DE69803749D1 - Verfahren zur photometrischen untersuchung eines gegenstandes - Google Patents

Verfahren zur photometrischen untersuchung eines gegenstandes

Info

Publication number
DE69803749D1
DE69803749D1 DE69803749T DE69803749T DE69803749D1 DE 69803749 D1 DE69803749 D1 DE 69803749D1 DE 69803749 T DE69803749 T DE 69803749T DE 69803749 T DE69803749 T DE 69803749T DE 69803749 D1 DE69803749 D1 DE 69803749D1
Authority
DE
Germany
Prior art keywords
photometric examination
photometric
examination
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69803749T
Other languages
English (en)
Other versions
DE69803749T2 (de
Inventor
Laurent Legrandjacques
Christophe Dehan
Jean-Claude Krapez
Poutre Francois Le
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Office National dEtudes et de Recherches Aerospatiales ONERA
Areva NP SAS
Original Assignee
Office National dEtudes et de Recherches Aerospatiales ONERA
Framatome ANP SAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Office National dEtudes et de Recherches Aerospatiales ONERA, Framatome ANP SAS filed Critical Office National dEtudes et de Recherches Aerospatiales ONERA
Application granted granted Critical
Publication of DE69803749D1 publication Critical patent/DE69803749D1/de
Publication of DE69803749T2 publication Critical patent/DE69803749T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/72—Investigating presence of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/0022—Radiation pyrometry, e.g. infrared or optical thermometry for sensing the radiation of moving bodies

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
DE69803749T 1997-03-05 1998-03-04 Verfahren zur photometrischen untersuchung eines gegenstandes Expired - Lifetime DE69803749T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR9702622A FR2760529B1 (fr) 1997-03-05 1997-03-05 Procede d'examen photothermique d'une piece
PCT/FR1998/000430 WO1998039641A1 (fr) 1997-03-05 1998-03-04 Procede d'examen photothermique d'une piece

Publications (2)

Publication Number Publication Date
DE69803749D1 true DE69803749D1 (de) 2002-03-21
DE69803749T2 DE69803749T2 (de) 2002-08-22

Family

ID=9504439

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69803749T Expired - Lifetime DE69803749T2 (de) 1997-03-05 1998-03-04 Verfahren zur photometrischen untersuchung eines gegenstandes

Country Status (7)

Country Link
US (1) US6343874B1 (de)
EP (1) EP0965038B1 (de)
DE (1) DE69803749T2 (de)
DK (1) DK0965038T3 (de)
ES (1) ES2172123T3 (de)
FR (1) FR2760529B1 (de)
WO (1) WO1998039641A1 (de)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020027941A1 (en) * 2000-08-25 2002-03-07 Jerry Schlagheck Method and apparatus for detection of defects using localized heat injection of narrow laser pulses
US7401976B1 (en) * 2000-08-25 2008-07-22 Art Advanced Research Technologies Inc. Detection of defects by thermographic analysis
US6720021B2 (en) * 2000-10-23 2004-04-13 The Procter + Gamble Co. Process for making a low-fat nut spread composition
US6517238B2 (en) * 2001-01-18 2003-02-11 The United States Of America As Represented By The United States Department Of Energy Thermal imaging measurement of lateral diffusivity and non-invasive material defect detection
US6517236B2 (en) * 2001-02-15 2003-02-11 The University Of Chicago Method and apparatus for automated thermal imaging of combustor liners and other products
EP1386481A1 (de) * 2001-05-07 2004-02-04 Flir Systems AB Infrarotstrahlungsempfindliche infrarotkamera
US20050169346A1 (en) * 2004-01-29 2005-08-04 Trw Automotive U.S. Llc Method for monitoring quality of a transmissive laser weld
US11654635B2 (en) 2019-04-18 2023-05-23 The Research Foundation For Suny Enhanced non-destructive testing in directed energy material processing
FR3102849B1 (fr) 2019-11-04 2022-02-11 Office National Detudes Rech Aerospatiales Analyse photothermique d’une piece de materiau solide
CZ309252B6 (cs) * 2020-11-24 2022-06-22 Západočeská Univerzita V Plzni Způsob měření plošného rozložení emisivity povrchu materiálu

