DE934436C - Method and device for producing equidistant, mutually variable strips - Google Patents

Method and device for producing equidistant, mutually variable strips

Info

Publication number
DE934436C
DE934436C DED17322A DED0017322A DE934436C DE 934436 C DE934436 C DE 934436C DE D17322 A DED17322 A DE D17322A DE D0017322 A DED0017322 A DE D0017322A DE 934436 C DE934436 C DE 934436C
Authority
DE
Germany
Prior art keywords
equidistant
producing
mutually variable
distance
strips
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DED17322A
Other languages
German (de)
Inventor
Ernst Dr Lau
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Akademie der Wissenschaften der DDR
Original Assignee
Akademie der Wissenschaften der DDR
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Akademie der Wissenschaften der DDR filed Critical Akademie der Wissenschaften der DDR
Priority to DED17322A priority Critical patent/DE934436C/en
Application granted granted Critical
Publication of DE934436C publication Critical patent/DE934436C/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/32—Fiducial marks and measuring scales within the optical system

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Description

Blekanntlich ver"endet man für viele Messungen Systeme äquidistanter Striche bzw. Meßmarken. For many measurements, systems are known to be more equidistant Lines or measuring marks.

Diese Striche werden entweder auf Maßstäbe direkt aufgebracht oder durch Fädensysteme gebildet. Nach der Erfindung werden solche Strichsysteme dadurch erzeugt, daß zwei Fresnel-Zonenplatten übereinandergelegt und gegeneinander verschoben werden.These lines are either applied directly to rulers or formed by thread systems. According to the invention, such line systems are thereby generated that two Fresnel zone plates placed one above the other and shifted against each other will.

Hierbei wird unter einer Fresnel-Zonenplatte ein System konzentrischer Kreise verstanden, deren Radius mit der Wurzel' aus ganzen Zahlen wächst (vgl. die Abb. 1). Legt man zwei derartige Platten aufeinander, so entstehen, sobald den Zentren ein Abstand gegeben wird, Überlagerungen, die auf geraden Linien liegen, die parallel und äquidistant sind (vgl. Abb. 2 und 3). Der Abstand dieser Geraden hängt einerseits von der Größe der Konstanten der Zonenplatten ab und ist umgekehrt proportional zu der Entfernung der Zentren voneinander. Man ist also, wenn man den Abstand der Zentren variabel gestaltet, in Ider Lage, Systeme von parallelen, äquidistanten Geraden zu erzeugen, deren Abstand variabel ist und umgekehrt proportional dem Abstand der Zonenzentren ist.Here, a system becomes more concentric under a Fresnel zone plate Understood circles, the radius of which increases with the square root of whole numbers (cf. Fig. 1). If one puts two such plates on top of one another, the centers emerge as soon as they are a distance is given, overlays that lie on straight lines that are parallel and are equidistant (see Fig. 2 and 3). The distance between these straight lines depends on the one hand depends on the size of the constant of the zone plates and is inversely proportional to the distance of the centers from one another. So you are when you measure the distance of the Centers variably designed, in any position, systems of parallel, equidistant Generate straight lines, the distance between which is variable and inversely proportional to the distance which is zone centers.

Derartige Liniensysteme haben für die Meßtechnik eine große Bedeutung. Sie können z. B. auch in Bildebenen von z. B. Fernrohren angebracht oder in die Bildebene ein;gespiegelt werden und dort zur Messung z. B. äquidistanter Marken von beobachteten Gegenständen verwendet werden. Dies ist vorwiegend bei solchen Instrumenten der Fall, bei denen kleiine parallaktische Winkel gemessen werden müssen. Such line systems are of great importance for measurement technology. You can e.g. B. also in image planes of z. B. telescopes attached or in the Image plane; be mirrored and there for measurement e.g. B. equidistant brands used by observed objects. This is predominantly with such This is the case with instruments in which small parallactic angles have to be measured.

Claims (3)

PATENTANSPRÜCHE: I. Verfahren zur Erzeugung einer Schar von parallelen Geraden. mit konstantem Abstand, dadurch gekennzeichnet, daß zwei Fresnel-Zonenplatten übereinandergelegt und gegeneinander verschoben werden. PATENT CLAIMS: I. Method for generating a family of parallel Straight lines. with constant spacing, characterized in that two Fresnel zone plates placed one on top of the other and shifted against each other. 2. Vorrichtung zur Durchführung des Verfahrens nach Anspruch I, dadurch gekennzeichnet, daß die bei,den Zonenpiatten gegeneinander verschiebbar ausgebildet und angeordnet sind. 2. Apparatus for performing the method according to claim I, characterized characterized in that the at, the zone plates are designed to be displaceable relative to one another and are arranged. 3. Vorrichtung nach Anspruch 2, dadurch gekennzeichnet, daß sie zur Messung von Größen in der Bildebene oder einer Zwischenabbildung eines optischen Meßinstrumentes dient. 3. Apparatus according to claim 2, characterized in that it is used for Measurement of quantities in the image plane or an intermediate image of an optical one Measuring instrument is used.
DED17322A 1954-03-17 1954-03-17 Method and device for producing equidistant, mutually variable strips Expired DE934436C (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DED17322A DE934436C (en) 1954-03-17 1954-03-17 Method and device for producing equidistant, mutually variable strips

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DED17322A DE934436C (en) 1954-03-17 1954-03-17 Method and device for producing equidistant, mutually variable strips

Publications (1)

Publication Number Publication Date
DE934436C true DE934436C (en) 1955-10-20

Family

ID=7035627

Family Applications (1)

Application Number Title Priority Date Filing Date
DED17322A Expired DE934436C (en) 1954-03-17 1954-03-17 Method and device for producing equidistant, mutually variable strips

Country Status (1)

Country Link
DE (1) DE934436C (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3039483A1 (en) * 1980-10-18 1982-04-29 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut INCREMENTAL LENGTH OR ANGLE MEASURING DEVICE

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3039483A1 (en) * 1980-10-18 1982-04-29 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut INCREMENTAL LENGTH OR ANGLE MEASURING DEVICE

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