DE69527362D1 - Automatische verstärkungsregelung für ein infrarot-strahlungspyrometer - Google Patents

Automatische verstärkungsregelung für ein infrarot-strahlungspyrometer

Info

Publication number
DE69527362D1
DE69527362D1 DE69527362T DE69527362T DE69527362D1 DE 69527362 D1 DE69527362 D1 DE 69527362D1 DE 69527362 T DE69527362 T DE 69527362T DE 69527362 T DE69527362 T DE 69527362T DE 69527362 D1 DE69527362 D1 DE 69527362D1
Authority
DE
Germany
Prior art keywords
gain control
infrared radiation
automatic gain
radiation pyrometer
pyrometer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69527362T
Other languages
English (en)
Other versions
DE69527362T2 (de
Inventor
M Jensen
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Luxtron Corp
Original Assignee
Luxtron Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Luxtron Corp filed Critical Luxtron Corp
Application granted granted Critical
Publication of DE69527362D1 publication Critical patent/DE69527362D1/de
Publication of DE69527362T2 publication Critical patent/DE69527362T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G01J1/46—Electric circuits using a capacitor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/16—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using electric radiation detectors
    • G01J1/18—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using electric radiation detectors using comparison with a reference electric value
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/0096—Radiation pyrometry, e.g. infrared or optical thermometry for measuring wires, electrical contacts or electronic systems
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/06—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity
    • G01J5/061—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity by controlling the temperature of the apparatus or parts thereof, e.g. using cooling means or thermostats
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/08—Optical arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/08—Optical arrangements
    • G01J5/0818—Waveguides
    • G01J5/0821—Optical fibres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/08—Optical arrangements
    • G01J5/0893—Arrangements to attach devices to a pyrometer, i.e. attaching an optical interface; Spatial relative arrangement of optical elements, e.g. folded beam path

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Radiation Pyrometers (AREA)
DE69527362T 1994-09-26 1995-09-22 Automatische verstärkungsregelung für ein infrarot-strahlungspyrometer Expired - Fee Related DE69527362T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/312,146 US5717608A (en) 1994-09-26 1994-09-26 Electro-optical board assembly for measuring the temperature of an object surface from infra-red emissions thereof, including an automatic gain control therefore
PCT/US1995/012234 WO1996010164A1 (en) 1994-09-26 1995-09-22 Automatic gain control for an infrared radiation pyrometer

Publications (2)

Publication Number Publication Date
DE69527362D1 true DE69527362D1 (de) 2002-08-14
DE69527362T2 DE69527362T2 (de) 2003-02-20

Family

ID=23210082

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69527362T Expired - Fee Related DE69527362T2 (de) 1994-09-26 1995-09-22 Automatische verstärkungsregelung für ein infrarot-strahlungspyrometer

Country Status (6)

Country Link
US (2) US5717608A (de)
EP (1) EP0783672B1 (de)
JP (1) JPH10506714A (de)
KR (1) KR100347727B1 (de)
DE (1) DE69527362T2 (de)
WO (1) WO1996010164A1 (de)

Families Citing this family (47)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5717608A (en) * 1994-09-26 1998-02-10 Luxtron Corporation Electro-optical board assembly for measuring the temperature of an object surface from infra-red emissions thereof, including an automatic gain control therefore
NO951427D0 (no) * 1995-04-11 1995-04-11 Ngoc Minh Dinh Fremgangsmåte og anordning for måling av mönster i en delvis varmeledende overflate
US6150649A (en) * 1996-11-29 2000-11-21 Imaging Diagnostic Systems, Inc. Detector array with variable gain amplifiers for use in a laser imaging apparatus
AU5798998A (en) * 1996-11-29 1998-06-22 Imaging Diagnostic Systems, Inc. Method for reconstructing the image of an object scanned with a laser imaging apparatus
US5971606A (en) * 1997-07-22 1999-10-26 Holtek Semiconductor Corporation Module and apparatus for measuring temperature properties of an SRAM IC
US6339216B1 (en) 1997-11-26 2002-01-15 Imaging Diagnostic Systems, Inc. Time-resolved breast imaging device
US6243134B1 (en) 1998-02-27 2001-06-05 Intel Corporation Method to reduce reset noise in photodiode based CMOS image sensors
US6370486B1 (en) * 1999-01-15 2002-04-09 En'urga Inc. System and method for determining combustion temperature using infrared emissions
US6354733B2 (en) 1999-01-15 2002-03-12 Ametex, Inc. System and method for determining combustion temperature using infrared emissions
US6422745B1 (en) 1999-01-15 2002-07-23 Ametek, Inc. System and method for determining combustion temperature using infrared emissions
US6393375B1 (en) * 1999-01-15 2002-05-21 En'urga Inc. System and method for determining combustion temperature using infrared emissions
US6267501B1 (en) * 1999-03-05 2001-07-31 Raytheon Company Ambient temperature micro-bolometer control, calibration, and operation
IL134908A (en) 1999-03-08 2003-12-10 C I Systems Ltd Active pyrometry with emissivity extrapolation and compensation
US6570662B1 (en) 1999-05-24 2003-05-27 Luxtron Corporation Optical techniques for measuring layer thicknesses and other surface characteristics of objects such as semiconductor wafers
WO2000071971A1 (en) 1999-05-24 2000-11-30 Luxtron Corporation Optical techniques for measuring layer thicknesses
US6816803B1 (en) 2000-06-02 2004-11-09 Exactus, Inc. Method of optical pyrometry that is independent of emissivity and radiation transmission losses
US6647350B1 (en) 2000-06-02 2003-11-11 Exactus, Inc. Radiometric temperature measurement system
US6799137B2 (en) 2000-06-02 2004-09-28 Engelhard Corporation Wafer temperature measurement method for plasma environments
US20060190211A1 (en) * 2001-07-23 2006-08-24 Schietinger Charles W In-situ wafer parameter measurement method employing a hot susceptor as radiation source for reflectance measurement
US20030036877A1 (en) * 2001-07-23 2003-02-20 Schietinger Charles W. In-situ wafer parameter measurement method employing a hot susceptor as a reflected light source
US7017433B2 (en) * 2001-10-04 2006-03-28 Ssi Technologies, Inc. Non-contacting sensor multichip module with integral heat-sinks
DE10222616A1 (de) * 2002-05-17 2003-12-04 Univ Albert Ludwigs Freiburg Fingerabdruck-Verifikationsmodul
EP1398638A1 (de) * 2002-09-10 2004-03-17 Agilent Technologies, Inc. - a Delaware corporation - Gerät und Verfahren zur Leistungsmessung
US7235779B1 (en) 2004-10-20 2007-06-26 United States Of America As Represented By The Secretary Of The Air Force Night vision-weighted irradiance testing
US7391504B1 (en) 2005-12-14 2008-06-24 The United States Of America As Represented By The Secretary Of The Air Force Low cost night vision apparatus and cockpit lighting compatibility evaluation via visual acuity
US20070171958A1 (en) * 2006-01-23 2007-07-26 Anh Hoang Electrical device measurement probes
DE102007010649B8 (de) * 2007-03-02 2009-01-22 Thermosensorik Gmbh Verfahren und Vorrichtung zur adaptiven Änderung der Integrationszeit eines Infrarotsensors
JP5654778B2 (ja) * 2010-06-10 2015-01-14 日置電機株式会社 イメージセンサ、分光装置、及びイメージセンサの作動方法
US9465427B2 (en) 2011-06-30 2016-10-11 International Business Machines Corporation Software-centric power management by indirectly determining that user is not actively using computer program running on computing device
US9064253B2 (en) * 2011-12-01 2015-06-23 Broadcom Corporation Systems and methods for providing NFC secure application support in battery on and battery off modes
DE102012205475A1 (de) * 2012-04-03 2013-10-10 Osram Gmbh Lichtsensor für eine Beleuchtungseinrichtung, ein Beleuchtungssystem umfassend mindestens einen Lichtsensor und ein Verfahren zur Einstellung einer Helligkeit eines Beleuchtungssystems umfassend mindestens einen Lichtsensor
DE202013103760U1 (de) * 2013-08-20 2014-11-28 Makita Corporation Temperaturmessvorrichtung zum Messen einer Temperatur eines Mediums, Verbrennungskraftmaschine und Motorarbeitsgerät
DE102013226847A1 (de) * 2013-12-20 2015-06-25 Hella Kgaa Hueck & Co. Vorrichtung zur Erfassung einer Temperatur
CN104316174B (zh) * 2014-10-31 2016-06-29 国网山东省电力公司潍坊供电公司 一种红外线光电检测电路
US10139285B2 (en) * 2014-12-23 2018-11-27 Advanced Energy Industries, Inc. Fully-differential amplification for pyrometry
TWI642915B (zh) * 2015-12-24 2018-12-01 美商先驅能源工業公司 高溫計系統、用於在一高溫計中放大一光學信號之全差分放大電路和操作一全差分雙放大電路之方法
DE102016005321B4 (de) * 2016-05-02 2017-11-23 Keller Hcw Gmbh Verfahren zur berührungslosen, strahlungsthermometrischen Temperaturmessung
JP6921592B2 (ja) * 2017-04-05 2021-08-18 旭化成エレクトロニクス株式会社 センサ出力処理装置およびセンサ出力処理方法
JP6921591B2 (ja) * 2017-04-05 2021-08-18 旭化成エレクトロニクス株式会社 センサ出力処理装置およびセンサ出力処理方法
US11646190B2 (en) 2017-07-21 2023-05-09 Atonarp Inc. Current detection device and spectrometer using the same
US10224192B2 (en) * 2017-07-21 2019-03-05 Atonarp Inc. High-speed low-noise ion current detection circuit and mass spectrometer using the same
US11417509B2 (en) 2017-07-21 2022-08-16 Atonarp Inc. Current detection device and spectrometer using ihe same
US11546991B2 (en) 2020-03-11 2023-01-03 Peter C. Salmon Densely packed electronic systems
US11393807B2 (en) 2020-03-11 2022-07-19 Peter C. Salmon Densely packed electronic systems
US10966338B1 (en) 2020-03-11 2021-03-30 Peter C. Salmon Densely packed electronic systems
US11523543B1 (en) 2022-02-25 2022-12-06 Peter C. Salmon Water cooled server
US11445640B1 (en) 2022-02-25 2022-09-13 Peter C. Salmon Water cooled server

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5921489B2 (ja) * 1978-08-29 1984-05-21 大日精化工業株式会社 光量測定回路
US4427306A (en) * 1980-08-04 1984-01-24 University Patents, Inc. Radiometer apparatus for air disturbance detection
US4644323A (en) * 1980-08-26 1987-02-17 The Perkin-Elmer Corporation Analog-to-digital converter having programmable dynamic range
US4636736A (en) * 1981-10-13 1987-01-13 Microdyne Corporation Variable phase signal demodulator
US4576486A (en) * 1983-08-23 1986-03-18 The United States Of America As Represented By The Secretary Of Commerce Optical fiber thermometer
US4718036A (en) * 1983-10-20 1988-01-05 Burr-Brown Corporation Comparator-integrator loop for digitizing a waveform
US4750139A (en) * 1985-01-24 1988-06-07 Accufiber, Inc. Blackbody radiation sensing optical fiber thermometer system
US4845647A (en) * 1985-01-24 1989-07-04 Accufiber, Inc. Method and apparatus for determining temperature in a blackbody radiation sensing system
FR2591409B1 (fr) * 1985-12-10 1988-08-19 Telecommunications Sa Camera thermique a balayage parallele
US4926227A (en) * 1986-08-01 1990-05-15 Nanometrics Inc. Sensor devices with internal packaged coolers
US4867574A (en) * 1988-05-19 1989-09-19 Jenkofsky John J Ultra high speed infrared temperature measuring device
US4900162A (en) * 1989-03-20 1990-02-13 Ivac Corporation Infrared thermometry system and method
DE4004408A1 (de) * 1990-02-13 1991-08-14 Ultrakust Electronic Gmbh Infrarot-temperatursensor
US5166080A (en) * 1991-04-29 1992-11-24 Luxtron Corporation Techniques for measuring the thickness of a film formed on a substrate
US5154512A (en) * 1990-04-10 1992-10-13 Luxtron Corporation Non-contact techniques for measuring temperature or radiation-heated objects
US5310260A (en) * 1990-04-10 1994-05-10 Luxtron Corporation Non-contact optical techniques for measuring surface conditions
US5103230A (en) * 1991-04-02 1992-04-07 Burr-Brown Corporation Precision digitized current integration and measurement circuit
DE69111800T2 (de) * 1991-06-20 1995-12-14 Hewlett Packard Gmbh Photodiodenanordnung.
US5194865A (en) * 1991-12-06 1993-03-16 Interbold Analog-to-digital converter circuit having automatic range control
US5241310A (en) * 1992-03-02 1993-08-31 General Electric Company Wide dynamic range delta sigma analog-to-digital converter with precise gain tracking
US5227631A (en) * 1992-04-30 1993-07-13 Nicolet Instrument Corporation Infrared detector of the type used in infrared spectrometers
US5246292A (en) * 1992-05-28 1993-09-21 Eli Gal Temperature measurement apparatus
US5717608A (en) * 1994-09-26 1998-02-10 Luxtron Corporation Electro-optical board assembly for measuring the temperature of an object surface from infra-red emissions thereof, including an automatic gain control therefore

Also Published As

Publication number Publication date
US5717608A (en) 1998-02-10
EP0783672B1 (de) 2002-07-10
US5897610A (en) 1999-04-27
EP0783672A1 (de) 1997-07-16
DE69527362T2 (de) 2003-02-20
KR100347727B1 (ko) 2002-10-04
WO1996010164A1 (en) 1996-04-04
JPH10506714A (ja) 1998-06-30
KR970705742A (ko) 1997-10-09

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee
8328 Change in the person/name/address of the agent

Representative=s name: DIEHL & PARTNER, 80333 MUENCHEN

8370 Indication related to discontinuation of the patent is to be deleted
8339 Ceased/non-payment of the annual fee