DE9116591U1 - - Google Patents

Info

Publication number
DE9116591U1
DE9116591U1 DE9116591U DE9116591U DE9116591U1 DE 9116591 U1 DE9116591 U1 DE 9116591U1 DE 9116591 U DE9116591 U DE 9116591U DE 9116591 U DE9116591 U DE 9116591U DE 9116591 U1 DE9116591 U1 DE 9116591U1
Authority
DE
Germany
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE9116591U
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to DE9116591U priority Critical patent/DE9116591U1/de
Priority claimed from DE4109908A external-priority patent/DE4109908C2/de
Publication of DE9116591U1 publication Critical patent/DE9116591U1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2831—Testing of materials or semi-finished products, e.g. semiconductor wafers or substrates
DE9116591U 1991-03-26 1991-03-26 Expired - Lifetime DE9116591U1 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE9116591U DE9116591U1 (de) 1991-03-26 1991-03-26

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE4109908A DE4109908C2 (de) 1991-03-26 1991-03-26 Anordnung zur Prüfung von Halbleiter-Wafern
DE9116591U DE9116591U1 (de) 1991-03-26 1991-03-26

Publications (1)

Publication Number Publication Date
DE9116591U1 true DE9116591U1 (de) 1993-04-08

Family

ID=25902264

Family Applications (1)

Application Number Title Priority Date Filing Date
DE9116591U Expired - Lifetime DE9116591U1 (de) 1991-03-26 1991-03-26

Country Status (1)

Country Link
DE (1) DE9116591U1 (de)

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Legal Events

Date Code Title Description
R173 Request for cancellation of utility model withdrawn
R173 Request for cancellation of utility model withdrawn

Effective date: 20130130