DK0819187T3 - Fremgangsmåde til dyrkning af en epitaksial film på en oxidoverflade og produkt - Google Patents
Fremgangsmåde til dyrkning af en epitaksial film på en oxidoverflade og produktInfo
- Publication number
- DK0819187T3 DK0819187T3 DK95904844T DK95904844T DK0819187T3 DK 0819187 T3 DK0819187 T3 DK 0819187T3 DK 95904844 T DK95904844 T DK 95904844T DK 95904844 T DK95904844 T DK 95904844T DK 0819187 T3 DK0819187 T3 DK 0819187T3
- Authority
- DK
- Denmark
- Prior art keywords
- perovskite
- spinel
- built
- metal oxide
- layer
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/10—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type
- G02B6/12—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type of the integrated circuit kind
- G02B6/13—Integrated optical circuits characterised by the manufacturing method
- G02B6/131—Integrated optical circuits characterised by the manufacturing method by using epitaxial growth
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B23/00—Single-crystal growth by condensing evaporated or sublimed materials
- C30B23/02—Epitaxial-layer growth
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/16—Oxides
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/16—Oxides
- C30B29/22—Complex oxides
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/16—Oxides
- C30B29/22—Complex oxides
- C30B29/32—Titanates; Germanates; Molybdates; Tungstates
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S438/00—Semiconductor device manufacturing: process
- Y10S438/967—Semiconductor on specified insulator
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Semiconductor Memories (AREA)
- Surface Treatment Of Optical Elements (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/163,427 US5450812A (en) | 1993-07-30 | 1993-12-08 | Process for growing a film epitaxially upon an oxide surface and structures formed with the process |
PCT/US1994/014098 WO1995016061A1 (fr) | 1993-12-08 | 1994-12-08 | Procede de croissance d'un film epitaxial sur une surface d'un oxyde et produit |
Publications (1)
Publication Number | Publication Date |
---|---|
DK0819187T3 true DK0819187T3 (da) | 2000-08-28 |
Family
ID=22589967
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DK95904844T DK0819187T3 (da) | 1993-12-08 | 1994-12-08 | Fremgangsmåde til dyrkning af en epitaksial film på en oxidoverflade og produkt |
Country Status (11)
Country | Link |
---|---|
US (1) | US5450812A (fr) |
EP (1) | EP0819187B1 (fr) |
JP (1) | JP3671055B2 (fr) |
AT (1) | ATE194172T1 (fr) |
CA (1) | CA2178656C (fr) |
DE (1) | DE69425078T2 (fr) |
DK (1) | DK0819187T3 (fr) |
ES (1) | ES2147281T3 (fr) |
GR (1) | GR3034394T3 (fr) |
PT (1) | PT819187E (fr) |
WO (1) | WO1995016061A1 (fr) |
Families Citing this family (46)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19627793C2 (de) * | 1996-07-10 | 2002-02-28 | Forschungszentrum Juelich Gmbh | Wellenleiter |
US6080235A (en) * | 1997-06-03 | 2000-06-27 | Ut-Battelle, Llc | Geometric shape control of thin film ferroelectrics and resulting structures |
US6023082A (en) * | 1996-08-05 | 2000-02-08 | Lockheed Martin Energy Research Corporation | Strain-based control of crystal anisotropy for perovskite oxides on semiconductor-based material |
US6093242A (en) * | 1996-08-05 | 2000-07-25 | Ut-Battelle, Llc | Anisotropy-based crystalline oxide-on-semiconductor material |
US5767543A (en) * | 1996-09-16 | 1998-06-16 | Motorola, Inc. | Ferroelectric semiconductor device having a layered ferroelectric structure |
US6020024A (en) * | 1997-08-04 | 2000-02-01 | Motorola, Inc. | Method for forming high dielectric constant metal oxides |
US6103008A (en) * | 1998-07-30 | 2000-08-15 | Ut-Battelle, Llc | Silicon-integrated thin-film structure for electro-optic applications |
US6248459B1 (en) | 1999-03-22 | 2001-06-19 | Motorola, Inc. | Semiconductor structure having a crystalline alkaline earth metal oxide interface with silicon |
US6241821B1 (en) | 1999-03-22 | 2001-06-05 | Motorola, Inc. | Method for fabricating a semiconductor structure having a crystalline alkaline earth metal oxide interface with silicon |
US6270568B1 (en) * | 1999-07-15 | 2001-08-07 | Motorola, Inc. | Method for fabricating a semiconductor structure with reduced leakage current density |
US6306668B1 (en) | 1999-09-23 | 2001-10-23 | Ut-Battelle, Llc | Control method and system for use when growing thin-films on semiconductor-based materials |
US6479173B1 (en) | 1999-12-17 | 2002-11-12 | Motorola, Inc. | Semiconductor structure having a crystalline alkaline earth metal silicon nitride/oxide interface with silicon |
US6291319B1 (en) | 1999-12-17 | 2001-09-18 | Motorola, Inc. | Method for fabricating a semiconductor structure having a stable crystalline interface with silicon |
US6693033B2 (en) | 2000-02-10 | 2004-02-17 | Motorola, Inc. | Method of removing an amorphous oxide from a monocrystalline surface |
US6392257B1 (en) | 2000-02-10 | 2002-05-21 | Motorola Inc. | Semiconductor structure, semiconductor device, communicating device, integrated circuit, and process for fabricating the same |
US6501973B1 (en) | 2000-06-30 | 2002-12-31 | Motorola, Inc. | Apparatus and method for measuring selected physical condition of an animate subject |
US6427066B1 (en) | 2000-06-30 | 2002-07-30 | Motorola, Inc. | Apparatus and method for effecting communications among a plurality of remote stations |
US6410941B1 (en) | 2000-06-30 | 2002-06-25 | Motorola, Inc. | Reconfigurable systems using hybrid integrated circuits with optical ports |
US6477285B1 (en) | 2000-06-30 | 2002-11-05 | Motorola, Inc. | Integrated circuits with optical signal propagation |
US6555946B1 (en) | 2000-07-24 | 2003-04-29 | Motorola, Inc. | Acoustic wave device and process for forming the same |
US6224669B1 (en) | 2000-09-14 | 2001-05-01 | Motorola, Inc. | Method for fabricating a semiconductor structure having a crystalline alkaline earth metal oxide interface with silicon |
US6638838B1 (en) | 2000-10-02 | 2003-10-28 | Motorola, Inc. | Semiconductor structure including a partially annealed layer and method of forming the same |
US6583034B2 (en) | 2000-11-22 | 2003-06-24 | Motorola, Inc. | Semiconductor structure including a compliant substrate having a graded monocrystalline layer and methods for fabricating the structure and semiconductor devices including the structure |
US6563118B2 (en) | 2000-12-08 | 2003-05-13 | Motorola, Inc. | Pyroelectric device on a monocrystalline semiconductor substrate and process for fabricating same |
US6673646B2 (en) | 2001-02-28 | 2004-01-06 | Motorola, Inc. | Growth of compound semiconductor structures on patterned oxide films and process for fabricating same |
US7046719B2 (en) | 2001-03-08 | 2006-05-16 | Motorola, Inc. | Soft handoff between cellular systems employing different encoding rates |
US20020152953A1 (en) * | 2001-04-23 | 2002-10-24 | Chambers Scott A. | Spinel-structured metal oxide on a substrate and method of making same by molecular beam epitaxy |
US6709989B2 (en) | 2001-06-21 | 2004-03-23 | Motorola, Inc. | Method for fabricating a semiconductor structure including a metal oxide interface with silicon |
US6646293B2 (en) | 2001-07-18 | 2003-11-11 | Motorola, Inc. | Structure for fabricating high electron mobility transistors utilizing the formation of complaint substrates |
US6693298B2 (en) | 2001-07-20 | 2004-02-17 | Motorola, Inc. | Structure and method for fabricating epitaxial semiconductor on insulator (SOI) structures and devices utilizing the formation of a compliant substrate for materials used to form same |
US6472694B1 (en) | 2001-07-23 | 2002-10-29 | Motorola, Inc. | Microprocessor structure having a compound semiconductor layer |
US6594414B2 (en) | 2001-07-25 | 2003-07-15 | Motorola, Inc. | Structure and method of fabrication for an optical switch |
US6667196B2 (en) | 2001-07-25 | 2003-12-23 | Motorola, Inc. | Method for real-time monitoring and controlling perovskite oxide film growth and semiconductor structure formed using the method |
US6585424B2 (en) | 2001-07-25 | 2003-07-01 | Motorola, Inc. | Structure and method for fabricating an electro-rheological lens |
CN1402027A (zh) * | 2001-08-03 | 2003-03-12 | Asml美国公司 | 能用于光波导的氧化物构件及其制造方法 |
US6462360B1 (en) | 2001-08-06 | 2002-10-08 | Motorola, Inc. | Integrated gallium arsenide communications systems |
US6639249B2 (en) | 2001-08-06 | 2003-10-28 | Motorola, Inc. | Structure and method for fabrication for a solid-state lighting device |
US6589856B2 (en) | 2001-08-06 | 2003-07-08 | Motorola, Inc. | Method and apparatus for controlling anti-phase domains in semiconductor structures and devices |
US6673667B2 (en) | 2001-08-15 | 2004-01-06 | Motorola, Inc. | Method for manufacturing a substantially integral monolithic apparatus including a plurality of semiconductor materials |
AU2003278763A1 (en) | 2002-09-04 | 2004-03-29 | Massachusetts Institute Of Technology | Optical isolator with magneto-optical material and manufacturing method |
US9023662B2 (en) | 2011-05-09 | 2015-05-05 | Board Of Regents, The University Of Texas System | Efficiently injecting spin-polarized current into semiconductors by interfacing crystalline ferromagnetic oxides directly on the semiconductor material |
US20130320813A1 (en) * | 2012-06-04 | 2013-12-05 | Tdk Corporation | Dielectric device |
US20180151301A1 (en) * | 2016-11-25 | 2018-05-31 | The Boeing Company | Epitaxial perovskite materials for optoelectronics |
US11342484B2 (en) | 2020-05-11 | 2022-05-24 | Silanna UV Technologies Pte Ltd | Metal oxide semiconductor-based light emitting device |
EP4430674A1 (fr) | 2021-11-10 | 2024-09-18 | Silanna UV Technologies Pte Ltd | Matériaux oxydes épitaxiaux, structures et dispositifs |
CN118369767A (zh) | 2021-11-10 | 2024-07-19 | 斯兰纳Uv科技有限公司 | 外延氧化物材料、结构和装置 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3655429A (en) * | 1969-04-16 | 1972-04-11 | Westinghouse Electric Corp | Method of forming thin insulating films particularly for piezoelectric transducers |
US4996187A (en) * | 1988-10-17 | 1991-02-26 | Allied-Signal Inc. | Epitaxial Ba-Y-Cu-O superconductor film |
US5225031A (en) * | 1991-04-10 | 1993-07-06 | Martin Marietta Energy Systems, Inc. | Process for depositing an oxide epitaxially onto a silicon substrate and structures prepared with the process |
US5323024A (en) * | 1992-10-09 | 1994-06-21 | Adams Jeff C | Relativistic semiconductor plasma wave frequency up-converter |
-
1993
- 1993-12-08 US US08/163,427 patent/US5450812A/en not_active Expired - Lifetime
-
1994
- 1994-12-08 DK DK95904844T patent/DK0819187T3/da active
- 1994-12-08 PT PT95904844T patent/PT819187E/pt unknown
- 1994-12-08 CA CA002178656A patent/CA2178656C/fr not_active Expired - Fee Related
- 1994-12-08 WO PCT/US1994/014098 patent/WO1995016061A1/fr active IP Right Grant
- 1994-12-08 JP JP51633395A patent/JP3671055B2/ja not_active Expired - Fee Related
- 1994-12-08 DE DE69425078T patent/DE69425078T2/de not_active Expired - Fee Related
- 1994-12-08 EP EP95904844A patent/EP0819187B1/fr not_active Expired - Lifetime
- 1994-12-08 ES ES95904844T patent/ES2147281T3/es not_active Expired - Lifetime
- 1994-12-08 AT AT95904844T patent/ATE194172T1/de not_active IP Right Cessation
-
2000
- 2000-09-13 GR GR20000402084T patent/GR3034394T3/el not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
ES2147281T3 (es) | 2000-09-01 |
CA2178656A1 (fr) | 1995-06-15 |
EP0819187B1 (fr) | 2000-06-28 |
EP0819187A4 (fr) | 1998-01-21 |
EP0819187A1 (fr) | 1998-01-21 |
ATE194172T1 (de) | 2000-07-15 |
CA2178656C (fr) | 2005-06-28 |
WO1995016061A1 (fr) | 1995-06-15 |
GR3034394T3 (en) | 2000-12-29 |
DE69425078T2 (de) | 2000-11-02 |
PT819187E (pt) | 2000-10-31 |
JP3671055B2 (ja) | 2005-07-13 |
DE69425078D1 (de) | 2000-08-03 |
JPH09509640A (ja) | 1997-09-30 |
US5450812A (en) | 1995-09-19 |
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