DK0392830T3 - Fremgangsmåde og apparat til detektering af spænding - Google Patents

Fremgangsmåde og apparat til detektering af spænding

Info

Publication number
DK0392830T3
DK0392830T3 DK90303924.6T DK90303924T DK0392830T3 DK 0392830 T3 DK0392830 T3 DK 0392830T3 DK 90303924 T DK90303924 T DK 90303924T DK 0392830 T3 DK0392830 T3 DK 0392830T3
Authority
DK
Denmark
Prior art keywords
measured
electrooptic material
voltage
light beam
detecting voltage
Prior art date
Application number
DK90303924.6T
Other languages
Danish (da)
English (en)
Inventor
Hironori Takahashi
Shinichiro Aoshima
Yutaka Tsuchiya
Original Assignee
Hamamatsu Photonics Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hamamatsu Photonics Kk filed Critical Hamamatsu Photonics Kk
Application granted granted Critical
Publication of DK0392830T3 publication Critical patent/DK0392830T3/da

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/07—Non contact-making probes
    • G01R1/071—Non contact-making probes containing electro-optic elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/24—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
    • G01R15/241—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption
    • G01R15/242—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption based on the Pockels effect, i.e. linear electro-optic effect

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
DK90303924.6T 1989-04-12 1990-04-11 Fremgangsmåde og apparat til detektering af spænding DK0392830T3 (da)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9215389 1989-04-12

Publications (1)

Publication Number Publication Date
DK0392830T3 true DK0392830T3 (da) 1994-10-24

Family

ID=14046476

Family Applications (1)

Application Number Title Priority Date Filing Date
DK90303924.6T DK0392830T3 (da) 1989-04-12 1990-04-11 Fremgangsmåde og apparat til detektering af spænding

Country Status (5)

Country Link
US (1) US5055770A (de)
EP (1) EP0392830B1 (de)
AT (1) ATE107778T1 (de)
DE (1) DE69010053T2 (de)
DK (1) DK0392830T3 (de)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2676543B1 (fr) * 1991-05-14 1998-03-06 Thomson Csf Dispositif pour tests hyperfrequences a large bande realises in situ.
EP0541139B1 (de) * 1991-08-05 2003-01-22 Koninklijke Philips Electronics N.V. Elektrooptische Messanordnung zum Messen eines elektrischen Signals in einem elektronischen Bauteil
US5635831A (en) * 1991-12-11 1997-06-03 Imatran Voima Oy Optical voltage and electric field sensor based on the pockels effect
JPH06265574A (ja) * 1993-03-15 1994-09-22 Hamamatsu Photonics Kk Ｅ−ｏプローブ
US5808473A (en) * 1994-08-04 1998-09-15 Nippon Telegraph & Telephone Corp. Electric signal measurement apparatus using electro-optic sampling by one point contact
US6034883A (en) * 1998-01-29 2000-03-07 Tinney; Charles E. Solid state director for beams
US6567206B1 (en) * 2001-12-20 2003-05-20 St. Clair Intellectual Property Consultants, Inc. Multi-stage optical switching device
EP1462810B1 (de) * 2003-03-28 2015-09-09 ABB Research Ltd. Temperaturkompensierter elektrooptischer Spannungssensor
EP1462811A1 (de) * 2003-03-28 2004-09-29 Abb Research Ltd. Elektrooptischer Spannungssensor für hohe Spannungen
US7177494B1 (en) 2005-01-14 2007-02-13 St. Clair Intellectual Property Consultants, Inc. Optical control device and method
JP6192890B2 (ja) * 2011-11-25 2017-09-06 東芝三菱電機産業システム株式会社 表面電位分布計測装置および表面電位分布計測方法
CA2907558C (en) 2013-03-19 2018-05-01 Toshiba Mitsubishi-Electric Industrial Systems Corporation Surface potential distribution measuring device
JP6642154B2 (ja) 2016-03-17 2020-02-05 富士通株式会社 光送信器および光信号を送信する方法

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5327938B2 (de) * 1971-12-17 1978-08-11
JPS4881554A (de) * 1972-02-01 1973-10-31
DE2845625A1 (de) * 1978-10-19 1980-04-30 Siemens Ag Anordnung zur elektrooptischen spannungsmessung
US4298794A (en) * 1979-08-30 1981-11-03 United Technologies Corporation Fiber optic hot spot detector
JPS5832171A (ja) * 1981-07-27 1983-02-25 Sumitomo Electric Ind Ltd 光応用電圧電界センサ
US4422035A (en) * 1981-12-11 1983-12-20 Extrude Hone Corporation Capacitance measurement probe
JPS58113764A (ja) * 1981-12-26 1983-07-06 Mitsubishi Electric Corp 交流電界測定装置
US4446425A (en) * 1982-02-12 1984-05-01 The University Of Rochester Measurement of electrical signals with picosecond resolution
DE3301939A1 (de) * 1983-01-21 1984-07-26 Max Planck Gesellschaft, 3400 Göttingen Anordnung zur messung von potentialdifferenzen
JPS59147274A (ja) * 1983-02-10 1984-08-23 Hitachi Ltd 光方式電界測定装置
US4603293A (en) * 1984-03-27 1986-07-29 University Of Rochester Measurement of electrical signals with subpicosecond resolution
US4618819A (en) * 1984-03-27 1986-10-21 The University Of Rochester Measurement of electrical signals with subpicosecond resolution
US4681449A (en) * 1984-09-07 1987-07-21 Stanford University High speed testing of electronic circuits by electro-optic sampling
EP0197196A1 (de) * 1985-03-08 1986-10-15 The University Of Rochester Elektro-elektronenoptisches Oszilloskop zur Zeitauflösung elektrischer Wellenzüge im Picosekundenbereich
JPH0695108B2 (ja) * 1986-11-25 1994-11-24 浜松ホトニクス株式会社 回路電圧検出装置
US4910458A (en) * 1987-03-24 1990-03-20 Princeton Applied Research Corp. Electro-optic sampling system with dedicated electro-optic crystal and removable sample carrier
US4926043A (en) * 1987-03-31 1990-05-15 Siemens Aktiengesellschaft Apparatus and method for optical measuring and imaging of electrical potentials
JPH0695109B2 (ja) * 1987-05-30 1994-11-24 浜松ホトニクス株式会社 電圧検出装置
DE3877628T2 (de) * 1987-05-31 1993-05-13 Hamamatsu Photonics Kk Spannungsdetektor.
JPH0695112B2 (ja) * 1987-06-10 1994-11-24 浜松ホトニクス株式会社 電圧検出装置
FR2633055B2 (fr) * 1987-07-31 1991-01-04 Schlumberger Ind Sa Perfectionnements aux testeurs de circuits
EP0299432B1 (de) * 1987-07-13 1994-06-08 Hamamatsu Photonics K.K. Anordnung eines Spannungsdetektors
DE3740468A1 (de) * 1987-11-28 1989-06-08 Kernforschungsz Karlsruhe Vorrichtung zur beruehrungslosen messung statischer und/oder zeitlich veraenderlicher elektrischer felder
JP2665231B2 (ja) * 1988-05-13 1997-10-22 浜松ホトニクス株式会社 光波形測定装置

Also Published As

Publication number Publication date
US5055770A (en) 1991-10-08
EP0392830A2 (de) 1990-10-17
EP0392830A3 (de) 1991-07-03
ATE107778T1 (de) 1994-07-15
DE69010053D1 (de) 1994-07-28
EP0392830B1 (de) 1994-06-22
DE69010053T2 (de) 1994-10-13

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