EA201650138A1 - A METHOD FOR STUDYING A SURFACE ON A NUCLEAR-POWER MICROSCOPE USING FLUORESCENT QUANTUM POINTS - Google Patents

A METHOD FOR STUDYING A SURFACE ON A NUCLEAR-POWER MICROSCOPE USING FLUORESCENT QUANTUM POINTS

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Publication number
EA201650138A1
EA201650138A1 EA201650138A EA201650138A EA201650138A1 EA 201650138 A1 EA201650138 A1 EA 201650138A1 EA 201650138 A EA201650138 A EA 201650138A EA 201650138 A EA201650138 A EA 201650138A EA 201650138 A1 EA201650138 A1 EA 201650138A1
Authority
EA
Eurasian Patent Office
Prior art keywords
properties
quantum dot
studying
nuclear
hand
Prior art date
Application number
EA201650138A
Other languages
Russian (ru)
Other versions
EA034576B1 (en
Inventor
Александр Борисович Петров
Рауф Загидович Бахтизин
Сергей Степанович Гоц
Original Assignee
Федеральное государственное бюджетное образовательное учреждение высшего образования "Башкирский государственный университет"
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Федеральное государственное бюджетное образовательное учреждение высшего образования "Башкирский государственный университет" filed Critical Федеральное государственное бюджетное образовательное учреждение высшего образования "Башкирский государственный университет"
Publication of EA201650138A1 publication Critical patent/EA201650138A1/en
Publication of EA034576B1 publication Critical patent/EA034576B1/en

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
    • G01Q70/08—Probe characteristics

Abstract

Изобретение относится к области техники зондовой микроскопии. Технический результат предполагаемого изобретения заключается в упрощении используемой экспериментальной техники с одной стороны и в увеличении возможностей в исследовании физических явлений на поверхности с нанометровым пространственным разрешением (химический состав, вязкоупругие свойства, диэлектрическая проницаемость и т.д.) с другой стороны. Технический результат достигается за счет квантовой точки, закрепленной на острие иглы кантилевера и находящейся в тесном механическом контакте с исследуемым образцом. Облучение квантовой точки заставляет ее высвечивать флуоресцентное излучение. Свойства флуоресцентного излучения определяются как свойствами самой квантовой точки, так и свойствами поверхности исследуемого образца в ее окрестности.The invention relates to the field of probe microscopy. The technical result of the proposed invention is to simplify the used experimental equipment on the one hand and to increase the possibilities in the study of physical phenomena on the surface with nanometer spatial resolution (chemical composition, viscoelastic properties, dielectric constant, etc.) on the other hand. The technical result is achieved due to a quantum dot attached to the tip of the cantilever needle and being in close mechanical contact with the sample under study. A quantum dot irradiation causes it to emit fluorescent radiation. The properties of fluorescent radiation are determined by both the properties of the quantum dot itself and the surface properties of the sample under study in its vicinity.

EA201650138A 2016-03-18 2016-12-30 Method for analysing surface on atomic-power microscope using fluorescent quantum dots EA034576B1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
RU2016110060A RU2631529C2 (en) 2016-03-18 2016-03-18 Method for analysing surface on atomic-power microscope using fluorescent quantum dots

Publications (2)

Publication Number Publication Date
EA201650138A1 true EA201650138A1 (en) 2017-11-30
EA034576B1 EA034576B1 (en) 2020-02-21

Family

ID=59930983

Family Applications (1)

Application Number Title Priority Date Filing Date
EA201650138A EA034576B1 (en) 2016-03-18 2016-12-30 Method for analysing surface on atomic-power microscope using fluorescent quantum dots

Country Status (2)

Country Link
EA (1) EA034576B1 (en)
RU (1) RU2631529C2 (en)

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005006347A1 (en) * 2003-07-10 2005-01-20 Yissum Research Development Company Of The Hebrew University Of Jerusalem Nanoparticles functionalized probes and methods for preparing such probes
US7608820B1 (en) * 2007-08-28 2009-10-27 The United States Of America As Represented By The United States Department Of Energy Spin microscope based on optically detected magnetic resonance
GB2453529A (en) * 2007-10-01 2009-04-15 Wesfaelische Wilhelms Uni Muen Cantilever sensor for atomic force microscopes
US8766630B2 (en) * 2008-11-04 2014-07-01 The University Of Melbourne Method and apparatus for monitoring a property of a sample
ES2369943B1 (en) * 2010-05-13 2012-10-15 Consejo Superior De Investigaciones Científicas (Csic) MODIFICATION OF MICROSCOPY POINTS OF ATOMIC FORCES THROUGH DEPOSIT OF NANOPARTICLES WITH A SOURCE OF AGGREGATES.

Also Published As

Publication number Publication date
RU2016110060A (en) 2017-09-21
RU2631529C2 (en) 2017-09-25
EA034576B1 (en) 2020-02-21

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MM4A Lapse of a eurasian patent due to non-payment of renewal fees within the time limit in the following designated state(s)

Designated state(s): AM AZ BY KZ KG TJ TM RU