DK3654532T3 - Proksimitetsregistreringssystem med komponentkompatibilitetstestning - Google Patents

Proksimitetsregistreringssystem med komponentkompatibilitetstestning Download PDF

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Publication number
DK3654532T3
DK3654532T3 DK19209285.6T DK19209285T DK3654532T3 DK 3654532 T3 DK3654532 T3 DK 3654532T3 DK 19209285 T DK19209285 T DK 19209285T DK 3654532 T3 DK3654532 T3 DK 3654532T3
Authority
DK
Denmark
Prior art keywords
registration system
compatibility test
component compatibility
proximity registration
proximity
Prior art date
Application number
DK19209285.6T
Other languages
English (en)
Inventor
Dan Tho Lu
David Lopez
Original Assignee
Bently Nevada Llc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bently Nevada Llc filed Critical Bently Nevada Llc
Application granted granted Critical
Publication of DK3654532T3 publication Critical patent/DK3654532T3/da

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Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/94—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the way in which the control signals are generated
    • H03K17/945—Proximity switches
    • H03K17/95—Proximity switches using a magnetic detector
    • H03K17/952—Proximity switches using a magnetic detector using inductive coils
    • H03K17/9537—Proximity switches using a magnetic detector using inductive coils in a resonant circuit
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V3/00—Electric or magnetic prospecting or detecting; Measuring magnetic field characteristics of the earth, e.g. declination, deviation
    • G01V3/08—Electric or magnetic prospecting or detecting; Measuring magnetic field characteristics of the earth, e.g. declination, deviation operating with magnetic or electric fields produced or modified by objects or geological structures or by detecting devices
    • G01V3/10—Electric or magnetic prospecting or detecting; Measuring magnetic field characteristics of the earth, e.g. declination, deviation operating with magnetic or electric fields produced or modified by objects or geological structures or by detecting devices using induction coils
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/12—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means
    • G01D5/14—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage
    • G01D5/20—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage by varying inductance, e.g. by a movable armature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D18/00—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
    • G01R35/007—Standards or reference devices, e.g. voltage or resistance standards, "golden references"
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/94—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the way in which the control signals are generated
    • H03K17/945—Proximity switches
    • H03K17/95—Proximity switches using a magnetic detector
    • H03K17/9502—Measures for increasing reliability
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/94—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the way in which the control signals are generated
    • H03K17/965—Switches controlled by moving an element forming part of the switch
    • H03K17/97—Switches controlled by moving an element forming part of the switch using a magnetic movable element
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
    • H03K2217/94—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated
    • H03K2217/9401—Calibration techniques
    • H03K2217/94021—Calibration techniques with human activation, e.g. processes requiring or being triggered by human intervention, user-input of digital word or analog voltage
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
    • H03K2217/94—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated
    • H03K2217/945—Proximity switches
    • H03K2217/95—Proximity switches using a magnetic detector
    • H03K2217/952—Detection of ferromagnetic and non-magnetic conductive targets

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Remote Sensing (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Electromagnetism (AREA)
  • Environmental & Geological Engineering (AREA)
  • Geology (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Electronic Switches (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
DK19209285.6T 2018-11-16 2019-11-14 Proksimitetsregistreringssystem med komponentkompatibilitetstestning DK3654532T3 (da)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US201862768290P 2018-11-16 2018-11-16

Publications (1)

Publication Number Publication Date
DK3654532T3 true DK3654532T3 (da) 2022-06-07

Family

ID=68583087

Family Applications (1)

Application Number Title Priority Date Filing Date
DK19209285.6T DK3654532T3 (da) 2018-11-16 2019-11-14 Proksimitetsregistreringssystem med komponentkompatibilitetstestning

Country Status (4)

Country Link
US (2) US11112522B2 (da)
EP (1) EP3654532B1 (da)
CN (1) CN111197995B (da)
DK (1) DK3654532T3 (da)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114154838B (zh) * 2021-11-29 2023-09-26 苏州浪潮智能科技有限公司 一种产品兼容性决策平台、方法及存储介质

