DK3654532T3 - Proksimitetsregistreringssystem med komponentkompatibilitetstestning - Google Patents
Proksimitetsregistreringssystem med komponentkompatibilitetstestning Download PDFInfo
- Publication number
- DK3654532T3 DK3654532T3 DK19209285.6T DK19209285T DK3654532T3 DK 3654532 T3 DK3654532 T3 DK 3654532T3 DK 19209285 T DK19209285 T DK 19209285T DK 3654532 T3 DK3654532 T3 DK 3654532T3
- Authority
- DK
- Denmark
- Prior art keywords
- registration system
- compatibility test
- component compatibility
- proximity registration
- proximity
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/94—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the way in which the control signals are generated
- H03K17/945—Proximity switches
- H03K17/95—Proximity switches using a magnetic detector
- H03K17/952—Proximity switches using a magnetic detector using inductive coils
- H03K17/9537—Proximity switches using a magnetic detector using inductive coils in a resonant circuit
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V3/00—Electric or magnetic prospecting or detecting; Measuring magnetic field characteristics of the earth, e.g. declination, deviation
- G01V3/08—Electric or magnetic prospecting or detecting; Measuring magnetic field characteristics of the earth, e.g. declination, deviation operating with magnetic or electric fields produced or modified by objects or geological structures or by detecting devices
- G01V3/10—Electric or magnetic prospecting or detecting; Measuring magnetic field characteristics of the earth, e.g. declination, deviation operating with magnetic or electric fields produced or modified by objects or geological structures or by detecting devices using induction coils
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/12—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means
- G01D5/14—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage
- G01D5/20—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage by varying inductance, e.g. by a movable armature
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D18/00—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
- G01R35/007—Standards or reference devices, e.g. voltage or resistance standards, "golden references"
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/94—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the way in which the control signals are generated
- H03K17/945—Proximity switches
- H03K17/95—Proximity switches using a magnetic detector
- H03K17/9502—Measures for increasing reliability
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/94—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the way in which the control signals are generated
- H03K17/965—Switches controlled by moving an element forming part of the switch
- H03K17/97—Switches controlled by moving an element forming part of the switch using a magnetic movable element
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
- H03K2217/94—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated
- H03K2217/9401—Calibration techniques
- H03K2217/94021—Calibration techniques with human activation, e.g. processes requiring or being triggered by human intervention, user-input of digital word or analog voltage
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
- H03K2217/94—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated
- H03K2217/945—Proximity switches
- H03K2217/95—Proximity switches using a magnetic detector
- H03K2217/952—Detection of ferromagnetic and non-magnetic conductive targets
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Remote Sensing (AREA)
- Life Sciences & Earth Sciences (AREA)
- Electromagnetism (AREA)
- Environmental & Geological Engineering (AREA)
- Geology (AREA)
- General Life Sciences & Earth Sciences (AREA)
- Geophysics (AREA)
- Electronic Switches (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201862768290P | 2018-11-16 | 2018-11-16 |
Publications (1)
Publication Number | Publication Date |
---|---|
DK3654532T3 true DK3654532T3 (da) | 2022-06-07 |
Family
ID=68583087
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DK19209285.6T DK3654532T3 (da) | 2018-11-16 | 2019-11-14 | Proksimitetsregistreringssystem med komponentkompatibilitetstestning |
Country Status (4)
Country | Link |
---|---|
US (2) | US11112522B2 (da) |
EP (1) | EP3654532B1 (da) |
CN (1) | CN111197995B (da) |
DK (1) | DK3654532T3 (da) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114154838B (zh) * | 2021-11-29 | 2023-09-26 | 苏州浪潮智能科技有限公司 | 一种产品兼容性决策平台、方法及存储介质 |
Family Cites Families (28)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2979717A (en) * | 1953-08-20 | 1961-04-11 | North American Aviation Inc | Voltage comparison circuit |
GB8426488D0 (en) * | 1984-10-19 | 1984-11-28 | Thorburn Technics Int | Electromagnetic inspection |
EP0898368B1 (de) * | 1997-08-20 | 2003-11-12 | Nord-Micro AG & Co. OHG | Sensoreinrichtung |
US6346807B1 (en) * | 1999-10-22 | 2002-02-12 | Bently Nevada Corporation | Digital eddy current proximity system: apparatus and method |
WO2002075763A1 (fr) * | 2001-03-15 | 2002-09-26 | Omron Corporation | Capteur de proximite |
DE10137091A1 (de) * | 2001-07-30 | 2003-02-13 | Sick Ag | Induktiver Näherungssensor |
US20040027118A1 (en) * | 2002-08-12 | 2004-02-12 | James Lenz | Proximity sensor circuit with programmable logic device controller |
US7068041B2 (en) * | 2003-11-26 | 2006-06-27 | General Electric Company | Method and system for multi-frequency inductive ratio measurement |
EP1637845A2 (en) * | 2004-09-15 | 2006-03-22 | Mitutoyo Corporation | Control parameter setting method in a measurement system |
US10746680B2 (en) * | 2006-11-16 | 2020-08-18 | General Electric Company | Sensing system and method |
CN100442005C (zh) * | 2006-12-30 | 2008-12-10 | 上海驰捷电子有限公司 | 一种线性自动补偿的定频调幅式电涡流位移传感器 |
JP4975824B2 (ja) * | 2007-10-18 | 2012-07-11 | パイオニア株式会社 | 静電容量検出装置 |
JP5357461B2 (ja) * | 2008-08-11 | 2013-12-04 | パナソニック株式会社 | 近接センサ |
US8659306B2 (en) * | 2008-10-15 | 2014-02-25 | Azoteq (Pty) Ltd | Parasitic capacitance cancellation in capacitive measurement applications |
DE102009009061A1 (de) * | 2009-01-21 | 2010-07-29 | Gerd Reime | Verfahren zum induktiven Erzeugen eines elektrischen Messsignals sowie zugehörige Sensorvorrichtung |
US8513959B2 (en) * | 2009-12-31 | 2013-08-20 | Mapper Lithography Ip B.V. | Integrated sensor system |
CN206711054U (zh) * | 2012-03-06 | 2017-12-05 | 苹果公司 | 校准触摸敏感设备的力测试和校准装置 |
DE102012102932B4 (de) * | 2012-04-04 | 2018-03-29 | Sma Solar Technology Ag | Verfahren und Vorrichtung zur Signalisierung einer Teilverschattung eines Photovoltaikgenerators |
GB2504991B (en) * | 2012-08-17 | 2015-09-23 | Ultra Electronics Ltd | Proximity sensor monitor |
US10067256B2 (en) * | 2015-03-26 | 2018-09-04 | General Electric Company | Proximity probe interchange compensation |
EP3109648B1 (en) * | 2015-06-25 | 2018-05-02 | Mitsubishi Electric R&D Centre Europe B.V. | Method and system for on-line monitoring an electrolytic capacitor condition |
US10345418B2 (en) * | 2015-11-20 | 2019-07-09 | Teradyne, Inc. | Calibration device for automatic test equipment |
JP6458742B2 (ja) * | 2016-01-20 | 2019-01-30 | オムロン株式会社 | 近接センサ |
KR102365629B1 (ko) * | 2016-04-12 | 2022-02-21 | 텍사스 인스트루먼츠 인코포레이티드 | 차폐된 케이블을 통해 공진기 커패시터에 커플링되는 감지 인덕터를 가지는 센서 공진기를 사용하는 원격 감지 |
DK3475662T3 (da) * | 2016-06-27 | 2021-11-08 | Omnisens S A | Kalibreringsanordning til fordeling af sensorteknologi |
US10337886B2 (en) * | 2017-01-23 | 2019-07-02 | Microsoft Technology Licensing, Llc | Active proximity sensor with adaptive electric field control |
WO2019043828A1 (ja) * | 2017-08-30 | 2019-03-07 | 三菱電機株式会社 | コンデンサ容量測定装置及び電力用機器 |
DE102017124309A1 (de) * | 2017-10-18 | 2019-04-18 | Huf Hülsbeck & Fürst Gmbh & Co. Kg | Verfahren zum Auswerten eines Kapazitätswerts einer kapazitiven Sensorelektrode |
-
2019
- 2019-11-14 DK DK19209285.6T patent/DK3654532T3/da active
- 2019-11-14 EP EP19209285.6A patent/EP3654532B1/en active Active
- 2019-11-15 US US16/684,677 patent/US11112522B2/en active Active
- 2019-11-18 CN CN201911126631.7A patent/CN111197995B/zh active Active
-
2021
- 2021-08-30 US US17/460,753 patent/US20210389494A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
US11112522B2 (en) | 2021-09-07 |
CN111197995A (zh) | 2020-05-26 |
EP3654532B1 (en) | 2022-05-18 |
US20210389494A1 (en) | 2021-12-16 |
EP3654532A1 (en) | 2020-05-20 |
CN111197995B (zh) | 2022-03-15 |
US20200158904A1 (en) | 2020-05-21 |
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