DE69505540D1 - Verfahren und gerät zur bestimmung von kennlinien - Google Patents

Verfahren und gerät zur bestimmung von kennlinien

Info

Publication number
DE69505540D1
DE69505540D1 DE69505540T DE69505540T DE69505540D1 DE 69505540 D1 DE69505540 D1 DE 69505540D1 DE 69505540 T DE69505540 T DE 69505540T DE 69505540 T DE69505540 T DE 69505540T DE 69505540 D1 DE69505540 D1 DE 69505540D1
Authority
DE
Germany
Prior art keywords
determining characteristics
determining
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69505540T
Other languages
English (en)
Other versions
DE69505540T2 (de
Inventor
John Gallop
Conway Langham
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
UK Secretary of State for Trade and Industry
Original Assignee
UK Secretary of State for Trade and Industry
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by UK Secretary of State for Trade and Industry filed Critical UK Secretary of State for Trade and Industry
Application granted granted Critical
Publication of DE69505540D1 publication Critical patent/DE69505540D1/de
Publication of DE69505540T2 publication Critical patent/DE69505540T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
DE69505540T 1994-08-04 1995-08-04 Verfahren und gerät zur bestimmung von kennlinien Expired - Fee Related DE69505540T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB9415923A GB9415923D0 (en) 1994-08-04 1994-08-04 Method of and apparatus for calibration
PCT/GB1995/001864 WO1996004563A1 (en) 1994-08-04 1995-08-04 Method of and apparatus for determining a response characteristic

Publications (2)

Publication Number Publication Date
DE69505540D1 true DE69505540D1 (de) 1998-11-26
DE69505540T2 DE69505540T2 (de) 1999-03-11

Family

ID=10759501

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69505540T Expired - Fee Related DE69505540T2 (de) 1994-08-04 1995-08-04 Verfahren und gerät zur bestimmung von kennlinien

Country Status (5)

Country Link
US (1) US5869958A (de)
EP (1) EP0774125B1 (de)
DE (1) DE69505540T2 (de)
GB (1) GB9415923D0 (de)
WO (1) WO1996004563A1 (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6674291B1 (en) * 2000-10-30 2004-01-06 Agere Systems Guardian Corp. Method and apparatus for determining and/or improving high power reliability in thin film resonator devices, and a thin film resonator device resultant therefrom
DE10252099B4 (de) * 2002-11-08 2021-08-05 Rohde & Schwarz GmbH & Co. Kommanditgesellschaft Messgerät und Verfahren zum Ermitteln einer Kennlinie einer Hochfrequenzeinheit
US20100148813A1 (en) 2006-07-18 2010-06-17 Multiprobe, Inc. Apparatus and method for combined micro-scale and nano-scale c-v, q-v, and i-v testing of semiconductor materials
JP5525773B2 (ja) * 2009-07-23 2014-06-18 三菱電機株式会社 Ｔｆｔ基板及びその製造方法
KR102040739B1 (ko) * 2013-03-20 2019-11-06 삼성전자주식회사 무선 전력 송수신 시스템

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3017571A (en) * 1956-12-04 1962-01-16 Anthony C Moricca Device for testing reactances
GB1040575A (en) * 1962-05-18 1966-09-01 Post Office Coaxial cable test method and apparatus
JPS5875074A (ja) * 1981-10-30 1983-05-06 Yokogawa Hewlett Packard Ltd 容量あるいは他のパラメ−タの測定装置
JPS63134965A (ja) * 1986-11-11 1988-06-07 シーメンス、アクチエンゲゼルシヤフト 電気的振動回路の測定方法
DE3812633A1 (de) * 1988-04-15 1989-10-26 Daimler Benz Ag Verfahren zur kontaktlosen widerstandsmessung
US4959614A (en) * 1989-08-03 1990-09-25 The United States Of America As Represented By The Secretary Of The Navy Apparatus for determining microwave characteristics of superconductive materials using a resonant cavity and calibration waveguides
US4978922A (en) * 1989-08-31 1990-12-18 Westinghouse Electric Corp. Superconducting sensor for quench detection in a superconductor
US5179074A (en) * 1991-01-24 1993-01-12 Space Systems/Loral, Inc. Hybrid dielectric resonator/high temperature superconductor filter
JPH04351103A (ja) * 1991-05-29 1992-12-04 Sumitomo Electric Ind Ltd マイクロ波共振器
CA2073272C (en) * 1991-07-08 1997-04-01 Kenjiro Higaki Microwave resonator of compound oxide superconductor material
US5324713A (en) * 1991-11-05 1994-06-28 E. I. Du Pont De Nemours And Company High temperature superconductor support structures for dielectric resonator

Also Published As

Publication number Publication date
EP0774125A1 (de) 1997-05-21
EP0774125B1 (de) 1998-10-21
DE69505540T2 (de) 1999-03-11
US5869958A (en) 1999-02-09
WO1996004563A1 (en) 1996-02-15
GB9415923D0 (en) 1994-09-28

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee