DE9401711U1 - Abbildungsvorrichtung - Google Patents

Abbildungsvorrichtung

Info

Publication number
DE9401711U1
DE9401711U1 DE9401711U DE9401711U DE9401711U1 DE 9401711 U1 DE9401711 U1 DE 9401711U1 DE 9401711 U DE9401711 U DE 9401711U DE 9401711 U DE9401711 U DE 9401711U DE 9401711 U1 DE9401711 U1 DE 9401711U1
Authority
DE
Germany
Prior art keywords
imaging device
imaging
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE9401711U
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
KRATZER AUTOMATISIERUNG GmbH
Original Assignee
KRATZER AUTOMATISIERUNG GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by KRATZER AUTOMATISIERUNG GmbH filed Critical KRATZER AUTOMATISIERUNG GmbH
Priority to DE9401711U priority Critical patent/DE9401711U1/de
Priority to AU15745/95A priority patent/AU1574595A/en
Priority to EP95907548A priority patent/EP0742898B1/de
Priority to AT95907548T priority patent/ATE154702T1/de
Priority to DE59500333T priority patent/DE59500333D1/de
Priority to PCT/DE1995/000132 priority patent/WO1995021376A1/de
Priority to KR1019960704174A priority patent/KR970700860A/ko
Priority to JP7520315A priority patent/JPH09511592A/ja
Publication of DE9401711U1 publication Critical patent/DE9401711U1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08—Monitoring manufacture of assemblages
    • H05K13/081—Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
    • H05K13/0813—Controlling of single components prior to mounting, e.g. orientation, component geometry

Landscapes

  • Engineering & Computer Science (AREA)
  • Operations Research (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
DE9401711U 1994-02-02 1994-02-02 Abbildungsvorrichtung Expired - Lifetime DE9401711U1 (de)

Priority Applications (8)

Application Number Priority Date Filing Date Title
DE9401711U DE9401711U1 (de) 1994-02-02 1994-02-02 Abbildungsvorrichtung
AU15745/95A AU1574595A (en) 1994-02-02 1995-02-01 Device for imaging a three-dimensional object
EP95907548A EP0742898B1 (de) 1994-02-02 1995-02-01 Vorrichtung zum abbilden eines dreidimensionalen objekts
AT95907548T ATE154702T1 (de) 1994-02-02 1995-02-01 Vorrichtung zum abbilden eines dreidimensionalen objekts
DE59500333T DE59500333D1 (de) 1994-02-02 1995-02-01 Vorrichtung zum abbilden eines dreidimensionalen objekts
PCT/DE1995/000132 WO1995021376A1 (de) 1994-02-02 1995-02-01 Vorrichtung zum abbilden eines dreidimensionalen objekts
KR1019960704174A KR970700860A (ko) 1994-02-02 1995-02-01 3차원 객체를 이미지화하기 위한 장치(device for imaging a three-dimensional object)
JP7520315A JPH09511592A (ja) 1994-02-02 1995-02-01 三次元物体の画像形成装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE9401711U DE9401711U1 (de) 1994-02-02 1994-02-02 Abbildungsvorrichtung

Publications (1)

Publication Number Publication Date
DE9401711U1 true DE9401711U1 (de) 1995-06-01

Family

ID=6904036

Family Applications (1)

Application Number Title Priority Date Filing Date
DE9401711U Expired - Lifetime DE9401711U1 (de) 1994-02-02 1994-02-02 Abbildungsvorrichtung

Country Status (1)

Country Link
DE (1) DE9401711U1 (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102014213086A1 (de) 2014-07-04 2016-01-07 Mahle International Gmbh Verfahren zur Prüfung der Verlötung eines Bauteils, sowie Wärmeübertrager

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2617457B2 (de) * 1975-04-21 1979-05-03 Ball Brothers Service Corp., Muncie, Ind. (V.St.A.) Vorrichtung zum Prüfen von durchsichtigen, axial symmetrischen Gegenständen auf Fehler
DE3106398A1 (de) * 1980-02-21 1981-12-10 Hajime Industries, Ltd., Tokyo Fehlstellenueberpruefungssystem
EP0385474A2 (de) * 1989-03-02 1990-09-05 Omron Corporation Verfahren und Einrichtung zur Untersuchung von gedruckten Schaltungen
US4959898A (en) * 1990-05-22 1990-10-02 Emhart Industries, Inc. Surface mount machine with lead coplanarity verifier
WO1991015104A1 (en) * 1990-03-23 1991-10-03 Icos Vision Systems N.V. Method and device for determining a position of at least one lead of an electronic component
DE4139189A1 (de) * 1990-11-29 1992-06-11 Matsushita Electric Ind Co Ltd Verfahren zur pruefung der aeusseren beschaffenheit von objekten
DE4032327C2 (de) * 1990-10-11 1992-07-23 Abos Automation, Bildverarbeitung, Optische Systeme Gmbh, 8057 Eching, De

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2617457B2 (de) * 1975-04-21 1979-05-03 Ball Brothers Service Corp., Muncie, Ind. (V.St.A.) Vorrichtung zum Prüfen von durchsichtigen, axial symmetrischen Gegenständen auf Fehler
DE3106398A1 (de) * 1980-02-21 1981-12-10 Hajime Industries, Ltd., Tokyo Fehlstellenueberpruefungssystem
EP0385474A2 (de) * 1989-03-02 1990-09-05 Omron Corporation Verfahren und Einrichtung zur Untersuchung von gedruckten Schaltungen
WO1991015104A1 (en) * 1990-03-23 1991-10-03 Icos Vision Systems N.V. Method and device for determining a position of at least one lead of an electronic component
US4959898A (en) * 1990-05-22 1990-10-02 Emhart Industries, Inc. Surface mount machine with lead coplanarity verifier
DE4032327C2 (de) * 1990-10-11 1992-07-23 Abos Automation, Bildverarbeitung, Optische Systeme Gmbh, 8057 Eching, De
DE4139189A1 (de) * 1990-11-29 1992-06-11 Matsushita Electric Ind Co Ltd Verfahren zur pruefung der aeusseren beschaffenheit von objekten

Non-Patent Citations (4)

* Cited by examiner, † Cited by third party
Title
JP 3-155700 A.,E-1118,Oct. 3,1991,Vol.15,No.390 *
JP Patents Abstracts of Japan: JP 3-110900 A.,E-1097,Aug. 7,1991,Vol.15,No.308 *
Schrift des Instituts für Technische Optik, ITO: 3D-Meßtechnik und beleuchtungsdynamische Inspektion, Unviversität Stuttgart *
SCHUH,Wolfgang: Die Spreu vom Weizen trennen. In: productronic 3-1990, S.50-52 *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102014213086A1 (de) 2014-07-04 2016-01-07 Mahle International Gmbh Verfahren zur Prüfung der Verlötung eines Bauteils, sowie Wärmeübertrager

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