DE69630548D1 - Belichtungsvorrichtung - Google Patents
BelichtungsvorrichtungInfo
- Publication number
- DE69630548D1 DE69630548D1 DE69630548T DE69630548T DE69630548D1 DE 69630548 D1 DE69630548 D1 DE 69630548D1 DE 69630548 T DE69630548 T DE 69630548T DE 69630548 T DE69630548 T DE 69630548T DE 69630548 D1 DE69630548 D1 DE 69630548D1
- Authority
- DE
- Germany
- Prior art keywords
- exposure device
- exposure
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/08—Catadioptric systems
- G02B17/0892—Catadioptric systems specially adapted for the UV
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B13/00—Optical objectives specially designed for the purposes specified below
- G02B13/22—Telecentric objectives or lens systems
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/002—Arrays of reflective systems
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/008—Systems specially adapted to form image relays or chained systems
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/08—Catadioptric systems
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70066—Size and form of the illuminated area in the mask plane, e.g. reticle masking blades or blinds
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70225—Optical aspects of catadioptric systems, i.e. comprising reflective and refractive elements
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70275—Multiple projection paths, e.g. array of projection systems, microlens projection systems or tandem projection systems
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70358—Scanning exposure, i.e. relative movement of patterned beam and workpiece during imaging
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Lenses (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP583595 | 1995-01-18 | ||
JP583595 | 1995-01-18 | ||
JP13677995A JP3724517B2 (ja) | 1995-01-18 | 1995-06-02 | 露光装置 |
JP13677995 | 1995-06-02 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69630548D1 true DE69630548D1 (de) | 2003-12-11 |
DE69630548T2 DE69630548T2 (de) | 2004-09-23 |
Family
ID=26339846
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69630548T Expired - Lifetime DE69630548T2 (de) | 1995-01-18 | 1996-01-18 | Belichtungsvorrichtung |
Country Status (4)
Country | Link |
---|---|
EP (1) | EP0723173B1 (de) |
JP (1) | JP3724517B2 (de) |
KR (1) | KR100385813B1 (de) |
DE (1) | DE69630548T2 (de) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5585972A (en) * | 1995-02-15 | 1996-12-17 | Ultratech Stepper, Inc. | Arbitrarily wide lens array with an image field to span the width of a substrate |
JPH09293676A (ja) * | 1996-04-24 | 1997-11-11 | Nikon Corp | 投影光学系及び投影露光装置 |
JP3757536B2 (ja) * | 1996-10-01 | 2006-03-22 | 株式会社ニコン | 投影光学系及びそれを備えた露光装置並びにデバイス製造方法 |
DE19757074A1 (de) | 1997-12-20 | 1999-06-24 | Zeiss Carl Fa | Projektionsbelichtungsanlage und Belichtungsverfahren |
JP3708845B2 (ja) * | 2001-06-19 | 2005-10-19 | 株式会社ミツトヨ | 両テレセントリック対物レンズ |
JP2004354909A (ja) * | 2003-05-30 | 2004-12-16 | Orc Mfg Co Ltd | 投影露光装置および投影露光方法 |
CN100388056C (zh) * | 2006-06-02 | 2008-05-14 | 上海微电子装备有限公司 | 一种投影物镜光学系统 |
JP5782336B2 (ja) * | 2011-08-24 | 2015-09-24 | キヤノン株式会社 | 投影光学系、露光装置及びデバイス製造方法 |
CN107255858B (zh) * | 2011-12-20 | 2020-05-29 | 株式会社尼康 | 基底处理装置 |
CN110045580B (zh) * | 2013-06-14 | 2021-07-23 | 株式会社尼康 | 扫描曝光装置 |
JP2016080870A (ja) * | 2014-10-17 | 2016-05-16 | 財団法人國家實驗研究院 | 共役共通光路リソグラフィレンズ |
JP2022022911A (ja) | 2020-07-10 | 2022-02-07 | キヤノン株式会社 | 結像光学系、露光装置、および物品製造方法 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4171871A (en) * | 1977-06-30 | 1979-10-23 | International Business Machines Corporation | Achromatic unit magnification optical system |
US4769680A (en) * | 1987-10-22 | 1988-09-06 | Mrs Technology, Inc. | Apparatus and method for making large area electronic devices, such as flat panel displays and the like, using correlated, aligned dual optical systems |
US5298939A (en) * | 1991-11-04 | 1994-03-29 | Swanson Paul A | Method and apparatus for transfer of a reticle pattern onto a substrate by scanning |
JPH06118341A (ja) * | 1991-11-11 | 1994-04-28 | Topcon Corp | 走査型投影装置 |
JP3385718B2 (ja) * | 1994-05-30 | 2003-03-10 | 株式会社ニコン | 露光装置及び方法 |
US5585972A (en) * | 1995-02-15 | 1996-12-17 | Ultratech Stepper, Inc. | Arbitrarily wide lens array with an image field to span the width of a substrate |
-
1995
- 1995-06-02 JP JP13677995A patent/JP3724517B2/ja not_active Expired - Fee Related
-
1996
- 1996-01-17 KR KR1019960000847A patent/KR100385813B1/ko not_active IP Right Cessation
- 1996-01-18 EP EP96100719A patent/EP0723173B1/de not_active Expired - Lifetime
- 1996-01-18 DE DE69630548T patent/DE69630548T2/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0723173A2 (de) | 1996-07-24 |
KR960029907A (ko) | 1996-08-17 |
EP0723173B1 (de) | 2003-11-05 |
KR100385813B1 (ko) | 2004-06-14 |
JP3724517B2 (ja) | 2005-12-07 |
JPH08255746A (ja) | 1996-10-01 |
DE69630548T2 (de) | 2004-09-23 |
EP0723173A3 (de) | 1997-10-08 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |