DE69833058D1 - Vorrichtung zum Erzeugen eines Ausgabe-Stromes - Google Patents

Vorrichtung zum Erzeugen eines Ausgabe-Stromes

Info

Publication number
DE69833058D1
DE69833058D1 DE69833058T DE69833058T DE69833058D1 DE 69833058 D1 DE69833058 D1 DE 69833058D1 DE 69833058 T DE69833058 T DE 69833058T DE 69833058 T DE69833058 T DE 69833058T DE 69833058 D1 DE69833058 D1 DE 69833058D1
Authority
DE
Germany
Prior art keywords
generating
output current
current
output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69833058T
Other languages
English (en)
Other versions
DE69833058T2 (de
Inventor
Garry Gillette
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Credence Systems Corp
Original Assignee
Credence Systems Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Credence Systems Corp filed Critical Credence Systems Corp
Publication of DE69833058D1 publication Critical patent/DE69833058D1/de
Application granted granted Critical
Publication of DE69833058T2 publication Critical patent/DE69833058T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2879—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers
    • G01R31/2841—Signal generators
DE69833058T 1997-08-29 1998-08-20 Vorrichtung zum Erzeugen eines Ausgabe-Stromes Expired - Fee Related DE69833058T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US924035 1997-08-29
US08/924,035 US5952821A (en) 1997-08-29 1997-08-29 Load circuit for integrated circuit tester

Publications (2)

Publication Number Publication Date
DE69833058D1 true DE69833058D1 (de) 2006-02-02
DE69833058T2 DE69833058T2 (de) 2006-06-22

Family

ID=25449619

Family Applications (2)

Application Number Title Priority Date Filing Date
DE69833058T Expired - Fee Related DE69833058T2 (de) 1997-08-29 1998-08-20 Vorrichtung zum Erzeugen eines Ausgabe-Stromes
DE69827401T Expired - Fee Related DE69827401T2 (de) 1997-08-29 1998-08-20 Belastungsschaltung für ic-tester

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE69827401T Expired - Fee Related DE69827401T2 (de) 1997-08-29 1998-08-20 Belastungsschaltung für ic-tester

Country Status (6)

Country Link
US (1) US5952821A (de)
EP (2) EP1018026B1 (de)
JP (1) JP2001514390A (de)
KR (1) KR100530176B1 (de)
DE (2) DE69833058T2 (de)
WO (1) WO1999010752A1 (de)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6356853B1 (en) 1999-07-23 2002-03-12 Daniel B. Sullivan Enhancing voltmeter functionality
US6365859B1 (en) * 2000-06-28 2002-04-02 Advanced Micro Devices Processor IC performance metric
US20050146320A1 (en) * 2003-12-31 2005-07-07 Gohel Tushar K. Differential active load
KR100555544B1 (ko) * 2004-01-02 2006-03-03 삼성전자주식회사 피시험 장치의 내부 임피던스 변화에 무관한 전류 소스를갖는 테스트 자극 신호를 발생하는 장치
SG113006A1 (en) * 2004-01-04 2005-07-28 Teradyne Inc Silicon-on-insulator channel architecture of automatic test equipment
US20060214812A1 (en) * 2005-03-25 2006-09-28 Ainsworth Kenneth M Measurement of output voltage characteristics on dynamic logic signals
KR100690275B1 (ko) 2006-01-31 2007-03-12 삼성전자주식회사 테스트 모드에서 전압모드로 동작하는 전류모드 반도체집적회로장치
DE602006007307D1 (de) * 2006-03-09 2009-07-30 Teradyne Inc V/I-Quelle und Testsystem damit
KR101742875B1 (ko) * 2015-06-18 2017-06-01 인하대학교 산학협력단 고 임피던스 전류 보정 회로를 갖는 테스트 보드용 엑티브 로드
DE102016215991A1 (de) 2016-08-25 2018-03-01 Siemens Aktiengesellschaft Verfahren zur Bestimmung des Alters eines elektrochemischen Energiespeichers

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3956645A (en) * 1972-09-09 1976-05-11 U.S. Philips Corporation Controllable current source
US3849726A (en) * 1974-01-28 1974-11-19 Sperry Rand Corp Universal programmable digital testing interface line
JPS5816396A (ja) * 1981-07-20 1983-01-31 パイオニア株式会社 電圧−電流変換回路
JPH0743413B2 (ja) * 1984-05-09 1995-05-15 三菱電機株式会社 半導体試験装置
JPS6144371A (ja) * 1984-08-06 1986-03-04 Mitsubishi Electric Corp 半導体試験装置
US4712058A (en) * 1986-07-22 1987-12-08 Tektronix, Inc. Active load network
US5010297A (en) * 1989-12-01 1991-04-23 Analog Devices, Incorporated Automatic test equipment with active load having high-speed inhibit mode switching
JPH03277983A (ja) * 1990-03-28 1991-12-09 Ando Electric Co Ltd Ｄｂ型ａｓによるｄｕｔ負荷切換回路
US5493519A (en) * 1993-08-16 1996-02-20 Altera Corporation High voltage driver circuit with fast current limiting for testing of integrated circuits
US5488289A (en) * 1993-11-18 1996-01-30 National Semiconductor Corp. Voltage to current converter having feedback for providing an exponential current output

Also Published As

Publication number Publication date
US5952821A (en) 1999-09-14
EP1018026A1 (de) 2000-07-12
JP2001514390A (ja) 2001-09-11
KR20010023515A (ko) 2001-03-26
EP1450172A1 (de) 2004-08-25
DE69827401D1 (de) 2004-12-09
EP1018026A4 (de) 2003-06-04
WO1999010752A1 (en) 1999-03-04
KR100530176B1 (ko) 2005-11-22
DE69827401T2 (de) 2005-11-10
EP1450172B1 (de) 2005-12-28
EP1018026B1 (de) 2004-11-03
DE69833058T2 (de) 2006-06-22

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee