DE69529870D1 - Betrieb einer Abtastverriegelungszelle zur Prüfung von Struktur und Leistung - Google Patents

Betrieb einer Abtastverriegelungszelle zur Prüfung von Struktur und Leistung

Info

Publication number
DE69529870D1
DE69529870D1 DE69529870T DE69529870T DE69529870D1 DE 69529870 D1 DE69529870 D1 DE 69529870D1 DE 69529870 T DE69529870 T DE 69529870T DE 69529870 T DE69529870 T DE 69529870T DE 69529870 D1 DE69529870 D1 DE 69529870D1
Authority
DE
Germany
Prior art keywords
performance
lock cell
check structure
scan lock
scan
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69529870T
Other languages
German (de)
English (en)
Inventor
Robert Warren
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics Ltd Great Britain
STMicroelectronics lnc USA
Original Assignee
STMicroelectronics Ltd Great Britain
SGS Thomson Microelectronics Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STMicroelectronics Ltd Great Britain, SGS Thomson Microelectronics Inc filed Critical STMicroelectronics Ltd Great Britain
Application granted granted Critical
Publication of DE69529870D1 publication Critical patent/DE69529870D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318541—Scan latches or cell details
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/027—Generators characterised by the type of circuit or by the means used for producing pulses by the use of logic circuits, with internal or external positive feedback
    • H03K3/037—Bistable circuits
    • H03K3/0375—Bistable circuits provided with means for increasing reliability; for protection; for ensuring a predetermined initial state when the supply voltage has been applied; for storing the actual state when the supply voltage fails

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
DE69529870T 1994-09-01 1995-08-22 Betrieb einer Abtastverriegelungszelle zur Prüfung von Struktur und Leistung Expired - Lifetime DE69529870D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB9417590A GB9417590D0 (en) 1994-09-01 1994-09-01 Scan latch

Publications (1)

Publication Number Publication Date
DE69529870D1 true DE69529870D1 (de) 2003-04-17

Family

ID=10760670

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69529870T Expired - Lifetime DE69529870D1 (de) 1994-09-01 1995-08-22 Betrieb einer Abtastverriegelungszelle zur Prüfung von Struktur und Leistung

Country Status (5)

Country Link
US (1) US5719876A (enExample)
EP (1) EP0702240B1 (enExample)
JP (2) JPH08179015A (enExample)
DE (1) DE69529870D1 (enExample)
GB (1) GB9417590D0 (enExample)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE68928613T2 (de) * 1988-09-07 1998-09-24 Texas Instruments Inc Bidirektionale-Boundary-Scan-Testzelle
US6304987B1 (en) * 1995-06-07 2001-10-16 Texas Instruments Incorporated Integrated test circuit
US5969538A (en) 1996-10-31 1999-10-19 Texas Instruments Incorporated Semiconductor wafer with interconnect between dies for testing and a process of testing
JP3816560B2 (ja) * 1995-12-25 2006-08-30 株式会社ルネサステクノロジ 連想メモリ回路のテスト方法及び連想メモリ回路のテスト回路
JP3917734B2 (ja) * 1997-11-07 2007-05-23 富士通株式会社 半導体記憶装置
US6408413B1 (en) 1998-02-18 2002-06-18 Texas Instruments Incorporated Hierarchical access of test access ports in embedded core integrated circuits
US6405335B1 (en) 1998-02-25 2002-06-11 Texas Instruments Incorporated Position independent testing of circuits
GB9810512D0 (en) 1998-05-15 1998-07-15 Sgs Thomson Microelectronics Detecting communication errors across a chip boundary
US7058862B2 (en) * 2000-05-26 2006-06-06 Texas Instruments Incorporated Selecting different 1149.1 TAP domains from update-IR state
US6728915B2 (en) 2000-01-10 2004-04-27 Texas Instruments Incorporated IC with shared scan cells selectively connected in scan path
US6769080B2 (en) 2000-03-09 2004-07-27 Texas Instruments Incorporated Scan circuit low power adapter with counter
US20030188243A1 (en) * 2002-03-29 2003-10-02 Rajan Krishna B. Method and apparatus for delay fault testing
US6671860B2 (en) * 2002-04-16 2003-12-30 Lsi Logic Corporation Method and apparatus for fault injection using boundary scan for pins enabled as outputs
EP1544633B1 (en) 2003-12-17 2008-10-01 STMicroelectronics (Research & Development) Limited Tap multiplexer
US7203876B2 (en) * 2004-11-30 2007-04-10 International Business Machines Corporation Method and apparatus for controlling AC power during scan operations in scannable latches
US7146551B2 (en) * 2005-01-20 2006-12-05 Hewlett-Packard Development Company, L.P. Method and system of modifying data in functional latches of a logic unit during scan chain testing thereof
US20130326451A1 (en) 2012-06-01 2013-12-05 International Business Machines Corporation Structured Latch and Local-Clock-Buffer Planning

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4697279A (en) * 1985-11-04 1987-09-29 Hughes Aircraft Company Test/master/slave triple latch flip-flop
US4742293A (en) * 1987-04-06 1988-05-03 Hughes Aircraft Company Pseudo-memory circuit for testing for stuck open faults
US5015875A (en) * 1989-12-01 1991-05-14 Motorola, Inc. Toggle-free scan flip-flop
US5068881A (en) * 1990-08-10 1991-11-26 Hewlett-Packard Company Scannable register with delay test capability
US5130568A (en) * 1990-11-05 1992-07-14 Vertex Semiconductor Corporation Scannable latch system and method
GB9111179D0 (en) * 1991-05-23 1991-07-17 Motorola Gmbh An implementation of the ieee 1149.1 boundary-scan architecture
JPH05215820A (ja) * 1992-02-05 1993-08-27 Fujitsu Ltd スキャンパス回路

Also Published As

Publication number Publication date
EP0702240A2 (en) 1996-03-20
GB9417590D0 (en) 1994-10-19
EP0702240A3 (enExample) 1996-04-10
JPH08179015A (ja) 1996-07-12
EP0702240B1 (en) 2003-03-12
US5719876A (en) 1998-02-17
JP3070053U (ja) 2000-07-14

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Legal Events

Date Code Title Description
8332 No legal effect for de