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US3808439A (en) * 1972-04-24 1974-04-30 Us Army Laser illumination thermal imaging device for nondestructive testing
US3842277A (en) * 1973-06-25 1974-10-15 Western Electric Co Infrared scanning apparatus using a plurality of parallel detectors
US3949225A (en) * 1974-09-23 1976-04-06 Xerox Corporation Infrared imaging apparatus
CA1098615A (en) * 1975-12-29 1981-03-31 George S. Hopper Ferroelectric imaging system
US4429330A (en) * 1980-04-18 1984-01-31 Texas Instruments Incorporated Infrared matrix using transfer gates
US4910401A (en) * 1982-01-20 1990-03-20 The Boeing Company LWIR sensor system with improved clutter rejection
GB8431928D0 (en) * 1984-12-18 1985-01-30 Stevenson G M Non-destructively testing heat shrinkable sleeves
IE58049B1 (en) * 1985-05-21 1993-06-16 Tekscan Ltd Surface analysis microscopy apparatus
JPS62127660A (ja) * 1985-11-29 1987-06-09 Toshiba Corp パタ−ン検査装置
US4956686A (en) * 1986-02-04 1990-09-11 Texas Instruments Incorporated Two color infrared focal plane array
FR2593917B1 (fr) * 1986-02-06 1988-06-03 Univ Reims Champagne Ardenne Procede et dispositif d'analyse et de mesure des parametres physiques d'un materiau en couches par radiometrie thermique
US4900367A (en) * 1986-08-01 1990-02-13 Rockwell International Method of making a reticulated temperature sensitive imaging device
US4792681A (en) * 1986-10-23 1988-12-20 Varo, Inc. Infrared detector arrays
US4792683A (en) * 1987-01-16 1988-12-20 Hughes Aircraft Company Thermal technique for simultaneous testing of circuit board solder joints
US4703179A (en) * 1987-04-02 1987-10-27 Ford Aerospace & Communications Corporation Sensor for hemispherical applications
US4989086A (en) * 1988-06-02 1991-01-29 Westinghouse Electric Corp. Ultra wide field-of-regard multispectral imaging radiometer
US5131758A (en) * 1990-05-16 1992-07-21 Administrator Of The National Aeronautics And Space Administration Method of remotely characterizing thermal properties of a sample
US5111048A (en) * 1990-09-27 1992-05-05 General Electric Company Apparatus and method for detecting fatigue cracks using infrared thermography
US5124640A (en) * 1991-09-05 1992-06-23 The United States Of Americas As Represented By The Administrator Of The National Aeronautics & Space Administration Method for advanced material characterization by laser induced eddy current imaging
FR2682186B1 (fr) * 1991-10-08 1993-12-03 Thomson Csf Detecteur infrarouge a haute sensibilite et camera infrarouge utilisant un tel detecteur.
IL101570A0 (en) * 1992-04-10 1992-12-30 Amir Alon Method and apparatus for reading data
US5228776A (en) * 1992-05-06 1993-07-20 Therma-Wave, Inc. Apparatus for evaluating thermal and electrical characteristics in a sample
US5246291A (en) * 1992-06-01 1993-09-21 Motorola, Inc. Bond inspection technique for a semiconductor chip
FR2692423B1 (fr) * 1992-06-16 1995-12-01 Thomson Csf Camera d'observation multistandard et systeme de surveillance utilisant une telle camera.
US5302824A (en) * 1992-12-01 1994-04-12 Hughes Aircraft Company Measurement of relative detector gain
DE69312894T2 (de) * 1992-12-29 1998-02-12 Philips Electronics Nv Pyrometer mit Emissionsmesser
US5376793A (en) * 1993-09-15 1994-12-27 Stress Photonics, Inc. Forced-diffusion thermal imaging apparatus and method
CA2126481C (en) * 1994-06-22 2001-03-27 Andreas Mandelis Non-contact photothermal method for measuring thermal diffusivity and electronic defect properties of solids
US5654977A (en) * 1995-02-02 1997-08-05 Teledyne Industries Inc. Method and apparatus for real time defect inspection of metal at elevated temperature
JP3246704B2 (ja) * 1995-02-27 2002-01-15 シャープ株式会社 配線基板の検査装置
US5709469A (en) * 1995-03-13 1998-01-20 The United States Of America As Represented By The Secretary Of The Air Force Process for testing integrity of bonds between epoxy patches and aircraft structural materials
JP2850816B2 (ja) * 1995-12-18 1999-01-27 日本電気株式会社 バンプ接合検査装置及び検査方法
US5711603A (en) * 1996-10-30 1998-01-27 United Technologies Corporation Nondestructive testing: transient depth thermography
US6000844A (en) * 1997-03-04 1999-12-14 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Method and apparatus for the portable identification of material thickness and defects using spatially controlled heat application
US6013915A (en) * 1998-02-10 2000-01-11 Philip Morris Incorporated Process control by transient thermography
US6054868A (en) * 1998-06-10 2000-04-25 Boxer Cross Incorporated Apparatus and method for measuring a property of a layer in a multilayered structure
US6049220A (en) * 1998-06-10 2000-04-11 Boxer Cross Incorporated Apparatus and method for evaluating a wafer of semiconductor material

Also Published As

Publication number Publication date
EP0965038B1 (de) 2002-02-06
FR2760529B1 (fr) 1999-05-28
DK0965038T3 (da) 2002-05-27
ES2172123T3 (es) 2002-09-16
DE69803749T2 (de) 2002-08-22
FR2760529A1 (fr) 1998-09-11
EP0965038A1 (de) 1999-12-22
WO1998039641A1 (fr) 1998-09-11
US6343874B1 (en) 2002-02-05

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Legal Events

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