DE69910941D1 - Generator für beliebige Wellenformen - Google Patents

Generator für beliebige Wellenformen

Info

Publication number
DE69910941D1
DE69910941D1 DE69910941T DE69910941T DE69910941D1 DE 69910941 D1 DE69910941 D1 DE 69910941D1 DE 69910941 T DE69910941 T DE 69910941T DE 69910941 T DE69910941 T DE 69910941T DE 69910941 D1 DE69910941 D1 DE 69910941D1
Authority
DE
Germany
Prior art keywords
waveform
generator
test
datapoints
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69910941T
Other languages
English (en)
Other versions
DE69910941T2 (de
Inventor
David D Colby
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Texas Instruments Inc
Original Assignee
Texas Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Texas Instruments Inc filed Critical Texas Instruments Inc
Publication of DE69910941D1 publication Critical patent/DE69910941D1/de
Application granted granted Critical
Publication of DE69910941T2 publication Critical patent/DE69910941T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/3167—Testing of combined analog and digital circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Magnetic Resonance Imaging Apparatus (AREA)
  • Control Of Eletrric Generators (AREA)
  • Vehicle Body Suspensions (AREA)
DE69910941T 1998-10-22 1999-10-22 Generator für beliebige Wellenformen Expired - Lifetime DE69910941T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10526798P 1998-10-22 1998-10-22
US105267P 1998-10-22

Publications (2)

Publication Number Publication Date
DE69910941D1 true DE69910941D1 (de) 2003-10-09
DE69910941T2 DE69910941T2 (de) 2004-07-15

Family

ID=22304888

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69910941T Expired - Lifetime DE69910941T2 (de) 1998-10-22 1999-10-22 Generator für beliebige Wellenformen

Country Status (4)

Country Link
US (1) US6591205B1 (de)
EP (1) EP0995999B1 (de)
AT (1) ATE249050T1 (de)
DE (1) DE69910941T2 (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020157053A1 (en) * 2001-04-21 2002-10-24 Chen Leon Lee Semiconductor test system with time critical sequence generation using general purpose operating system
US7340357B2 (en) * 2005-05-27 2008-03-04 National Instruments Corporation Arbitrary waveform generator with configurable digital signal processing unit

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3778814A (en) * 1972-08-07 1973-12-11 Us Navy Waveform synthesizer
US4222108A (en) * 1978-12-01 1980-09-09 Braaten Norman J Digitally-programmed arbitrary waveform generator
US4447747A (en) * 1981-03-02 1984-05-08 Gte Laboratories Incorporated Waveform generating apparatus
JPS5963578A (ja) * 1982-10-04 1984-04-11 Advantest Corp 多チヤンネル電圧発生装置
JPS59197873A (ja) * 1983-04-25 1984-11-09 Fujitsu Ltd 試験デ−タ作成方式
DE3373393D1 (en) * 1983-04-29 1987-10-08 Ibm A step waveform generator and crt vertical timebase incorporating such a generator
US5463334A (en) * 1995-02-02 1995-10-31 The United States Of America As Represented By The Secretary Of The Navy Arbitrary waveform generator

Also Published As

Publication number Publication date
EP0995999A3 (de) 2001-04-25
EP0995999A2 (de) 2000-04-26
US6591205B1 (en) 2003-07-08
DE69910941T2 (de) 2004-07-15
ATE249050T1 (de) 2003-09-15
EP0995999B1 (de) 2003-09-03

Similar Documents

Publication Publication Date Title
AU590110B2 (en) Method and apparatus for isolating faults in a digital logic circuit
WO2003054666A3 (en) System and method for automated test-case generation for software
EP1360513A4 (de) Mehrfacherfassungs-dft-system zum detektieren oder auffinden von überschreitenden taktbereichsfehlern während der selbstprüfung oder scan-prüfung
EP0372226A3 (de) Paralleler Pseudo-Zufallsmustergenerator mit variierender Phasenverschiebung und Verfahren zur Simulation eines solchen
WO2008088992A3 (en) Method for enhancing the diagnostic accuracy of a vlsi chip
US5390194A (en) ATG test station
US8214170B2 (en) Test pattern compression
DE3485384D1 (de) Methode und vorrichtung fuer die fehlerpruefung eines taktverteilungsnetzwerks eines prozessors.
KR910018812A (ko) 다중 주파수 회로용 스캔 검사 회로
JPH0481675A (ja) 半導体デバイステスト装置
DE69910941D1 (de) Generator für beliebige Wellenformen
US20030229473A1 (en) Event processing apparatus and method for high speed event based test system
TW201823753A (zh) 克服自動測試設備的時序約束衝突之設備及方法
KR960015215A (ko) 에지 트리거 래치를 갖춘 레벨 센서티브 래치를 에뮬레이션하는 시뮬레이션 방법 및 장치
CN116013401B (zh) 存储器调试方法、装置、设备及存储介质
Pomeranz et al. Scan-BIST based on transition probabilities for circuits with single and multiple scan chains
RU2225013C2 (ru) Автоматизированная система контроля электрических величин аппаратуры электронной
MY128470A (en) Boundary-scan testing opto-electronic devices.
EP0378325A3 (de) Verfahren und Gerät zur Schaltungsprüfung
Baumbaugh Production testing issues for ASICs for high energy physics
JPS63103985A (ja) 集積回路素子検査装置
Altaf-Ul-Amin et al. VHDL design of a test processor based on mixed-mode test generation
Badarov Teaching methodology for signature analysis and cyclic redundancy check.
JPS5698796A (en) High-speed memory test system
Maes Special report survey of the present status on critical reliability issues within europe

Legal Events

Date Code Title Description
8364 No opposition during term of opposition