DE69915100D1 - Mess- und regeleinrichtung bezüglich der dicke einer silikonschicht - Google Patents

Mess- und regeleinrichtung bezüglich der dicke einer silikonschicht

Info

Publication number
DE69915100D1
DE69915100D1 DE69915100T DE69915100T DE69915100D1 DE 69915100 D1 DE69915100 D1 DE 69915100D1 DE 69915100 T DE69915100 T DE 69915100T DE 69915100 T DE69915100 T DE 69915100T DE 69915100 D1 DE69915100 D1 DE 69915100D1
Authority
DE
Germany
Prior art keywords
measuring
thickness
control device
silicone layer
device relating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69915100T
Other languages
English (en)
Other versions
DE69915100T2 (de
Inventor
Edward Belotserkovsky
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Honeywell Inc
Original Assignee
Honeywell Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Honeywell Inc filed Critical Honeywell Inc
Publication of DE69915100D1 publication Critical patent/DE69915100D1/de
Application granted granted Critical
Publication of DE69915100T2 publication Critical patent/DE69915100T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01G—WEIGHING
    • G01G17/00—Apparatus for or methods of weighing material of special form or property
    • G01G17/02—Apparatus for or methods of weighing material of special form or property for weighing material of filamentary or sheet form
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0625—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Coating Apparatus (AREA)
  • Paper (AREA)
  • Application Of Or Painting With Fluid Materials (AREA)
  • Spray Control Apparatus (AREA)
  • Length Measuring Devices By Optical Means (AREA)
DE69915100T 1998-11-20 1999-11-18 Mess- und regeleinrichtung bezüglich der dicke einer silikonschicht Expired - Lifetime DE69915100T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/196,862 US6179918B1 (en) 1998-11-20 1998-11-20 Silicone coat weight measuring and control apparatus
US196862 1998-11-20
PCT/US1999/027261 WO2000031499A1 (en) 1998-11-20 1999-11-18 Silicone coat thickness measuring and control apparatus

Publications (2)

Publication Number Publication Date
DE69915100D1 true DE69915100D1 (de) 2004-04-01
DE69915100T2 DE69915100T2 (de) 2004-09-02

Family

ID=22727072

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69915100T Expired - Lifetime DE69915100T2 (de) 1998-11-20 1999-11-18 Mess- und regeleinrichtung bezüglich der dicke einer silikonschicht

Country Status (6)

Country Link
US (1) US6179918B1 (de)
EP (1) EP1131598B1 (de)
JP (1) JP4511736B2 (de)
CA (1) CA2351866C (de)
DE (1) DE69915100T2 (de)
WO (1) WO2000031499A1 (de)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FI110638B (fi) * 1998-10-06 2003-02-28 Metso Paper Automation Oy Menetelmä ja laite liikkuvalla alustalla olevan silikonipäällysteen määrän mittaamiseksi
US6183561B1 (en) * 1998-12-15 2001-02-06 Honeywell International Inc Coat weight measuring and control apparatus
US20050181118A1 (en) * 2004-02-12 2005-08-18 Janssen Robert A. Method for the precision saturation of substrates in preparation for digital printing, and the substrates produced therefrom
WO2006083001A1 (ja) * 2005-02-03 2006-08-10 Eisai R&D Management Co., Ltd. コーティング量の測定方法および溶出挙動の予測方法
DE102008055584B3 (de) 2008-12-23 2010-04-22 Gunther Prof. Dr.-Ing. Krieg Verfahren und Vorrichtung zum Beschichten von bedruckten Papierbahnen
JP2010241976A (ja) * 2009-04-07 2010-10-28 Seiko Epson Corp 耐水化アルミニウム顔料分散液の製造方法、耐水化アルミニウム顔料およびそれを含有する水性インク組成物
US8664601B2 (en) 2009-04-16 2014-03-04 Tetra Laval Holdings & Finance S.A. System and method for measuring the thickness of a layer of coating
US8314388B2 (en) 2010-12-20 2012-11-20 Honeywell Asca Inc. Single-sided infrared sensor for thickness or weight measurement of products containing a reflective layer
US8975586B2 (en) 2011-06-06 2015-03-10 Honeywell Asca Inc. Diffusing measurement window for near and mid IR multichannel sensor
US9382660B2 (en) 2012-04-16 2016-07-05 Stora Enso Oyj Method for automatically determining stickies in a recycled fibre process
US9927366B2 (en) 2015-03-24 2018-03-27 Honeywell Limited Spectroscopic sensor for thickness or weight measurement of thin plastic films
FI128094B (fi) 2016-07-13 2019-09-13 Valmet Automation Oy Mittausmenetelmä, mittausjärjestely ja mittalaite
CN109716106A (zh) 2016-07-19 2019-05-03 惠普印迪格公司 打印基底上的底涂含量的评估
CN107130471B (zh) * 2017-05-10 2018-07-20 南阳森源塑胶有限公司 皱纹面密封板材及其制作方法
US11879765B2 (en) 2018-09-26 2024-01-23 Honeywell International Inc. Apparatus for composite sheet weight determinations
CN111121609A (zh) * 2018-10-31 2020-05-08 无锡市帕尔斯仪器有限公司 全自动在线双面金属箔或金属镀层测厚装置
CN114210485B (zh) * 2021-11-17 2023-04-28 河北和赢电气有限责任公司 一种光伏电缆绝缘漆喷涂系统及其使用方法
WO2024075575A1 (ja) * 2022-10-03 2024-04-11 富士フイルム株式会社 電極層の製造方法
CN115561249B (zh) * 2022-11-09 2023-04-25 松乐智能装备(广东)有限公司 一种喷涂设备的智能化监测方法及系统

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4006358A (en) 1975-06-12 1977-02-01 Measurex Corporation Method and apparatus for measuring the amount of moisture that is associated with a web of moving material
FI68322C (fi) * 1983-06-28 1985-08-12 Enso Gutzeit Oy Foerfarande och anordning foer maetning av maengden av siliciumbelaeggning vid papper eller kartong
DE3638932A1 (de) * 1986-11-14 1988-05-26 Kaemmerer Gmbh Verfahren zur messung von beschichtungsmengen, insbesondere von silikon-beschichtungen auf papier oder kunststoffolie
US4957770A (en) 1989-01-27 1990-09-18 Measurex Corporation Coating weight measuring and control apparatus and method
US5338361A (en) 1991-11-04 1994-08-16 Measurex Corporation Multiple coat measurement and control apparatus and method
US5795394A (en) 1997-06-02 1998-08-18 Honeywell-Measurex Coating weight measuring and control apparatus

Also Published As

Publication number Publication date
EP1131598B1 (de) 2004-02-25
WO2000031499A1 (en) 2000-06-02
EP1131598A1 (de) 2001-09-12
CA2351866A1 (en) 2000-06-02
CA2351866C (en) 2008-06-03
DE69915100T2 (de) 2004-09-02
US6179918B1 (en) 2001-01-30
JP2002530664A (ja) 2002-09-17
JP4511736B2 (ja) 2010-07-28

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