DE69508222T2 - Ionisationskammer mit zweifachem Eingangsfenster zur Messung der Röntgenstrahlbelichtung - Google Patents

Ionisationskammer mit zweifachem Eingangsfenster zur Messung der Röntgenstrahlbelichtung

Info

Publication number
DE69508222T2
DE69508222T2 DE69508222T DE69508222T DE69508222T2 DE 69508222 T2 DE69508222 T2 DE 69508222T2 DE 69508222 T DE69508222 T DE 69508222T DE 69508222 T DE69508222 T DE 69508222T DE 69508222 T2 DE69508222 T2 DE 69508222T2
Authority
DE
Germany
Prior art keywords
measuring
ionization chamber
ray exposure
entrance window
double entrance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69508222T
Other languages
English (en)
Other versions
DE69508222D1 (de
Inventor
Michael Steven Labbe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
INOVISION RADIATION MEASUREMENTS LLC(N.D.GES.DES S
Original Assignee
Keithley Instruments LLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Keithley Instruments LLC filed Critical Keithley Instruments LLC
Publication of DE69508222D1 publication Critical patent/DE69508222D1/de
Application granted granted Critical
Publication of DE69508222T2 publication Critical patent/DE69508222T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/185—Measuring radiation intensity with ionisation chamber arrangements

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Electron Tubes For Measurement (AREA)
  • X-Ray Techniques (AREA)
DE69508222T 1995-02-01 1995-12-01 Ionisationskammer mit zweifachem Eingangsfenster zur Messung der Röntgenstrahlbelichtung Expired - Fee Related DE69508222T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/382,138 US5508526A (en) 1995-02-01 1995-02-01 Dual entrance window ion chamber for measuring X-ray exposure

Publications (2)

Publication Number Publication Date
DE69508222D1 DE69508222D1 (de) 1999-04-15
DE69508222T2 true DE69508222T2 (de) 1999-09-02

Family

ID=23507676

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69508222T Expired - Fee Related DE69508222T2 (de) 1995-02-01 1995-12-01 Ionisationskammer mit zweifachem Eingangsfenster zur Messung der Röntgenstrahlbelichtung

Country Status (5)

Country Link
US (1) US5508526A (de)
EP (1) EP0725425B1 (de)
JP (1) JP2831316B2 (de)
CA (1) CA2163416C (de)
DE (1) DE69508222T2 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU5615798A (en) * 1996-12-23 1998-07-17 Regents Of The University Of California, The Gamma ray detector
DE19758363C2 (de) * 1997-12-22 2002-04-18 Deutsches Elektronen Synchr Anordnung zur digitalen Subtraktionsangiographie
DE19907207A1 (de) * 1999-02-19 2000-08-31 Schwerionenforsch Gmbh Ionisationskammer für Ionenstrahlen und Verfahren zur Intensitätsüberwachung eines Ionenstrahls
US6885007B2 (en) * 2002-08-01 2005-04-26 Cardinal Health 419, L.L.C. Radiation detection apparatus
US20040251422A1 (en) * 2003-01-27 2004-12-16 Overhoff Mario W. Ionization chamber detector system for the detection and measurement of nuclear radiation including beta, gamma, and x-ray radiation
WO2006055942A2 (en) * 2004-11-18 2006-05-26 Compumed, Inc. Methods and systems for analyzing bone conditions using mammography device
US9721772B2 (en) 2013-01-25 2017-08-01 General Electric Company Ion chamber enclosure material to increase gamma radiation sensitivity
CN105486379B (zh) * 2015-12-30 2018-10-19 黑龙江省科学院技术物理研究所 可调高能x射线反散射物位测量方法

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB970432A (en) * 1961-04-22 1964-09-23 Takeo Ichinokawa Improvements in or relating to proportional counters
JPS4115035Y1 (de) * 1966-01-17 1966-07-13
JPS52166585U (de) * 1976-06-10 1977-12-16
US4240491A (en) * 1978-06-14 1980-12-23 Capintec Inc. Thin-film window for nuclear instruments and method of making same
US4230944A (en) * 1979-02-09 1980-10-28 Advanced Instrument Development, Inc. X-ray system exposure control with ion chamber
US4626688A (en) * 1982-11-26 1986-12-02 Barnes Gary T Split energy level radiation detection
NL8503152A (nl) * 1985-11-15 1987-06-01 Optische Ind De Oude Delft Nv Dosismeter voor ioniserende straling.
JPH01134289A (ja) * 1987-11-19 1989-05-26 Aloka Co Ltd 電離箱式線量率計
US5033075A (en) * 1988-05-18 1991-07-16 Rad/Red Laboratories Inc. Radiation reduction filter for use in medical diagnosis
US5115134A (en) * 1988-11-23 1992-05-19 Slowey Thomas W Precision low energy radiation dosimetry system
US5166966A (en) * 1990-02-07 1992-11-24 The United States Of America As Represented By The United States Department Of Energy Coated x-ray filters
JPH05332958A (ja) * 1991-05-30 1993-12-17 Hitachi Ltd Ｘ線回折装置及びそれに用いる位置敏感型ガス入りｘ線計数器
JP2728986B2 (ja) * 1991-06-05 1998-03-18 三菱電機株式会社 放射線モニタ
US5375158A (en) * 1993-04-23 1994-12-20 Regents Of The University Of California X-ray source for mammography

Also Published As

Publication number Publication date
US5508526A (en) 1996-04-16
CA2163416C (en) 1999-02-23
DE69508222D1 (de) 1999-04-15
CA2163416A1 (en) 1996-08-02
EP0725425B1 (de) 1999-03-10
JPH08248138A (ja) 1996-09-27
JP2831316B2 (ja) 1998-12-02
EP0725425A1 (de) 1996-08-07

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: INOVISION RADIATION MEASUREMENTS LLC(N.D.GES.DES S

8339 Ceased/non-payment of the annual fee