EA201700166A1 - METHOD OF LUMINESCENT ANALYSIS ON NUCLEAR-POWER MICROSCOPE BY MEANS OF FLUOROPHOR-FLUORESCENT PROBES - Google Patents

METHOD OF LUMINESCENT ANALYSIS ON NUCLEAR-POWER MICROSCOPE BY MEANS OF FLUOROPHOR-FLUORESCENT PROBES

Info

Publication number
EA201700166A1
EA201700166A1 EA201700166A EA201700166A EA201700166A1 EA 201700166 A1 EA201700166 A1 EA 201700166A1 EA 201700166 A EA201700166 A EA 201700166A EA 201700166 A EA201700166 A EA 201700166A EA 201700166 A1 EA201700166 A1 EA 201700166A1
Authority
EA
Eurasian Patent Office
Prior art keywords
fluorophor
nuclear
fluorescent probes
analysis
hand
Prior art date
Application number
EA201700166A
Other languages
Russian (ru)
Other versions
EA034343B1 (en
Inventor
Александр Борисович Петров
Рауф Загидович Бахтизин
Сергей Степанович Гоц
Original Assignee
Федеральное государственное бюджетное образовательное учреждение высшего образования "Башкирский государственный университет"
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Федеральное государственное бюджетное образовательное учреждение высшего образования "Башкирский государственный университет" filed Critical Федеральное государственное бюджетное образовательное учреждение высшего образования "Башкирский государственный университет"
Priority to EA201700166A priority Critical patent/EA034343B1/en
Publication of EA201700166A1 publication Critical patent/EA201700166A1/en
Publication of EA034343B1 publication Critical patent/EA034343B1/en

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
    • G01Q70/08—Probe characteristics

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Analytical Chemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

Изобретение относится к области техники зондовой микроскопии. Технический результат предполагаемого изобретения заключается в упрощении используемой экспериментальной техники, с одной стороны, за счет упрощения оптической схемы возбуждения и регистрации фотонов и в переносе методов классического люминесцентного анализа на нанометровый уровень, с другой стороны. Такой перенос позволяет точно позиционировать положение флуоресцентного зонда над исследуемым образцом, соответственно, становится возможным делать локальный химический анализ, а также изучать резонансный перенос энергии при люминесценции во взаимосвязи с особенностями строения поверхности изучаемого образца.The invention relates to the field of probe microscopy. The technical result of the proposed invention is to simplify the experimental technique used, on the one hand, by simplifying the optical excitation scheme and photon registration and in transferring the methods of classical luminescence analysis to the nanometer level, on the other hand. Such a transfer makes it possible to precisely position the position of the fluorescent probe over the sample under investigation, respectively, it becomes possible to do a local chemical analysis, and also to study the resonant energy transfer during luminescence in conjunction with the structural features of the surface of the sample under study.

EA201700166A 2016-12-30 2016-12-30 Method for luminescent analysis on atomic-force microscope using fluorophore-fluorescent probes EA034343B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
EA201700166A EA034343B1 (en) 2016-12-30 2016-12-30 Method for luminescent analysis on atomic-force microscope using fluorophore-fluorescent probes

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EA201700166A EA034343B1 (en) 2016-12-30 2016-12-30 Method for luminescent analysis on atomic-force microscope using fluorophore-fluorescent probes

Publications (2)

Publication Number Publication Date
EA201700166A1 true EA201700166A1 (en) 2018-07-31
EA034343B1 EA034343B1 (en) 2020-01-29

Family

ID=62974882

Family Applications (1)

Application Number Title Priority Date Filing Date
EA201700166A EA034343B1 (en) 2016-12-30 2016-12-30 Method for luminescent analysis on atomic-force microscope using fluorophore-fluorescent probes

Country Status (1)

Country Link
EA (1) EA034343B1 (en)

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005006347A1 (en) * 2003-07-10 2005-01-20 Yissum Research Development Company Of The Hebrew University Of Jerusalem Nanoparticles functionalized probes and methods for preparing such probes
WO2008115950A1 (en) * 2007-03-20 2008-09-25 Massachusetts Institute Of Technology High resolution near field scanning optical microscopy
RU2425386C1 (en) * 2009-11-03 2011-07-27 Государственное образовательное учреждение высшего профессионального образования "Воронежский государственный университет" Method for imaging in near-field luminescence microscope

Also Published As

Publication number Publication date
EA034343B1 (en) 2020-01-29

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Legal Events

Date Code Title Description
MM4A Lapse of a eurasian patent due to non-payment of renewal fees within the time limit in the following designated state(s)

Designated state(s): AM AZ BY KZ KG TJ TM RU