DE69522936D1 - Hochspannungstreiberschaltung für induktive Lasten - Google Patents
Hochspannungstreiberschaltung für induktive LastenInfo
- Publication number
- DE69522936D1 DE69522936D1 DE69522936T DE69522936T DE69522936D1 DE 69522936 D1 DE69522936 D1 DE 69522936D1 DE 69522936 T DE69522936 T DE 69522936T DE 69522936 T DE69522936 T DE 69522936T DE 69522936 D1 DE69522936 D1 DE 69522936D1
- Authority
- DE
- Germany
- Prior art keywords
- high voltage
- driver circuit
- voltage driver
- inductive loads
- inductive
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 230000001939 inductive effect Effects 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/7801—DMOS transistors, i.e. MISFETs with a channel accommodating body or base region adjoining a drain drift region
- H01L29/7816—Lateral DMOS transistors, i.e. LDMOS transistors
- H01L29/7824—Lateral DMOS transistors, i.e. LDMOS transistors with a substrate comprising an insulating layer, e.g. SOI-LDMOS transistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/0203—Particular design considerations for integrated circuits
- H01L27/0248—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
- H01L27/0251—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices
- H01L27/0255—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices using diodes as protective elements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
- H01L27/06—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration
- H01L27/0611—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration integrated circuits having a two-dimensional layout of components without a common active region
- H01L27/0617—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration integrated circuits having a two-dimensional layout of components without a common active region comprising components of the field-effect type
- H01L27/0629—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration integrated circuits having a two-dimensional layout of components without a common active region comprising components of the field-effect type in combination with diodes, or resistors, or capacitors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/70—Bipolar devices
- H01L29/72—Transistor-type devices, i.e. able to continuously respond to applied control signals
- H01L29/739—Transistor-type devices, i.e. able to continuously respond to applied control signals controlled by field-effect, e.g. bipolar static induction transistors [BSIT]
- H01L29/7393—Insulated gate bipolar mode transistors, i.e. IGBT; IGT; COMFET
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/7801—DMOS transistors, i.e. MISFETs with a channel accommodating body or base region adjoining a drain drift region
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/7801—DMOS transistors, i.e. MISFETs with a channel accommodating body or base region adjoining a drain drift region
- H01L29/7816—Lateral DMOS transistors, i.e. LDMOS transistors
- H01L29/7817—Lateral DMOS transistors, i.e. LDMOS transistors structurally associated with at least one other device
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Ceramic Engineering (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Insulated Gate Type Field-Effect Transistor (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP95830346A EP0757389B1 (de) | 1995-07-31 | 1995-07-31 | Hochspannungstreiberschaltung für induktive Lasten |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69522936D1 true DE69522936D1 (de) | 2001-10-31 |
DE69522936T2 DE69522936T2 (de) | 2002-08-29 |
Family
ID=8221993
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69522936T Expired - Fee Related DE69522936T2 (de) | 1995-07-31 | 1995-07-31 | Hochspannungstreiberschaltung für induktive Lasten |
Country Status (4)
Country | Link |
---|---|
US (1) | US5912495A (de) |
EP (1) | EP0757389B1 (de) |
JP (1) | JPH09134964A (de) |
DE (1) | DE69522936T2 (de) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0859456A1 (de) * | 1997-02-14 | 1998-08-19 | Koninklijke Philips Electronics N.V. | Steuerschaltung für einen Elektromotor |
DE19845995A1 (de) * | 1998-04-15 | 2000-04-13 | Andreas Boehringer | Stromrichter mit aktiv beeinflußter Kommutierung |
JP3275850B2 (ja) * | 1998-10-09 | 2002-04-22 | 日本電気株式会社 | 高耐圧ダイオードとその製造方法 |
US6346461B1 (en) * | 2000-05-15 | 2002-02-12 | The Regents Of The University Of California | Electroless epitaxial etching for semiconductor applications |
US6794719B2 (en) * | 2001-06-28 | 2004-09-21 | Koninklijke Philips Electronics N.V. | HV-SOI LDMOS device with integrated diode to improve reliability and avalanche ruggedness |
US6555877B2 (en) * | 2001-08-27 | 2003-04-29 | Semiconductor Components Industries Llc | NMOSFET with negative voltage capability formed in P-type substrate and method of making the same |
EP1291924A1 (de) * | 2001-09-10 | 2003-03-12 | STMicroelectronics S.r.l. | MOS-Halbleiteranordnung mit einem Bodybereich |
JP3713490B2 (ja) * | 2003-02-18 | 2005-11-09 | 株式会社東芝 | 半導体装置 |
US20060220170A1 (en) * | 2005-03-31 | 2006-10-05 | Chih-Feng Huang | High-voltage field effect transistor having isolation structure |
JP4890838B2 (ja) * | 2005-11-17 | 2012-03-07 | ルネサスエレクトロニクス株式会社 | 半導体集積回路のレイアウト設計方法、及びレイアウト設計ツール |
CN101964361B (zh) * | 2009-07-24 | 2012-08-29 | 新唐科技股份有限公司 | 金属氧化半导体晶体管与其制造方法 |
JP2011238771A (ja) * | 2010-05-11 | 2011-11-24 | Hitachi Ltd | 半導体装置 |
US10103258B2 (en) | 2016-12-29 | 2018-10-16 | Texas Instruments Incorporated | Laterally diffused metal oxide semiconductor with gate poly contact within source window |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2401701C3 (de) * | 1974-01-15 | 1978-12-21 | Robert Bosch Gmbh, 7000 Stuttgart | Transistorleistungsschalter |
US4250829A (en) * | 1978-05-30 | 1981-02-17 | Brunswick Corporation | Vapor detector for marine propulsion apparatus |
US4496849A (en) * | 1982-02-22 | 1985-01-29 | General Motors Corporation | Power transistor protection from substrate injection |
US4847603A (en) * | 1986-05-01 | 1989-07-11 | Blanchard Clark E | Automatic closed loop scaling and drift correcting system and method particularly for aircraft head up displays |
IT1197279B (it) * | 1986-09-25 | 1988-11-30 | Sgs Microelettronica Spa | Dispositivo integrato per schermare l'iniezione di cariche nel substrato, in particolare in circuiti di pilotaggio di carichi induttivi e/o capacitivi |
IT1221839B (it) * | 1987-10-09 | 1990-07-12 | Sgs Microelettronica Spa | Controllo attivo della sovratensione nel pilotaggio di carichi induttivi |
JPH0716005B2 (ja) * | 1988-04-08 | 1995-02-22 | 株式会社東芝 | 半導体装置 |
US4979001A (en) * | 1989-06-30 | 1990-12-18 | Micrel Incorporated | Hidden zener diode structure in configurable integrated circuit |
US5397914A (en) * | 1992-04-30 | 1995-03-14 | Hitachi Ltd. | Power transistor device including power transistors in darlington connection and zener diode which is coupled between collector and base of power transistors and which is formed in polysilicon film |
JP3158738B2 (ja) * | 1992-08-17 | 2001-04-23 | 富士電機株式会社 | 高耐圧mis電界効果トランジスタおよび半導体集積回路 |
US5347419A (en) * | 1992-12-22 | 1994-09-13 | Eaton Corporation | Current limiting solenoid driver |
DE69330556T2 (de) * | 1993-05-13 | 2002-05-16 | Cons Ric Microelettronica | Integrierte Schaltungsstruktur für den Schutz von Leistungsvorrichtung gegen Überspannungen |
US5495123A (en) * | 1994-10-31 | 1996-02-27 | Sgs-Thomson Microelectronics, Inc. | Structure to protect against below ground current injection |
US5751052A (en) * | 1996-04-01 | 1998-05-12 | Motorola, Inc. | Inductive driver circuit and method therefor |
-
1995
- 1995-07-31 DE DE69522936T patent/DE69522936T2/de not_active Expired - Fee Related
- 1995-07-31 EP EP95830346A patent/EP0757389B1/de not_active Expired - Lifetime
-
1996
- 1996-07-31 US US08/690,060 patent/US5912495A/en not_active Expired - Lifetime
- 1996-07-31 JP JP8201504A patent/JPH09134964A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
EP0757389A1 (de) | 1997-02-05 |
US5912495A (en) | 1999-06-15 |
EP0757389B1 (de) | 2001-09-26 |
DE69522936T2 (de) | 2002-08-29 |
JPH09134964A (ja) | 1997-05-20 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8332 | No legal effect for de | ||
8370 | Indication related to discontinuation of the patent is to be deleted | ||
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |