DE69411515D1 - Vakuumeinführungsvorrichtung - Google Patents

Vakuumeinführungsvorrichtung

Info

Publication number
DE69411515D1
DE69411515D1 DE69411515T DE69411515T DE69411515D1 DE 69411515 D1 DE69411515 D1 DE 69411515D1 DE 69411515 T DE69411515 T DE 69411515T DE 69411515 T DE69411515 T DE 69411515T DE 69411515 D1 DE69411515 D1 DE 69411515D1
Authority
DE
Germany
Prior art keywords
insertion device
vacuum insertion
vacuum
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69411515T
Other languages
English (en)
Other versions
DE69411515T2 (de
Inventor
Stephen James Mullock
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kore Technology Ltd
Original Assignee
Kore Technology Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kore Technology Ltd filed Critical Kore Technology Ltd
Publication of DE69411515D1 publication Critical patent/DE69411515D1/de
Application granted granted Critical
Publication of DE69411515T2 publication Critical patent/DE69411515T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/34Dynamic spectrometers
    • H01J49/40Time-of-flight spectrometers

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
DE69411515T 1993-11-25 1994-11-21 Vakuumeinführungsvorrichtung Expired - Fee Related DE69411515T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB939324213A GB9324213D0 (en) 1993-11-25 1993-11-25 Vacuum inlet

Publications (2)

Publication Number Publication Date
DE69411515D1 true DE69411515D1 (de) 1998-08-13
DE69411515T2 DE69411515T2 (de) 1998-12-24

Family

ID=10745660

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69411515T Expired - Fee Related DE69411515T2 (de) 1993-11-25 1994-11-21 Vakuumeinführungsvorrichtung

Country Status (4)

Country Link
US (1) US5543619A (de)
EP (1) EP0655770B1 (de)
DE (1) DE69411515T2 (de)
GB (1) GB9324213D0 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19523860A1 (de) * 1995-06-30 1997-01-02 Bruker Franzen Analytik Gmbh Ionenfallen-Massenspektrometer mit vakuum-externer Ionenerzeugung
GB2323165B (en) * 1997-03-11 2001-01-31 Graseby Dynamics Ltd Improvements in or relating to fluid sampling systems
WO2005098413A1 (en) * 2004-03-31 2005-10-20 Mine Safety Appliances Company Photoionization detector
US10446378B2 (en) 2013-09-20 2019-10-15 Micromass Uk Limited Ion inlet assembly
DE102014226038A1 (de) * 2014-12-16 2016-06-16 Carl Zeiss Microscopy Gmbh Druckreduzierungseinrichtung, Vorrichtung zur massenspektrometrischen Analyse eines Gases und Reinigungsverfahren
CN113340972B (zh) * 2021-05-06 2023-11-21 清华大学 基于快速压缩机的超快时间分辨质谱诊断系统

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3801788A (en) * 1972-11-16 1974-04-02 Midwest Research Inst Mass marking for spectrometry using programmed molecule clusters
DE2650685A1 (de) * 1976-11-05 1978-05-18 Varian Mat Gmbh Verfahren zur identifizierenden analyse von gemischen organischer substanzen
US4740692A (en) * 1985-06-13 1988-04-26 Mitsubishi Denki Kabushiki Kaisha Laser mass spectroscopic analyzer and method
US4955717A (en) * 1986-12-02 1990-09-11 Geochemical Services, Inc. Demand modulated atomization apparatus and method for plasma spectroscopy
JP2580156B2 (ja) * 1987-03-30 1997-02-12 株式会社日立製作所 大気圧イオン化質量分析計
JP2765890B2 (ja) * 1988-12-09 1998-06-18 株式会社日立製作所 プラズマイオン源微量元素質量分析装置
US5070240B1 (en) * 1990-08-29 1996-09-10 Univ Brigham Young Apparatus and methods for trace component analysis
JP2913924B2 (ja) * 1991-09-12 1999-06-28 株式会社日立製作所 質量分析の方法および装置
JPH05251038A (ja) * 1992-03-04 1993-09-28 Hitachi Ltd プラズマイオン質量分析装置
CA2101237C (en) * 1992-09-11 1999-04-13 Stephen Ward Downey Apparatus comprising means for mass spectrometry
US5316955A (en) * 1993-06-14 1994-05-31 Govorchin Steven W Furnace atomization electron ionization mass spectrometry

Also Published As

Publication number Publication date
EP0655770B1 (de) 1998-07-08
US5543619A (en) 1996-08-06
EP0655770A1 (de) 1995-05-31
DE69411515T2 (de) 1998-12-24
GB9324213D0 (en) 1994-01-12

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee