DK1018030T3 - Fremgangsmåde til styring af testprober i et testapparat for elektroniske printkort, samt apparatur til udøvelse af fremgangsmåden - Google Patents
Fremgangsmåde til styring af testprober i et testapparat for elektroniske printkort, samt apparatur til udøvelse af fremgangsmådenInfo
- Publication number
- DK1018030T3 DK1018030T3 DK98942515T DK98942515T DK1018030T3 DK 1018030 T3 DK1018030 T3 DK 1018030T3 DK 98942515 T DK98942515 T DK 98942515T DK 98942515 T DK98942515 T DK 98942515T DK 1018030 T3 DK1018030 T3 DK 1018030T3
- Authority
- DK
- Denmark
- Prior art keywords
- practicing
- circuit board
- electronic circuit
- controlling
- test
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
- G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07392—Multiple probes manipulating each probe element or tip individually
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DK105697 | 1997-09-15 | ||
PCT/DK1998/000392 WO1999014608A1 (en) | 1997-09-15 | 1998-09-14 | A method of controlling test probes in a testing apparatus for electronic printed circuit boards, and an apparatus for performing the method |
Publications (1)
Publication Number | Publication Date |
---|---|
DK1018030T3 true DK1018030T3 (da) | 2003-03-10 |
Family
ID=8100492
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DK98942515T DK1018030T3 (da) | 1997-09-15 | 1998-09-14 | Fremgangsmåde til styring af testprober i et testapparat for elektroniske printkort, samt apparatur til udøvelse af fremgangsmåden |
Country Status (5)
Country | Link |
---|---|
EP (1) | EP1018030B1 (da) |
AU (1) | AU9063298A (da) |
DE (1) | DE69809577T2 (da) |
DK (1) | DK1018030T3 (da) |
WO (1) | WO1999014608A1 (da) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107064779B (zh) * | 2017-05-26 | 2023-10-31 | 深圳市赛伦北斗科技有限责任公司 | 一种电路板测试方法、装置及系统 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4427250A (en) * | 1981-01-19 | 1984-01-24 | Everett/Charles Test Equipment, Inc. | Printed circuit board test fixture with compliant platen |
DK291184D0 (da) * | 1984-06-13 | 1984-06-13 | Boeegh Petersen Allan | Fremgangsmaade og indretning til test af kredsloebsplader |
US5107206A (en) * | 1990-05-25 | 1992-04-21 | Tescon Co., Ltd. | Printed circuit board inspection apparatus |
US5469064A (en) * | 1992-01-14 | 1995-11-21 | Hewlett-Packard Company | Electrical assembly testing using robotic positioning of probes |
US5390283A (en) * | 1992-10-23 | 1995-02-14 | North American Philips Corporation | Method for optimizing the configuration of a pick and place machine |
-
1998
- 1998-09-14 WO PCT/DK1998/000392 patent/WO1999014608A1/en active IP Right Grant
- 1998-09-14 AU AU90632/98A patent/AU9063298A/en not_active Abandoned
- 1998-09-14 EP EP98942515A patent/EP1018030B1/en not_active Expired - Lifetime
- 1998-09-14 DK DK98942515T patent/DK1018030T3/da active
- 1998-09-14 DE DE69809577T patent/DE69809577T2/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP1018030A1 (en) | 2000-07-12 |
AU9063298A (en) | 1999-04-05 |
DE69809577T2 (de) | 2003-07-17 |
DE69809577D1 (de) | 2003-01-02 |
EP1018030B1 (en) | 2002-11-20 |
WO1999014608A1 (en) | 1999-03-25 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE69809313D1 (de) | Verfahren und Vorrichtung zum Prüfen von Leiterplatten | |
DE69734379D1 (de) | Vorrichtung zur Prüfung von integrierten Schaltungen | |
SG78283A1 (en) | Method and apparatus for performing operative testing on an integrated circuit | |
DE69942007D1 (de) | System und verfahren zum identifizieren von endlichen automaten und überprüfung des schaltkreisdesigns | |
NO992124D0 (no) | Apparat omfattende elektroniske og/eller optoelektroniske kretser og fremgangsmÕte til realisering av kretsene | |
GB2392251B (en) | Automatic integrated circuit testing system and device using an integrative computer and method for the same | |
DE69810681D1 (de) | Verfahren und Vorrichtung zum Prüfen von Leiterplatten | |
DE69113537D1 (de) | Verfahren und Vorrichtung zur Musterprüfung gedrukter Schaltungsplatten. | |
DE59712869D1 (de) | Vorrichtung und Verfahren zum Prüfen von Leiterplatten | |
DK0797379T3 (da) | Printplade og fremgangsmåde til bestykning og lodning af electroniske komponenter i nøjagtig position på printpladens overflade | |
DE59813158D1 (de) | Verfahren zum Testen einer elektronischen Schaltung | |
ZA992494B (en) | Method and apparatus for measuring temperature with an integrated circuit device. | |
DE69717216D1 (de) | Schaltplatinenprüfvorrichtung und Verfahren dafür | |
ITTO930486A0 (it) | Metodo e dispositivo di collaudo per schede elettroniche | |
DE19980807D2 (de) | Verfahren und Vorrichtung zum Prüfen von Schraubverbindungen | |
DE59712870D1 (de) | Vorrichtung und Verfahren zum Prüfen von unbestückten Leiterplatten | |
DE59709821D1 (de) | Vorrichtung zum Prüfen von elektrischen Leiterplatten | |
DE69506585D1 (de) | Verfahren und gerät zur prüfung von halbleiterplatten | |
FR2764072B1 (fr) | Procede et dispositif de test pour equipements electroniques | |
DK1018030T3 (da) | Fremgangsmåde til styring af testprober i et testapparat for elektroniske printkort, samt apparatur til udøvelse af fremgangsmåden | |
DE59900130D1 (de) | Vorrichtung zum prüfen von leiterplatten | |
DE59710940D1 (de) | Automatisierte Vorrichtung zum Prüfen von Leiterplatten | |
DK0772048T3 (da) | Anordning til prøvning af printplader og/eller flade moduler | |
DE69904644D1 (de) | Verfahren und vorrichtung zur schnellen fehlererkennung in einer integrierten schaltung | |
DE59802233D1 (de) | Verfahren zum prüfen einer integrierten schaltung |