DE69717270D1 - Testverfahren für elektronische bauteile - Google Patents

Testverfahren für elektronische bauteile

Info

Publication number
DE69717270D1
DE69717270D1 DE69717270T DE69717270T DE69717270D1 DE 69717270 D1 DE69717270 D1 DE 69717270D1 DE 69717270 T DE69717270 T DE 69717270T DE 69717270 T DE69717270 T DE 69717270T DE 69717270 D1 DE69717270 D1 DE 69717270D1
Authority
DE
Germany
Prior art keywords
steps
duration
function
electronic components
test procedure
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69717270T
Other languages
English (en)
Other versions
DE69717270T2 (de
Inventor
Philippe Lejeune
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SOFTLINK DOURDAN
Original Assignee
SOFTLINK DOURDAN
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SOFTLINK DOURDAN filed Critical SOFTLINK DOURDAN
Application granted granted Critical
Publication of DE69717270D1 publication Critical patent/DE69717270D1/de
Publication of DE69717270T2 publication Critical patent/DE69717270T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/04—Testing or calibrating of apparatus covered by the other groups of this subclass of instruments for measuring time integral of power or current

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
DE69717270T 1996-05-29 1997-05-23 Testverfahren für elektronische bauteile Expired - Fee Related DE69717270T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR9606611A FR2749396B1 (fr) 1996-05-29 1996-05-29 Outil d'aide pour appareil de test de composants electroniques
PCT/FR1997/000908 WO1997045748A1 (fr) 1996-05-29 1997-05-23 Procede de test de composants electroniques

Publications (2)

Publication Number Publication Date
DE69717270D1 true DE69717270D1 (de) 2003-01-02
DE69717270T2 DE69717270T2 (de) 2003-07-03

Family

ID=9492521

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69717270T Expired - Fee Related DE69717270T2 (de) 1996-05-29 1997-05-23 Testverfahren für elektronische bauteile

Country Status (9)

Country Link
US (1) US6269326B1 (de)
EP (1) EP0901637B1 (de)
JP (1) JP3093285B2 (de)
CN (1) CN1090325C (de)
AU (1) AU3037397A (de)
CA (1) CA2256601C (de)
DE (1) DE69717270T2 (de)
FR (1) FR2749396B1 (de)
WO (1) WO1997045748A1 (de)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2796157B1 (fr) * 1999-07-05 2002-05-31 Softlink Procede de tests de composants electroniques
US6449577B1 (en) * 1999-08-19 2002-09-10 Agere Systems Guardian Corp. Self-optimizing adjustment algorithm
JP3478230B2 (ja) * 2000-03-21 2003-12-15 株式会社村田製作所 圧電トランスの特性選別方法
FR2812401B1 (fr) 2000-07-28 2002-10-11 Bealach Bo No Finne Teo Ta Gal Procede de test de composants electroniques tenant compte de la derive de la moyenne
US6782297B2 (en) 2001-05-24 2004-08-24 Eric Paul Tabor Methods and apparatus for data smoothing
US6785632B1 (en) 2001-04-12 2004-08-31 Seagate Removable Solutions Llc Real time statistical computation in embedded systems
US6732002B1 (en) * 2001-08-23 2004-05-04 Kla-Tencor Corporation Apparatus and methods for predicting multiple product chip yields through critical area matching
US7280945B1 (en) 2001-10-17 2007-10-09 Kla-Tencor Technologies Corporation Apparatus and methods for detection of systematic defects
US6918101B1 (en) 2001-10-25 2005-07-12 Kla -Tencor Technologies Corporation Apparatus and methods for determining critical area of semiconductor design data
US6948141B1 (en) 2001-10-25 2005-09-20 Kla-Tencor Technologies Corporation Apparatus and methods for determining critical area of semiconductor design data
US7529336B2 (en) 2007-05-31 2009-05-05 Test Research, Inc. System and method for laminography inspection
US9654145B1 (en) * 2014-11-24 2017-05-16 Seagate Technology Llc Interleaving code-words
CN106526459B (zh) * 2016-12-28 2024-01-16 深圳市华力宇电子科技有限公司 高性能射频遥控自动化测试系统及其方法
JP7245623B2 (ja) * 2018-09-13 2023-03-24 株式会社アドバンテスト 装置、方法、およびプログラム
CN113242976B (zh) 2018-10-01 2024-09-17 大众汽车股份公司 用于监测电子系统的可靠性的方法和装置
TWI836395B (zh) * 2022-03-31 2024-03-21 英屬開曼群島商迪芬尼環球股份有限公司 異音測量治具以及異音測量方法
FR3138701B1 (fr) * 2022-08-08 2024-07-19 Bealach Na Bo Finne Teoranta Procédé de test de composants électroniques optimisé par un algorithme d’apprentissage

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4686628A (en) * 1984-07-19 1987-08-11 Fairchild Camera & Instrument Corp. Electric device or circuit testing method and apparatus
DE3530308A1 (de) * 1985-08-24 1987-02-26 Blaupunkt Werke Gmbh Verfahren zur anpassung eines pruefprogramms fuer elektrische schaltungen
US4926452A (en) * 1987-10-30 1990-05-15 Four Pi Systems Corporation Automated laminography system for inspection of electronics
JP2697861B2 (ja) * 1988-06-28 1998-01-14 三菱電機株式会社 測定プログラム自動作成装置
US5036479A (en) * 1989-04-20 1991-07-30 Trw Inc. Modular automated avionics test system
DE69326004T2 (de) * 1993-09-20 1999-11-25 Hewlett-Packard Gmbh Testapparat mit grosser Kapazität
IT1272036B (it) * 1993-11-05 1997-06-11 Marelli Autronica Sistema di registraziome per una linea di produzione.
US5589765A (en) * 1995-01-04 1996-12-31 Texas Instruments Incorporated Method for final testing of semiconductor devices
US5838568A (en) * 1996-06-28 1998-11-17 International Business Machines Corporation Heated circuit assembly tester and method

Also Published As

Publication number Publication date
EP0901637B1 (de) 2002-11-20
JP3093285B2 (ja) 2000-10-03
EP0901637A1 (de) 1999-03-17
FR2749396A1 (fr) 1997-12-05
US6269326B1 (en) 2001-07-31
JPH11510903A (ja) 1999-09-21
CA2256601A1 (en) 1997-12-04
DE69717270T2 (de) 2003-07-03
CN1090325C (zh) 2002-09-04
AU3037397A (en) 1998-01-05
WO1997045748A1 (fr) 1997-12-04
CA2256601C (en) 2002-12-10
FR2749396B1 (fr) 1998-08-07
CN1220008A (zh) 1999-06-16

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee