DE69739205D1 - Lle - Google Patents

Lle

Info

Publication number
DE69739205D1
DE69739205D1 DE69739205T DE69739205T DE69739205D1 DE 69739205 D1 DE69739205 D1 DE 69739205D1 DE 69739205 T DE69739205 T DE 69739205T DE 69739205 T DE69739205 T DE 69739205T DE 69739205 D1 DE69739205 D1 DE 69739205D1
Authority
DE
Germany
Prior art keywords
port
source
noise
output
equivalent circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69739205T
Other languages
German (de)
English (en)
Inventor
Robert S Roeder
Matthew C Smith
Lawrence P Dunleavy
Steven M Lardizabal
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
University of South Florida
Raytheon Co
Original Assignee
University of South Florida
Raytheon Co
University of South Florida St Petersburg
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by University of South Florida, Raytheon Co, University of South Florida St Petersburg filed Critical University of South Florida
Application granted granted Critical
Publication of DE69739205D1 publication Critical patent/DE69739205D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K15/00—Testing or calibrating of thermometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K11/00—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00
    • G01K11/006—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00 using measurement of the effect of a material on microwaves or longer electromagnetic waves, e.g. measuring temperature via microwaves emitted by the object

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Radiation Pyrometers (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Details Of Television Scanning (AREA)
  • Semiconductor Lasers (AREA)
  • Measuring Or Testing Involving Enzymes Or Micro-Organisms (AREA)
DE69739205T 1996-12-03 1997-11-28 Lle Expired - Lifetime DE69739205D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US3226296P 1996-12-03 1996-12-03
PCT/US1997/020969 WO1998027414A2 (en) 1996-12-03 1997-11-28 Variable microwave cold/warm noise source

Publications (1)

Publication Number Publication Date
DE69739205D1 true DE69739205D1 (de) 2009-02-26

Family

ID=21863983

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69739205T Expired - Lifetime DE69739205D1 (de) 1996-12-03 1997-11-28 Lle

Country Status (7)

Country Link
US (2) US6217210B1 (enExample)
EP (1) EP0944952B1 (enExample)
JP (1) JP3918021B2 (enExample)
AT (1) ATE420492T1 (enExample)
CA (1) CA2285643C (enExample)
DE (1) DE69739205D1 (enExample)
WO (1) WO1998027414A2 (enExample)

Families Citing this family (37)

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EP1285366A1 (en) * 2000-04-28 2003-02-26 Trw, Inc. Semi-physical modeling of hemt high frequency noise equivalent circuit models
US6772400B2 (en) 2000-04-28 2004-08-03 Northrop Grumman Corporation Semi-physical modeling of HEMT high frequency small signal equivalent circuit models
JP3669502B2 (ja) * 2002-06-25 2005-07-06 独立行政法人 宇宙航空研究開発機構 人工衛星用トータルパワー方式マイクロ波放射計の校正方法
US6834991B2 (en) * 2002-09-23 2004-12-28 Raytheon Company Radiometer with programmable noise source calibration
US7034516B2 (en) 2003-09-18 2006-04-25 Xytrans, Inc. Multi-channel radiometer imaging system
US7088086B2 (en) * 2003-09-18 2006-08-08 Xytrans, Inc. Multi-channel radiometer imaging system
US7603088B2 (en) 2003-09-18 2009-10-13 Reveal Imaging, Llc Multi-channel radiometer imaging system and MMIC chips for use thereof
US7221141B2 (en) * 2004-07-14 2007-05-22 Xytrans, Inc. Switched measuring system and method for measuring radiant signals
JP4757664B2 (ja) * 2006-03-07 2011-08-24 スタンレー電気株式会社 マイクロ波供給源装置
JP2010511178A (ja) * 2006-11-29 2010-04-08 レイセオン カンパニー 冷ノイズ源システム
JP5191221B2 (ja) * 2007-02-23 2013-05-08 株式会社エヌ・ティ・ティ・ドコモ 低温受信増幅器
EP1962418B1 (en) * 2007-02-23 2011-06-29 NTT DoCoMo, Inc. Cryogenic receiving amplifier and amplifying method
WO2008128140A1 (en) * 2007-04-13 2008-10-23 The Regents Of The University Of Michigan Delivery device and method for forming the same
US8421478B2 (en) 2008-01-25 2013-04-16 International Business Machines Corporation Radio frequency integrated circuit with on-chip noise source for self-test
WO2010070257A2 (en) * 2008-12-19 2010-06-24 Radio Physics Solutions Ltd A method for formation of radiometric images and an antenna for implementation of the method
US8485722B1 (en) 2009-10-14 2013-07-16 Raytheon Company Subsurface temperature measurement system
CN102243294B (zh) * 2010-05-14 2015-02-04 中国科学院空间科学与应用研究中心 一种地基微波辐射计的非线性定标方法及装置
GB201015207D0 (en) 2010-09-13 2010-10-27 Radio Physics Solutions Ltd Improvements in or relating to millimeter and sub-millimeter mave radar-radiometric imaging
DE102011016732B3 (de) * 2011-04-11 2012-07-05 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Radiometrische Kalibrationseinrichtung mit monolithisch integriertem Mehrfachschalter
FR2976661B1 (fr) * 2011-06-17 2013-07-05 Thales Sa Systeme compact de mesure altimetrique de haute precision.
GB2496835B (en) 2011-09-23 2015-12-30 Radio Physics Solutions Ltd Package for high frequency circuits
TWI434057B (zh) * 2011-11-24 2014-04-11 Ind Tech Res Inst 輻射計之校正裝置、校正系統與校正方法
US8981794B2 (en) 2013-06-25 2015-03-17 Raytheon Company Loss-less frequency dependent dicke-switched radiometer
WO2014210506A2 (en) * 2013-06-28 2014-12-31 Associated Universities, Inc. Randomized surface reflector
US9798458B2 (en) 2013-10-02 2017-10-24 The Joan and Irwin Jacobs Technion-Cornell Innovation Institute Methods, systems, and apparatuses for accurate measurement and real-time feedback of solar ultraviolet exposure
US9880052B2 (en) 2013-10-02 2018-01-30 The Joan and Irwin Jacobs Technion-Cornell Innovation Institute Methods, systems, and apparatuses for accurate measurement and real-time feedback of solar ultraviolet exposure
US20150185088A1 (en) * 2013-12-31 2015-07-02 i4c Innovations Inc. Microwave Radiometry Using Two Antennas
CN103812451B (zh) * 2014-01-27 2016-10-05 中国电子科技集团公司第十研究所 常温输出端口微波变温噪声源
WO2017035384A1 (en) 2015-08-25 2017-03-02 The Joan and Irwin Jacobs Technion-Cornell Innovation Institute Methods, systems, and apparatuses for accurate measurement and real-time feedback of solar ultraviolet exposure
RU2617276C1 (ru) * 2015-12-22 2017-04-24 Общество с ограниченной ответственностью "РТМ Диагностика" Радиотермометр
US10739253B2 (en) 2016-06-07 2020-08-11 Youv Labs, Inc. Methods, systems, and devices for calibrating light sensing devices
USD829112S1 (en) 2016-08-25 2018-09-25 The Joan and Irwin Jacobs Technion-Cornell Innovation Institute Sensing device
JP6746183B2 (ja) 2018-07-02 2020-08-26 エレックス工業株式会社 マイクロ波放射計の較正方法
WO2020082084A1 (en) 2018-10-19 2020-04-23 Youv Labs, Inc. Methods, systems, and apparatus for accurate measurement of health relevant uv exposure from sunlight
CN113296063B (zh) * 2021-04-06 2023-09-29 北京无线电计量测试研究所 一种毫米波辐射计线性度的测量装置和方法
CN114123976B (zh) * 2021-11-10 2022-11-22 华中科技大学 一种具有超大相对带宽的分布式有源冷热噪声源
CN115291152A (zh) * 2022-08-05 2022-11-04 中国科学院国家天文台 一种高低温负载及使用其对频谱测量系统进行标定的方法

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Publication number Priority date Publication date Assignee Title
US3409827A (en) 1965-07-22 1968-11-05 Air Force Usa Feedback-stabilized microwave radiometer
US3525037A (en) 1967-11-14 1970-08-18 Ampex Method and apparatus for measuring subsurface electrical impedance utilizing first and second successively transmitted signals at different frequencies
US3564420A (en) 1967-11-28 1971-02-16 Nasa Method and means for providing an absolute power measurement capability
US3628151A (en) * 1970-01-08 1971-12-14 Sperry Rand Corp Radiometer gain control
US3693095A (en) 1970-10-28 1972-09-19 Sperry Rand Corp Radiometer gain control reference
US3777270A (en) 1972-05-12 1973-12-04 Rockwell International Corp Precision variable pulse rate nulling radiometer
US4272731A (en) 1979-05-25 1981-06-09 Sperry Corporation Thin film resistor microwave noise generator
JPS58102118A (ja) * 1981-12-14 1983-06-17 Sumitomo Metal Ind Ltd 金属体温度測定方法
FR2650390B1 (fr) * 1989-07-27 1992-10-30 Inst Nat Sante Rech Med Procede pour la mesure des temperatures par radiometrie microonde, avec calibration automatique de la mesure, et dispositif pour la mise en oeuvre de ce procede
US5128884A (en) 1989-12-18 1992-07-07 Prager Kenneth E Black body calibration using image processing techniques
FR2673470B1 (fr) 1991-02-01 1993-06-04 Centre Nat Rech Scient Procede, dispositif de mesure de temperature utilisant le rayonnement microonde et application pour la determination du coefficient de reflexion hyperfrequence d'un objet quelconque.
CA2064451C (en) 1991-03-31 1998-09-22 Kazuhiro Ogikubo Radiometer with correction device
US5231404A (en) * 1991-05-17 1993-07-27 Georgia Tech Research Corporation Dual-polarized cross-correlating radiometer and method and apparatus for calibrating same
FR2679455B1 (fr) 1991-07-26 1998-08-28 Inst Nat Sante Rech Med Systeme pour le traitement thermique interne d'un corps certain et son utilisation.
FR2723784B1 (fr) * 1994-08-19 1997-01-17 Sadis Bruker Spectrospin Radiometre pour la determination d'une temperature d'un corps par mesure du bruit thermique emis et procede de mesure mettant en oeuvre ce radiometre
US5688050A (en) * 1995-04-03 1997-11-18 Mmtc, Inc. Temperature-measuring microwave radiometer apparatus
US6137440A (en) * 1996-12-03 2000-10-24 Raytheon Company Microwave active solid state cold/warm noise source

Also Published As

Publication number Publication date
CA2285643C (en) 2007-02-06
US6217210B1 (en) 2001-04-17
EP0944952A2 (en) 1999-09-29
CA2285643A1 (en) 1998-06-25
US20010019572A1 (en) 2001-09-06
WO1998027414A2 (en) 1998-06-25
WO1998027414A3 (en) 1998-11-26
ATE420492T1 (de) 2009-01-15
US6439763B2 (en) 2002-08-27
EP0944952B1 (en) 2009-01-07
JP2001506363A (ja) 2001-05-15
EP0944952A4 (en) 2000-01-05
JP3918021B2 (ja) 2007-05-23

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Legal Events

Date Code Title Description
8327 Change in the person/name/address of the patent owner

Owner name: RAYTHEON CO., WALTHAM, MASS., US

Owner name: UNIVERSITY OF SOUTH FLORIDA, TAMPA, FLA., US

8364 No opposition during term of opposition