DE69525921D1 - Abtastspeichervorrichtung und Fehlerkorrekturverfahren - Google Patents

Abtastspeichervorrichtung und Fehlerkorrekturverfahren

Info

Publication number
DE69525921D1
DE69525921D1 DE69525921T DE69525921T DE69525921D1 DE 69525921 D1 DE69525921 D1 DE 69525921D1 DE 69525921 T DE69525921 T DE 69525921T DE 69525921 T DE69525921 T DE 69525921T DE 69525921 D1 DE69525921 D1 DE 69525921D1
Authority
DE
Germany
Prior art keywords
memory device
error correction
correction method
scan memory
scan
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69525921T
Other languages
English (en)
Other versions
DE69525921T2 (de
Inventor
Takahiko Kamae
Mitsuchika Saito
Kiyoyuki Ihara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HP Inc
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Publication of DE69525921D1 publication Critical patent/DE69525921D1/de
Application granted granted Critical
Publication of DE69525921T2 publication Critical patent/DE69525921T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B9/00—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor
    • G11B9/12—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor
    • G11B9/14—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor using microscopic probe means, i.e. recording or reproducing by means directly associated with the tip of a microscopic electrical probe as used in Scanning Tunneling Microscopy [STM] or Atomic Force Microscopy [AFM] for inducing physical or electrical perturbations in a recording medium; Record carriers or media specially adapted for such transducing of information
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B20/00—Signal processing not specific to the method of recording or reproducing; Circuits therefor
    • G11B20/10—Digital recording or reproducing
    • G11B20/18—Error detection or correction; Testing, e.g. of drop-outs
    • G11B20/1816—Testing
    • G11B20/182—Testing using test patterns
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B20/00—Signal processing not specific to the method of recording or reproducing; Circuits therefor
    • G11B20/10—Digital recording or reproducing
    • G11B20/18—Error detection or correction; Testing, e.g. of drop-outs
    • G11B20/1833—Error detection or correction; Testing, e.g. of drop-outs by adding special lists or symbols to the coded information
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B20/00—Signal processing not specific to the method of recording or reproducing; Circuits therefor
    • G11B20/10—Digital recording or reproducing
    • G11B20/18—Error detection or correction; Testing, e.g. of drop-outs
    • G11B20/1883—Methods for assignment of alternate areas for defective areas
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B9/00—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor
    • G11B9/12—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor
    • G11B9/14—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor using microscopic probe means, i.e. recording or reproducing by means directly associated with the tip of a microscopic electrical probe as used in Scanning Tunneling Microscopy [STM] or Atomic Force Microscopy [AFM] for inducing physical or electrical perturbations in a recording medium; Record carriers or media specially adapted for such transducing of information
    • G11B9/1463—Record carriers for recording or reproduction involving the use of microscopic probe means
    • G11B9/1472—Record carriers for recording or reproduction involving the use of microscopic probe means characterised by the form
    • G11B9/1481—Auxiliary features, e.g. reference or indexing surfaces

Landscapes

  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Chemical & Material Sciences (AREA)
  • Nanotechnology (AREA)
  • Physics & Mathematics (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
DE69525921T 1994-12-31 1995-12-21 Abtastspeichervorrichtung und Fehlerkorrekturverfahren Expired - Lifetime DE69525921T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP34044794A JP3652728B2 (ja) 1994-12-31 1994-12-31 走査型メモリ装置および誤り訂正方法

Publications (2)

Publication Number Publication Date
DE69525921D1 true DE69525921D1 (de) 2002-04-25
DE69525921T2 DE69525921T2 (de) 2002-09-19

Family

ID=18337053

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69525921T Expired - Lifetime DE69525921T2 (de) 1994-12-31 1995-12-21 Abtastspeichervorrichtung und Fehlerkorrekturverfahren

Country Status (4)

Country Link
US (1) US5848077A (de)
EP (1) EP0723262B1 (de)
JP (1) JP3652728B2 (de)
DE (1) DE69525921T2 (de)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09237162A (ja) * 1996-02-23 1997-09-09 Hewlett Packard Co <Hp> 走査型データ記憶システム、及びその針摩耗管理方法、媒体摩耗管理方法、並びに残存寿命表示装置
US6081911A (en) * 1997-05-30 2000-06-27 Stmicroelectronics S.R.L. Method and circuit architecture for testing a non-volatile memory device
US7260051B1 (en) 1998-12-18 2007-08-21 Nanochip, Inc. Molecular memory medium and molecular memory integrated circuit
US6701451B1 (en) * 2000-08-11 2004-03-02 Emc Corporation Selective correction of data errors
US20020108073A1 (en) * 2001-02-02 2002-08-08 Hughes Brian William System for and method of operating a programmable column fail counter for redundancy allocation
US6691252B2 (en) * 2001-02-23 2004-02-10 Hewlett-Packard Development Company, L.P. Cache test sequence for single-ported row repair CAM
US6373758B1 (en) 2001-02-23 2002-04-16 Hewlett-Packard Company System and method of operating a programmable column fail counter for redundancy allocation
US20020184557A1 (en) * 2001-04-25 2002-12-05 Hughes Brian William System and method for memory segment relocation
US6982898B2 (en) * 2002-10-15 2006-01-03 Nanochip, Inc. Molecular memory integrated circuit utilizing non-vibrating cantilevers
US7233517B2 (en) 2002-10-15 2007-06-19 Nanochip, Inc. Atomic probes and media for high density data storage
US6985377B2 (en) 2002-10-15 2006-01-10 Nanochip, Inc. Phase change media for high density data storage
US20040213129A1 (en) * 2003-04-25 2004-10-28 Marshall Daniel R. Emitter cluster for a data storage device
JP4056488B2 (ja) 2004-03-30 2008-03-05 エルピーダメモリ株式会社 半導体装置の試験方法及び製造方法
US7471615B2 (en) * 2004-07-30 2008-12-30 Hewlett-Packard Development Company, L.P. Storage device having information to identify defective storage region
US8059519B2 (en) 2007-02-27 2011-11-15 Pioneer Corporation Information recording/reproducing apparatus and method using a plurality of probes
US20080301660A1 (en) * 2007-05-30 2008-12-04 Google Inc. Maintaining Multiple Versions of a Software Application on a Device

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2426938A1 (fr) * 1978-05-26 1979-12-21 Cii Honeywell Bull Dispositif de detection de secteurs defectueux et d'allocation de secteurs de remplacement dans une memoire a disques
US4346459A (en) * 1980-06-30 1982-08-24 Inmos Corporation Redundancy scheme for an MOS memory
US4571716A (en) * 1981-02-02 1986-02-18 Discovision Associates Method and apparatus for scanning a recording medium for defects
SE8400287D0 (sv) * 1984-01-20 1984-01-20 Grundstenen 17356 Ab Anordning/metod for kalibrering av monteringsmaskiner mm
US4841498A (en) * 1985-03-11 1989-06-20 Matsushita Electric Industrial Co., Ltd. Information recording/reproducing apparatus with means for substituting predetermined good sectors for defective ones
US4910725A (en) * 1986-04-23 1990-03-20 Drexler Technology Corporation Optical recording method for data cards
JPH0298896A (ja) * 1988-10-05 1990-04-11 Olympus Optical Co Ltd 記憶装置
JPH02193335A (ja) * 1989-01-20 1990-07-31 Csk Corp カード型光記録媒体
JPH02206043A (ja) * 1989-02-03 1990-08-15 Olympus Optical Co Ltd 記憶装置
DE69002774T2 (de) * 1989-02-09 1994-02-10 Olympus Optical Co Rastertunnelmikroskop-Speichergerät.
US5216631A (en) * 1990-11-02 1993-06-01 Sliwa Jr John W Microvibratory memory device
US5416331A (en) * 1991-01-11 1995-05-16 Hitachi, Ltd. Surface atom fabrication method and apparatus
JP3126409B2 (ja) * 1991-06-05 2001-01-22 キヤノン株式会社 情報記録再生方法
JP3109861B2 (ja) * 1991-06-12 2000-11-20 キヤノン株式会社 情報の記録及び／又は再生装置

Also Published As

Publication number Publication date
JP3652728B2 (ja) 2005-05-25
EP0723262A2 (de) 1996-07-24
EP0723262A3 (de) 1997-07-02
US5848077A (en) 1998-12-08
DE69525921T2 (de) 2002-09-19
JPH08185699A (ja) 1996-07-16
EP0723262B1 (de) 2002-03-20

Similar Documents

Publication Publication Date Title
DE69524542D1 (de) Farbkorrekturverfahren und -vorrichtung
DE69223474T2 (de) Gradationskorrekturverfahren und Gerät
DE69332644T2 (de) Implantat und methode zu seinem zusammenfalten
DE69628956D1 (de) Abtastvorrichtung und -verfahren
DE4497968T1 (de) Abbildungsverfahren und Abbildungseinrichtung
DE69517459D1 (de) Bilderzeugungsgerät und -verfahren
DE69708619T2 (de) Elektroentionisierungsvorrichtung und methode
DE69525921T2 (de) Abtastspeichervorrichtung und Fehlerkorrekturverfahren
NO305095B1 (no) FremgangsmÕte og anordning for forsegling
DE69517913D1 (de) Fixiervorrichtung und Fixierverfahren
DE69535201D1 (de) Positionsbestimmungsgerät und -verfahren
DE69525115D1 (de) Bildlesevorrichtung und -verfahren
NL1007054A1 (nl) Foutcorrectiemethode en -inrichting.
DE69521097T2 (de) Fehlerkorrekturgerät
NO964541D0 (no) Porphacyanin og CNC-utvidete porphyriner
DE69509696D1 (de) Bildleseverfahren und -vorrichtung
DE69536034D1 (de) Belichtungsapparat und Belichtungsverfahren
DE69517543D1 (de) Bilderzeugungsverfahren und Gerät
NL1007004A1 (nl) Foutcorrectiemethode en inrichting.
KR960015535A (ko) 에러 정정 방법 및 장치
DE69421480D1 (de) Halbleiterspeicheranordnung und Betriebsverfahren dafür
DE69513599T2 (de) Redundanter Adressenspeicher und Testverfahren dafür
DE69610691T2 (de) Belichtungsverfahren und Belichtungsvorrichtung
DE69728931D1 (de) Speicherabbildungsverfahren und -vorrichtung
FI963119A (fi) Menetelmä ja laite muistin ohjaamiseksi

Legal Events

Date Code Title Description
8364 No opposition during term of opposition