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US2979717A (en) * 1953-08-20 1961-04-11 North American Aviation Inc Voltage comparison circuit
GB8426488D0 (en) * 1984-10-19 1984-11-28 Thorburn Technics Int Electromagnetic inspection
DE59810137D1 (de) * 1997-08-20 2003-12-18 Nord Micro Ag & Co Ohg Sensoreinrichtung
US6346807B1 (en) * 1999-10-22 2002-02-12 Bently Nevada Corporation Digital eddy current proximity system: apparatus and method
DE60226847D1 (de) * 2001-03-15 2008-07-10 Omron Tateisi Electronics Co Näherungssensor
DE10137091A1 (de) * 2001-07-30 2003-02-13 Sick Ag Induktiver Näherungssensor
US20040027118A1 (en) * 2002-08-12 2004-02-12 James Lenz Proximity sensor circuit with programmable logic device controller
US7068041B2 (en) * 2003-11-26 2006-06-27 General Electric Company Method and system for multi-frequency inductive ratio measurement
EP1637845A2 (en) * 2004-09-15 2006-03-22 Mitutoyo Corporation Control parameter setting method in a measurement system
US10746680B2 (en) * 2006-11-16 2020-08-18 General Electric Company Sensing system and method
CN100442005C (zh) * 2006-12-30 2008-12-10 上海驰捷电子有限公司 一种线性自动补偿的定频调幅式电涡流位移传感器
US8253426B2 (en) * 2007-10-18 2012-08-28 Pioneer Corporation Capacitance detector
JP5357461B2 (ja) * 2008-08-11 2013-12-04 パナソニック株式会社 近接センサ
WO2010045662A2 (en) * 2008-10-15 2010-04-22 Azoteq (Pty) Ltd Parasitic capacitance cancellation in capacitive measurement applications
DE102009009061A1 (de) * 2009-01-21 2010-07-29 Gerd Reime Verfahren zum induktiven Erzeugen eines elektrischen Messsignals sowie zugehörige Sensorvorrichtung
US20110261344A1 (en) * 2009-12-31 2011-10-27 Mapper Lithography Ip B.V. Exposure method
CN206711054U (zh) * 2012-03-06 2017-12-05 苹果公司 校准触摸敏感设备的力测试和校准装置
DE102012102932B4 (de) * 2012-04-04 2018-03-29 Sma Solar Technology Ag Verfahren und Vorrichtung zur Signalisierung einer Teilverschattung eines Photovoltaikgenerators
GB2504991B (en) * 2012-08-17 2015-09-23 Ultra Electronics Ltd Proximity sensor monitor
US10067256B2 (en) * 2015-03-26 2018-09-04 General Electric Company Proximity probe interchange compensation
EP3109648B1 (en) * 2015-06-25 2018-05-02 Mitsubishi Electric R&D Centre Europe B.V. Method and system for on-line monitoring an electrolytic capacitor condition
US10345418B2 (en) * 2015-11-20 2019-07-09 Teradyne, Inc. Calibration device for automatic test equipment
JP6458742B2 (ja) * 2016-01-20 2019-01-30 オムロン株式会社 近接センサ
CN109154631B (zh) * 2016-04-12 2021-08-20 德州仪器公司 电感/数据转换器电路及用于感应谐振感测的系统和方法
US10845221B2 (en) * 2016-06-27 2020-11-24 Omnisens Sa Calibration device for distributing sensing technologies
US10337886B2 (en) * 2017-01-23 2019-07-02 Microsoft Technology Licensing, Llc Active proximity sensor with adaptive electric field control
WO2019043828A1 (ja) * 2017-08-30 2019-03-07 三菱電機株式会社 コンデンサ容量測定装置及び電力用機器
DE102017124309A1 (de) * 2017-10-18 2019-04-18 Huf Hülsbeck & Fürst Gmbh & Co. Kg Verfahren zum Auswerten eines Kapazitätswerts einer kapazitiven Sensorelektrode

Also Published As

Publication number Publication date
US11112522B2 (en) 2021-09-07
CN111197995A (zh) 2020-05-26
CN111197995B (zh) 2022-03-15
US20200158904A1 (en) 2020-05-21
EP3654532B1 (en) 2022-05-18
EP3654532A1 (en) 2020-05-20
US20210389494A1 (en) 2021-12-16

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