DK1693656T3 - Fotodetektor og spektroskop anvendende samme - Google Patents

Fotodetektor og spektroskop anvendende samme

Info

Publication number
DK1693656T3
DK1693656T3 DK04819369.2T DK04819369T DK1693656T3 DK 1693656 T3 DK1693656 T3 DK 1693656T3 DK 04819369 T DK04819369 T DK 04819369T DK 1693656 T3 DK1693656 T3 DK 1693656T3
Authority
DK
Denmark
Prior art keywords
spectroscope
photodetector
same
Prior art date
Application number
DK04819369.2T
Other languages
English (en)
Inventor
Mitsuaki Kageyama
Katsumi Shibayama
Seiichiro Mizuno
Helmut Teichmann
Dietmar Hiller
Ulrich Starker
Original Assignee
Hamamatsu Photonics Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hamamatsu Photonics Kk filed Critical Hamamatsu Photonics Kk
Application granted granted Critical
Publication of DK1693656T3 publication Critical patent/DK1693656T3/da

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/1446—Devices controlled by radiation in a repetitive configuration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/2803—Investigating the spectrum using photoelectric array detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0243—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows having a through-hole enabling the optical element to fulfil an additional optical function, e.g. a mirror or grating having a throughhole for a light collecting or light injecting optical fiber
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0256—Compact construction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0291—Housings; Spectrometer accessories; Spatial arrangement of elements, e.g. folded path arrangements

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Electromagnetism (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
DK04819369.2T 2003-11-28 2004-11-24 Fotodetektor og spektroskop anvendende samme DK1693656T3 (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2003400278A JP4627402B2 (ja) 2003-11-28 2003-11-28 光検出器を用いた分光器
PCT/JP2004/017411 WO2005052523A1 (ja) 2003-11-28 2004-11-24 光検出器及びそれを用いた分光器

Publications (1)

Publication Number Publication Date
DK1693656T3 true DK1693656T3 (da) 2013-12-16

Family

ID=34631639

Family Applications (1)

Application Number Title Priority Date Filing Date
DK04819369.2T DK1693656T3 (da) 2003-11-28 2004-11-24 Fotodetektor og spektroskop anvendende samme

Country Status (5)

Country Link
US (1) US8125636B2 (da)
EP (1) EP1693656B1 (da)
JP (1) JP4627402B2 (da)
DK (1) DK1693656T3 (da)
WO (1) WO2005052523A1 (da)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5512961B2 (ja) * 2008-05-15 2014-06-04 浜松ホトニクス株式会社 分光モジュール及びその製造方法
JP5592089B2 (ja) 2009-08-19 2014-09-17 浜松ホトニクス株式会社 分光モジュール及びその製造方法
JP6325268B2 (ja) 2014-02-05 2018-05-16 浜松ホトニクス株式会社 分光器、及び分光器の製造方法
US9863809B2 (en) 2015-08-31 2018-01-09 Mettler-Toledo Gmbh Spectrograph
JP6244513B1 (ja) * 2016-06-07 2017-12-06 雫石　誠 光電変換素子とその製造方法、分光分析装置

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2540834B2 (ja) * 1987-02-06 1996-10-09 株式会社ニコン Ｍｏｓ型イメ−ジセンサ
JPH0644640B2 (ja) * 1987-10-29 1994-06-08 浜松ホトニクス株式会社 入射位置検出用半導体装置
JP2546341B2 (ja) * 1988-06-28 1996-10-23 日本電気株式会社 イメージセンサと入出力装置
US5542018A (en) * 1990-08-31 1996-07-30 Kuhara; Yoshiki Semiconductor laser device making use of photodiode chip
SE506654C2 (sv) 1994-09-16 1998-01-26 Sitek Electro Optics Ab Positionskänslig fotodetektor med eliminerad inverkan av ströljus
JPH0989669A (ja) * 1995-09-25 1997-04-04 Olympus Optical Co Ltd 分光器付受光素子及びその製造方法
DE19717015A1 (de) * 1997-04-23 1998-10-29 Inst Mikrotechnik Mainz Gmbh Miniaturisiertes optisches Bauelement sowie Verfahren zu seiner Herstellung
US6573984B2 (en) * 1998-06-30 2003-06-03 Lj Laboratories Llc Apparatus and method for measuring optical characteristics of teeth
JP2002344002A (ja) * 2001-03-12 2002-11-29 Matsushita Electric Ind Co Ltd 受光素子及び受光素子実装体
JP2003139611A (ja) * 2001-11-06 2003-05-14 Olympus Optical Co Ltd 分光光度計
JP2004077433A (ja) 2002-08-22 2004-03-11 Kobe Steel Ltd ダイヤモンド膜紫外線センサ
JP4409860B2 (ja) * 2003-05-28 2010-02-03 浜松ホトニクス株式会社 光検出器を用いた分光器

Also Published As

Publication number Publication date
WO2005052523A1 (ja) 2005-06-09
US8125636B2 (en) 2012-02-28
US20080259331A1 (en) 2008-10-23
EP1693656A1 (en) 2006-08-23
JP2005164286A (ja) 2005-06-23
JP4627402B2 (ja) 2011-02-09
EP1693656A4 (en) 2010-12-08
EP1693656B1 (en) 2013-11-06

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