FUJITSU K. K.) 15-10-1981 * |
Also Published As
Publication number | Publication date |
---|---|
EP0095172B1 (en) | 1988-02-10 |
JPS58204176A (en) | 1983-11-28 |
US4470872A (en) | 1984-09-11 |
DE3375672D1 (en) | 1988-03-17 |
EP0095172A2 (en) | 1983-11-30 |
JPS6237713B2 (en) | 1987-08-13 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
GB2144083B (en) | Selective etching process | |
GB8325811D0 (en) | Reaction method | |
GB8319605D0 (en) | Assay method | |
JPS56126929A (en) | Plasma etching method | |
GB2124958B (en) | Plasma-assisted etching process | |
GB8320520D0 (en) | Chemical process | |
DE3375672D1 (en) | Chemical etching method | |
GB8332072D0 (en) | Currency-dispensing method | |
GB8320521D0 (en) | Chemical process | |
GB8324902D0 (en) | Chemical process | |
GB8324152D0 (en) | Chemical process | |
JPS57208144A (en) | Etching method | |
GB8325408D0 (en) | Chemical process | |
GB8323961D0 (en) | Chemical process | |
GB8329956D0 (en) | Chemical process | |
GB8304161D0 (en) | Chemical process | |
GB8332608D0 (en) | Chemical process | |
GB8524913D0 (en) | Chemical method | |
GB2131748B (en) | Silicon etch process | |
GB8318675D0 (en) | Chemical process | |
GB8302155D0 (en) | Chemical process | |
GB8309066D0 (en) | Chemical process | |
GB8304613D0 (en) | Chemical process | |
PT76900A (en) | Chemical process | |
GB8319489D0 (en) | Chemical method |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
17P | Request for examination filed |
Effective date: 19830521 |
|
AK | Designated contracting states |
Designated state(s): DE GB NL |
|
PUAL | Search report despatched |
Free format text: ORIGINAL CODE: 0009013 |
|
AK | Designated contracting states |
Designated state(s): DE GB NL |
|
17Q | First examination report despatched |
Effective date: 19861013 |
|
GRAA | (expected) grant |
Free format text: ORIGINAL CODE: 0009210 |
|
AK | Designated contracting states |
Kind code of ref document: B1 Designated state(s): DE GB NL |
|
REF | Corresponds to: |
Ref document number: 3375672 Country of ref document: DE Date of ref document: 19880317 |
|
PLBE | No opposition filed within time limit |
Free format text: ORIGINAL CODE: 0009261 |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: NO OPPOSITION FILED WITHIN TIME LIMIT |
|
26N | No opposition filed | ||
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: NL Payment date: 19890531 Year of fee payment: 7 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: NL Effective date: 19901201 |
|
NLV4 | Nl: lapsed or anulled due to non-payment of the annual fee | ||
REG | Reference to a national code |
Ref country code: GB Ref legal event code: 732 |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: GB Payment date: 19940511 Year of fee payment: 12 |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: DE Payment date: 19940524 Year of fee payment: 12 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: GB Effective date: 19950521 |
|
GBPC | Gb: european patent ceased through non-payment of renewal fee |
Effective date: 19950521 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: DE Effective date: 19960201 |