DE69920575D1 - Gerät zur Messung der elektrischen Eigenschaften von Schaltungen - Google Patents
Gerät zur Messung der elektrischen Eigenschaften von SchaltungenInfo
- Publication number
- DE69920575D1 DE69920575D1 DE69920575T DE69920575T DE69920575D1 DE 69920575 D1 DE69920575 D1 DE 69920575D1 DE 69920575 T DE69920575 T DE 69920575T DE 69920575 T DE69920575 T DE 69920575T DE 69920575 D1 DE69920575 D1 DE 69920575D1
- Authority
- DE
- Germany
- Prior art keywords
- circuits
- measuring
- electrical properties
- properties
- electrical
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
- G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15772798 | 1998-06-05 | ||
JP15772798 | 1998-06-05 | ||
JP10436099A JP3419342B2 (ja) | 1998-06-05 | 1999-04-12 | 測定器 |
JP10436099 | 1999-04-12 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69920575D1 true DE69920575D1 (de) | 2004-11-04 |
DE69920575T2 DE69920575T2 (de) | 2005-11-17 |
Family
ID=26444862
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69920575T Expired - Lifetime DE69920575T2 (de) | 1998-06-05 | 1999-06-04 | Gerät zur Messung der elektrischen Eigenschaften von Schaltungen |
Country Status (4)
Country | Link |
---|---|
US (1) | US6449307B1 (de) |
EP (1) | EP0962783B1 (de) |
JP (1) | JP3419342B2 (de) |
DE (1) | DE69920575T2 (de) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DK1245093T3 (da) * | 2000-01-07 | 2006-11-20 | Aware Inc | Diagnostiske fremgangsmåder og systemer til multicarrier-modemmer |
ATE357802T1 (de) | 2000-04-18 | 2007-04-15 | Aware Inc | Datenzuweisung mit änderbaren signal- rauschabstand |
JP5705395B2 (ja) * | 2006-07-21 | 2015-04-22 | テクトロニクス・インターナショナル・セールス・ゲーエムベーハー | 信号分析装置 |
US7994807B1 (en) * | 2007-10-23 | 2011-08-09 | National Semiconductor Corporation | Built-in test circuit for testing AC transfer characteristic of high-speed analog circuit |
JP4554698B2 (ja) * | 2008-09-01 | 2010-09-29 | 株式会社Kddi研究所 | Ofdm信号復調装置 |
DE102009016028A1 (de) * | 2009-04-02 | 2010-10-07 | Siemens Aktiengesellschaft | Netzwerkanalysator mit einem zumindest zwei Tore aufweisenden Mehrtor zur Messung der Wellenparameter |
TWI517605B (zh) * | 2013-06-07 | 2016-01-11 | 晨星半導體股份有限公司 | 內建自我測試功能之信號處理系統、其測試方法以及測試訊號產生器 |
CN117169591B (zh) * | 2023-10-25 | 2024-03-12 | 南方电网科学研究院有限责任公司 | 电力系统宽频测量方法、装置和计算机设备 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2096331B (en) * | 1981-04-02 | 1985-01-03 | Solartron Electronic Group The | Signal processors |
US4633411A (en) * | 1982-12-27 | 1986-12-30 | Rockwell International Corporation | Link quality analyzer |
US5394120A (en) * | 1993-04-13 | 1995-02-28 | Japan Radio Co., Ltd. | Device for testing an amplifier |
JPH08331095A (ja) * | 1995-05-31 | 1996-12-13 | Sony Corp | 通信システム |
EP0966171A3 (de) * | 1998-06-19 | 2000-05-24 | Wavetek Gmbh | Verfahren zum Betreiben einer Funkmesseinrichtung und Vorrichtung dafür |
-
1999
- 1999-04-12 JP JP10436099A patent/JP3419342B2/ja not_active Expired - Fee Related
- 1999-06-03 US US09/325,145 patent/US6449307B1/en not_active Expired - Fee Related
- 1999-06-04 EP EP99110804A patent/EP0962783B1/de not_active Expired - Lifetime
- 1999-06-04 DE DE69920575T patent/DE69920575T2/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US6449307B1 (en) | 2002-09-10 |
EP0962783A2 (de) | 1999-12-08 |
DE69920575T2 (de) | 2005-11-17 |
EP0962783A3 (de) | 2003-04-23 |
EP0962783B1 (de) | 2004-09-29 |
JP3419342B2 (ja) | 2003-06-23 |
JP2000055957A (ja) | 2000-02-25 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |