DE69715736D1 - Kontaktsystem für elektrische Verbinder - Google Patents

Kontaktsystem für elektrische Verbinder

Info

Publication number
DE69715736D1
DE69715736D1 DE69715736T DE69715736T DE69715736D1 DE 69715736 D1 DE69715736 D1 DE 69715736D1 DE 69715736 T DE69715736 T DE 69715736T DE 69715736 T DE69715736 T DE 69715736T DE 69715736 D1 DE69715736 D1 DE 69715736D1
Authority
DE
Germany
Prior art keywords
contacts
controlled
providing
movement
circuit board
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69715736T
Other languages
English (en)
Other versions
DE69715736T2 (de
Inventor
James J Rathburn
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Johnstech International Corp
Original Assignee
Johnstech International Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Johnstech International Corp filed Critical Johnstech International Corp
Application granted granted Critical
Publication of DE69715736D1 publication Critical patent/DE69715736D1/de
Publication of DE69715736T2 publication Critical patent/DE69715736T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2435—Contacts for co-operating by abutting resilient; resiliently-mounted with opposite contact points, e.g. C beam
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K7/00—Constructional details common to different types of electric apparatus
    • H05K7/02—Arrangements of circuit components or wiring on supporting structure
    • H05K7/10—Plug-in assemblages of components, e.g. IC sockets
    • H05K7/1053—Plug-in assemblages of components, e.g. IC sockets having interior leads
    • H05K7/1061—Plug-in assemblages of components, e.g. IC sockets having interior leads co-operating by abutting
    • H05K7/1069—Plug-in assemblages of components, e.g. IC sockets having interior leads co-operating by abutting with spring contact pieces

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
  • Multi-Conductor Connections (AREA)
  • Connecting Device With Holders (AREA)
  • Manufacturing Of Electrical Connectors (AREA)
  • Motorcycle And Bicycle Frame (AREA)
  • Supply And Distribution Of Alternating Current (AREA)
  • Steering-Linkage Mechanisms And Four-Wheel Steering (AREA)
  • Electrical Discharge Machining, Electrochemical Machining, And Combined Machining (AREA)
  • Laying Of Electric Cables Or Lines Outside (AREA)
DE69715736T 1996-07-02 1997-06-25 Kontaktsystem für elektrische Verbinder Expired - Lifetime DE69715736T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/674,447 US5947749A (en) 1996-07-02 1996-07-02 Electrical interconnect contact system

Publications (2)

Publication Number Publication Date
DE69715736D1 true DE69715736D1 (de) 2002-10-31
DE69715736T2 DE69715736T2 (de) 2003-08-07

Family

ID=24706639

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69715736T Expired - Lifetime DE69715736T2 (de) 1996-07-02 1997-06-25 Kontaktsystem für elektrische Verbinder

Country Status (12)

Country Link
US (1) US5947749A (de)
EP (1) EP0817319B1 (de)
JP (1) JPH10177886A (de)
KR (1) KR100290301B1 (de)
AT (1) ATE225090T1 (de)
CA (1) CA2208654A1 (de)
DE (1) DE69715736T2 (de)
ES (1) ES2183101T3 (de)
MY (1) MY119438A (de)
PT (1) PT817319E (de)
SG (1) SG68621A1 (de)
TW (1) TW352481B (de)

Families Citing this family (52)

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WO1998050985A1 (en) 1997-05-06 1998-11-12 Gryphics, Inc. Multi-mode compliant connector and replaceable chip module utilizing the same
US5913687A (en) 1997-05-06 1999-06-22 Gryphics, Inc. Replacement chip module
US5938451A (en) 1997-05-06 1999-08-17 Gryphics, Inc. Electrical connector with multiple modes of compliance
US6409521B1 (en) 1997-05-06 2002-06-25 Gryphics, Inc. Multi-mode compliant connector and replaceable chip module utilizing the same
US8480580B2 (en) 1998-04-30 2013-07-09 Abbott Diabetes Care Inc. Analyte monitoring device and methods of use
US8974386B2 (en) 1998-04-30 2015-03-10 Abbott Diabetes Care Inc. Analyte monitoring device and methods of use
US8688188B2 (en) 1998-04-30 2014-04-01 Abbott Diabetes Care Inc. Analyte monitoring device and methods of use
US6175752B1 (en) 1998-04-30 2001-01-16 Therasense, Inc. Analyte monitoring device and methods of use
US8346337B2 (en) 1998-04-30 2013-01-01 Abbott Diabetes Care Inc. Analyte monitoring device and methods of use
US9066695B2 (en) 1998-04-30 2015-06-30 Abbott Diabetes Care Inc. Analyte monitoring device and methods of use
US8465425B2 (en) 1998-04-30 2013-06-18 Abbott Diabetes Care Inc. Analyte monitoring device and methods of use
US6949816B2 (en) 2003-04-21 2005-09-27 Motorola, Inc. Semiconductor component having first surface area for electrically coupling to a semiconductor chip and second surface area for electrically coupling to a substrate, and method of manufacturing same
AU2637400A (en) * 1999-02-02 2000-08-25 Gryphics, Inc. Low or zero insertion force connector for printed circuit boards and electrical devices
US6830460B1 (en) * 1999-08-02 2004-12-14 Gryphics, Inc. Controlled compliance fine pitch interconnect
US6957963B2 (en) * 2000-01-20 2005-10-25 Gryphics, Inc. Compliant interconnect assembly
AU2001232772A1 (en) * 2000-01-20 2001-07-31 Gryphics, Inc. Flexible compliant interconnect assembly
WO2001063424A1 (fr) * 2000-02-24 2001-08-30 Fujitsu Limited Controleur d'entree/sortie, procede d'identification de dispositif, et procede de commande des entrees/sorties
US6560471B1 (en) 2001-01-02 2003-05-06 Therasense, Inc. Analyte monitoring device and methods of use
US7041468B2 (en) 2001-04-02 2006-05-09 Therasense, Inc. Blood glucose tracking apparatus and methods
JP2003123923A (ja) * 2001-10-03 2003-04-25 Molex Inc 半導体パッケージのソケット、及びコンタクト
US6876213B2 (en) 2002-02-22 2005-04-05 Johnstech International Corporation Compliant actuator for IC test fixtures
EP1642364A1 (de) 2003-07-07 2006-04-05 Gryphics, Inc. Normal geschlossener nullkraftsteckverbinder
US7297003B2 (en) * 2003-07-16 2007-11-20 Gryphics, Inc. Fine pitch electrical interconnect assembly
WO2005011060A2 (en) * 2003-07-16 2005-02-03 Gryphics, Inc. Electrical interconnect assembly with interlocking contact system
US6972470B2 (en) * 2004-03-30 2005-12-06 Texas Instruments Incorporated Dual metal Schottky diode
US7220132B2 (en) * 2004-06-28 2007-05-22 Intel Corporation Tilted land grid array package and socket, systems, and methods
US7335979B2 (en) * 2004-06-28 2008-02-26 Intel Corporation Device and method for tilted land grid array interconnects on a coreless substrate package
NL1027450C2 (nl) * 2004-11-09 2006-05-10 Shin Etsu Polymer Europ B V Doorverbindingsconnector, frame omvattende een dergelijke connector, elektrische meet- en testinrichting en contacteringswerkwijze met behulp van een dergelijke connector.
WO2006114895A1 (ja) * 2005-04-21 2006-11-02 Kabushiki Kaisha Nihon Micronics 電気的接続装置
WO2007109608A2 (en) 2006-03-20 2007-09-27 Gryphics, Inc. Composite contact for fine pitch electrical interconnect assembly
US20080071157A1 (en) 2006-06-07 2008-03-20 Abbott Diabetes Care, Inc. Analyte monitoring system and method
CN101140295A (zh) * 2006-09-05 2008-03-12 杰冯科技有限公司 用于互连系统的改良接触器
CN201004523Y (zh) * 2007-02-06 2008-01-09 番禺得意精密电子工业有限公司 电子装置
JP2009043591A (ja) * 2007-08-09 2009-02-26 Yamaichi Electronics Co Ltd Ｉｃソケット
US8278955B2 (en) * 2008-03-24 2012-10-02 Interconnect Devices, Inc. Test interconnect
US20090289647A1 (en) * 2008-05-01 2009-11-26 Interconnect Devices, Inc. Interconnect system
JP5146234B2 (ja) * 2008-09-30 2013-02-20 富士通株式会社 機能拡張装置及びその製造方法、並びに電子装置システム
JP5029969B2 (ja) * 2008-11-12 2012-09-19 山一電機株式会社 電気接続装置
TW201027849A (en) * 2009-01-13 2010-07-16 Yi-Zhi Yang Connector
US10078101B2 (en) 2009-04-21 2018-09-18 Johnstech International Corporation Wafer level integrated circuit probe array and method of construction
DE102010019955A1 (de) 2010-02-03 2011-08-04 Eutegra Ag, 60325 Elektrische Kontaktiereinrichtung
US8251755B2 (en) * 2010-06-14 2012-08-28 Tyco Electronics Corporation Connector with a laterally moving contact
EP2864799B1 (de) * 2012-06-20 2021-04-14 JohnsTech International Corporation Kontaktvorrichtung für eine integrierte schaltung auf wafer-ebene
US9274141B1 (en) 2013-01-22 2016-03-01 Johnstech International Corporation Low resistance low wear test pin for test contactor
TWI500222B (zh) * 2013-07-12 2015-09-11 Ccp Contact Probes Co Ltd 連接器組合
US9354251B2 (en) * 2014-02-25 2016-05-31 Titan Semiconductor Tool, LLC Integrated circuit (IC) test socket using Kelvin bridge
TWI651539B (zh) * 2014-03-10 2019-02-21 美商瓊斯科技國際公司 晶圓級積體電路探針陣列及建構方法
US9343830B1 (en) * 2015-06-08 2016-05-17 Xcerra Corporation Integrated circuit chip tester with embedded micro link
US10761112B1 (en) * 2017-09-11 2020-09-01 Johnstech International Corporation Self flattening test socket with anti-bowing and elastomer retention
USD1042346S1 (en) 2022-04-05 2024-09-17 Johnstech International Corporation Contact pin for integrated circuit testing
USD1042345S1 (en) 2022-04-05 2024-09-17 Johnstech International Corporation Test pin
CN116654555B (zh) * 2023-07-28 2023-10-31 成都高新蜂鸟先进智造科技有限公司 一种带电测试环形中试生产线

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56116282A (en) * 1980-02-19 1981-09-11 Sharp Kk Electronic part with plural terminals
FR2495846A1 (fr) * 1980-12-05 1982-06-11 Cii Honeywell Bull Dispositif de connexion electrique a haute densite de contacts
US4593961A (en) * 1984-12-20 1986-06-10 Amp Incorporated Electrical compression connector
US4793814A (en) * 1986-07-21 1988-12-27 Rogers Corporation Electrical circuit board interconnect
US5634801A (en) * 1991-01-09 1997-06-03 Johnstech International Corporation Electrical interconnect contact system
US5069629A (en) * 1991-01-09 1991-12-03 Johnson David A Electrical interconnect contact system
US5388996A (en) * 1991-01-09 1995-02-14 Johnson; David A. Electrical interconnect contact system
JPH0734378B2 (ja) * 1991-03-15 1995-04-12 山一電機株式会社 載接形コンタクト
US5137456A (en) * 1991-11-04 1992-08-11 International Business Machines Corporation High density, separable connector and contact for use therein
US5336094A (en) * 1993-06-30 1994-08-09 Johnstech International Corporation Apparatus for interconnecting electrical contacts

Also Published As

Publication number Publication date
ATE225090T1 (de) 2002-10-15
MY119438A (en) 2005-05-31
ES2183101T3 (es) 2003-03-16
KR100290301B1 (ko) 2001-05-15
EP0817319A3 (de) 1999-10-20
JPH10177886A (ja) 1998-06-30
EP0817319A2 (de) 1998-01-07
DE69715736T2 (de) 2003-08-07
EP0817319B1 (de) 2002-09-25
PT817319E (pt) 2003-02-28
TW352481B (en) 1999-02-11
KR980012727A (ko) 1998-04-30
US5947749A (en) 1999-09-07
CA2208654A1 (en) 1998-01-02
SG68621A1 (en) 1999-11-16

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Legal Events

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8364 No opposition during term of opposition