DE69615579D1 - Wellenfront-messsystem mit integraler geometrischer referenz (igr) - Google Patents

Wellenfront-messsystem mit integraler geometrischer referenz (igr)

Info

Publication number
DE69615579D1
DE69615579D1 DE69615579T DE69615579T DE69615579D1 DE 69615579 D1 DE69615579 D1 DE 69615579D1 DE 69615579 T DE69615579 T DE 69615579T DE 69615579 T DE69615579 T DE 69615579T DE 69615579 D1 DE69615579 D1 DE 69615579D1
Authority
DE
Germany
Prior art keywords
igr
measuring system
wave front
geometric reference
front measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69615579T
Other languages
English (en)
Inventor
E Schmutz
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Adaptive Optics Associates Inc
Original Assignee
Adaptive Optics Associates Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Adaptive Optics Associates Inc filed Critical Adaptive Optics Associates Inc
Application granted granted Critical
Publication of DE69615579D1 publication Critical patent/DE69615579D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Length Measuring Devices By Optical Means (AREA)
DE69615579T 1995-12-15 1996-12-13 Wellenfront-messsystem mit integraler geometrischer referenz (igr) Expired - Lifetime DE69615579D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/572,907 US5629765A (en) 1995-12-15 1995-12-15 Wavefront measuring system with integral geometric reference (IGR)
PCT/US1996/020388 WO1997021989A1 (en) 1995-12-15 1996-12-13 Wavefront measuring system with integral geometric reference (igr)

Publications (1)

Publication Number Publication Date
DE69615579D1 true DE69615579D1 (de) 2001-10-31

Family

ID=24289854

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69615579T Expired - Lifetime DE69615579D1 (de) 1995-12-15 1996-12-13 Wellenfront-messsystem mit integraler geometrischer referenz (igr)

Country Status (5)

Country Link
US (1) US5629765A (de)
EP (1) EP0866956B1 (de)
JP (1) JP3193724B2 (de)
DE (1) DE69615579D1 (de)
WO (1) WO1997021989A1 (de)

Families Citing this family (57)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5980513A (en) 1994-04-25 1999-11-09 Autonomous Technologies Corp. Laser beam delivery and eye tracking system
US6130419A (en) * 1996-07-10 2000-10-10 Wavefront Sciences, Inc. Fixed mount wavefront sensor
US6271914B1 (en) 1996-11-25 2001-08-07 Autonomous Technologies Corporation Objective measurement and correction of optical systems using wavefront analysis
US20010041884A1 (en) * 1996-11-25 2001-11-15 Frey Rudolph W. Method for determining and correcting vision
US5777719A (en) * 1996-12-23 1998-07-07 University Of Rochester Method and apparatus for improving vision and the resolution of retinal images
US5857042A (en) * 1997-04-29 1999-01-05 Mcgill University Optical interconnection arrangements
JP3431828B2 (ja) * 1998-04-09 2003-07-28 三菱電機株式会社 波面センサー
US6219360B1 (en) 1998-04-24 2001-04-17 Trw Inc. High average power solid-state laser system with phase front control
US6819414B1 (en) 1998-05-19 2004-11-16 Nikon Corporation Aberration measuring apparatus, aberration measuring method, projection exposure apparatus having the same measuring apparatus, device manufacturing method using the same measuring method, and exposure method
US6007204A (en) * 1998-06-03 1999-12-28 Welch Allyn, Inc. Compact ocular measuring system
US6791696B1 (en) 1998-06-18 2004-09-14 Optikos Corporation Automated optical measurement apparatus and method
WO2000010448A1 (en) 1998-08-19 2000-03-02 Autonomous Technologies Corporation Apparatus and method for measuring vision defects of a human eye
US6598975B2 (en) * 1998-08-19 2003-07-29 Alcon, Inc. Apparatus and method for measuring vision defects of a human eye
DE19841083C2 (de) * 1998-09-09 2000-08-03 Fraunhofer Ges Forschung Verfahren zur Charakterisierung eines Strahlenbündels
FR2788597B1 (fr) * 1999-01-15 2001-02-23 Imagine Optic Sarl Procede et dispositif d'analyse de front d'onde a grande dynamique
EP1189707A4 (de) 1999-04-30 2008-03-05 Siemens Ag System zum vereinzeln von elementen
US6471044B1 (en) 1999-04-30 2002-10-29 Siemens Electrocom, L.P. Hold and release singulator
US6750958B1 (en) 1999-06-09 2004-06-15 Optikos Corporation Automated optical measurement apparatus and method
US6184974B1 (en) * 1999-07-01 2001-02-06 Wavefront Sciences, Inc. Apparatus and method for evaluating a target larger than a measuring aperture of a sensor
US6376819B1 (en) * 1999-07-09 2002-04-23 Wavefront Sciences, Inc. Sub-lens spatial resolution Shack-Hartmann wavefront sensing
DE19938203A1 (de) 1999-08-11 2001-02-15 Aesculap Meditec Gmbh Verfahren und Vorrichtung zur Korrektur von Sehfehlern des menschlichen Auges
US6624896B1 (en) * 1999-10-18 2003-09-23 Wavefront Sciences, Inc. System and method for metrology of surface flatness and surface nanotopology of materials
US6199986B1 (en) 1999-10-21 2001-03-13 University Of Rochester Rapid, automatic measurement of the eye's wave aberration
US6707020B1 (en) 1999-12-28 2004-03-16 Mza Associates Corporation Adaptive dynamic range wavefront sensor
US6578963B2 (en) 2000-04-19 2003-06-17 Alcon Universal Ltd. Wavefront sensor for objective measurement of an optical system and associated methods
US6460997B1 (en) 2000-05-08 2002-10-08 Alcon Universal Ltd. Apparatus and method for objective measurements of optical systems using wavefront analysis
US6382793B1 (en) 2000-05-20 2002-05-07 Carl Zeiss, Inc. Method and apparatus for measuring a wavefront
US6649895B1 (en) 2000-07-14 2003-11-18 Adaptive Optics Associates, Inc. Dispersed Hartmann sensor and method for mirror segment alignment and phasing
US7161128B2 (en) 2000-07-14 2007-01-09 Adaptive Optics Associates, Inc. Optical instrument employing a wavefront sensor capable of coarse and fine phase measurement capabilities during first and second modes of operation
US6486943B1 (en) * 2000-09-19 2002-11-26 The Schepens Eye Research Institute, Inc. Methods and apparatus for measurement and correction of optical aberration
US6406146B1 (en) 2000-09-21 2002-06-18 Carl Zeiss, Inc. Wavefront refractor simultaneously recording two hartmann-shack images
US6548797B1 (en) 2000-10-20 2003-04-15 Nikon Corporation Apparatus and method for measuring a wavefront using a screen with apertures adjacent to a multi-lens array
UA59488C2 (uk) * 2001-10-03 2003-09-15 Василь Васильович Молебний Спосіб вимірювання хвильових аберацій ока та пристрій для його здійснення (варіанти)
US6784408B1 (en) * 2001-04-25 2004-08-31 Oceanit Laboratories, Inc. Array of lateral effect detectors for high-speed wavefront sensing and other applications
US6572230B2 (en) * 2001-06-05 2003-06-03 Metrologic Instruments, Inc. Ophthalmic instrument having an integral wavefront sensor and display device that displays a graphical representation of high order aberrations of the human eye measured by the wavefront sensor
US6631991B2 (en) 2001-08-31 2003-10-14 Adaptive Optics Associates, Inc. Ophthalmic instrument having hartmann wavefront sensor deriving location of spots with spot fitting techniques
US6575572B2 (en) 2001-09-21 2003-06-10 Carl Zeiss Ophthalmic Systems, Inc. Method and apparatus for measuring optical aberrations of an eye
US6597510B2 (en) * 2001-11-02 2003-07-22 Corning Incorporated Methods and apparatus for making optical devices including microlens arrays
AU2003240945A1 (en) * 2002-05-31 2003-12-19 Wavefront Sciences, Inc. Methhod and system for sensing and analyzing a wavefront of an optically transmissive system
US7343099B2 (en) * 2004-02-12 2008-03-11 Metrologic Instruments, Inc. Free space optical (FSO) laser communication system employing fade mitigation measures based on laser beam speckle tracking and locking principles
US7256891B2 (en) * 2004-08-23 2007-08-14 Beckman Coulter, Inc. Sensor alignment apparatus for an analysis system
KR100593896B1 (ko) * 2004-12-27 2006-06-28 삼성전기주식회사 렌즈 분할형 카메라 모듈
US7381934B2 (en) * 2006-01-11 2008-06-03 Xinetics, Inc. Closed loop compensation system and method for a deformable mirror
EP2008058B1 (de) * 2006-04-07 2012-12-05 Abbott Medical Optics Inc. Geometrisches messsystem und verfahren zur messung der geometrischen eigenschaft eines objekts
US7639369B2 (en) * 2006-04-13 2009-12-29 Mette Owner-Petersen Multi-object wavefront sensor with spatial filtering
US8045178B2 (en) * 2008-03-28 2011-10-25 Optical Physics Company Interferometric tracking device
EP2446249B1 (de) * 2009-06-24 2020-08-05 Koninklijke Philips N.V. Optischer biosensor mit fokussierungsoptik
CN102483358B (zh) * 2009-07-20 2014-03-05 索雷博股份有限公司 具有可拆卸的小透镜阵列的夏克哈特曼传感器
US8531581B2 (en) * 2011-05-23 2013-09-10 Ricoh Co., Ltd. Focusing and focus metrics for a plenoptic imaging system
US9137441B2 (en) 2012-02-16 2015-09-15 Ricoh Co., Ltd. Spatial reconstruction of plenoptic images
JP6080427B2 (ja) * 2012-08-10 2017-02-15 キヤノン株式会社 シャック・ハルトマンセンサとそれを利用した波面計測方法
TW201439511A (zh) * 2013-04-02 2014-10-16 Hon Hai Prec Ind Co Ltd 大動態測量範圍的波前測量系統及其測量方法
CN103226059A (zh) * 2013-04-09 2013-07-31 中国科学院西安光学精密机械研究所 光学系统波前测量装置及测量方法
DE102016009475B4 (de) 2016-08-05 2019-06-19 Primes GmbH Meßtechnik für die Produktion mit Laserstrahlung Strahlleistungsmessung mit Aufweitung
US10948740B2 (en) * 2017-09-19 2021-03-16 Intel Corporation Head-mounted displays having curved lens arrays and generating elemental images for displaying
DE102019104661B4 (de) * 2019-01-14 2020-09-10 Dioptic Gmbh Wellenfrontsensor umfassend eine flächige Aperturmaske und Verfahren zur Kalibration
CN112729570B (zh) * 2020-12-16 2022-04-19 航天科工微电子系统研究院有限公司 基于指向调制微透镜阵列的波前传感器及波前检测方法

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4141652A (en) * 1977-11-25 1979-02-27 Adaptive Optics Associates, Inc. Sensor system for detecting wavefront distortion in a return beam of light
US4490039A (en) * 1980-12-12 1984-12-25 United Technologies Corporation Wave front sensor
US4399356A (en) * 1981-01-19 1983-08-16 Adaptive Optics Associates, Inc. Optical wavefront sensing system
US4472029A (en) * 1982-03-01 1984-09-18 Itek Corporation Integrated wavefront compensator
US4518854A (en) * 1982-06-17 1985-05-21 Itek Corporation Combined shearing interferometer and Hartmann wavefront sensor
US4725138A (en) * 1985-05-22 1988-02-16 Adaptive Optics Associates Incorporated Optical wavefront sensing system
FR2665955B1 (fr) * 1985-11-20 1993-04-23 Onera (Off Nat Aerospatiale) Analyseur opto electronique de surfaces d'onde a mosauique de micro-lentilles.
US4737621A (en) * 1985-12-06 1988-04-12 Adaptive Optics Assoc., Inc. Integrated adaptive optical wavefront sensing and compensating system
USH615H (en) * 1988-01-22 1989-04-04 The United States Of America As Represented By The Secretary Of The Air Force High speed/low light wavefront sensor system
US5083015A (en) * 1990-11-16 1992-01-21 United Technologies Corporation Optical centroid processor wavefront sensor
US5164578A (en) * 1990-12-14 1992-11-17 United Technologies Corporation Two-dimensional OCP wavefront sensor employing one-dimensional optical detection
US5287165A (en) * 1991-09-30 1994-02-15 Kaman Aerospace Corporation High sensitivity-wide dynamic range optical tilt sensor
US5270859A (en) * 1992-01-30 1993-12-14 United Technologies Corporation Optical instrument with micro-lenses
US5233174A (en) * 1992-03-11 1993-08-03 Hughes Danbury Optical Systems, Inc. Wavefront sensor having a lenslet array as a null corrector

Also Published As

Publication number Publication date
EP0866956A1 (de) 1998-09-30
EP0866956B1 (de) 2001-09-26
JPH11500833A (ja) 1999-01-19
WO1997021989A1 (en) 1997-06-19
JP3193724B2 (ja) 2001-07-30
US5629765A (en) 1997-05-13

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