DE69716169D1 - Vorrichtung zum Erfassen für axiale Transversal- und Quadratur-Tomographie - Google Patents

Vorrichtung zum Erfassen für axiale Transversal- und Quadratur-Tomographie

Info

Publication number
DE69716169D1
DE69716169D1 DE69716169T DE69716169T DE69716169D1 DE 69716169 D1 DE69716169 D1 DE 69716169D1 DE 69716169 T DE69716169 T DE 69716169T DE 69716169 T DE69716169 T DE 69716169T DE 69716169 D1 DE69716169 D1 DE 69716169D1
Authority
DE
Germany
Prior art keywords
tomography
quadrature
detection device
axial transverse
transverse
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69716169T
Other languages
English (en)
Other versions
DE69716169T2 (de
Inventor
Bernard M Gordon
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Analogic Corp
Original Assignee
Analogic Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Analogic Corp filed Critical Analogic Corp
Application granted granted Critical
Publication of DE69716169D1 publication Critical patent/DE69716169D1/de
Publication of DE69716169T2 publication Critical patent/DE69716169T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G01V5/226
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/1603Measuring radiation intensity with a combination of at least two different types of detector
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914Measurement of spatial distribution of radiation
    • G01T1/2985In depth localisation, e.g. using positron emitters; Tomographic imaging (longitudinal and transverse section imaging; apparatus for radiation diagnosis sequentially in different planes, steroscopic radiation diagnosis)
DE69716169T 1996-06-27 1997-06-13 Vorrichtung zum Erfassen für axiale Transversal- und Quadratur-Tomographie Expired - Fee Related DE69716169T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US67171696A 1996-06-27 1996-06-27

Publications (2)

Publication Number Publication Date
DE69716169D1 true DE69716169D1 (de) 2002-11-14
DE69716169T2 DE69716169T2 (de) 2003-06-12

Family

ID=24695607

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69716169T Expired - Fee Related DE69716169T2 (de) 1996-06-27 1997-06-13 Vorrichtung zum Erfassen für axiale Transversal- und Quadratur-Tomographie

Country Status (6)

Country Link
US (1) US5818897A (de)
EP (1) EP0816873B1 (de)
JP (1) JP3451181B2 (de)
KR (1) KR980003563A (de)
CN (1) CN1172952A (de)
DE (1) DE69716169T2 (de)

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US7471764B2 (en) 2005-04-15 2008-12-30 Rapiscan Security Products, Inc. X-ray imaging system having improved weather resistance
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GB0901338D0 (en) 2009-01-28 2009-03-11 Cxr Ltd X-Ray tube electron sources
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US9218933B2 (en) 2011-06-09 2015-12-22 Rapidscan Systems, Inc. Low-dose radiographic imaging system
JP5894478B2 (ja) * 2012-03-19 2016-03-30 株式会社イシダ X線検査装置
JP6006561B2 (ja) * 2012-07-18 2016-10-12 救急薬品工業株式会社 フィルム状医薬品の検査方法
CN103674979B (zh) * 2012-09-19 2016-12-21 同方威视技术股份有限公司 一种行李物品ct安检系统及其探测器装置
CN103901489B (zh) * 2012-12-27 2017-07-21 清华大学 检查物体的方法、显示方法和设备
KR102167245B1 (ko) 2013-01-31 2020-10-19 라피스캔 시스템스, 인코포레이티드 이동식 보안검사시스템
CN104165895B (zh) * 2014-08-04 2016-05-25 于双悦 工业ct的3d成像系统的成像方法
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Also Published As

Publication number Publication date
EP0816873A1 (de) 1998-01-07
KR980003563A (ko) 1998-03-30
DE69716169T2 (de) 2003-06-12
US5818897A (en) 1998-10-06
EP0816873B1 (de) 2002-10-09
CN1172952A (zh) 1998-02-11
JP3451181B2 (ja) 2003-09-29
JPH1082747A (ja) 1998-03-31

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee