DE69617150D1 - Prüfung von Behältern mit FPGA-Logik - Google Patents

Prüfung von Behältern mit FPGA-Logik

Info

Publication number
DE69617150D1
DE69617150D1 DE69617150T DE69617150T DE69617150D1 DE 69617150 D1 DE69617150 D1 DE 69617150D1 DE 69617150 T DE69617150 T DE 69617150T DE 69617150 T DE69617150 T DE 69617150T DE 69617150 D1 DE69617150 D1 DE 69617150D1
Authority
DE
Germany
Prior art keywords
container
image
pixel data
containers
rotated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69617150T
Other languages
English (en)
Other versions
DE69617150T2 (de
Inventor
John W Juvinall
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Owens Brockway Glass Container Inc
Original Assignee
Owens Brockway Glass Container Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Owens Brockway Glass Container Inc filed Critical Owens Brockway Glass Container Inc
Publication of DE69617150D1 publication Critical patent/DE69617150D1/de
Application granted granted Critical
Publication of DE69617150T2 publication Critical patent/DE69617150T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/90Investigating the presence of flaws or contamination in a container or its contents
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8896Circuits specially adapted for system specific signal conditioning

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Logic Circuits (AREA)
  • Discharge Of Articles From Conveyors (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
  • Control Of Steam Boilers And Waste-Gas Boilers (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
  • Image Input (AREA)
  • Exchange Systems With Centralized Control (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
  • Auxiliary Devices For And Details Of Packaging Control (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Examining Or Testing Airtightness (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
DE69617150T 1995-09-22 1996-09-19 Prüfung von Behältern mit FPGA-Logik Expired - Lifetime DE69617150T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US53235095A 1995-09-22 1995-09-22

Publications (2)

Publication Number Publication Date
DE69617150D1 true DE69617150D1 (de) 2002-01-03
DE69617150T2 DE69617150T2 (de) 2002-07-04

Family

ID=24121420

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69617150T Expired - Lifetime DE69617150T2 (de) 1995-09-22 1996-09-19 Prüfung von Behältern mit FPGA-Logik

Country Status (18)

Country Link
EP (1) EP0764846B1 (de)
JP (1) JP3316400B2 (de)
CN (1) CN1092795C (de)
AT (1) ATE209346T1 (de)
AU (1) AU716983B2 (de)
BR (1) BR9603839A (de)
CA (1) CA2186070C (de)
CO (1) CO4520168A1 (de)
DE (1) DE69617150T2 (de)
DK (1) DK0764846T3 (de)
EE (1) EE03576B1 (de)
ES (1) ES2168423T3 (de)
HU (1) HU224946B1 (de)
MX (1) MX9604213A (de)
PE (1) PE28798A1 (de)
PL (1) PL181442B1 (de)
PT (1) PT764846E (de)
ZA (1) ZA967987B (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5896195A (en) * 1997-05-15 1999-04-20 Owens-Brockway Glass Container Inc. Container sealing surface area inspection
SE9900276L (sv) 1999-01-28 2000-01-10 Skogsind Tekn Foskningsinst Topografisk bestämning av en av infallande ljus belyst yta
US6256095B1 (en) 2000-01-21 2001-07-03 Owens-Brockway Glass Container Inc. Container sealing surface area inspection
US6469126B1 (en) 2000-12-21 2002-10-22 E. I. Du Pont De Nmeours And Company Melt-processible, thermoplastic random copolyimides having recoverable crystallinity and associated processes
CN103217441B (zh) * 2012-01-19 2016-07-06 昆山思拓机器有限公司 一种医用支架检测装置
JP6086320B2 (ja) * 2013-05-21 2017-03-01 大日本印刷株式会社 容器製造システム、容器製造方法、および容器製造システムにおいて用いられる型
GB2515573A (en) * 2013-06-28 2014-12-31 Univ Manchester Data processing system and method
DE102015121758A1 (de) * 2015-12-14 2017-06-14 Gerresheimer Bünde Gmbh System zur optischen Erfassung eines Untersuchungsbereichs eines Glaskörpers
FR3053792B1 (fr) * 2016-07-06 2023-07-14 Tiama Procede, dispositif et ligne d'inspection pour la determination d'une bavure a l'endroit d'un bord interne d'une surface de bague
FR3076619B1 (fr) 2018-01-05 2020-01-24 Tiama Procede, dispositif et ligne d'inspection pour determiner la geometrie tridimensionnelle d'une surface de bague de recipient
CN108401136B (zh) * 2018-01-31 2023-07-18 合肥学院 移动目标图像压缩采样及重构方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4679075A (en) * 1985-04-29 1987-07-07 Emhart Industries, Inc. Glassware inspection using optical streak detection
US4958223A (en) * 1988-09-16 1990-09-18 Owens-Brockway Glass Container Inc. Inspection of container finish
US5214713A (en) * 1991-04-12 1993-05-25 Owens-Brockway Glass Container Inc. Container inspection system with systolic array processing
US5440648A (en) * 1991-11-19 1995-08-08 Dalsa, Inc. High speed defect detection apparatus having defect detection circuits mounted in the camera housing
US5361373A (en) * 1992-12-11 1994-11-01 Gilson Kent L Integrated circuit computing device comprising a dynamically configurable gate array having a microprocessor and reconfigurable instruction execution means and method therefor

Also Published As

Publication number Publication date
HU224946B1 (en) 2006-04-28
ZA967987B (en) 1997-04-07
DE69617150T2 (de) 2002-07-04
HUP9602556A2 (en) 1997-09-29
AU6577096A (en) 1997-03-27
EP0764846A1 (de) 1997-03-26
ATE209346T1 (de) 2001-12-15
CA2186070C (en) 2004-02-24
PT764846E (pt) 2002-04-29
CO4520168A1 (es) 1997-10-15
EE9600152A (et) 1997-06-16
CN1154469A (zh) 1997-07-16
DK0764846T3 (da) 2002-05-21
ES2168423T3 (es) 2002-06-16
MX9604213A (es) 1998-04-30
JPH09305772A (ja) 1997-11-28
PL181442B1 (pl) 2001-07-31
JP3316400B2 (ja) 2002-08-19
EE03576B1 (et) 2001-12-17
CN1092795C (zh) 2002-10-16
PE28798A1 (es) 1998-05-28
HUP9602556A3 (en) 1999-07-28
EP0764846B1 (de) 2001-11-21
PL316190A1 (en) 1997-04-01
BR9603839A (pt) 1998-06-02
CA2186070A1 (en) 1997-03-23
HU9602556D0 (en) 1996-11-28
AU716983B2 (en) 2000-03-16

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition