DE8528346U1 - Vorrichtung zur on-line-Messung von Transmission oder Reflexion an bewegten Objekten im Bereich detektierbarer elektromagnetischer Strahlung - Google Patents
Vorrichtung zur on-line-Messung von Transmission oder Reflexion an bewegten Objekten im Bereich detektierbarer elektromagnetischer StrahlungInfo
- Publication number
- DE8528346U1 DE8528346U1 DE8528346U DE8528346U DE8528346U1 DE 8528346 U1 DE8528346 U1 DE 8528346U1 DE 8528346 U DE8528346 U DE 8528346U DE 8528346 U DE8528346 U DE 8528346U DE 8528346 U1 DE8528346 U1 DE 8528346U1
- Authority
- DE
- Germany
- Prior art keywords
- measuring
- transmission
- detector
- reflection
- measurement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000005259 measurement Methods 0.000 title claims description 43
- 230000005540 biological transmission Effects 0.000 title claims description 34
- 230000005670 electromagnetic radiation Effects 0.000 title description 3
- 238000012360 testing method Methods 0.000 claims description 20
- 238000012935 Averaging Methods 0.000 claims description 19
- 238000000034 method Methods 0.000 claims description 11
- 238000001514 detection method Methods 0.000 claims description 7
- 230000003287 optical effect Effects 0.000 claims description 7
- 229910000673 Indium arsenide Inorganic materials 0.000 claims description 3
- RPQDHPTXJYYUPQ-UHFFFAOYSA-N indium arsenide Chemical compound [In]#[As] RPQDHPTXJYYUPQ-UHFFFAOYSA-N 0.000 claims description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 2
- 230000002238 attenuated effect Effects 0.000 claims description 2
- 230000015572 biosynthetic process Effects 0.000 claims description 2
- 238000005375 photometry Methods 0.000 claims description 2
- 230000005855 radiation Effects 0.000 claims description 2
- 229910052710 silicon Inorganic materials 0.000 claims description 2
- 239000010703 silicon Substances 0.000 claims description 2
- 244000309464 bull Species 0.000 claims 1
- 238000001035 drying Methods 0.000 claims 1
- 239000011521 glass Substances 0.000 description 5
- 238000005070 sampling Methods 0.000 description 4
- 238000000576 coating method Methods 0.000 description 3
- 230000032683 aging Effects 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 239000003086 colorant Substances 0.000 description 2
- 238000011109 contamination Methods 0.000 description 2
- 238000013016 damping Methods 0.000 description 2
- 238000003384 imaging method Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000003908 quality control method Methods 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000003708 edge detection Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 239000005357 flat glass Substances 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
- G01J1/16—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using electric radiation detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/86—Investigating moving sheets
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
- G01J1/16—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using electric radiation detectors
- G01J2001/161—Ratio method, i.e. Im/Ir
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J2001/4242—Modulated light, e.g. for synchronizing source and detector circuit
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/59—Transmissivity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/8422—Investigating thin films, e.g. matrix isolation method
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE8528346U DE8528346U1 (de) | 1985-10-04 | 1985-10-04 | Vorrichtung zur on-line-Messung von Transmission oder Reflexion an bewegten Objekten im Bereich detektierbarer elektromagnetischer Strahlung |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE8528346U DE8528346U1 (de) | 1985-10-04 | 1985-10-04 | Vorrichtung zur on-line-Messung von Transmission oder Reflexion an bewegten Objekten im Bereich detektierbarer elektromagnetischer Strahlung |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE8528346U1 true DE8528346U1 (de) | 1987-02-12 |
Family
ID=6785965
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE8528346U Expired DE8528346U1 (de) | 1985-10-04 | 1985-10-04 | Vorrichtung zur on-line-Messung von Transmission oder Reflexion an bewegten Objekten im Bereich detektierbarer elektromagnetischer Strahlung |
Country Status (1)
| Country | Link |
|---|---|
| DE (1) | DE8528346U1 (ja) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE4201274A1 (de) * | 1992-01-18 | 1993-07-22 | Ver Glaswerke Gmbh | Vorrichtung zum messen der reflexionseigenschaften einer mit einer teilreflektierenden schicht versehenen glasscheibe |
| DE19616245A1 (de) * | 1996-04-15 | 1997-10-16 | Zam Zentrum Fuer Angewandte Mi | Verfahren und Anordnung zum zerstörungsfreien, berührungslosen Prüfen und/oder Bewerten von Festkörpern, Flüssigkeiten, Gasen und Biomaterialien |
| DE10127239A1 (de) * | 2001-05-28 | 2002-12-12 | Inst Mikroelektronik Und Mecha | Verfahren und Computerprogrammprodukt zur Auswertung von durch Meßgeräte aufgenommenen Daten |
| DE102008002247A1 (de) * | 2008-06-05 | 2009-12-10 | Carl Zeiss Smt Ag | Verfahren und Vorrichtung zum Bestimmen einer optischen Eigenschaft eines optischen Systems |
-
1985
- 1985-10-04 DE DE8528346U patent/DE8528346U1/de not_active Expired
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE4201274A1 (de) * | 1992-01-18 | 1993-07-22 | Ver Glaswerke Gmbh | Vorrichtung zum messen der reflexionseigenschaften einer mit einer teilreflektierenden schicht versehenen glasscheibe |
| DE19616245A1 (de) * | 1996-04-15 | 1997-10-16 | Zam Zentrum Fuer Angewandte Mi | Verfahren und Anordnung zum zerstörungsfreien, berührungslosen Prüfen und/oder Bewerten von Festkörpern, Flüssigkeiten, Gasen und Biomaterialien |
| DE19616245C2 (de) * | 1996-04-15 | 1998-06-18 | Zam Zentrum Fuer Angewandte Mi | Verfahren und Anordnung zum zerstörungsfreien, berührungslosen Prüfen und/oder Bewerten von Festkörpern, Flüssigkeiten, Gasen und Biomaterialien |
| DE10127239A1 (de) * | 2001-05-28 | 2002-12-12 | Inst Mikroelektronik Und Mecha | Verfahren und Computerprogrammprodukt zur Auswertung von durch Meßgeräte aufgenommenen Daten |
| US7050948B2 (en) | 2001-05-28 | 2006-05-23 | Dr. Johannes Heidenhain Gmbh | Method and computer program product for evaluation of data recorded by measuring instruments |
| DE102008002247A1 (de) * | 2008-06-05 | 2009-12-10 | Carl Zeiss Smt Ag | Verfahren und Vorrichtung zum Bestimmen einer optischen Eigenschaft eines optischen Systems |
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