DE69920581D1 - Verfahren und Vorrichtung zur Charakterisierung von Oberflächeneffekten - Google Patents

Verfahren und Vorrichtung zur Charakterisierung von Oberflächeneffekten

Info

Publication number
DE69920581D1
DE69920581D1 DE69920581T DE69920581T DE69920581D1 DE 69920581 D1 DE69920581 D1 DE 69920581D1 DE 69920581 T DE69920581 T DE 69920581T DE 69920581 T DE69920581 T DE 69920581T DE 69920581 D1 DE69920581 D1 DE 69920581D1
Authority
DE
Germany
Prior art keywords
surface effects
characterizing surface
characterizing
effects
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69920581T
Other languages
English (en)
Other versions
DE69920581T2 (de
Inventor
William L Weber
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
GretagMacbeth LLC
Original Assignee
GretagMacbeth LLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by GretagMacbeth LLC filed Critical GretagMacbeth LLC
Application granted granted Critical
Publication of DE69920581D1 publication Critical patent/DE69920581D1/de
Publication of DE69920581T2 publication Critical patent/DE69920581T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474—Details of optical heads therefor, e.g. using optical fibres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
DE69920581T 1998-06-26 1999-06-25 Verfahren und Vorrichtung zur Charakterisierung von Oberflächeneffekten Expired - Lifetime DE69920581T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US106200 1993-08-13
US09/106,200 US6226085B1 (en) 1998-06-26 1998-06-26 Method and apparatus for surface effect characterization

Publications (2)

Publication Number Publication Date
DE69920581D1 true DE69920581D1 (de) 2004-11-04
DE69920581T2 DE69920581T2 (de) 2005-10-13

Family

ID=22310067

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69920581T Expired - Lifetime DE69920581T2 (de) 1998-06-26 1999-06-25 Verfahren und Vorrichtung zur Charakterisierung von Oberflächeneffekten

Country Status (4)

Country Link
US (1) US6226085B1 (de)
EP (1) EP0967459B1 (de)
DE (1) DE69920581T2 (de)
ES (1) ES2226291T3 (de)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002073550A1 (en) 2001-03-14 2002-09-19 Orell Füssli Security Documents AG A method for verifying the authenticity of an article
US6700657B1 (en) * 2002-05-10 2004-03-02 Schmitt Measurement Systems, Inc. System and method for detecting surface roughness
GB2416834A (en) * 2004-08-03 2006-02-08 Intercolor Ltd A method of measuring the lustre of a surface having a metallic appearance
US7249695B2 (en) * 2004-10-28 2007-07-31 Alemite, Llc Grease gun
EP1839035A1 (de) * 2005-01-13 2007-10-03 E.I. Dupont De Nemours And Company Verfahren zur bestimmung der passenden oberflächenstruktur eines beschichteten artikels
WO2007020554A1 (en) 2005-08-15 2007-02-22 Koninklijke Philips Electronics, N.V. Dual beam set-up for scatterometer
US7440121B2 (en) * 2006-09-20 2008-10-21 Lawrence Livermore National Security, Llc Optically measuring interior cavities
US8854734B2 (en) * 2009-11-12 2014-10-07 Vela Technologies, Inc. Integrating optical system and methods
US8426800B2 (en) * 2010-09-09 2013-04-23 Vela Technologies, Inc. Integrating optical systems and methods
DE102010041749A1 (de) * 2010-09-30 2012-04-05 Carl Zeiss Microlmaging Gmbh Messeinrichtungen und Vorrichtungen zur spektroskopischen Untersuchung von Proben
US8890073B2 (en) 2011-03-28 2014-11-18 Northrop Grumman Guidance And Electronics Company, Inc. Systems and methods for detecting and/or identifying materials based on electromagnetic radiation
CN104094101A (zh) 2011-11-28 2014-10-08 涂料外国Ip有限公司 用于测定颜色标准的表面光泽度的方法
DE102013209104A1 (de) * 2013-05-16 2014-11-20 Carl Zeiss Microscopy Gmbh Vorrichtung und Verfahren zur spektroskopischen Analyse
DE102014215193A1 (de) 2014-08-01 2016-02-04 Carl Zeiss Spectroscopy Gmbh Messanordnung zur Reflexionsmessung
CN110268251A (zh) * 2017-04-25 2019-09-20 惠普发展公司，有限责任合伙企业 确定基底的特性
JP7163720B2 (ja) * 2018-10-30 2022-11-01 コニカミノルタ株式会社 光学特性測定装置
JP7409386B2 (ja) * 2019-09-12 2024-01-09 コニカミノルタ株式会社 測色装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5182618A (en) * 1985-11-27 1993-01-26 Aimo Heinonen Reflectometric method of measurement and apparatus for realizing the method
US4886355A (en) 1988-03-28 1989-12-12 Keane Thomas J Combined gloss and color measuring instrument
JPH04115109A (ja) 1990-09-06 1992-04-16 Nec Corp 表面粗さ計測装置
US5155558A (en) 1990-09-19 1992-10-13 E. I. Du Pont De Nemours And Company Method and apparatus for analyzing the appearance features of a surface
JPH0650817A (ja) * 1992-07-29 1994-02-25 Minolta Camera Co Ltd 試料の光学特性測定装置
DE4423698A1 (de) 1994-06-24 1996-01-04 Ingo Hennig Meßanordnung zur optoelektronischen Bestimmung des gerichteten und gestreuten Anteils der Reflexion von Körperoberflächen
US5625451A (en) 1995-11-27 1997-04-29 Schmitt Measurement Systems, Inc. Methods and apparatus for characterizing a surface

Also Published As

Publication number Publication date
ES2226291T3 (es) 2005-03-16
EP0967459B1 (de) 2004-09-29
DE69920581T2 (de) 2005-10-13
EP0967459A1 (de) 1999-12-29
US6226085B1 (en) 2001-05-01

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