DE69721419D1 - Gerät zur optischen differentiellen Messung des Gleitabstandes über einer magnetischen Platte - Google Patents
Gerät zur optischen differentiellen Messung des Gleitabstandes über einer magnetischen PlatteInfo
- Publication number
- DE69721419D1 DE69721419D1 DE69721419T DE69721419T DE69721419D1 DE 69721419 D1 DE69721419 D1 DE 69721419D1 DE 69721419 T DE69721419 T DE 69721419T DE 69721419 T DE69721419 T DE 69721419T DE 69721419 D1 DE69721419 D1 DE 69721419D1
- Authority
- DE
- Germany
- Prior art keywords
- magnetic plate
- sliding distance
- distance over
- differential measurement
- optical differential
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/14—Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Supporting Of Heads In Record-Carrier Devices (AREA)
- Manufacturing Of Magnetic Record Carriers (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/710,818 US5703684A (en) | 1996-09-23 | 1996-09-23 | Apparatus for optical differential measurement of glide height above a magnetic disk |
Publications (1)
Publication Number | Publication Date |
---|---|
DE69721419D1 true DE69721419D1 (de) | 2003-06-05 |
Family
ID=24855676
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69721419T Expired - Lifetime DE69721419D1 (de) | 1996-09-23 | 1997-09-05 | Gerät zur optischen differentiellen Messung des Gleitabstandes über einer magnetischen Platte |
Country Status (6)
Country | Link |
---|---|
US (1) | US5703684A (de) |
EP (1) | EP0831464B1 (de) |
JP (1) | JPH10116480A (de) |
KR (1) | KR19980024159A (de) |
DE (1) | DE69721419D1 (de) |
TW (1) | TW334562B (de) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6112582A (en) * | 1998-04-16 | 2000-09-05 | Seagate Technology, Inc. | Glide head apparatus for testing recording media |
US6105421A (en) * | 1998-04-16 | 2000-08-22 | Seagate Technology, Inc. | Glide height testing using a glide head apparatus with a piezoelectric actuator |
US7019840B2 (en) * | 2003-06-17 | 2006-03-28 | Seagate Technology Llc | Dual-beam interferometer for ultra-smooth surface topographical measurements |
US10120196B2 (en) * | 2016-09-30 | 2018-11-06 | National Taiwan University Of Science And Technology | Optical device |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2133687A1 (de) * | 1971-07-07 | 1973-01-25 | Ibm Deutschland | Anordnung zur stabilisierung der optischen weglaengendifferenz |
FR2300998A2 (fr) * | 1975-02-11 | 1976-09-10 | Anvar | Dispositif pour la spectrometrie interferentielle a modulation selective |
DE2851750B1 (de) * | 1978-11-30 | 1980-03-06 | Ibm Deutschland | Verfahren und Vorrichtung zur Messung der Ebenheit der Rauhigkeit oder des Kruemmungsradius einer Messflaeche |
US4534649A (en) * | 1981-10-30 | 1985-08-13 | Downs Michael J | Surface profile interferometer |
JPS6220187A (ja) * | 1985-07-19 | 1987-01-28 | Toshiba Corp | 磁気デイスク装置 |
US4844616A (en) * | 1988-05-31 | 1989-07-04 | International Business Machines Corporation | Interferometric dimensional measurement and defect detection method |
US5122648A (en) * | 1990-06-01 | 1992-06-16 | Wyko Corporation | Apparatus and method for automatically focusing an interference microscope |
US5280340A (en) * | 1991-10-23 | 1994-01-18 | Phase Metrics | Method and apparatus to calibrate intensity and determine fringe order for interferometric measurement of small spacings |
US5457534A (en) * | 1991-10-23 | 1995-10-10 | Phase Metrics | Method and apparatus to calibrate intensity and determine fringe order for interferometric measurement of small spacings |
JPH0827178B2 (ja) * | 1992-11-06 | 1996-03-21 | 日本アイ・ビー・エム株式会社 | ヘッド浮上量測定装置 |
JP2980493B2 (ja) * | 1993-08-19 | 1999-11-22 | インターナショナル・ビジネス・マシーンズ・コーポレイション | 磁気ヘッドの浮上量測定方法 |
US5469259A (en) * | 1994-01-03 | 1995-11-21 | International Business Machines Corporation | Inspection interferometer with scanning autofocus, and phase angle control features |
US5410402A (en) * | 1994-01-24 | 1995-04-25 | Seagate Technology, Inc. | Calibration standard for flying height tester having a wedge slider and a transparent disc held together |
US5600441A (en) * | 1995-01-31 | 1997-02-04 | Zygo Corporation | Interferometer and method for measuring the distance of an object surface with respect to the surface of a rotating disk |
-
1996
- 1996-09-23 US US08/710,818 patent/US5703684A/en not_active Expired - Fee Related
-
1997
- 1997-07-09 TW TW086109656A patent/TW334562B/zh active
- 1997-08-22 KR KR19970040092A patent/KR19980024159A/ko active IP Right Grant
- 1997-09-05 DE DE69721419T patent/DE69721419D1/de not_active Expired - Lifetime
- 1997-09-05 EP EP97306927A patent/EP0831464B1/de not_active Expired - Lifetime
- 1997-09-19 JP JP9255410A patent/JPH10116480A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
TW334562B (en) | 1998-06-21 |
KR19980024159A (de) | 1998-07-06 |
EP0831464A1 (de) | 1998-03-25 |
EP0831464B1 (de) | 2003-05-02 |
JPH10116480A (ja) | 1998-05-06 |
US5703684A (en) | 1997-12-30 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8332 | No legal effect for de |