DE716326C - X-ray fine structure chamber, especially for the structure analysis of single crystals and fibers - Google Patents

X-ray fine structure chamber, especially for the structure analysis of single crystals and fibers

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Publication number
DE716326C
DE716326C DES121122D DES0121122D DE716326C DE 716326 C DE716326 C DE 716326C DE S121122 D DES121122 D DE S121122D DE S0121122 D DES0121122 D DE S0121122D DE 716326 C DE716326 C DE 716326C
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DE
Germany
Prior art keywords
film
cone
primary beam
axis
test body
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DES121122D
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German (de)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HUGO SEEMANN DR
Original Assignee
HUGO SEEMANN DR
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by HUGO SEEMANN DR filed Critical HUGO SEEMANN DR
Priority to DES121122D priority Critical patent/DE716326C/en
Application granted granted Critical
Publication of DE716326C publication Critical patent/DE716326C/en
Expired legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/205Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials using diffraction cameras

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  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Description

Röntgenfeinstrukturkammer, insbesondere für die Strukturanalyse von Einkristallen und Faserstoffen Röntgenfeinstrukturkammern mit kegelförmig gebogenem Film, in dessen Achse der um diese Achse dreh- und schwenkbare Prüfkörper angeordnet ist, sind zur Aufn.ahmle von Polylkristalldiagrammen (Pulverdiagrammen) und zur Aufnahme von Laue-Diagrammen von Einkristallen ohne Drehung des Kristalls bekannt. Sie haben gegenüber den Planfilmen und Zylinderfilmen den Vorteil, einen bedeutend größeren Teil der Reflexhalbkugel aufzufangen als diese. Das Laue-Kegelfilmverfahren führt jedoch zu starken Verzerrungen der fast kreisförmigen Kegel- -schnittfiguren, durch die die gewöhnlichen Laue-Diagramme ausgezeichnet sind. Bei beiden Kegelfilmanordnungen und -verfahren fällt ein möglichst streng linienförmiges Primärstrahlenbündel in der Richtung der Kegelachse auf den. Präfkörper.X-ray fine structure chamber, especially for structural analysis of Single crystals and fibers X-ray fine structure chambers with a cone-shaped bent Film, in the axis of which the test body rotatable and pivotable about this axis is arranged are for recording polycrystalline diagrams (powder diagrams) and for Record of Laue diagrams of single crystals without rotation of the crystal known. They have the advantage over flat films and cylinder films, one significant catch a larger part of the reflex hemisphere than this. The Laue cone film process but leads to strong distortions of the almost circular conic-section figures, which distinguish the ordinary Laue diagrams. With both cone film arrangements and method falls into a primary beam that is as strictly linear as possible the direction of the cone axis to the. Prefecture.

Die Erfindung macht die Vorteile der Kegelfilmanordnung auch für Schichtliniendiagramme nutzbar. Sie erreicht durch eine solche Anordnung der das Primärstrahlenbündel begrenzenden Blenden, daß das Primärstrahlenbundel unter einem Winkel von 900 oder nahezu go0 gegen die Achse des Kegelfilms geneigt auf den Einkristallprüfkörper fällt, den Vorteil, daß die Kreise, auf denen -die Reflexpunkte (Spektrallinien) der Schichtlinien auf den bisher benutzten Zylinderfilmen liegen, als Kreise bzw. Kreisbogen auf dem Kegelfilm erhalten bleiben unter voller Wahrung der Vorteile der Kegelfilme. Die Auswertung der Einltristalldiagramme und ganz besonders die Vermessung wird dadurch auch gegenüber den gewöhnlichen Schichtliniendiagrammen erleichtert, weil die verschiedenen Schichtliniien auf dem eben ausgebreiteten Film konzentrische Kreise bilden. die mit Zyklometern vermessen werden können, ohne daß die Zentrierung des Films im Zyklometer beim Übergang von einer Schichtlinie zur anderen verändert zu werden braucht. The invention makes the advantages of the cone film arrangement for Layer line diagrams can be used. It achieves through such an arrangement of the Primary beam limiting diaphragms that the primary beam under one Angle of 900 or almost go0 inclined to the axis of the cone film on the single crystal test body has the advantage that the circles on which the reflex points (spectral lines) of the layer lines lie on the cylinder films used so far, as circles or Circular arcs on the cone film are preserved while fully preserving the advantages the bowling films. The evaluation of the single crystal diagrams and especially the As a result, measurement is also compared to the usual layer line diagrams relieved because the different stratification lines on the film that has just been spread out form concentric circles. which can be measured with cyclometers without the centering of the film in the cyclometer at the transition from a slice line to others need to be changed.

Die Übertragung der Vorteile des Kegelfilms auf die Schichtliniendiagramme bleibt auch dann voll erhalten, wenn gemäß weiterer Ausgestaltung der Erfindung der mit dem Prüfkörper (Einkristall, Faserstoff ) fest verbundene Kegelfilm iun die Kegelachse gedreht wird, während das Primärstrahlenbündel feststeht. Dabei kommt auch der große Vorzug dieser sog. Festkn.stallmethode voll zur Geltung, ein konvergent auf den Prüfkörper fallendes Strahlenbündel (Strahlenfäeher, Sektor) anwenden zu können, dessen Ebene auf der Drehachse .erfindnngsgemäß senkrecht steht und damit eine oft vielfache Abkürzung der Expositionszeit gegenüber der Verwendung eines linienförmigen Primärstrahlenbündels erreichen zu können. The transfer of the advantages of the cone film to the layer line diagrams remains fully intact even if, according to a further embodiment of the invention the cone film firmly connected to the test body (single crystal, fiber material) iun the cone axis is rotated while the primary beam is fixed. Here comes the great advantage of this so-called Festkn.stall method fully comes into its own, a convergent one to apply the bundle of rays falling on the test specimen (beam deflector, sector) can, whose plane is perpendicular to the axis of rotation .invention and thus an often multiple shortening of exposure time compared to using one to be able to achieve linear primary beam.

Eine weitere Fortentwicklung der Erfindung (Abb. 2) besteht darin, daß an Stelle eines Vollkegelfilms vorzugsweise ein durch einen Hauptschnitt halbierter Kegelmantelfilm angebracht ist und die das Primärstrahlenlbündel begrenzenden Blenden derart angeordnet sind, daß dieses den Prüfkörper außerhalb des Von dem Halbkegelmantel umschlossenen Raumes erreicht. In diesem Fall wird nicht nur eine Ersparnis an Film erzielt, ohne daß wesentliche Teile des Diagrammes verlorengehen, sondern auch die lästige Anbringung eines Schlitzes im Filmrand für den Primärstrahl oder dessen Blende (Abb. I? vermieden. Another further development of the invention (Fig. 2) consists in that instead of a full cone film, preferably one by one Main cut halved cone jacket film is attached and the primary beam bounding Apertures are arranged so that this the test specimen outside of the From Half-cone envelope enclosed space reached. In this case there won't be just one Saving of film achieved without losing essential parts of the diagram, but also the annoying creation of a slot in the edge of the film for the primary beam or its aperture (Fig. I? avoided.

Claims (3)

Bei der Anordnung nach Anspruch 2 bedeutet die Benutzung eines Halb;luegel-films auch keinen Verlust an Diagrammpunkten, da bei dieser festen Verbindung von Kristall und Film und 360° Drehung beider das ganze Diagramm doppelt auf dem Film erscheint. In the arrangement according to claim 2, the use of a semi-luegel film means also no loss of points in the diagram, because of this solid connection of crystal and film and 360 ° rotation both the whole diagram appears twice on the film. Es genügt daher ein Halbkegelfilin und höchstens 180° Drehung zur Aufnahme eines vollständigen Diagrammes.A half-cone filin and a maximum of 180 ° rotation are therefore sufficient Recording of a complete diagram. PATENTAXSPRÜCHE: I. Röntgenfeinstrukturkammer, insbesondere für die Strukturanalyse von Einkristallen und Faserstoffen, mit LEegelförmig gebogenem photographischem Film, in dessen Achse der um diese Achse dreh-und schwenkbare Prüfkörper angeordnet ist, gekennzeichnet durch eine solche Anordnung der das Primärstrahlenbündel begrenzenden Blenden, daß das Primärstrahlenbündel unter einem Winkel von 90 oder angenähert 90° gegen die Achse des .Kegelfilms geneigt auf den Prüfkörper fällt. PATENTAX CLAIMS: I. X-ray fine structure chamber, in particular for the Structural analysis of single crystals and fibers, with L-shaped curved photographic Film in whose axis the test body rotatable and pivotable about this axis is arranged is characterized by such an arrangement of the primary beam delimiting Aperture that the primary beam at an angle of 90 or approximated 90 ° against the axis of the .Kegelfilms falls on the test body. 2. Röntgenfeinstrukturkammer nach Anspruch I, dadurch gekennzeichnet, daß der mit dem Prüfkörper starr verbundene Kegelfilm um die Kegelachse drehbar ist, während das Primärstrahlenbündel feststeht. 2. X-ray fine structure chamber according to claim I, characterized in that that the cone film rigidly connected to the test body can be rotated about the cone axis while the primary beam is fixed. 3. Röntgenfeinstrukturkammer nach Anaspruch 1 und 2, dadurch gekennzeichnet, daß ein durch den Hauptschnitt vorzug weise halbierter Kegelmantelfilm angel bracht ist und die das Primärstrahlenbündel begrenzenden Blenden derart angeordnet sind, daß das Primärstrahlenbündel des Prüfkörper außerhalb des von diesem Halbkegelmantel umschlossenen Raumes erreicht. 3. X-ray fine structure chamber according to claim 1 and 2, characterized in that that a cone-shaped film preferably halved by the main cut brings angling and the diaphragms delimiting the primary beam are arranged in such a way that the primary beam of the test body outside of this hemisphere enclosed space reached.
DES121122D 1936-01-11 1936-01-11 X-ray fine structure chamber, especially for the structure analysis of single crystals and fibers Expired DE716326C (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DES121122D DE716326C (en) 1936-01-11 1936-01-11 X-ray fine structure chamber, especially for the structure analysis of single crystals and fibers

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DES121122D DE716326C (en) 1936-01-11 1936-01-11 X-ray fine structure chamber, especially for the structure analysis of single crystals and fibers

Publications (1)

Publication Number Publication Date
DE716326C true DE716326C (en) 1942-01-16

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DES121122D Expired DE716326C (en) 1936-01-11 1936-01-11 X-ray fine structure chamber, especially for the structure analysis of single crystals and fibers

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0383752A1 (en) * 1987-10-16 1990-08-29 Eastman Kodak Co Powder diffraction method and apparatus.

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0383752A1 (en) * 1987-10-16 1990-08-29 Eastman Kodak Co Powder diffraction method and apparatus.
EP0383752A4 (en) * 1987-10-16 1991-09-18 Eastman Kodak Company (A New Jersey Corporation) Powder diffraction method and apparatus

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