DE69906699D1 - Quadrupl ionenfalle und flugzeitmassenspektrometer mit einer solchen ionen falle - Google Patents

Quadrupl ionenfalle und flugzeitmassenspektrometer mit einer solchen ionen falle

Info

Publication number
DE69906699D1
DE69906699D1 DE69906699T DE69906699T DE69906699D1 DE 69906699 D1 DE69906699 D1 DE 69906699D1 DE 69906699 T DE69906699 T DE 69906699T DE 69906699 T DE69906699 T DE 69906699T DE 69906699 D1 DE69906699 D1 DE 69906699D1
Authority
DE
Germany
Prior art keywords
ion trap
quadrupl
mass spectrometer
flight time
time mass
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69906699T
Other languages
English (en)
Other versions
DE69906699T2 (de
Inventor
Eizo Kawato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Research Laboratory Europe Ltd
Original Assignee
Shimadzu Research Laboratory Europe Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Research Laboratory Europe Ltd filed Critical Shimadzu Research Laboratory Europe Ltd
Publication of DE69906699D1 publication Critical patent/DE69906699D1/de
Application granted granted Critical
Publication of DE69906699T2 publication Critical patent/DE69906699T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/426—Methods for controlling ions
    • H01J49/427—Ejection and selection methods
DE69906699T 1998-01-30 1999-01-12 Quadrupl ionenfalle und flugzeitmassenspektrometer mit einer solchen ionen falle Expired - Lifetime DE69906699T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GBGB9802111.6A GB9802111D0 (en) 1998-01-30 1998-01-30 Time-of-flight mass spectrometer
PCT/GB1999/000084 WO1999039368A2 (en) 1998-01-30 1999-01-12 Time-of-flight mass spectrometer

Publications (2)

Publication Number Publication Date
DE69906699D1 true DE69906699D1 (de) 2003-05-15
DE69906699T2 DE69906699T2 (de) 2003-10-23

Family

ID=10826236

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69906699T Expired - Lifetime DE69906699T2 (de) 1998-01-30 1999-01-12 Quadrupl ionenfalle und flugzeitmassenspektrometer mit einer solchen ionen falle

Country Status (7)

Country Link
US (1) US6380666B1 (de)
EP (1) EP1051730B1 (de)
JP (1) JP4132667B2 (de)
AU (1) AU2065199A (de)
DE (1) DE69906699T2 (de)
GB (1) GB9802111D0 (de)
WO (1) WO1999039368A2 (de)

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3785042B2 (ja) 1998-12-21 2006-06-14 シマヅ リサーチ ラボラトリー（ヨーロッパ）リミティド 無線周波共振器の高速起動及び／高速終了の方法
US6545268B1 (en) 2000-04-10 2003-04-08 Perseptive Biosystems Preparation of ion pulse for time-of-flight and for tandem time-of-flight mass analysis
CA2381070C (en) * 2000-06-14 2005-04-05 Mitsubishi Heavy Industries, Ltd. Detector of chemical substances and concentration-measuring method of chemical substances
JP3990889B2 (ja) * 2001-10-10 2007-10-17 株式会社日立ハイテクノロジーズ 質量分析装置およびこれを用いる計測システム
US6770871B1 (en) 2002-05-31 2004-08-03 Michrom Bioresources, Inc. Two-dimensional tandem mass spectrometry
GB2390935A (en) 2002-07-16 2004-01-21 Anatoli Nicolai Verentchikov Time-nested mass analysis using a TOF-TOF tandem mass spectrometer
US7196324B2 (en) 2002-07-16 2007-03-27 Leco Corporation Tandem time of flight mass spectrometer and method of use
US7102126B2 (en) 2002-08-08 2006-09-05 Micromass Uk Limited Mass spectrometer
GB0218454D0 (en) * 2002-08-08 2002-09-18 Micromass Ltd Mass spectrometer
US6875980B2 (en) 2002-08-08 2005-04-05 Micromass Uk Limited Mass spectrometer
US6794642B2 (en) 2002-08-08 2004-09-21 Micromass Uk Limited Mass spectrometer
JP3800178B2 (ja) 2003-01-07 2006-07-26 株式会社島津製作所 質量分析装置及び質量分析方法
CA2517700C (en) 2003-03-19 2009-11-17 Thermo Finnigan Llc Obtaining tandem mass spectrometry data for multiple parent ions in an ion population
US7041968B2 (en) * 2003-03-20 2006-05-09 Science & Technology Corporation @ Unm Distance of flight spectrometer for MS and simultaneous scanless MS/MS
US7947950B2 (en) 2003-03-20 2011-05-24 Stc.Unm Energy focus for distance of flight mass spectometry with constant momentum acceleration and an ion mirror
JP3960306B2 (ja) * 2003-12-22 2007-08-15 株式会社島津製作所 イオントラップ装置
JP4033133B2 (ja) 2004-01-13 2008-01-16 株式会社島津製作所 質量分析装置
GB0404285D0 (en) * 2004-02-26 2004-03-31 Shimadzu Res Lab Europe Ltd A tandem ion-trap time-of flight mass spectrometer
WO2005106921A1 (en) * 2004-05-05 2005-11-10 Mds Inc. Doing Business Through Its Mds Sciex Division Ion guide for mass spectrometer
CN1326191C (zh) * 2004-06-04 2007-07-11 复旦大学 用印刷电路板构建的离子阱质量分析仪
GB0511386D0 (en) * 2005-06-03 2005-07-13 Shimadzu Res Lab Europe Ltd Method for introducing ions into an ion trap and an ion storage apparatus
JP5107263B2 (ja) * 2006-01-11 2012-12-26 ディーエイチ テクノロジーズ デベロップメント プライベート リミテッド 質量分析計におけるイオンの断片化
CN100424039C (zh) * 2006-03-10 2008-10-08 中国科学院金属研究所 一种原位反应热压合成TiB2－NbC－SiC高温陶瓷复合材料的制备方法
GB0620398D0 (en) * 2006-10-13 2006-11-22 Shimadzu Corp Multi-reflecting time-of-flight mass analyser and a time-of-flight mass spectrometer including the time-of-flight mass analyser
US8334506B2 (en) 2007-12-10 2012-12-18 1St Detect Corporation End cap voltage control of ion traps
US7973277B2 (en) 2008-05-27 2011-07-05 1St Detect Corporation Driving a mass spectrometer ion trap or mass filter
RU2447539C2 (ru) * 2009-05-25 2012-04-10 Закрытое акционерное общество "Геркон-авто" Анализатор пролетного квадрупольного масс-спектрометра (типа фильтр масс, "монополь" и "триполь")
WO2011066551A1 (en) * 2009-11-30 2011-06-03 Ionwerks, Inc. Time-of-flight spectrometry and spectroscopy of surfaces
DE102012013038B4 (de) * 2012-06-29 2014-06-26 Bruker Daltonik Gmbh Auswerfen einer lonenwolke aus 3D-HF-lonenfallen
DE102013208959A1 (de) 2013-05-15 2014-11-20 Carl Zeiss Microscopy Gmbh Vorrichtung zur massenselektiven Bestimmung eines Ions
CN104377109B (zh) * 2013-08-16 2017-10-03 中国人民解放军63975部队 一种线性离子阱质量分析器
CN105849515B (zh) * 2013-12-24 2019-04-23 Dh科技发展私人贸易有限公司 高速极性切换飞行时间质谱仪
GB201409074D0 (en) 2014-05-21 2014-07-02 Thermo Fisher Scient Bremen Ion ejection from a quadrupole ion trap

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5569917A (en) * 1995-05-19 1996-10-29 Varian Associates, Inc. Apparatus for and method of forming a parallel ion beam

Also Published As

Publication number Publication date
JP4132667B2 (ja) 2008-08-13
EP1051730B1 (de) 2003-04-09
WO1999039368A3 (en) 1999-09-23
JP2002502095A (ja) 2002-01-22
AU2065199A (en) 1999-08-16
GB9802111D0 (en) 1998-04-01
DE69906699T2 (de) 2003-10-23
WO1999039368A2 (en) 1999-08-05
US6380666B1 (en) 2002-04-30
EP1051730A2 (de) 2000-11-15

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