DK146367C - Maaleapparat til roentgenfluorescensanalyse - Google Patents

Maaleapparat til roentgenfluorescensanalyse

Info

Publication number
DK146367C
DK146367C DK325778A DK325778A DK146367C DK 146367 C DK146367 C DK 146367C DK 325778 A DK325778 A DK 325778A DK 325778 A DK325778 A DK 325778A DK 146367 C DK146367 C DK 146367C
Authority
DK
Denmark
Prior art keywords
roentgen
fluorescent analysis
fluorescent
analysis
roentgen fluorescent
Prior art date
Application number
DK325778A
Other languages
Danish (da)
English (en)
Other versions
DK146367B (da
DK325778A (da
Inventor
Heinrich Schwenke
Joachim Knoth
Rainer Marten
Herbert Rosomm
Original Assignee
Geesthacht Gkss Forschung
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Geesthacht Gkss Forschung filed Critical Geesthacht Gkss Forschung
Publication of DK325778A publication Critical patent/DK325778A/da
Publication of DK146367B publication Critical patent/DK146367B/da
Application granted granted Critical
Publication of DK146367C publication Critical patent/DK146367C/da

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DK325778A 1977-08-17 1978-07-21 Maaleapparat til roentgenfluorescensanalyse DK146367C (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE2736960 1977-08-17
DE2736960A DE2736960C3 (de) 1977-08-17 1977-08-17 Meßanordnung zur Röntgenfluoreszenzanalyse

Publications (3)

Publication Number Publication Date
DK325778A DK325778A (da) 1979-02-18
DK146367B DK146367B (da) 1983-09-19
DK146367C true DK146367C (da) 1984-02-27

Family

ID=6016538

Family Applications (1)

Application Number Title Priority Date Filing Date
DK325778A DK146367C (da) 1977-08-17 1978-07-21 Maaleapparat til roentgenfluorescensanalyse

Country Status (12)

Country Link
US (1) US4426717A (xx)
AT (1) AT368285B (xx)
BE (1) BE869791A (xx)
CA (1) CA1111576A (xx)
CH (1) CH635433A5 (xx)
DE (1) DE2736960C3 (xx)
DK (1) DK146367C (xx)
FR (1) FR2400704A1 (xx)
GB (1) GB2003267B (xx)
IT (1) IT1162195B (xx)
LU (1) LU80106A1 (xx)
NL (1) NL185305C (xx)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3542003A1 (de) * 1985-11-28 1987-06-04 Geesthacht Gkss Forschung Verfahren zur zerstoerungsfreien analyse der oberflaechenschicht von proben
DE3606748C1 (de) * 1986-03-01 1987-10-01 Geesthacht Gkss Forschung Anordnung zur zerstoerungsfreien Messung von Metallspuren
DE3813329A1 (de) * 1988-04-21 1989-11-02 Geesthacht Gkss Forschung Verfahren und anordnung zur sammlung und analyse von staub
EP0372278A3 (de) * 1988-12-02 1991-08-21 Gkss-Forschungszentrum Geesthacht Gmbh Verfahren und Anordung zur Untersuchung von Proben nach der Methode der Röntgenfluoreszenzanalyse
JP2853261B2 (ja) * 1989-05-16 1999-02-03 三菱マテリアル株式会社 金属分析方法および分析装置
US5220591A (en) * 1989-10-19 1993-06-15 Sumitomo Electric Industries, Ltd. Total reflection X-ray fluorescence apparatus
US5249216B1 (en) * 1989-10-19 1996-11-05 Sumitomo Electric Industries Total reflection x-ray fluorescence apparatus
US5014287A (en) * 1990-04-18 1991-05-07 Thornton Michael G Portable x-ray fluorescence spectrometer for environmental monitoring of inorganic pollutants
DE4127778C2 (de) * 1991-04-30 1994-11-03 Picolab Oberflaechen Und Spure Vorrichtung zur Totalreflexions-Röntgenfluoreszenzanalyse
CN109827982B (zh) * 2017-11-23 2024-04-26 核工业西南物理研究院 一种土壤重金属检测的快速检测仪

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3920984A (en) * 1974-04-08 1975-11-18 Machlett Lab Inc X-ray energy analyzer

Also Published As

Publication number Publication date
GB2003267A (en) 1979-03-07
GB2003267B (en) 1982-01-06
LU80106A1 (xx) 1979-01-19
FR2400704B1 (xx) 1983-09-16
NL7808130A (nl) 1979-02-20
CA1111576A (en) 1981-10-27
DE2736960B2 (de) 1979-06-28
FR2400704A1 (fr) 1979-03-16
DK146367B (da) 1983-09-19
IT7883626A0 (it) 1978-07-16
NL185305C (nl) 1990-03-01
US4426717A (en) 1984-01-17
CH635433A5 (de) 1983-03-31
ATA557478A (de) 1982-01-15
DE2736960A1 (de) 1979-03-01
DE2736960C3 (de) 1980-03-06
NL185305B (nl) 1989-10-02
DK325778A (da) 1979-02-18
BE869791A (fr) 1978-12-18
IT1162195B (it) 1987-03-25
AT368285B (de) 1982-09-27

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Legal Events

Date Code Title Description
PBP Patent lapsed