DE69422227D1 - Verfahren zur Untersuchung einer festen Probe - Google Patents

Verfahren zur Untersuchung einer festen Probe

Info

Publication number
DE69422227D1
DE69422227D1 DE69422227T DE69422227T DE69422227D1 DE 69422227 D1 DE69422227 D1 DE 69422227D1 DE 69422227 T DE69422227 T DE 69422227T DE 69422227 T DE69422227 T DE 69422227T DE 69422227 D1 DE69422227 D1 DE 69422227D1
Authority
DE
Germany
Prior art keywords
examining
procedure
solid sample
sample
solid
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69422227T
Other languages
English (en)
Other versions
DE69422227T2 (de
Inventor
Tadashi Mochizuki
Yohichi Ishibashi
Takanori Akiyoshi
Yoshihito Iwata
Satoshi Kinoshiro
Akiko Sakashita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JFE Steel Corp
Original Assignee
NKK Corp
Nippon Kokan Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NKK Corp, Nippon Kokan Ltd filed Critical NKK Corp
Application granted granted Critical
Publication of DE69422227D1 publication Critical patent/DE69422227D1/de
Publication of DE69422227T2 publication Critical patent/DE69422227T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/718—Laser microanalysis, i.e. with formation of sample plasma

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Optics & Photonics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
DE69422227T 1993-06-29 1994-06-28 Verfahren zur Untersuchung einer festen Probe Expired - Fee Related DE69422227T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP5159416A JP2870364B2 (ja) 1993-06-29 1993-06-29 レーザー気化分析方法及び装置
CN94115712A CN1117584A (zh) 1993-06-29 1994-08-25 分析固体样品的方法

Publications (2)

Publication Number Publication Date
DE69422227D1 true DE69422227D1 (de) 2000-01-27
DE69422227T2 DE69422227T2 (de) 2000-05-31

Family

ID=37076173

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69422227T Expired - Fee Related DE69422227T2 (de) 1993-06-29 1994-06-28 Verfahren zur Untersuchung einer festen Probe

Country Status (5)

Country Link
US (1) US5452070A (de)
EP (1) EP0632264B1 (de)
JP (1) JP2870364B2 (de)
CN (1) CN1117584A (de)
DE (1) DE69422227T2 (de)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3166569B2 (ja) * 1995-06-12 2001-05-14 日本鋼管株式会社 鋼材表面に生じた異常部の発生原因検出方法
US5844149A (en) * 1996-09-19 1998-12-01 Nkk Corporation Method for analyzing solid specimen and apparatus therefor
AU2011308072B2 (en) * 2010-10-01 2015-01-22 Technological Resources Pty. Limited Laser induced breakdown spectroscopy analyser
WO2014150696A1 (en) * 2013-03-15 2014-09-25 Materialytics, LLC Methods and systems for analyzing samples
CN103234912B (zh) * 2013-04-17 2015-06-03 中国工程物理研究院流体物理研究所 超音速切向气流下材料激光反射率动态测量装置及方法
EP3690923A1 (de) 2013-04-17 2020-08-05 Fluidigm Canada Inc. Probenanalyse für massenzytometrie
DE102013009962B3 (de) * 2013-06-14 2014-11-06 K+S Aktiengesellschaft LIBS-Messtubus
JP7146905B2 (ja) * 2018-04-18 2022-10-04 株式会社エス・テイ・ジャパン レーザーアブレーション装置および分析装置
US20230016029A1 (en) * 2019-12-24 2023-01-19 Battelle Energy Alliance, Llc Laser ablation methods and systems for producing feedstock powder suitable for laser-based additive manufacturing
WO2022034029A1 (en) * 2020-08-11 2022-02-17 Merck Patent Gmbh Method for the collection of substances comprised in an environment for analytical purposes

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03118440A (ja) * 1989-09-29 1991-05-21 Yokogawa Electric Corp レーザ装置を有する元素分析装置

Also Published As

Publication number Publication date
CN1117584A (zh) 1996-02-28
DE69422227T2 (de) 2000-05-31
JP2870364B2 (ja) 1999-03-17
EP0632264A1 (de) 1995-01-04
EP0632264B1 (de) 1999-12-22
JPH0772047A (ja) 1995-03-17
US5452070A (en) 1995-09-19

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: JFE ENGINEERING CORP., TOKIO/TOKYO, JP

8327 Change in the person/name/address of the patent owner

Owner name: JFE STEEL CORP., TOKIO/TOKYO, JP

8339 Ceased/non-payment of the annual fee