DE69923118D1 - Vorrichtung und Verfahren zum Feststellen von kontrastarmen Flecken - Google Patents

Vorrichtung und Verfahren zum Feststellen von kontrastarmen Flecken

Info

Publication number
DE69923118D1
DE69923118D1 DE69923118T DE69923118T DE69923118D1 DE 69923118 D1 DE69923118 D1 DE 69923118D1 DE 69923118 T DE69923118 T DE 69923118T DE 69923118 T DE69923118 T DE 69923118T DE 69923118 D1 DE69923118 D1 DE 69923118D1
Authority
DE
Germany
Prior art keywords
detecting low
contrast spots
spots
contrast
detecting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69923118T
Other languages
English (en)
Other versions
DE69923118T2 (de
Inventor
Minoru Fujita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Engineering Corp
Original Assignee
Toshiba Engineering Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Engineering Corp filed Critical Toshiba Engineering Corp
Application granted granted Critical
Publication of DE69923118D1 publication Critical patent/DE69923118D1/de
Publication of DE69923118T2 publication Critical patent/DE69923118T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20021—Dividing image into blocks, subimages or windows
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30124—Fabrics; Textile; Paper

Landscapes

  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Quality & Reliability (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Textile Engineering (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Closed-Circuit Television Systems (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
DE69923118T 1998-07-21 1999-05-27 Vorrichtung und Verfahren zum Feststellen von kontrastarmen Flecken Expired - Fee Related DE69923118T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP20525298A JP4165932B2 (ja) 1998-07-21 1998-07-21 明暗検査装置および明暗検査方法
JP20525298 1998-07-21

Publications (2)

Publication Number Publication Date
DE69923118D1 true DE69923118D1 (de) 2005-02-17
DE69923118T2 DE69923118T2 (de) 2005-12-29

Family

ID=16503919

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69923118T Expired - Fee Related DE69923118T2 (de) 1998-07-21 1999-05-27 Vorrichtung und Verfahren zum Feststellen von kontrastarmen Flecken

Country Status (5)

Country Link
US (1) US6570607B1 (de)
EP (1) EP0974830B1 (de)
JP (1) JP4165932B2 (de)
CA (1) CA2269244A1 (de)
DE (1) DE69923118T2 (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ES2184646B1 (es) * 2001-09-21 2004-07-16 Fabrica Nacional De Moneda Y Timbre-Real Casa De La Moneda Metodo de analisis de la nubosidad visual del papel de seguridad, y dispositivo para la puesta en practica del mismo.
JP4247993B2 (ja) * 2004-11-05 2009-04-02 シャープ株式会社 画像検査装置、画像検査方法、制御プログラムおよび可読記憶媒体
JP4882529B2 (ja) 2005-08-26 2012-02-22 セイコーエプソン株式会社 欠陥検出方法および欠陥検出装置
JP5467692B2 (ja) * 2010-10-06 2014-04-09 株式会社石井 穴検査対象物の検査装置
JP5714173B2 (ja) 2011-03-29 2015-05-07 ヒューレット−パッカード デベロップメント カンパニー エル．ピー．Ｈｅｗｌｅｔｔ‐Ｐａｃｋａｒｄ Ｄｅｖｅｌｏｐｍｅｎｔ Ｃｏｍｐａｎｙ， Ｌ．Ｐ． イメージのスクラッチの検出

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2597370B2 (ja) 1987-10-14 1997-04-02 株式会社ヒューテック シート状被検材の有意差検出方法
US5091963A (en) 1988-05-02 1992-02-25 The Standard Oil Company Method and apparatus for inspecting surfaces for contrast variations
CA2033096C (en) 1989-05-31 2000-07-18 Masahiro Yakabe Formation measuring method and formation control method and apparatus for using said formation measuring method
US5774177A (en) 1996-09-11 1998-06-30 Milliken Research Corporation Textile fabric inspection system

Also Published As

Publication number Publication date
JP4165932B2 (ja) 2008-10-15
JP2000036048A (ja) 2000-02-02
EP0974830A3 (de) 2000-03-22
US6570607B1 (en) 2003-05-27
EP0974830B1 (de) 2005-01-12
CA2269244A1 (en) 2000-01-21
EP0974830A2 (de) 2000-01-26
DE69923118T2 (de) 2005-12-29

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Legal Events

Date Code Title Description
8328 Change in the person/name/address of the agent

Representative=s name: STIPPL PATENTANWAELTE, 90482 NUERNBERG

8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee