DE69407529D1 - Vorrichtung zur Überwachung der Phasenverschiebung zwischen zwei Taktsignalen - Google Patents
Vorrichtung zur Überwachung der Phasenverschiebung zwischen zwei TaktsignalenInfo
- Publication number
- DE69407529D1 DE69407529D1 DE69407529T DE69407529T DE69407529D1 DE 69407529 D1 DE69407529 D1 DE 69407529D1 DE 69407529 T DE69407529 T DE 69407529T DE 69407529 T DE69407529 T DE 69407529T DE 69407529 D1 DE69407529 D1 DE 69407529D1
- Authority
- DE
- Germany
- Prior art keywords
- clock signals
- monitoring
- phase shift
- flops
- flip
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/22—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral
- H03K5/26—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being duration, interval, position, frequency, or sequence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/30—Marginal testing, e.g. by varying supply voltage
- G01R31/3016—Delay or race condition test, e.g. race hazard test
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Manipulation Of Pulses (AREA)
- Synchronisation In Digital Transmission Systems (AREA)
- Tests Of Electronic Circuits (AREA)
- Measuring Phase Differences (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR9312451A FR2711286B1 (fr) | 1993-10-11 | 1993-10-11 | Dispositif de surveillance du déphasage entre deux signaux d'horloge. |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69407529D1 true DE69407529D1 (de) | 1998-02-05 |
DE69407529T2 DE69407529T2 (de) | 1998-06-04 |
Family
ID=9451993
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69407529T Expired - Fee Related DE69407529T2 (de) | 1993-10-11 | 1994-10-10 | Vorrichtung zur Überwachung der Phasenverschiebung zwischen zwei Taktsignalen |
Country Status (5)
Country | Link |
---|---|
US (1) | US5498983A (de) |
EP (1) | EP0648017B1 (de) |
JP (1) | JP2657363B2 (de) |
DE (1) | DE69407529T2 (de) |
FR (1) | FR2711286B1 (de) |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2760284B2 (ja) * | 1994-06-27 | 1998-05-28 | 日本電気株式会社 | 半導体集積回路装置 |
WO1997002493A2 (en) * | 1995-07-06 | 1997-01-23 | Philips Electronics N.V. | A method for testing an electronic circuit by logically combining clock signals, and an electronic circuit provided with facilities for such testing |
US5754063A (en) * | 1996-06-27 | 1998-05-19 | Intel Corporation | Method and apparatus to measure internal node timing |
JPH11272353A (ja) * | 1998-03-19 | 1999-10-08 | Toshiba Corp | クロック供給回路及びデータ転送回路 |
JP2000009809A (ja) * | 1998-06-26 | 2000-01-14 | Advantest Corp | 誤設定検出機能を具備したic試験装置 |
JP3457626B2 (ja) * | 2000-04-20 | 2003-10-20 | Necエレクトロニクス株式会社 | ジッタ検出回路 |
GB2379142B (en) * | 2001-08-24 | 2004-11-17 | Fujitsu Ltd | Distribution of signals in high speed digital circuitry |
KR20040081803A (ko) * | 2002-02-21 | 2004-09-22 | 코닌클리즈케 필립스 일렉트로닉스 엔.브이. | 집적 회로 |
TWI229504B (en) * | 2002-10-25 | 2005-03-11 | Via Tech Inc | Clock skew indicating apparatus for integrated circuit chip |
FR2875311A1 (fr) * | 2004-09-14 | 2006-03-17 | St Microelectronics Sa | Procede de detection du positionnement relatif de deux signaux et dispositif correspondant |
JP4342503B2 (ja) * | 2005-10-20 | 2009-10-14 | 富士通マイクロエレクトロニクス株式会社 | 半導体装置および半導体装置の検査方法 |
EP1950577A3 (de) * | 2007-01-29 | 2012-01-11 | Stmicroelectronics Sa | Verfahren zur Integritätsüberprüfung einer Uhrwerkswelle |
DE102007027069B3 (de) * | 2007-06-12 | 2008-10-23 | Texas Instruments Deutschland Gmbh | Elektronische Vorrichtung und Verfahren zur chipintegrierten Zeitversatzmessung |
WO2010087817A1 (en) | 2009-01-27 | 2010-08-05 | Agere Systems Inc. | Critical-path circuit for performance monitoring |
FR3066871A1 (fr) * | 2017-05-24 | 2018-11-30 | Stmicroelectronics (Rousset) Sas | Dispositif logique de detection de fautes |
FR3084488B1 (fr) | 2018-07-24 | 2020-08-14 | Stmicroelectronics (Grenoble 2) Sas | Dispositif de detection d'une faute dans un circuit de propagation d'un signal d'horloge, et procede correspondant |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4072869A (en) * | 1976-12-10 | 1978-02-07 | Ncr Corporation | Hazard-free clocked master/slave flip-flop |
JPS59186415A (ja) * | 1983-04-08 | 1984-10-23 | テクトロニクス・インコ−ポレイテツド | スキユ−検出器 |
US4623805A (en) * | 1984-08-29 | 1986-11-18 | Burroughs Corporation | Automatic signal delay adjustment apparatus |
JPS6417515A (en) * | 1987-07-13 | 1989-01-20 | Hitachi Ltd | Phase comparator |
JPH02105910A (ja) * | 1988-10-14 | 1990-04-18 | Hitachi Ltd | 論理集積回路 |
US5095454A (en) * | 1989-05-25 | 1992-03-10 | Gateway Design Automation Corporation | Method and apparatus for verifying timing during simulation of digital circuits |
US5159279A (en) * | 1990-11-27 | 1992-10-27 | Dsc Communications Corporation | Apparatus and method for detecting out-of-lock condition in a phase lock loop |
US5313476A (en) * | 1991-06-28 | 1994-05-17 | International Business Machines Corporation | Clock security ring |
US5309111A (en) * | 1992-06-26 | 1994-05-03 | Thomson Consumer Electronics | Apparatus for measuring skew timing errors |
US5371417A (en) * | 1993-07-02 | 1994-12-06 | Tandem Computers Incorporated | Multiple frequency output clock generator system |
US5381416A (en) * | 1993-11-08 | 1995-01-10 | Unisys Corporation | Detection of skew fault in a multiple clock system |
-
1993
- 1993-10-11 FR FR9312451A patent/FR2711286B1/fr not_active Expired - Fee Related
-
1994
- 1994-09-19 US US08/308,808 patent/US5498983A/en not_active Expired - Lifetime
- 1994-10-07 JP JP6244183A patent/JP2657363B2/ja not_active Expired - Fee Related
- 1994-10-10 EP EP94410084A patent/EP0648017B1/de not_active Expired - Lifetime
- 1994-10-10 DE DE69407529T patent/DE69407529T2/de not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JPH07181234A (ja) | 1995-07-21 |
DE69407529T2 (de) | 1998-06-04 |
EP0648017A1 (de) | 1995-04-12 |
EP0648017B1 (de) | 1997-12-29 |
FR2711286A1 (fr) | 1995-04-21 |
US5498983A (en) | 1996-03-12 |
JP2657363B2 (ja) | 1997-09-24 |
FR2711286B1 (fr) | 1996-01-05 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |