DE69820670D1 - Absolutmessung von eigenschaften mit luftkalibrierung - Google Patents
Absolutmessung von eigenschaften mit luftkalibrierungInfo
- Publication number
- DE69820670D1 DE69820670D1 DE69820670T DE69820670T DE69820670D1 DE 69820670 D1 DE69820670 D1 DE 69820670D1 DE 69820670 T DE69820670 T DE 69820670T DE 69820670 T DE69820670 T DE 69820670T DE 69820670 D1 DE69820670 D1 DE 69820670D1
- Authority
- DE
- Germany
- Prior art keywords
- sensor
- instrument
- properties
- primary winding
- absolute
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
- G01N27/023—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance where the material is placed in the field of a coil
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Sampling And Sample Adjustment (AREA)
- Measuring Oxygen Concentration In Cells (AREA)
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US6353497P | 1997-10-29 | 1997-10-29 | |
US6960497P | 1997-12-15 | 1997-12-15 | |
US10452698P | 1998-10-16 | 1998-10-16 | |
PCT/US1998/022900 WO1999022231A1 (en) | 1997-10-29 | 1998-10-28 | Absolute property measurement with air calibration |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69820670D1 true DE69820670D1 (de) | 2004-01-29 |
DE69820670T2 DE69820670T2 (de) | 2004-10-21 |
Family
ID=27370495
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69820670T Expired - Lifetime DE69820670T2 (de) | 1997-10-29 | 1998-10-28 | Absolutmessung von eigenschaften mit luftkalibrierung |
Country Status (7)
Country | Link |
---|---|
US (2) | US6188218B1 (de) |
EP (1) | EP1027598B1 (de) |
AT (1) | ATE256865T1 (de) |
AU (1) | AU1367199A (de) |
CA (1) | CA2308166C (de) |
DE (1) | DE69820670T2 (de) |
WO (1) | WO1999022231A1 (de) |
Families Citing this family (50)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6420867B1 (en) * | 1997-03-13 | 2002-07-16 | Jentek Sensors, Inc. | Method of detecting widespread fatigue and cracks in a metal structure |
US6657429B1 (en) | 1995-08-25 | 2003-12-02 | Jentek Sensors, Inc. | Material condition assessment with spatially periodic field sensors |
WO1999058989A1 (en) * | 1998-05-12 | 1999-11-18 | Jentek Sensors, Incorporated | Methods for utilizing dielectrometry signals using estimation grids |
US7161350B2 (en) | 1999-09-07 | 2007-01-09 | Jentek Sensors, Inc. | Method for material property monitoring with perforated, surface mounted sensors |
US7824244B2 (en) | 2007-05-30 | 2010-11-02 | Corning Incorporated | Methods and apparatus for polishing a semiconductor wafer |
GB2377028B (en) * | 1999-09-20 | 2004-07-28 | Jentek Sensors Inc | Eddy-current sensor arrays |
GB2396427B (en) * | 1999-09-20 | 2004-10-13 | Jentek Sensors Inc | Method of monitoring damage at a fastener using an eddy-current sensor |
US6992482B2 (en) * | 2000-11-08 | 2006-01-31 | Jentek Sensors, Inc. | Magnetic field sensor having a switchable drive current spatial distribution |
US7385392B2 (en) * | 2000-11-13 | 2008-06-10 | Jentek Sensors, Inc. | Eddy current sensing arrays and system |
US6784662B2 (en) * | 2001-03-19 | 2004-08-31 | Jentek Sensors, Inc. | Eddy current sensor arrays having drive windings with extended portions |
WO2003034054A2 (en) * | 2001-10-17 | 2003-04-24 | Aea Technology Plc | Method and apparatus for measuring material properties and lift-off components of an object using a magnetic probe |
US7526964B2 (en) * | 2002-01-25 | 2009-05-05 | Jentek Sensors, Inc. | Applied and residual stress measurements using magnetic field sensors |
US20040004475A1 (en) * | 2002-04-22 | 2004-01-08 | Jentek Sensors, Inc. | High throughput absolute flaw imaging |
US7095224B2 (en) * | 2003-01-21 | 2006-08-22 | Jentek Sensors, Inc. | Process control and damage monitoring |
US20050007106A1 (en) * | 2003-05-23 | 2005-01-13 | Jentek Sensors, Inc. | Hybrid wound/etched winding constructs for scanning and monitoring |
US7161351B2 (en) * | 2003-09-03 | 2007-01-09 | Jentek Sensors, Inc. | Hidden feature characterization using a database of sensor responses |
US7188532B2 (en) * | 2003-09-08 | 2007-03-13 | Jentek Sensors, Inc. | Self-monitoring metals, alloys and materials |
US7696748B2 (en) * | 2003-10-10 | 2010-04-13 | Jentek Sensors, Inc. | Absolute property measurements using electromagnetic sensors |
US7106055B2 (en) * | 2003-11-14 | 2006-09-12 | Jentek Sensors, Inc. | Fabrication of samples having predetermined material conditions |
US7451657B2 (en) * | 2004-01-16 | 2008-11-18 | Jentek Sensors, Inc. | Material condition monitoring with multiple sensing modes |
US20060076952A9 (en) * | 2004-02-12 | 2006-04-13 | Jentek Sensors, Inc. | Segmented field sensors |
US8981018B2 (en) * | 2004-03-15 | 2015-03-17 | Jentek Sensors, Inc. | Internal material condition monitoring for control |
US7015690B2 (en) * | 2004-05-27 | 2006-03-21 | General Electric Company | Omnidirectional eddy current probe and inspection system |
US20070069720A1 (en) * | 2004-09-17 | 2007-03-29 | Goldfine Neil J | Material characterization with model based sensors |
US7289913B2 (en) * | 2004-10-08 | 2007-10-30 | Jentek Sensors, Inc. | Local feature characterization using quasistatic electromagnetic sensors |
US20060244443A1 (en) * | 2005-01-28 | 2006-11-02 | Goldfine Neil J | Material condition assessment with eddy current sensors |
EP1848989A1 (de) * | 2005-02-04 | 2007-10-31 | Commissariat A L'energie Atomique | Verfahren zur herstellung eines wirbelstromtestkopfs mit hoher dynamik und hoher räumlicher auflösung |
US7626383B1 (en) | 2005-04-25 | 2009-12-01 | Innovative Materials Testing Technologies, Inc. | Apparatus and method for holding a rotatable eddy-current magnetic probe, and for rotating the probe around a boundary |
US7528598B2 (en) * | 2005-06-22 | 2009-05-05 | Jentek Sensors, Inc. | Fastener and fitting based sensing methods |
US7885707B2 (en) * | 2005-09-15 | 2011-02-08 | St. Jude Medical, Atrial Fibrillation Division, Inc. | Method of scaling navigation signals to account for impedance drift in tissue |
US7560920B1 (en) | 2005-10-28 | 2009-07-14 | Innovative Materials Testing Technologies, Inc. | Apparatus and method for eddy-current scanning of a surface to detect cracks and other defects |
US8768657B2 (en) * | 2006-01-12 | 2014-07-01 | Jentek Sensors, Inc. | Remaining life prediction for individual components from sparse data |
US7533575B2 (en) * | 2006-02-03 | 2009-05-19 | Jentek Sensors, Inc. | Quasistatic magnetic and electric field stress/strain gages |
US7451639B2 (en) * | 2006-03-07 | 2008-11-18 | Jentek Sensors, Inc. | Engine blade dovetail inspection |
KR100892486B1 (ko) | 2007-08-01 | 2009-04-10 | 경희대학교 산학협력단 | 다층 주기 구조물의 물리량 산출 방법 |
US7948233B2 (en) * | 2008-10-07 | 2011-05-24 | General Electric Company | Omnidirectional eddy current array probes and methods of use |
US20110054806A1 (en) * | 2009-06-05 | 2011-03-03 | Jentek Sensors, Inc. | Component Adaptive Life Management |
US8928316B2 (en) * | 2010-11-16 | 2015-01-06 | Jentek Sensors, Inc. | Method and apparatus for non-destructive evaluation of materials |
ES2769295T3 (es) * | 2011-09-29 | 2020-06-25 | Abb Technology Ag | Disposición para la detección de grietas en materiales metálicos |
US9255875B2 (en) | 2011-10-25 | 2016-02-09 | Jentek Sensors, Inc. | Method and apparatus for inspection of corrosion and other defects through insulation |
US8884614B2 (en) | 2011-10-31 | 2014-11-11 | General Electric Company | Eddy current array probe |
US10739287B2 (en) | 2015-01-15 | 2020-08-11 | Transtech Systems, Inc. | Measurement and monitoring of physical properties of material under test (MUT) from a vehicle |
US9970325B2 (en) | 2015-04-30 | 2018-05-15 | General Electric Company | Jacking assembly for rotor |
CN105044463B (zh) * | 2015-06-29 | 2018-01-02 | 上海大学 | 在线式电阻率测试系统 |
JP6659821B2 (ja) | 2015-07-13 | 2020-03-04 | プロセク ソシエテ アノニム | インピーダンス測定によって車両内のカーボンセラミック製ブレーキディスクの摩耗を決定するための方法及び装置 |
KR20180047534A (ko) * | 2016-10-31 | 2018-05-10 | 한국전자통신연구원 | 패턴 인식 모델에 기반한 캘리브레이션이 가능한 후각 정보 생성 장치 및 생성 방법 |
US11016047B2 (en) * | 2017-08-25 | 2021-05-25 | 3M Innovative Properties Company | Temperature-corrected control data for verifying of structural integrity of materials |
US11268931B2 (en) | 2018-06-18 | 2022-03-08 | Jentek Sensors, Inc. | Segmented field eddy current sensing for dispersive property measurement and complex structures |
CN111999378B (zh) * | 2020-08-18 | 2023-08-29 | 中国人民解放军空军工程大学 | 一种基于tmr传感器的金属材料电导率和厚度的测量方法 |
CN114567289B (zh) * | 2022-04-27 | 2022-07-29 | 中国科学院精密测量科学与技术创新研究院 | 一种用于核磁共振谐振电路的气动自动调谐装置与方法 |
Family Cites Families (47)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3249854A (en) | 1957-11-01 | 1966-05-03 | Whittaker Corp | Displacement measuring device |
US3721821A (en) | 1970-12-14 | 1973-03-20 | Abex Corp | Railway wheel sensor |
SU578609A1 (ru) | 1972-02-22 | 1977-10-30 | Отдел Физики Неразрушающего Контроля Ан Белорусской Сср | Способ измерени параметров движущихс электропровод щих изделий |
SU502205A1 (ru) | 1973-12-24 | 1976-02-05 | Токовихревое устройство дл контрол электропроводных изделий | |
US3939404A (en) | 1974-07-10 | 1976-02-17 | Dominion Foundries And Steel, Limited | Method of testing for and preventing the possibility of cracking, spalling or like defects in rolling mill rolls by determining the rate of change in hardness |
US4058766A (en) | 1976-06-21 | 1977-11-15 | Agridustrial Electronics, Inc. | Multiple-frequency permittivity tester |
GB2031155B (en) | 1978-09-08 | 1982-12-22 | British Steel Corp | Isotropic magnetising system |
US4355300A (en) | 1980-02-14 | 1982-10-19 | Coulter Systems Corporation | Indicia recognition apparatus |
SU894547A1 (ru) | 1980-03-06 | 1981-12-30 | Всесоюзный заочный машиностроительный институт | Устройство дл модул ционного электромагнитного контрол |
US4399100A (en) | 1980-12-29 | 1983-08-16 | Lockheed Corporation | Automatic process control system and method for curing polymeric materials |
US4496697A (en) | 1980-12-29 | 1985-01-29 | Lockheed Corporation | Automatic process control system for curing polymeric material |
US4423371A (en) | 1981-09-03 | 1983-12-27 | Massachusetts Institute Of Technology | Methods and apparatus for microdielectrometry |
SU1095101A1 (ru) | 1983-02-08 | 1984-05-30 | Киевский технологический институт легкой промышленности | Устройство дл контрол многослойных диэлектриков |
ATE39869T1 (de) | 1983-07-05 | 1989-01-15 | Elektroniktechnologie Get | Induktive sensoranordnung und messanordnung zur verwendung derselben. |
FR2570501B1 (fr) | 1984-09-20 | 1987-12-18 | Siderurgie Fse Inst Rech | Procede de detection de defauts de surface par courants de foucault et dispositif mettant en oeuvre ce procede |
FR2589566A1 (fr) | 1985-11-06 | 1987-05-07 | Cegedur | Procede de mesure au defile et sans contact de l'epaisseur et de la temperature de feuilles metalliques minces au moyen de courants de foucault |
GB8607747D0 (en) | 1986-03-27 | 1986-04-30 | Duracell Int | Device |
US4710710A (en) | 1986-04-22 | 1987-12-01 | The Babcock & Wilcox Company | Scanning apparatus and method for inspection of header tube holes |
SE451886B (sv) | 1986-10-10 | 1987-11-02 | Sten Linder | Sett och anordning for beroringsfri metning av storheter hos eller i anslutning till elektriskt ledande material |
US4814690A (en) | 1987-10-02 | 1989-03-21 | Massachusetts Institute Of Technology | Apparatus and methods for measuring permittivity in materials |
US4883264A (en) | 1987-11-02 | 1989-11-28 | Laurel Bank Machines Co., Ltd. | Bill disbursing system |
US4912414A (en) | 1988-10-28 | 1990-03-27 | Lesky Edward S | Induction-type metal detector with increased scanning area capability |
US4922201A (en) | 1989-01-09 | 1990-05-01 | The United States Of America As Represented By The Secretary Of The Navy | Eddy current method for measuring electrical resistivity and device for providing accurate phase detection |
NL8900750A (nl) | 1989-03-28 | 1990-10-16 | Philips Nv | Inrichting voor het meten van een relatieve verplaatsing. |
FR2648236B1 (fr) | 1989-06-12 | 1991-12-20 | Onera (Off Nat Aerospatiale) | Appareil de mesure d'impedance surfacique |
DE4103603C2 (de) | 1990-02-08 | 2003-09-11 | Papst Licensing Gmbh & Co Kg | Positionssensor zum Erfassen linearer oder rotatorischer Bewegungen eines Teils |
GB9018660D0 (en) | 1990-08-24 | 1990-10-10 | Imperial College | Probe system |
US5182513A (en) | 1991-04-06 | 1993-01-26 | General Electric Company | Method and apparatus for a multi-channel multi-frequency data acquisition system for nondestructive eddy current inspection testing |
US5389876A (en) | 1991-05-06 | 1995-02-14 | General Electric Company | Flexible eddy current surface measurement array for detecting near surface flaws in a conductive part |
US5237271A (en) | 1991-05-06 | 1993-08-17 | General Electric Company | Apparatus and method for non-destructive testing using multi-frequency eddy currents |
US5345514A (en) | 1991-09-16 | 1994-09-06 | General Electric Company | Method for inspecting components having complex geometric shapes |
US5453689A (en) * | 1991-12-06 | 1995-09-26 | Massachusetts Institute Of Technology | Magnetometer having periodic winding structure and material property estimator |
US5293119A (en) * | 1992-02-20 | 1994-03-08 | Sqm Technology, Inc. | Electromagnetic microscope for evaluation of electrically conductive and magnetic materials |
US5315234A (en) | 1992-04-03 | 1994-05-24 | General Electric Company | Eddy current device for inspecting a component having a flexible support with a plural sensor array |
US5262722A (en) | 1992-04-03 | 1993-11-16 | General Electric Company | Apparatus for near surface nondestructive eddy current scanning of a conductive part using a multi-layer eddy current probe array |
US5371461A (en) | 1992-06-26 | 1994-12-06 | General Electric Company | Apparatus and method for compensating for variations in the lift-off of eddy current surface inspection array elements |
US5278498A (en) | 1992-11-06 | 1994-01-11 | The United States Of America As Represented By The Secretary Of The Navy | Surface conforming flexible eddy current probe for scanning varying surface contours |
US5363051A (en) | 1992-11-23 | 1994-11-08 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Steering capaciflector sensor |
US5442347A (en) | 1993-01-25 | 1995-08-15 | The United States Of America As Represented By The Administrater, National Aeronautics & Space Administration | Double-driven shield capacitive type proximity sensor |
US5463201A (en) | 1993-02-04 | 1995-10-31 | Generla Electric Company | Seam-tracking apparatus for a welding system employing an array of eddy current elements |
US5418457A (en) | 1993-03-12 | 1995-05-23 | General Electric Company | System and method for aligning an inspection probe and maintaining uniform spacing between the probe surface and an inspection surface |
US5371462A (en) | 1993-03-19 | 1994-12-06 | General Electric Company | Eddy current inspection method employing a probe array with test and reference data acquisition and signal processing |
US5485084A (en) | 1993-05-10 | 1996-01-16 | The Boeing Company | Apparatus and method for detecting structural cracks using a movable detector |
US5373245A (en) | 1993-07-12 | 1994-12-13 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Capaciflector camera |
US5434504A (en) | 1993-10-01 | 1995-07-18 | International Business Machines Corporation | Position sensors for linear motors including plural symmetrical fluxes generated by a planar drive coil and received by planar sense coils being colinear along an axis of motion |
EP0723166B1 (de) | 1995-01-18 | 2000-03-08 | Carlo Gavazzi Services AG | Kapazitiver Sensor |
US5541510A (en) | 1995-04-06 | 1996-07-30 | Kaman Instrumentation Corporation | Multi-Parameter eddy current measuring system with parameter compensation technical field |
-
1998
- 1998-10-28 CA CA002308166A patent/CA2308166C/en not_active Expired - Fee Related
- 1998-10-28 WO PCT/US1998/022900 patent/WO1999022231A1/en active IP Right Grant
- 1998-10-28 AU AU13671/99A patent/AU1367199A/en not_active Abandoned
- 1998-10-28 EP EP98957400A patent/EP1027598B1/de not_active Expired - Lifetime
- 1998-10-28 DE DE69820670T patent/DE69820670T2/de not_active Expired - Lifetime
- 1998-10-28 AT AT98957400T patent/ATE256865T1/de not_active IP Right Cessation
- 1998-10-29 US US09/182,693 patent/US6188218B1/en not_active Ceased
-
2003
- 2003-02-13 US US10/366,306 patent/USRE39206E1/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
AU1367199A (en) | 1999-05-17 |
EP1027598A1 (de) | 2000-08-16 |
CA2308166C (en) | 2007-09-04 |
CA2308166A1 (en) | 1999-05-06 |
USRE39206E1 (en) | 2006-07-25 |
EP1027598B1 (de) | 2003-12-17 |
WO1999022231A1 (en) | 1999-05-06 |
ATE256865T1 (de) | 2004-01-15 |
DE69820670T2 (de) | 2004-10-21 |
US6188218B1 (en) | 2001-02-13 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |