SE9900276L - Topografisk bestämning av en av infallande ljus belyst yta - Google Patents

Topografisk bestämning av en av infallande ljus belyst yta

Info

Publication number
SE9900276L
SE9900276L SE9900276A SE9900276A SE9900276L SE 9900276 L SE9900276 L SE 9900276L SE 9900276 A SE9900276 A SE 9900276A SE 9900276 A SE9900276 A SE 9900276A SE 9900276 L SE9900276 L SE 9900276L
Authority
SE
Sweden
Prior art keywords
recorded
incident light
surface illuminated
light
topographic
Prior art date
Application number
SE9900276A
Other languages
Unknown language ( )
English (en)
Other versions
SE511985C2 (sv
SE9900276D0 (sv
Inventor
Peter Hansson
Per-Aake Johansson
Original Assignee
Skogsind Tekn Foskningsinst
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Skogsind Tekn Foskningsinst filed Critical Skogsind Tekn Foskningsinst
Priority to SE9900276A priority Critical patent/SE9900276L/sv
Publication of SE9900276D0 publication Critical patent/SE9900276D0/sv
Priority to EP00903057A priority patent/EP1155284A1/en
Priority to JP2000596332A priority patent/JP2002535668A/ja
Priority to PCT/SE2000/000024 priority patent/WO2000045125A1/en
Priority to CA002359263A priority patent/CA2359263A1/en
Priority to AU24693/00A priority patent/AU2469300A/en
Priority to US09/890,056 priority patent/US6757065B1/en
Publication of SE511985C2 publication Critical patent/SE511985C2/sv
Publication of SE9900276L publication Critical patent/SE9900276L/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/306—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Inking, Control Or Cleaning Of Printing Machines (AREA)
SE9900276A 1999-01-28 1999-01-28 Topografisk bestämning av en av infallande ljus belyst yta SE9900276L (sv)

Priority Applications (7)

Application Number Priority Date Filing Date Title
SE9900276A SE9900276L (sv) 1999-01-28 1999-01-28 Topografisk bestämning av en av infallande ljus belyst yta
EP00903057A EP1155284A1 (en) 1999-01-28 2000-01-10 Method of determining an illuminated surface
JP2000596332A JP2002535668A (ja) 1999-01-28 2000-01-10 受光面の決定方法
PCT/SE2000/000024 WO2000045125A1 (en) 1999-01-28 2000-01-10 Method of determining an illuminated surface
CA002359263A CA2359263A1 (en) 1999-01-28 2000-01-10 Method of determining an illuminated surface
AU24693/00A AU2469300A (en) 1999-01-28 2000-01-10 Method of determining an illuminated surface
US09/890,056 US6757065B1 (en) 1999-01-28 2000-01-10 Method of determining an illuminated surface

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE9900276A SE9900276L (sv) 1999-01-28 1999-01-28 Topografisk bestämning av en av infallande ljus belyst yta

Publications (3)

Publication Number Publication Date
SE9900276D0 SE9900276D0 (sv) 1999-01-28
SE511985C2 SE511985C2 (sv) 2000-01-10
SE9900276L true SE9900276L (sv) 2000-01-10

Family

ID=20414269

Family Applications (1)

Application Number Title Priority Date Filing Date
SE9900276A SE9900276L (sv) 1999-01-28 1999-01-28 Topografisk bestämning av en av infallande ljus belyst yta

Country Status (7)

Country Link
US (1) US6757065B1 (sv)
EP (1) EP1155284A1 (sv)
JP (1) JP2002535668A (sv)
AU (1) AU2469300A (sv)
CA (1) CA2359263A1 (sv)
SE (1) SE9900276L (sv)
WO (1) WO2000045125A1 (sv)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE515711C2 (sv) * 2000-02-09 2001-10-01 Volvo Personvagnar Ab Anordning och förfarande för uppmätning hos ytojämnheter hos ett mätobjekt
SE0003904L (sv) * 2000-05-05 2001-11-06 Roger Tuomas Sätt att mäta ytråhet
EP1400802A1 (en) * 2002-09-23 2004-03-24 Ford Global Technologies, Inc. Method and arrangement for detecting and evaluating surface irregularities
DE102004050355A1 (de) * 2004-10-15 2006-04-27 Steinbichler Optotechnik Gmbh Verfahren und Vorrichtung zum Prüfen der Oberfläche eines Reifens
FI20060331A0 (sv) * 2006-04-05 2006-04-05 Kari Seppaelae Förfarande och anordning för formmätning/formidentifiering
US20090027648A1 (en) * 2007-07-25 2009-01-29 Asml Netherlands B.V. Method of reducing noise in an original signal, and signal processing device therefor
FI122448B (sv) 2008-07-23 2012-01-31 Labvision Technologies Ltd Oy Bilderingsanordning
WO2010024254A1 (ja) * 2008-08-26 2010-03-04 株式会社ブリヂストン 被検体の凹凸検出方法とその装置
ES2670333T3 (es) * 2009-11-14 2018-05-30 Vmt Vision Machine Technic Bildverarbeitungssysteme Gmbh Procedimiento para detectar las superficies de borde frontales de fibras huecas y procedimiento para detectar los espacios interiores de fibras huecas, no obstruidas, de un haz de fibras huecas
JP6635674B2 (ja) * 2015-05-11 2020-01-29 キヤノン株式会社 計測装置、計測方法およびプログラム
US9903710B2 (en) 2015-06-05 2018-02-27 Nippon Steel & Sumitomo Metal Corporation Shape inspection apparatus for metallic body and shape inspection method for metallic body

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4162126A (en) 1976-12-10 1979-07-24 Hitachi, Ltd. Surface detect test apparatus
JPS5892904A (ja) * 1981-11-30 1983-06-02 Hitachi Ltd 面方向の検出方法及び同装置
JPS60135704A (ja) 1983-12-23 1985-07-19 Hitachi Ltd パタ−ン検出装置
JPS6182106A (ja) 1984-09-28 1986-04-25 Tokyo Doro Enjinia Kk 路面段差の検知方法
JPH071164B2 (ja) * 1985-02-28 1995-01-11 ソニー株式会社 三次元形状の認識装置
JPH02243911A (ja) * 1989-03-17 1990-09-28 Hitachi Ltd はんだ付検査装置
US5463464A (en) * 1991-10-04 1995-10-31 Kms Fusion, Inc. Electro-optical system for gauging surface profile deviations using infrared radiation
US5465153A (en) * 1991-10-04 1995-11-07 Kms Fusion, Inc. Electro-optical system for gauging specular surface profile deviations
US5311286A (en) * 1992-04-01 1994-05-10 Materials Technologies Corporation Apparatus and method for optically measuring a surface
WO1995035506A2 (en) * 1994-06-17 1995-12-28 Kensington Laboratories, Inc. Scribe mark reader
DE19534716C2 (de) * 1995-09-19 1999-06-17 Autronic Bildverarbeitung Einrichtung zum Erfassen von Fehlstellen auf einer glatten Oberfläche
HU224946B1 (en) 1995-09-22 2006-04-28 Owens Brockway Glass Container System for checking containers by a field programmable gate array logic
JP3509377B2 (ja) 1996-04-12 2004-03-22 株式会社ニコン 曲率測定装置
US5930383A (en) * 1996-09-24 1999-07-27 Netzer; Yishay Depth sensing camera systems and methods
SE508822C2 (sv) 1997-02-17 1998-11-09 Volvo Ab Förfarande och anordning för mätning och kvantifiering av ytdefekter på en provyta
WO1999058930A1 (en) * 1998-05-14 1999-11-18 Metacreations Corporation Structured-light, triangulation-based three-dimensional digitizer
AU4975399A (en) * 1998-07-08 2000-02-01 Lennard H. Bieman Machine vision and semiconductor handling
US6552783B1 (en) * 2000-06-28 2003-04-22 Teradyne, Inc. Optical system

Also Published As

Publication number Publication date
CA2359263A1 (en) 2000-08-03
JP2002535668A (ja) 2002-10-22
WO2000045125A8 (en) 2000-12-07
AU2469300A (en) 2000-08-18
WO2000045125A1 (en) 2000-08-03
SE511985C2 (sv) 2000-01-10
SE9900276D0 (sv) 1999-01-28
US6757065B1 (en) 2004-06-29
EP1155284A1 (en) 2001-11-21

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