DE69214570D1 - CCD-Schieberegister - Google Patents
CCD-SchieberegisterInfo
- Publication number
- DE69214570D1 DE69214570D1 DE69214570T DE69214570T DE69214570D1 DE 69214570 D1 DE69214570 D1 DE 69214570D1 DE 69214570 T DE69214570 T DE 69214570T DE 69214570 T DE69214570 T DE 69214570T DE 69214570 D1 DE69214570 D1 DE 69214570D1
- Authority
- DE
- Germany
- Prior art keywords
- shift register
- ccd shift
- ccd
- register
- shift
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/762—Charge transfer devices
- H01L29/765—Charge-coupled devices
- H01L29/768—Charge-coupled devices with field effect produced by an insulated gate
- H01L29/76816—Output structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/148—Charge coupled imagers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/762—Charge transfer devices
- H01L29/765—Charge-coupled devices
- H01L29/768—Charge-coupled devices with field effect produced by an insulated gate
- H01L29/76866—Surface Channel CCD
- H01L29/76875—Two-Phase CCD
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Ceramic Engineering (AREA)
- Electromagnetism (AREA)
- Solid State Image Pick-Up Elements (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP03237217A JP3143979B2 (ja) | 1991-08-22 | 1991-08-22 | Ccdシフトレジスタ |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69214570D1 true DE69214570D1 (de) | 1996-11-21 |
DE69214570T2 DE69214570T2 (de) | 1997-05-15 |
Family
ID=17012120
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69214570T Expired - Fee Related DE69214570T2 (de) | 1991-08-22 | 1992-08-12 | CCD-Schieberegister |
Country Status (5)
Country | Link |
---|---|
US (1) | US5220185A (de) |
EP (1) | EP0529417B1 (de) |
JP (1) | JP3143979B2 (de) |
KR (1) | KR100225558B1 (de) |
DE (1) | DE69214570T2 (de) |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5514886A (en) * | 1995-01-18 | 1996-05-07 | Eastman Kodak Company | Image sensor with improved output region for superior charge transfer characteristics |
US5900654A (en) * | 1995-07-17 | 1999-05-04 | Spratt; James P. | Radiation hardened charge coupled device |
KR970042822A (ko) * | 1995-12-30 | 1997-07-26 | 김준용 | 폴리부틸렌테레프탈레이트 수지조성물 |
JP2874668B2 (ja) * | 1996-10-30 | 1999-03-24 | 日本電気株式会社 | 固体撮像装置の製造方法 |
KR100364231B1 (ko) * | 1997-12-15 | 2003-02-19 | 제일모직주식회사 | 저온 충격강도가 우수한 열가소성 수지 조성물 |
JP2001308313A (ja) | 2000-04-21 | 2001-11-02 | Nec Corp | 電荷転送装置及びそれを用いた固体撮像装置 |
JP2003283086A (ja) | 2002-01-21 | 2003-10-03 | Hitachi Cable Ltd | 配線基板、配線基板の製造方法及び配線基板を用いた電子部品 |
US7429764B2 (en) * | 2002-02-27 | 2008-09-30 | Canon Kabushiki Kaisha | Signal processing device and image pickup apparatus using the same |
US6818483B2 (en) | 2002-07-16 | 2004-11-16 | Fairchild Imaging | Large area, fast frame rate charge coupled device |
JP2004140258A (ja) * | 2002-10-18 | 2004-05-13 | Sanyo Electric Co Ltd | 固体撮像素子及びその製造方法 |
JP4353459B2 (ja) * | 2003-04-15 | 2009-10-28 | 富士フイルム株式会社 | 信号電荷転送路 |
US8004724B2 (en) * | 2005-12-05 | 2011-08-23 | Canon Kabushiki Kaisha | Method and apparatus for image reading with synchronized readout and lighting control |
US20070258002A1 (en) * | 2006-05-04 | 2007-11-08 | Kevin Nay | Imaging subsystem employing a bidirectional shift register |
US20070258003A1 (en) * | 2006-05-04 | 2007-11-08 | Kevin Nay | Imaging subsystem employing dual shift registers |
US20080007622A1 (en) * | 2006-06-08 | 2008-01-10 | Eastman Kodak Company | Method of improving solid-state image sensor sensitivity |
GB201000117D0 (en) | 2010-01-06 | 2010-02-17 | Dow Corning | Organopolysiloxanes containing an unsaturated group |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6010675A (ja) * | 1983-06-30 | 1985-01-19 | Toshiba Corp | 電荷結合素子 |
FR2549273B1 (fr) * | 1983-07-12 | 1989-02-10 | Thomson Csf | Procede pour diminuer le bruit de precharge d'une capacite mos |
JPS60123063A (ja) * | 1983-12-07 | 1985-07-01 | Toshiba Corp | 電荷転送装置 |
JPS62188371A (ja) * | 1986-02-14 | 1987-08-17 | Pioneer Electronic Corp | 電荷転送装置の入力バイアス回路 |
JP2642927B2 (ja) * | 1986-06-12 | 1997-08-20 | ソニー株式会社 | 電荷転送装置 |
JP2508668B2 (ja) * | 1986-11-10 | 1996-06-19 | ソニー株式会社 | 電荷転送装置 |
-
1991
- 1991-08-22 JP JP03237217A patent/JP3143979B2/ja not_active Expired - Fee Related
-
1992
- 1992-08-10 US US07/926,328 patent/US5220185A/en not_active Expired - Lifetime
- 1992-08-12 DE DE69214570T patent/DE69214570T2/de not_active Expired - Fee Related
- 1992-08-12 EP EP92113767A patent/EP0529417B1/de not_active Expired - Lifetime
- 1992-08-13 KR KR1019920014609A patent/KR100225558B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
EP0529417A1 (de) | 1993-03-03 |
KR940004860A (ko) | 1994-03-16 |
DE69214570T2 (de) | 1997-05-15 |
JPH0555539A (ja) | 1993-03-05 |
KR100225558B1 (ko) | 1999-10-15 |
US5220185A (en) | 1993-06-15 |
JP3143979B2 (ja) | 2001-03-07 |
EP0529417B1 (de) | 1996-10-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |