DE9100432U1 - - Google Patents

Info

Publication number
DE9100432U1
DE9100432U1 DE9100432U DE9100432U DE9100432U1 DE 9100432 U1 DE9100432 U1 DE 9100432U1 DE 9100432 U DE9100432 U DE 9100432U DE 9100432 U DE9100432 U DE 9100432U DE 9100432 U1 DE9100432 U1 DE 9100432U1
Authority
DE
Germany
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE9100432U
Other languages
German (de)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG filed Critical Siemens AG
Priority to DE9100432U priority Critical patent/DE9100432U1/de
Publication of DE9100432U1 publication Critical patent/DE9100432U1/de
Priority to EP19920100205 priority patent/EP0495380A3/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R11/00—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts
    • H01R11/11—End pieces or tapping pieces for wires, supported by the wire and for facilitating electrical connection to some other wire, terminal or conductive member
    • H01R11/18—End pieces terminating in a probe
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G01R1/06738—Geometry aspects related to tip portion
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G01R1/0675—Needle-like
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
DE9100432U 1991-01-15 1991-01-15 Expired - Lifetime DE9100432U1 (US06272257-20010807-P00051.png)

Priority Applications (2)

Application Number Priority Date Filing Date Title
DE9100432U DE9100432U1 (US06272257-20010807-P00051.png) 1991-01-15 1991-01-15
EP19920100205 EP0495380A3 (en) 1991-01-15 1992-01-08 Probe tip for electric test fixture

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE9100432U DE9100432U1 (US06272257-20010807-P00051.png) 1991-01-15 1991-01-15

Publications (1)

Publication Number Publication Date
DE9100432U1 true DE9100432U1 (US06272257-20010807-P00051.png) 1991-04-04

Family

ID=6863359

Family Applications (1)

Application Number Title Priority Date Filing Date
DE9100432U Expired - Lifetime DE9100432U1 (US06272257-20010807-P00051.png) 1991-01-15 1991-01-15

Country Status (2)

Country Link
EP (1) EP0495380A3 (US06272257-20010807-P00051.png)
DE (1) DE9100432U1 (US06272257-20010807-P00051.png)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19617488A1 (de) * 1996-05-02 1997-11-13 Gustav Dr Krueger Kontaktelement für lösbare elektrische Verbindungen
DE19939955A1 (de) * 1999-08-23 2001-03-01 Atg Test Systems Gmbh Prüfnadel für einen Rasteranpassungsadapter einer Vorrichtung zum Testen von Leiterplatten
DE202009012411U1 (de) 2009-09-11 2010-12-30 Ptr Messtechnik Gmbh & Co. Kg Schaltfeder-Kontaktstift

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6408257B2 (ja) * 2013-06-07 2018-10-17 国立研究開発法人物質・材料研究機構 コンタクトプローブ及びその製造方法、非破壊的なコンタクト形成方法、多層膜の製造過程における測定方法並びにプローバー

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3014127A1 (de) * 1979-05-09 1980-11-27 Elektromat Veb Pruefspitze zur zwischenmessung von halbleiterchips und deren herstellungsverfahren
US4481467A (en) * 1981-07-30 1984-11-06 At&T Technologies, Inc. Break-away test probe
JPS63128264A (ja) * 1986-11-18 1988-05-31 Nec Corp プロ−ブ　カ−ド
US4791363A (en) * 1987-09-28 1988-12-13 Logan John K Ceramic microstrip probe blade
DE3818728A1 (de) * 1988-06-01 1989-12-14 Feinmetall Gmbh Federkontaktstift

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19617488A1 (de) * 1996-05-02 1997-11-13 Gustav Dr Krueger Kontaktelement für lösbare elektrische Verbindungen
DE19617488C2 (de) * 1996-05-02 2002-03-07 Gustav Krueger Kontaktelement für lösbare elektrische Verbindungen
DE19939955A1 (de) * 1999-08-23 2001-03-01 Atg Test Systems Gmbh Prüfnadel für einen Rasteranpassungsadapter einer Vorrichtung zum Testen von Leiterplatten
US6646457B2 (en) 1999-08-23 2003-11-11 Atg Test Systems Gmbh & Co. Kg Test needle for pattern adapter of circuit board tester
DE202009012411U1 (de) 2009-09-11 2010-12-30 Ptr Messtechnik Gmbh & Co. Kg Schaltfeder-Kontaktstift
WO2011029496A1 (de) 2009-09-11 2011-03-17 Ptr Messtechnik Gmbh & Co. Kg Schaltfeder-kontaktstift

Also Published As

Publication number Publication date
EP0495380A3 (en) 1992-12-09
EP0495380A2 (de) 1992-07-22

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